Munano

Atomic force microscope device

Prepared by
Chemist. Reem fathy abd El-badea
Researcher at Mansoura univ. nanotechnology center
 Nanomaterial characterization
AAS
TEM
Magnetic properties
EDS
Elemental and
Surface,area,size
SEM and shape
mineral
composition
XPS
AFM Characterization
of nanomaterial TGA
RS
Type of TMA
structure
Thermal
FT-IR and bonds in
properties
it
DSC
XAS
Atomic force microscope (AFM)
Atomic force microscope (AFM)
AFM can measure the Z height and thus generate
very high-resolution topographic images of a surface
down to atomic resolution

AFM can be used for 3D information of surface defect

such as scratch , corrosions.
Comparision of AFM with other microscopy techniques
Parameter SEM TEM AFM
Measurement Vacuum Vacuum Air, liguid
environment

Surface height Not possible Not possible possible

Measurement 2D 2D 3D
dimension

cost Expensive Expensive cheap

usage Skilled operator Skilled operator Easy to easy
required required
Measurement Fast Fast Slow
speed
Basic components of AFM
1- Cantilever
ranges from 100 to 200 µm in length, 100 to 40 µm
in width and 0.3 to 2µm in thickness. It Made from silicon
Or silicon nitride and It has a sharp Tip (probe)on
its edge.

2- Laser diode, a photodetector

which as a scanner, and a sample
stage capable of moving in X,Y,Z directions
Principle of AFM technique
.The AFM probe interacts with the substrate through scanning
motion. The up/down and side to side motion of the AFM tip as
it scans along the surface is monitored through a laser beam is
tracked by a position sensitive photo-detector (PSPD) that picks
up the vertical and lateral motion of the probe and converted it
to data .
Working modes of AFM
There are 3 modes
1-contact
2- NON contact
3-Tapping

LOOK

contact mode uses for solid and hard samples but non contact and
tapping modes use for soft ,biology , powder samples
Applications of AFM for material characterization
1-Imaging
-Identify surface topography (3D)
- Roughness
-phase change
2-spectroscopy
-Measure stiffness and hardness
-Measure electrical and thermal conductivity
3-Nanolithography
Noise of the AFM
Air flow(air condition) , talking ,light 50Hz,….. etc.
We can solve it by isostage and put AFM in the dark box to prevent the
sound and light.
Thank you