Radiated Emission and Susceptibility

Tzong-Lin Wu, Ph.D.

EMC Lab
Department of Electrical Engineering
National Taiwan University

Differential-Mode v.s. Common-mode Currents

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Differential-Mode v.s. Common-mode Currents
Eθ = Eθ ,1 + Eθ ,2
− j β 0 r1
? e e − j β0 r2
= M? ( I1 + I2 ) F (θ )
r1 r2
− j β 0 ( r +Δ )
e e − j β0 ( r −Δ )
= M ( I1 + I2 ) F (θ )
r+Δ r−Δ
e − j β0r
=M ( I1e− j β0 Δ + I 2 e j β0 Δ ) F (θ )
r
M is a function of antenna type

F(θ) is the array factor

⎧ η0 β 0
⎪M = j l = j 2π ×10−6 fl
⎨ 4π For Hertzian dipole
⎪⎩ F (θ ) = sin θ

Differential-mode current emission model

A Question: Where is the maximum E field for the differential current ?

θ
x

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Differential-mode current emission model

Θ=90 is the maximum

Differential-mode current emission model

fI D l − j β0 d − j β0 s / 2
I1 = I d Ed ,max = j 2π ×10−7 e {e − e j β0 s / 2 }
d
I2 = −Id
I f 2ls
= 1.316 × 10−14 D
d

1. Reduce the loop size

2. Reduce the current level

Can reduce the EMI

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Differential-mode current emission for trapezoidal pulse train

EMI due to the differential-mode current is

significant for higher frequencies.

An example
1m ribbon cable with 50mil distance carrying 20mA current at 30MHz

The EMI at 3m distance is about

40dBuV/m

It’s easy to over the FCC limit line

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Why the slot increase EMI ?

15cm 15cm

12.5cm
5mm

30cm 30cm

Common-mode Emission Model

I1 = I c Ed ,max = j 2π × 10−7
fI c l − j β0 d − j β0 s / 2
e {e + e j β0 s / 2 }
d
I2 = Ic I fl
= 1.257 × 10−6 c
d

1. Reduce the trace length

2. Reduce the current level

Can reduce the common-mode EMI

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An Example

1m ribbon cable with 50mil distance carrying 7.96uA current at 30MHz

The EMI at 3m distance is about

40dBuV/m -> limit of FCC

Very small current will exceed the limit of FCC !

Common-mode current emission for trapezoidal pulse train

Common-mode EMI usually occurs

at low frequency range

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Current Probe for common-mode current
Working principal ?

Ampere’s Law and

Faraday Law are both used in
the design

Calibration data:
Zt = V / I
(transfer impedance)

Why only common-mode current are

Sensed in this probe?

Current Probe Example

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Examples for common-mode EMI

James L. Knighten et al., “Experimental Analysis of Common Mode Currents on

Fiber Channel Cable Shields due to Skew Imbalance of Differential Signals
Operating at 1.0625 Gb/s”, IEEE EMC Symposium, 1999

Lothar 0. Hoeft et al., “Spectral Analysis of Common Mode Currents on

Fiber Channel Cable Shields due to Skew Imbalance of Differential
Signals Operating at 1.0625 Gb/s”, IEEE EMC Symposium, 1998

James L. Knighten et al., “Effects of Device Variations on the EMI Potential of

High Speed Digital Integrated Circuits”, IEEE EMC Symposium, 1997

Decomposition of the Common/Differential mode

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 Delay Skew effect on the Spectral components (1st harmonic)

Rise time is a minor effect on the spectral component

Skew effect on the Spectral components (1st harmonic)

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Measurement setup for EMI and Common-mode current

Delay Skew design on PCB

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Measurement Results for Common-mode current and their radiation

Fundamental Frequency

EMI increases about 9dB/decade

of the skew

Common-mode current v.s. EMI (measurement)

Fundamental Frequency

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Delay Skew v.s. Common-mode current (measurement)

Higher harmonics

Questions:

• Why does 3rd harmonic not increase

as skew increases ?

• Why does 2nd harmonic exist ?

Delay Skew v.s. Common-mode current

Increasing delay skew will increase the energy of 3rd harmonic.

But, impedance mismatch between trace on PCB and Cables increase

the reflection coefficient.

Therefore the common-mode current of 3rd harmonic on the cable decreases.

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About the Even harmonics
2nd harmonic
1st harmonic

Lack of symmetry of the waveform causes the even harmonics

Measurement setup for digital waveform

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Digital waveform and its spectrum

Even harmonics

Asymmetry of the waveform may be resulted from

• Difference of the rise/fall times

• Not 50% duty cycle (shorter or longer)

EMI for higher harmonics

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 Common-Mode EMI on the Ground Plane

A trace on a solid Ground plane

Common-Mode EMI on the Ground Plane

Equivalent Circuit

Common-mode Noise

It can be reduced by increasing

the mutual inductance

How ?

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Common-Mode EMI on the Ground Plane

Reducing trace Height

To increase Mgs

Common-Mode EMI on the Ground Plane

Adding another return path

to decrease I2

Guard trace

Shunt trace

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 Common-Mode EMI on the Ground Plane

Resonant effect by
Image Plane

Radiated Susceptibility
Area of uniform field

Incoming mains power filter (1.5m×1.5m)

Field generation antenna
Interconnection filter

0.8m

Field 3m
generation
Interconnecting cables
equipment Chamber penetration cables

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 Radiated Susceptibility

Test levels for radiated immunity

( 80 MHz to 1000 MHz)
Level Test field strength
V/m
1 1
2 3
3 10
x Special
NOTE – x is an open test level. This level
may be given in the product specification.
The signal is 80 % amplitude modulated
with 1 kHz sinewave to simulate actual
treats.

8-2 Simple Susceptibility Models for wires and PCB Lands

a.Modelling a two conductor line to determine the terminal voltages
induced by incident eletromagnetic field.
Incident wave
y
y Ei

z x
L
+ + Hi
RS _ VS S VL _ RL

The problem is: x

predicting the VS and VL given the magnitude,polarization ,and direction of

the incident uniform plane wave(Ei , Hi)

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b.Only two components of incident wave contribute to the induced voltage.
Ei = E i
y
S E yi ⊗ −H RL
RS Hi = H
i
z
i
z (induce)

equivalent Tx line model I ( x + x)

L X

+
I ( x)
RS S V (X )
C X
IS X
RL
_

where per-unit-length
μ0 s
L= n( )
π rω
for parallel-wire line
C = πε 0
s
n ( )
rω

c.V s ( x ) , I s ( x ) = ?
(1)by the Faraday's law ⇒ the incident magnetic field

H zi will induce the emf in the loop.

emf = jω ∫ B zi i d S
s
s
=-jωμ 0 ∫ H zi i dS = - jωμ 0 x ∫ H zi dy
y =0
s

emf s
∴ per-unit-length source at x , V s ( x ) = = - jωμ 0 ∫ H zi dy
x y =0

(2)The incident E yi induces a voltage between the two conductors

,which induces a displacement current in the per-unit-length
capacitance C.
s
∴ Is ( x) = - jωC ∫ E yi dy
y =0

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 d .Derive the tx-line equations

V( x + x) − V( x) = − jω L xI ( x) − V( x) x

I ( x + x) − I ( x) = − jωC xV( x + x) + I S ( x) x
Dividing x , and x → 0

dV( x) s
⇒ + jω LI ( x) = − VS ( x) = + jωμ 0 ∫ H zi dy
dx y =0

d I ( x) s
+ jωC V( x) = I S ( x) = - jωC ∫ E yi dy
dx y =0

e. if the tx-line is electrically short = L λ 0

the , C can be ignored
jωμ 0 H zi i A
+ +
RS VS - jωCE yi i A VL RL
_ _

∴ total source
s area
VSL = jωμ 0 ∫ H zi dy ≅ jωμ 0 H zi i S i L = jωμ 0 H zi i A
y =0
S L λ0
s
I SL = - jωC ∫ E dy ≅ - jωCE yi i S i L = - jωCE yi i A
i
y
y =0
S L λ0

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f.∴ It is easy to compute the induced voltage VS and VL
RS RSRL
VS = jωμ 0 LSH zi − jωCLSE yi
RS + RL R S + RL
RL RSRL
VL = − jωμ 0 LSH zi − jωCLSE i

RS + RL RS + RL y

g.An example:
+ +
50Ω 50mil 150Ω
VS VL
− − Ei = 10 v
m
1m f = 100MHz

(1)only magnetic field induce voltage source.

Ei
(2)VS = jωμ 0 LSH ni A = j × 2π × 108 × 4π × 10−7 × × 1m × 1.27 × 10−3
70
= j 26.6mv

(3)
j 26.6mv
+
50Ω 150Ω
VS
−

50
VS = j 26.6mv = j 6.65mv
50 + 150
150
VL = − j 26.6mv = − j 20mv
50 + 150

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Radiated Susceptibility for a transmission line
Example (1):

What kind of noise will couple to the transmission line ?

Radiated Susceptibility for a transmission line

Voltage noise source

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Radiated Susceptibility for a transmission line
Example 2

Radiated Susceptibility for a transmission line

Example 3. Current Injection Technique in Conducted Susceptibility Test

Can this technique replace the R.S. test ?
“Investigation of the Bulk Current Injection Technique by Comparison to Induced Currents from Radiated
Electromagnetic Fields”, IEEE EMC Symposium, p412 – p417, 1996

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Radiated Susceptibility for a transmission line
Testing probes and their working principle

Radiated Susceptibility for a transmission line

Test Plate for generating uniform EM wave

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Radiated Susceptibility for a transmission line

Uniform field check

Radiated Susceptibility for a transmission line

Three different cases

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Radiated Susceptibility for a transmission line
1 Ohm case

They are quite consistent below

100MHz

Measured under BCI technique

Measured under Parallel Plate

Calculated by previous theory

Radiated Susceptibility for a transmission line

270 Ohm case 50 Ohm Case

Summary: BCI technique can be used in low frequency range to complement the
high frequency radiation susceptibility test

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