Application

Example ...............................................................................................................
............ 3
2
Introduction .........................................................................................................
................................. 5
3 Defining the Test
Object ..................................................................................................................
... 5
4 Global Hardware Configuration
CMC ................................................................................................ 7
4.1 Output
Configuration ....................................................................................................................... 7
4.2 Analog
Outputs ............................................................................................................................... 7
4.3 Binary
Inputs ................................................................................................................................... 8
4.4 Binary
Outputs ................................................................................................................................ 8
5 Defining the Test
Configuration .......................................................................................................
10
5.1 General
Approach .........................................................................................................................10
5.2 Testing Frequency Protection
Function ........................................................................................11
5.2.1
Settings ...................................................................................................................................11
5.2.2 Testing Pick-Up
Values ...........................................................................................................11
5.2.3 Testing the Trip
Times ............................................................................................................13
5.3 Testing Voltage
Protection ............................................................................................................14
5.3.1 Settings of the Voltage
Protection ..........................................................................................14
5.3.2 Overlapping with Other Protective
Functions .........................................................................14
5.3.3 Testing V< Pick-
Up .................................................................................................................15
5.3.4 Testing V> Pick-
Up .................................................................................................................16
5.3.5 Testing the Trip
Times ............................................................................................................17
5.4 Testing Overexcitation
Protection .................................................................................................17
5.4.1 Settings of the Overexcitation
Protection ................................................................................18
5.4.2 Overlapping with Other Protective
Functions .........................................................................18
5.4.3 Testing V/f> Pick-Up of the Warning
Stage ............................................................................18
5.4.4 Testing Thermal Trip
Times ....................................................................................................19
5.5 Testing Overcurrent Protection (without Undervoltage Seal-
In) ...................................................20
5.5.1 Settings of the Overcurrent
Protection ....................................................................................20
5.5.2 Overlapping with Other Protective
Functions .........................................................................20
5.5.3 Testing I>-Pick-
Up ..................................................................................................................20
5.5.4 Extending the Test Object
Definition ......................................................................................22
5.5.5 Testing Overcurrent Trip Time (I>>-
Stage) .............................................................................23
5.6 Testing Thermal Overload Protection
(TOL) ................................................................................24
5.6.1 Extending the Test Object
Definition ......................................................................................24
5.6.2 Testing the TOL Trip
times .....................................................................................................25
5.7 Testing the Unbalanced Load Protection (Negative
Sequence) ..................................................27
5.7.1 Settings of the unbalanced load protective
function ...............................................................27
5.7.2 Extending the Test Object
Definition ......................................................................................27
5.7.3 Testing the trip characteristic
curve ........................................................................................28
5.8 Testing the Differential Protection
Function ..................................................................................29
5.8.1 Settings of the differential protection
relay ..............................................................................29
5.8.2 Extending the Test Object
Defintion .......................................................................................29
5.8.3 Testing the stability .....................................................................