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Alfred Mann Foundation for Scientific Research1, Valencia, California, USA 91355
Alfred Mann Institute at the University of Southern California2, Los Angeles, CA, 90089
1. INTRODUCTION
EMG
RT
L Amp.
Tissue
The requirement for implantable neural prosthetic devices
necessitates an integrated circuit implementation of
ISt ICh vEMG
bioelectric stimulators and sense amplifiers. Researchers
working on functional electrical stimulation (FES) of
Iridium electrode
paralyzed limbs are presently interested in sensing
electromyogram (EMG) signals for FES applications such Figure 1: Implantable Device for Stimulation and
as foot-drop correction or hand grasp in tetraplegic EMG Sensing.
patients [1]-[2]. The device itself may be powered by an
inductively rechargeable battery or through constant The power spectrum for the EMG lies primarily between
inductive coupling from an RF field [3]-[4]. Due to the 10 Hz and 3000 Hz with a peak around 100 Hz [6]. The
extremely poor inductive power coupling to the implanted actual magnitude and peak spectral distribution can vary
device, power consumption by the implant electronics as a function of electrode size, spacing and proximity to
becomes restrictive. Figure 1 illustrates the situation the muscle being sensed. For the application of concern,
where the implantable device is powered through the specifications shown in Table 1 were used as a design
inductive coupling via inductor L and uses the electrodes guideline. The detection of signals in the range of 10uV
for both stimulation and EMG sensing. Anodized and at very low frequencies, can pose a problem, given
tantalum is used for one of the electrodes and an iridium the presence of ‘1/f’ noise amidst the other electronic and
electrode is used as the return path. The dual electrodes in biological noise sources. The need to detect very low
combination with the tissue, creates a large valued frequencies from the high source impedance of the muscle
tantalum capacitor (CT) that can be used for charge tissue while still maintaining a dc-block from the
storage [5]. Stimulation is achieved by discharging the stimulation voltage source warrants the need for very
stored voltage present on the inherent electrode-tissue large input impedances. This is further compounded by
capacitance with a controlled current source, ISt through the practical constraints of packaging a high voltage
2. PROPOSED CIRCUIT CONFIGURATION where RG2 is one half of the RG in Figure 2 and gm and ro
V b ia s are the transconductance of Q1 and the overall impedance
at the collector of Q1, respectively.
RB
CMFBC
QB IC IM IC QB
in + o u t+
C in
out+
D
out-
J
RF
RG in+ Q1 QM Q2 in-
RF RF
Vref
RF
C in RG2 RM RG2
in - o u t-
IT
RB
CMFBT
V b ia s
Figure 3: Proposed Amplifier Topology for Increased
Figure 2: Typical Instrumentation Amplifier Topology Input Impedance
As discussed in Section 1, the design specifications High impedance dc biasing of the amplifiers is also
require that the preamplifier have high input impedance, achieved with minimal current draw. This is done by
low power consumption and low noise at low-frequencies. using the diode voltage of QM and the voltage across RM
Typically, high impedance is achieved by using an as a representation of the input common-mode voltage
instrumentation amplifier topology as shown in Figure 2. and feeding this back with amplifier J so that the bias
Such a topology ensures that the input impedance is kept transistors QB produce the appropriate bias current for the
high while allowing for differential input signals. The base current of Q1 and Q2. In the process, the input
closed-loop differential gain, G, of such an amplifier is common mode voltage of the amplifier is set to Vref while
given by: maintaining low input common-mode impedance. The
RF value for RM is determined by noting that the additional
G 1 (2 u
RG
) (1) voltage drop across the RG2 resistors, due to the common-
mode current via the RF resistors, needs to be accounted
For a single supply implementation and a 10 Hz high-pass for by increasing the resistance of RM accordingly.
corner frequency, large valued biasing resistors, RB, and For high-speed applications and better stability,
dc-blocking capacitors, Cin, are required. For example, an the output common-mode voltage is set by a feedback
external 1nF dc-blocking capacitor will require a bias loop that controls IC through control signal CMFBC. In
resistor valued at 16 M:. Integration of such a large situations where large input common-mode voltage
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variations are expected, this can change the desired V 2 noise I CQ 1 QB I CQB Q1 I CQ 1
| RG 2 2 ( 2 q u [ I cQB ])
quiescent point of the input transistors, due to the E f E Q1 u f
undesirable current feedback through RF. This problem M1 g
u ( mM 1 ) 2 2 kT
can be alleviated by output common-mode feedback, WLC ox _ M 1 u f g mQ 1 g mQ1 (3)
using control signal CMFBT to change the tail current IT R 2
4 kT ( rb ( G 2 RG 2 ))
such that the original quiescent points of the input RF
transistors are maintained.
The above topology still maintains a high In equation 3, QB, Q1 , M 1 are process dependent
differential input impedance while using bipolar devices
parameters of QB, Q1 and QM1 respectively. ICQB, ICQ1 are
on the input. This exploits the lower ‘1/f ’ noise traits of a
collector currents of QB and Q1 respectively and rb is the
BJT that are not present if one were to use MOSFET
base spreading resistance of input transistor Q1. Due to the
devices for the input stage. In addition, the low supply
differential nature, the total input referred spectral noise
current constraints make the choice of a bipolar device
density would be twice that shown above.
with its larger gm for a given current (in contrast to a
Analysis of equation 3 indicates that the
MOSFET), more attractive for reducing noise
minimum input referred noise occurs for currents through
contributions from the active load devices, as will be
the input stage that are in the range of hundreds of micro-
shown later. The input referred amplifier noise is a
amps. However, given our constraints for low-power
function of the closed-loop amplifier gain, its gm (and
operation and the noise floor desired, an operating current
hence operating current of the bipolar devices and FETs),
of 2uA for each branch of the input stage was shown to be
the resistors involved and the ‘1/f’ and shot noise
sufficient to meet the required specifications. At such low
components from the various devices.
currents, the ‘1/f’ and shot-noise noise contributions of
Figure 4 illustrates the actual implementation of
devices Q1, Q2, QB1 and QB2 become the most significant
the input stage. Cascode devices MC and QC are used to
contributors of noise in the bandwidth of interest. The
maximize the impedance seen at the input of amplifier D
base spreading resistance, rb, loses its significance as a
thereby increasing the differential input impedance rin as
noise source due to the low currents and hence low gm of
shown in equation 2. The bias transistors QB do not
Q1. The significance of each noise source is shown in
reduce the impedance due to the extremely small value of
equation 3 with the first line being the largest noise source
collector current flowing through them.
and the last line being the least significant noise source.
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For a 3.3V supply, the total power consumption differential input impedance was achieved without using
was measured to be 37PA, which included the power conventional area intensive on-chip resistors. The
consumption of an internal current biasing generator. This resulting high impedance makes it possible in the future to
was higher than predicted by simulation results due to integrate the external dc blocking capacitor, allowing for
variations in the value of the resistor inside the bias further size reduction of the implantable device.
generator. The high-pass frequency corner was measured
to be between 1 and 2 Hz when 1nF external capacitors,
Cin, were used. This indicated that the differential input
impedance was over 80 M:. As a result, it is quite
possible to integrate the external capacitors on chip to
obtain the high-pass cut-off frequency of 10 Hz. This
would reduce the overall dimensions of the implantable
device even further. It should be mentioned that if on-chip
resistors were used to bias the amplifier inputs in a
conventional process, the die area would increase
significantly for the achievable impedance. The input
referred rms noise was measured to be about 9.7PV for a
bandwidth between 10 Hz and 10 kHz. The dominant
noise is the 1/f noise from the input transistors. The 1/f
noise corner is between 500 Hz and 600 Hz. Table 2 Figure 5: Die Photograph of the EMG Amplifier
shows a summary of the preliminary test results.
5. ACKNOWLEDGEMENTS
Table 2: Performance Summary of EMG Amplifier
The authors would like to thank M. Vogel and R. Nelson
Process 0.8Pm BiCMOS for assistance with the die preparation and Dr. Troyk and
Dr. Loeb for the insights provided by them on implantable
Supply voltage 3.3 V device electronics and FES respectively.
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