Professional Documents
Culture Documents
Gustaaf Sutorius
Jitter & Typical Digital Development Process
• Accurate Design
Analysis
• Test & Analysis
Capability
• Measurement
Automation
AGENDA
1. Jitter:
I. Definition and Description of Jitter
II. Understanding Jitter, its Components, and Separation
III. Jitter Measurement Methods and Tools
2. Actual jitter measurements
Page 3
AGENDA
1. Jitter:
I. Definition and Description of Jitter
II. Understanding Jitter, its Components, and Separation
III. Jitter Measurement Methods and Tools
2. Actual jitter measurements
Page 4
Jitter Primer: Topics to be Covered
Page 5
What is Jitter?
• ‘Jitter ‘ is another word for shaky, quiver,
tremulous… speaks of degree of instability of
location.
• In the Digital Design world, jitter has been defined
as:
Page 6
What is Jitter: Analyzing an Edge (Transition)
Transition
Early Instant
Threshold
Late
∆tEarly
0 1
∆tLate
∆tEarly Pk + ∆tlate Pk
JPP=∆
Page 7
Units for expressing Jitter
π= π/2 radians
JPP= .25 UI x 2π
Page 8
Jitter: Creating the Eye… E1
Eye Crossing
Points
E0
Overlaid
transitions
• Bit Errors!
Transmitted
Waveform 1 0 0 1 0 1 1 0
Received
Waveform 1 0 0 1 0 1 1 0
Interpretted
Waveform 1 1 0 1 0 1 1 0
Page 10
Jitter as Horizontal “Timing Noise”
Page 12
Jitter Primer: Topics to be Covered
Page 13
Representing Jitter
S(t): a general digital jitter signal and P(t): a pulse train
S(t)=P(Asin(2πfDt+ϕ(t)))
Where ϕ(t) is overall system jitter function with many sources.
ϕ(t)= ϕ B(t) +ϕ UB(t)
ϕΒ(t) is composed of functions ϕUΒ(t) is composed of functions that
that have Deterministic have Random (UnBounded) phase
(Bounded) phase deviations deviations because their max
because their max amplitudes amplitudes do change. The functions
don’t change are characterized by their statistics
Page 14
Lets Look at the Jitter Sources Again…
Oscillator Topology
PLL Design
Crystal Performance Noise
Thermal Noise
RANDOM / UNBOUNDED
Shot Noise
Dispersion
Reference Spurious
Radiated or Conducted Signals
System
Crosstalk
Duty Cycle Distortion mechanisms DETERMINISTIC
Impedance mismatch BOUNDED
Inter Symbol Interference mechanisms
Receiver Detector characteristics
Data
Clock/Data Recovery Design
PRBS Mechanisms
Page 15
Example Random and Deterministic Jitter
σ JPPDJ
Random Jitter (RJ): Deterministic Jitter (DJ): The spacing
Defined by RMS value, σ, between the mean values of the
of the Gaussian “earliest” and “latest” traces, JPPDJ
distribution
Page 16
Expressing Total Jitter
• Usually represented as root-mean-square, Jrms, and peak-to-peak,
JPP
• Most useful to characterize jitter as a combination of JrmsRJ and JPPDJ
at a given Bit Error Ratio (BER)
Sampling Point
Measure BER(x) = β(x)
x Gaussian
Jitter Only!
(No DJ)
σL σR
Overlap indicates BER
µ Sampling Point µ
×σ
JPPRJ = n×
Page 18
Random Jitter JPPRJ : What factor to use ?
×σ
JPPRJ = n×
JPPRJ
Random jitter is UNBOUNDED, if we wait long enough we would have “hits” anywhere in the Eyediagram.
We could use any Berr but 10-12 is quite common to use and 10-12 equals to 14.1 sigma.
So if we measure sigma is 10 picoseconds, then we would say the random jitter is 141 Psec.
Page 19
Expressing Total Jitter: RJ & DJ combined
• Since JPPRJ is unbounded, it can be defined by the BER that
would result if there were only RJ. This is where the tails of the
right and left distributions overlap (at the Sampling point):
For a BER = 10-12 → JPPRJ = 14× ×σ
Then JPPRJ ≡ n××σ so that JPPRJ =nxJrmsRJ
• The Total Jitter (TJ), JTJ, for a given BER is then:
J TJ = n × J rms
RJ
+ J PP
DJ
= 14 × σ + J PP
DJ
Page 20
The Dual Dirac Assumption
Total Jitter
The ‘DJ’ The ‘RJ’
JPPDJ
7σ
∗ σ
=
No Jitter values
between deltas
µL µR µL µR
x2 (x − µ L )2 (x − µ R )2
[δ ( x − µ L ) + δ ( x − µ R )] ∗ exp − 2
= exp − + exp −
2σ σ 2σ 2
2
2
Page 21
Jitter Probability: BER
J pk − pk = J deterministic n ×σ random
=
Page 22
Random and Deterministic Jitter
• Waveform Observation
• Pattern
• Note Characteristics σ = JrmsRJ
JPPDJ
2 Distinct 2 Distinct
Falling Edges Rising Edges
Threshold
JPP Jrms
Lots of Zeros
Page 23
Random and Deterministic Jitter
• Lets Look at Deterministic Component…
σ = JrmsRJ
DJ
J
J PPDJ
PP
JLPPDJ JRPPDJ
Page 24
Random and Deterministic Jitter
• Now lets Look at the Random Component…
σ = JrmsRJ
JPPDJ
σRJ σRJ
Page 25
Random and Deterministic Jitter
• Now lets Summarize Jitter for the Circuit Measured…
σσ=J
= JrmsRJRJ
rms
DJ
J
J PPDJ
PP
JPPT
Page 26
Total jitter: Histogram View
Total Jitter is composed of
random and determistic
components
Random Jitter (RJ) unbounded
• Due to thermal noise, shot noise, etc.
• Follows Gaussian distribution
• Requires statistical analysis to be
quantified
• RJpp = 14.1 x Jrms for 10-12 BER
Page 27
Correlated TJ Uncorr
DDJ PJ
ISI DCD
Data-Correlated Data-Uncorrelated
Total
ϕB(t) Jitter (TJ)
Deterministic Random
Jitter (DJ) Jitter (RJ)
Page 28
Correlated TJ Uncorr
DDJ PJ
Transmitter Threshold Offset Problem DCD
ISI
1 1
Actual Threshold
Ideal Threshold
0 0
Clock
Note: One technique to test for DCD is to stimulate your system/components with a repeating 1-0-1-0… data pattern.
Page 29
This technique will eliminat inter-symbol interference (ISI) jitter and make viewing the DCD within the spectrum display much easier .
Correlated TJ Uncorr
DDJ
Transmitter Edge Transition Speed Asymmetry PJ
ISI DCD
1 1
Threshold
0
Clock
Page 30
Correlated TJ Uncorr
1 1 1 1 1 1 1 1 1 1 1
Threshold
0 0 0 0 0 0 0 0 0 0 0
Page 31
Correlated TJ Uncorr
Data Signal
Corrupter
Threshold
TIE Trend
Page 33
Where Does Jitter Come From? Correlated TJ Uncorr
DJ RJ
DDJ PJ
ISI DCD
Transmitter Receiver
Media
Page 34
Jitter examples for different Jitter Distributions
Different types of jitter ϕ(t) in S(t)=P(Asin(2πfDt+ϕ(t)))
ϕ(t ) = mess
ϕ(t ) = square wave
ϕ(t ) = pulse
Page 35
Jitter Examples Continued
A DCD B ISI
Page 36
Jitter Primer: Topics to be Covered
Page 37
Which Eye Has Worse Jitter?
A B
You can’t know unless you measure the Total
Jitter or measure the jitter components!
Page 38
Jitter Measurement Solutions from Agilent
• Infiniium Scopes (up to 32 GHz):
• EZJit Software
• EZJit Plus Software
• DCA-J (86100 Series Infiniium 20-80 GHz Scopes)
• Jitter SW package
• Infiniimax Probes to 13 GHz
• N1930 Physical Layer Test System
• Vector Network Analyzer or Time Domain Reflectometer
• N4900 Series BERTs
• Bathtub curve Extrapolation and RJ/DJ Estimation
• E443x Signal Sources
• E4438C-SP1 Jitter Injection Software
Page 39
Tools to Measure/Analyze Jitter
Transmitter Media Receiver
Pattern Generator X X
X X X
Bit Error Ratio Tester
X
Vector Network analyzer
Time domain Reflectometer X
Page 40
Jitter Tolerance Testing (w/Pattern Generators)
Pros
Low Noise (RJ) available
Standard Patterns and User Definable Patterns
Flexible for wide variety of technologies.
RJ, PJ, and DCD can be created.
Cons
Cost Range: Modestly to Highly Expensive
Intersymbol Interference is not available.
Complex sequencing not available.
Page 41
Tolerance Testing (using a Pattern Generator)
Square Sinusoidal
Sinusoidal,
RJ and ISI*
Pros
Measures Total Jitter Directly
Can Provide good estimate of total Jitter quickly with BERTScan method
System Tool: Usable for Media analysis, receiver stress analysis
J-Bert N4903B available for jitter stress test
Cons
Expensive
Time of Measurement of Total Jitter is Long
Need an external clock provided
Page 43
Jitter Analysis: BERT BathTub Curve
Scan the sampling point across the eye
-3
Measure the Bit Error
10
β(x) Gaussian
Tails
ratio as a function of
sampling point delay,
BER
10-6
10-9
Eye Opening at β(x) ⇒ TJβ
BER=10-12
10-12
0 0.5TB TB
Page 44
Jitter Analysis: N1951A PLTS with Vector Network Analyzers
(VNAs) or Time Domain Reflectometers (TDRs)
VNAs TDRs
Expensive InExpensive
50 GHz BW available yields high Limited by rise time of Pulse
resolution source (35ps)
Highest Accuracy Accuracy may be sufficient in
many environments. Using
Full Differential Analysis Normalization to increases
analysis to show EMI, mode accuracy
conversion locations Only magnitude TDT and TDR
Software Modeling and Analysis
Available
S-Parameters for modeling or to Software Modeling and Analysis
estimate ISI contribution of path Available
Page 45
N1951A VNA Measurement of XAUI Backplane
Page 46
Jitter Analysis (Real Time Oscilloscopes)
Pros
•Captures contiguous time record
•No external clock required
•Software clock recovery methods yield precise clock reconstruction
•System Tool: Usable for Debug
•Flexibility for many technologies and usually a growth path provided
•Many views provided for insight: histograms, eyes, fft, trend, data, etc
•Oscilloscope Bandwidths are going higher
Cons
•Expensive
•Limited to current BW of scope
Page 47
Agilent Infiniium Series
Oscilloscopes
Page 48
How Do Real Time Scopes Measure Jitter on Data: Ezjit Display
NRZ
Serial
Data
Recovered
Clock
Jitter
Trend
Page 49
Agilent E2681A EZJIT Jitter Measurement Application for Infiniium Oscilloscopes
Signal
Histogram
Trend
Spectrum
Page 50
Sampling Techniques
Page 51
Sampling
Real Time (Single Shot) Technique
• Used with either Repetitive or Single-Shot Signals
• All Samples Are Taken From a Single Trigger
• Samples from Previous Triggers are Erased
• Sample Rate May Limit Scope’s Overall Bandwidth
• Best Resolution Depends Directly on Sample Rate
Each
Trigger
Identical
Page 52
Sampling
Sequential Sampling Technique
• Used ONLY with Repetitive Signals
• One Sample is taken for each Trigger
• Multiple Trigger Events Build Up Waveform
• Used in High Speed Applications with BW >10GHz
• No Pre-Trigger Information
1st Trigger
2nd Trigger
3rd Trigger
Page 53
Jitter Analysis (Equivalent Time Sampling Oscilloscopes)
Pros
InExpensive
Bandwidth is Highest Available
Noise floor is good
TDR options for media analysis
Flexibility for increasing rates
Industry leading jitter separation algorithm (DCA-J)
Cons
External Clock or Clock related trigger is required or
Hardware Clock Recovery Module
Page 54
Jitter Analysis (Equivalent Time Oscilloscopes)
A
Page 55
J TJ = n × J rms
RJ
+ J PP
DJ
A B
Page 56
Jitter Measurements on an equivalent Time
Sampling Oscilloscope, 86100C DCA-J
DDJ PJ
ISI DCD
Uncorrelated:
• Counter hardware focuses samples on edges
• Pattern lock – focus on specific edges
• Analyze jitter uncorrelated to the pattern:
random jitter and periodic jitter (RJ ∗ PJ)
Correlated:
• Pattern lock – average every
edge
• Analyze jitter correlated to the
pattern:
data dependent jitter (DDJ)
Page 59
Correlated TJ Uncorr
DDJ PJ
Average out the uncorrelated jitter using Pattern ISI DCD
Lock
• Isolates data-correlated contributions only
Page 60
Correlated TJ Uncorr
Duty Cycle Distortion (DCD) &
DJ RJ
µF µR
DCD
P-PF
P-PR
DDJ
Page 61
Correlated TJ Uncorr
PJ
Focus on only one edge at a time ISI DCD
• Isolates uncorrelated contributions
Jitter
Time
Early
Page 62
Correlated TJ Uncorr
PJ
ISI DCD
Late
Jitter
Time
Early
FFT time sampled record
• Aliased jitter frequency spectrum
• Shows RJ & PJ – PJ appears as spikes
Page 63
Correlated TJ Uncorr
DDJ PJ
ISI DCD
Page 64
Correlated TJ Uncorr
PJ
DDJ
• DDJ histogram (Data-Correlated)
and RJ, PJ histogram (Data-
Uncorrelated) are measured
directly
• Convolution of these histograms
produces a histogram *
representing the PDF of all of the Aggregate
jitter present – Total Jitter Jitter
histogram
Page 65
Correlated Uncorr
Deterministic Jitter (DJ) and TJ
DJ RJ
Total Jitter (TJ) DDJ PJ
ISI DCD
DJ
Separation (offset) of two Gaussians
corresponding to the match is the
deterministic jitter (DJ)
Page 66
Seeing the Complete Jitter Picture
Page 67
New: N5400A EZJIT Plus Jitter Separation
= DCA-J algorithm on a real-time oscilloscope
Page 68
N5400A EZJIT+ simplifies jitter compliance
Page 69
EZJIT and EZJIT Plus Measurements
• E2681A EZJIT Jitter Analysis • N5400A EZJIT Plus Additions*
• Single-Source • RJ/DJ Separation Components
• Period • Random jitter (RJ)
• Frequency • Deterministic jitter (DJ)
• Positive/Negative pulse width • Data-dependent jitter
• Duty cycle • Inter-symbol interference (ISI)
• Rise/Fall time • Duty cycle distortion (DCD)
• Dual-source • Periodic jitter
• Setup/Hold time • Total jitter at user-selectable bit error rate
• Phase • Display Views
• Clock • RJ/PJ histogram
• Time-interval error (TIE)
• TJ histogram
• Cycle-to-cycle jitter
• DDJ histogram
• N-cycle jitter
• Cycle-cycle positive/negative pulse width • Composite histogram (TJ, DDJ, RJ/PJ)
• Cycle-cycle duty cycle • Jitter spectrum (zoomable)
• Data • DDJ vs. bit (for repeating patterns)
• Time-interval error (TIE) • Bathtub curve (eye-opening vs. BER)
• Data rate
• N5400A and E2681A common display views
• Unit Interval
• Measurement trend
• Histogram
• Jitter spectrum *N5400A includes all features of E2681A
as well as the following
Page 70
Summary
• Jitter is a complex phenomena and understanding and measuring it can be as
well.
• Having a Total Jitter to achieve a desired Bit Error Ratio is the main goal for any
digital interface.
• Jitter Separation is an Enterprise Jitter methodology to deliver an estimate of
Total Jitter quickly.
• There are many methods to separate jitter in our next paper we will see they can
give different results. The results for TJ are often 15-25% in error—almost
always an overestimate of TJ.
• There are many tools that can be used in the testing for jitter. Which ones you
select are dependent on your tasks, future projects, size, and your comfort level.
www.agilent.com/find/jitter Jitter meas. solutions
www.agilent.com/find/jitter_info Jitter app. info.
www.agilent.com/find/si Signal Integrity Solutions
Page 71
Results Agilent Jitter Accuracy Study (Jitterfest 3)
TJ Estimate vs Actual TJ
300
BERT
225
Fast TJ Estimate (ps)
TRUE
DCA-J
DSO81304A/N5400A EZJIT Plus
150
75
0
0 50 100 150 200 250
Actual TJ (ps)
Page 72
AGENDA
1. Jitter:
I. Definition and Description of Jitter
II. Understanding Jitter, its Components, and Separation
III. Jitter Measurement Methods and Tools
Page 73
Actual Jitter Measurements
• 86100D as jitter analyzer
• 81134A as pattern generaror
• Demo 1: measure ISI jitter with bnc cable as “ISI injector”
• Demo 2 : measure uncorrelated Pj and Resolve Pj frequencies
with MXG as uncorrelated Pj source
Page 74
•Questions?
Page 75