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EEE1011-Automated Test Engineering Lab Digital Assignement-2
EEE1011-Automated Test Engineering Lab Digital Assignement-2
Digital Assignement-2
Name: Abhishek Raj
Register Number: 18BEE0342
Slot: L33+L34
Faculty: Prof. Karthikeyan A
Experiment-2
Title: Cluster test of a basic logic gate (NOT) using QE-49 trainer kit
Aim: To perform cluster test on a combinational or sequential circuit (NOT Gate) to check
the functionality of the complete circuit Apparatus Used:
Connections of 7404 IC
Graph
Input Output as shown in the software