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Physics Procedia 19 (2011) 482–486

International Conference on Optics in Precision Engineering and Nanotechnology


(ICOPEN2011)

Nonlinear Optical Characterization of CdTe Nano Particles Using


Moiré Deflectometry Method
M. H. Majles Araa,*, R. Golzarianb,d, Z. Javadia, R. Sahraeic
a
Photonic lab, Tarbiat Moallem University of Tehran, Tehran
b
Department of Physics, Islamic Azad University, Tehran central branch
c
Department of Chemistry, University of Ilam
d
Young Researchers Club, Islamic Azad University, Tehran central branch

Abstract

In this paper we have been synthesized CdTe nano particles and determined the size of them by XRD pattern and TEM
micrograph about 35nm. The UV-Vis spectrum of these nano particles showed an exitonic absorption peak at 600nm. Then With
a CW He-Ne laser (632.8 nm: near to wavelength of exitonic peak), we measured the refractive index of these nano particles for
two different incident laser powers by using moiré deflectometry method.

PACS: 42.65.-k 81.07.-b


© 2011 Published by Elsevier B.V. Open access under CC BY-NC-ND license.
Selection and/or peer-review under responsibility of the Organising Committee of the ICOPEN 2011 conference

Keywords: nonlinear optics; CdTe nano particles; moire deflectometry; nonlinear refractive index; He-Ne laser

1. Introduction

CdTe nano particles physical dimensions and chemical surface is very similar to proteins and because of large
Bohr exitonic diameter, it is considered the most important semiconductor in group II-VI. One of the most important
aspects of quantum confinement is absorption edge shift towards high energy by reducing the particle size [1-4]. The
optical properties of particles, such as refraction and absorption coefficients for custom applications and future
applications would be useful.
The moiré method is a high precision technique for measuring the nonlinear refractive index of materials by ray
deflections. Moiré fringes patterns are formed by superimposing one of the Talbot images of the first grating on the
second one. If an object is placed in front of first grating, Due to the convergence or divergence of the collimated

* Corresponding author. Tel.: +982188309294; fax: +982188309294.


E-mail address: majlesara@gmail.com.

1875-3892 © 2011 Published by Elsevier B.V. Selection and/or peer-review under responsibility of the Organising Committee of the ICOPEN
2011 conference Open access under CC BY-NC-ND license.
doi:10.1016/j.phpro.2011.06.196
M. H. Majles Ara et al. / Physics Procedia 19 (2011) 482–486 483

incident laser beam on moiré deflectometry system, the moiré fringes rotate and size of fringes would change too[5].
Moving the sample along the propagation path led to variations of the effective focal length of the sample that can
be measured from the amount of fringes rotation angle. Since the effective focal length depends on the strength of
the nonlinear refraction of the sample we can measure the nonlinear refractive index by using it.

2. Theory

The experimental set up used for moiré deflectometery is shown in Fig.1. At first the light beam collimates by
two lenses (L1 and L2). Then a pair of linear transmission gratings is placed in front of the collimated laser beam to
construct the moiré fringes patterns. The gap between the two similar Ranchi gratings G1 and G2 should be one of
Talbot distances [6]:
d2
zt n n 0,1, 2, ... (1)
O

where d is the length of the grating steps.

Fig.1: moire deflectometry setup

A sample with nonlinear refractive index n2 is placed close to the focal point of L1. Moving the sample in Z
direction, the position of the induced focus will change so the incident beam on moiré deflectometer will either
converges or diverges and the moiré fringes show a rotation. These rotations obtain from [7]:
ª z z2 º
D ( z ) tan 1 « t » (2)
«¬ T f 2 f 2 z  f 2 f eff ( z )  z 2 »¼

where feff (z) is the effective focal length of the sample:

2
Sf 4 ( z ) ª z2 º
f eff ( z ) f eff (0) «1  2 » (3)
4dn2 pin ¬« z0 »¼

By measuring the rotated angle Į (z) of the moiré fringes at various distances, nonlinear refractive index of the
sample can be determined from two last equations.

3. Experiments

For preparing of CdTe nano particles, firstly we solved 2.35 mmol of Cd (ClO4)2.6H2O in 125 ml of pure
distilled water. Then we added 5.7 mmol of the 2-dimethyl amino ethane thiol stabilizer as covering operator and
484 M. H. Majles Ara et al. / Physics Procedia 19 (2011) 482–486

stirred the resulting solution for 30 minutes. We added drop wise a solution of 1 molar sodium hydroxide to set the
resulting solution in the value of 0.9 and put the obtained solution in a flask at the atmosphere of Nitrogen gas to
sending out the Oxygen completely. Also we guided the H2Te gas produced from the reaction of 0.2 gr Al2Te3 with
0.5molar sulfuric acid for 20 minutes into flask under the atmosphere of nitrogen gas. After half hour, the color of
solution became orange that was indicating the creation of nano particles of cadmium Telluride.
The size of these nano particles using XRD pattern and TEM image was obtained about 35nm. XRD pattern and
TEM image of nano particles, respectively is shown in Fig.2, 3.

Fig. 2: XRD diffraction of CdTe nano particles

Fig. 3: TEM of CdTe nano particles


M. H. Majles Ara et al. / Physics Procedia 19 (2011) 482–486 485

UV-Vis spectrum of CdTe nano particles is observed in the Fig.4. The peak of excitonic absorbance have been
happened about 600nm.

Fig. 4: observed absorb spectrum of CdTe nano particles

We have used a CW He-Ne laser (Ȝ = 632.8nm) for moire deflectometry that was near to wavelength of excitonic
absorption peak of nano particles. Two lenses L1 and L2 with the focal lengths of 80 mm and 500 mm and two
similar Ranchi gratings G1 and G2 with pitch of 0.17 mm were used in moiré setup. The distance between planes of
G1 and G2 was chosen 87.9 mm and it was known as one of Talbot distances for the used gratings. CdTe solution
was filled in a quartz cell (L=10mm). We observed the rotation of fringes by moving the samples in z direction.
Some of the patterns obtained in different places at P0=50mW are shown in Fig.5.

Z= -1.2cm Z=0 Z=0.8cm


Fig. 5: Some of the patterns obtained in different places at P0=50mW
486 M. H. Majles Ara et al. / Physics Procedia 19 (2011) 482–486

The comparison of experimental measurements (small circles) for moiré fringe angles of CdTe nano particles
with theoretical fit (solid line) are shown in Fig. 6.
By fitting the experimental measurements with theoretical relations we obtained the nonlinear refractive index of
CdTe nano particles at P0=50mW and P0=30mW incident powers equal to 4.6×10-8 and 5.1×10-8 (cm2/W-1)
respectively. The sign of n2 was negative because the curves of fringes rotation angles had two peaks [7-8].

Fig. 6: the moiré fringes rotation angles as a function of distance from focus

4. Conclusions

At first the size of CdTe nano particles were determined by two methods XRD and TEM that in both the amount
of nano particles is approximately 35 nm. We used the moiré deflectometry for measuring the nonlinear refractive
index of CdTe nano particles solution. We observed a rotation about the lens center when we inserted each of the
samples in our set-up before and after the focus of the lens L1. But For the case, when the sample was placed just at
the focus, the fringes rotation vanished. Finally using this method we measured the nonlinear refractive index of
sample at P0=50mW and P0=30mW incident powers equal to 4.6×10-8 and 5.1×10-8 (cm2/W-1) with negative sign
respectively.

5. References

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Farias , B.S.Santos “CdTe/CdS core shell quantum dots for photonic applications” Microelectronics Journal,
No. 36 (2005) 989-991.
2. Sharat Chandra, S Tripura Sundari, G Raghavan and A K Tyagi “Optical properties of CdTe nanoparticle
thin films studied by spectroscopic ellipsometry”, J.Phys.D:Appl.Phys, No. 36 (2003) 2121-2129.
3. Zhiyong Tang, Zhenli Zhang, Ying Wang, Sharon C.Glotzer, Nicholas A.Kotov “Self-Assembly of CdTe
Nanocrystals into Free-Floating Sheets” Science, No. 314 (2006) 274-278.
4. Sandeep Kumar and Thomas Nann “Hexagonal CdTe nano particles of various morphologies”,
Chem.commun, No. 19 (2003) 2478-2479.
5. K. Patorski, "The self-imaging phenomenon and its applications", Progress in optics, No. 27 (1989) 1-108.
6. Glatt, O. Kafri, "Moir Deflectometry-Ray Tracing lnterferometry", Optics and Lasers in Engineering, No. 8
(1988) 277-320.
7. Kazem Jamshidi-Ghaleh, Nastaran Mansour, "Nonlinear refraction measurements of materials using the
moire deÀec tometry", Optics Communications, No. 234 (2004) 419–425.
8. M. H. Majles Ara, Z. Javadi, R.S.Sirohi, "Measurement of nonlinear refractive index of Ag and Au nano-
particles using moiré technique", OPTIK, (2010) in press.

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