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Vishay Siliconix
N-Channel JFETs
PRODUCT SUMMARY
Part Number VGS(off) (V) V(BR)GSS Min (V) gfs Min (mS) IDSS Min (mA)
DESCRIPTION
The J304/305 n-channel JFETs provide high-performance For similar products in TO-236 (SOT-23) packages, see the
amplification, especially at high-frequency. These products 2N/SST5484 series data sheet, or in TO-206AF (TO-72)
are available in tape and reel for automated assembly (see packages, see the 2N/SST4416 series data sheet.
Package Information).
TO-226AA
(TO-92)
S 1
D 2
G
3
Top View
Parameter Symbol Test Conditions Typa Min Max Min Max Unit
Static
Gate-Source Breakdown Voltage V(BR)GSS IG = −1 mA , VDS = 0 V −35 −30 −30 V
Dynamic
Common-Source
gfs 4.5 7.5 3 mS
Forward Transconductance
VDS = 15 V
V, VGS = 0 V,
V f = 1 kHz
Common-Source
gos 50 50 mS
Output Conductance
Common-Source Input Capacitance Ciss 2.2
Common-Source
Crss VDS = 15 V, VGS = 0 V 0.7
Reverse Transfer Capacitance pF
p
f = 1 MHz
Common-Source
Coss 1
Output Capacitance
VDS = 10 V, VGS = 0 V nV⁄
Equivalent Input Noise Voltage en 10
f = 100 Hz √Hz
Notes
a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing. NH
b. Pulse test: PW v300 ms, duty cycle v2%.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
16 400 f = 1 kHz
6 rDS 30
12 gfs 300
gos
8 4 200 20
0 0 0 0
0 −2 −4 −6 −8 −10 0 −2 −4 −6 −8 −10
VGS(off) − Gate-Source Cutoff Voltage (V) VGS(off) − Gate-Source Cutoff Voltage (V)
1 mA 8
0.1 mA
IG − Gate Leakage (A)
1 nA TA = 125_C TA = −55_C
6
IGSS
100 pA @
125_C 25_C
5 mA 4
10 pA 1 mA
125_C
0.1 mA
TA = 25_C 2
1 pA IGSS @ 25_C
0.1 pA 0
0 4 8 12 16 20 0.1 1 10
8 12
VGS = 0 V VGS = 0 V
ID − Drain Current (mA)
ID − Drain Current (mA)
6 −0.2 V 9 −0.3 V
−0.4 V −0.6 V
−0.9 V
4 −0.6 V 6
−1.2 V
−0.8 V
−1.0 V −1.5 V
2 3
−1.2 V
−1.8 V
−1.4 V
0 0
0 2 4 6 8 10 0 2 4 6 8 10
VDS − Drain-Source Voltage (V) VDS − Drain-Source Voltage (V)
8 8
TA = −55_C
TA = −55_C
25_C
6 6
25_C
4 125_C 4 125_C
2 2
0 0
0 −0.4 −0.8 −1.2 −1.6 −2 0 −0.6 −1.2 −1.8 −2.4 −3
VGS − Gate-Source Voltage (V) VGS − Gate-Source Voltage (V)
8 8
TA = −55_C TA = −55_C
6 6
25_C 25_C
4 125_C 4
125_C
2 2
0 0
0 −0.4 −0.8 −1.2 −1.6 −2 0 −0.6 −1.2 −1.8 −2.4 −3
VGS − Gate-Source Voltage (V) VGS − Gate-Source Voltage (V)
On-Resistance vs. Drain Current Circuit Voltage Gain vs. Drain Current
300 100
TA = 25_C g fs R L
rDS(on) − Drain-Source On-Resistance ( Ω )
AV + 1 ) R g
L os
240 80
Assume VDD = 15 V, VDS = 5 V
VGS(off) = −2 V 10 V
RL + ID
AV − Voltage Gain
180 60
VGS(off) = −3 V VGS(off) = −2 V
120 40
60 20
VGS(off) = −3 V
0 0
0.1 1 10 0.1 1 10
3 1.8
VDS = 0 V VDS = 0 V
2 1.2
VDS = 10 V VDS = 10 V
1 0.6
0 0
0 −4 −8 −12 −16 −20 0 −4 −8 −12 −16 −20
10 10
gis gfs
(mS)
(mS)
−bfs
1 1
0.1 0.1
100 200 500 1000 100 200 500 1000
1 1
gos
(mS)
(mS)
−grs
0.1 0.1
TA = 25_C
VDS = 15 V
VGS = 0 V
Common Source
0.01 0.01
100 200 500 1000 100 200 500 1000
Equivalent Input Noise Voltage vs. Frequency Output Conductance vs. Drain Current
20 20
VDS = 10 V VGS(off) = −3 V
16 16
TA = −55_C
en − Noise Voltage nV /
12 12
25_C
8 8
125_C
ID = 5 mA
4 4
VDS = 10 V
VGS = 0 V f = 1 kHz
0 0
10 100 1k 10 k 100 k 0.1 1 10
f − Frequency (Hz) ID − Drain Current (mA)
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and
Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see
http://www.vishay.com/ppg?70236.
Notice
Specifications of the products displayed herein are subject to change without notice. Vishay Intertechnology, Inc.,
or anyone on its behalf, assumes no responsibility or liability for any errors or inaccuracies.
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