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CHAPTER 1
INTRODUCTION
1.1 Introduction
SEM provides detailed high resolution images of the sample by rastering a focussed electron
beam across the surface and detecting secondary or backscattered electron signal. An Energy
Dispersive X-Ray Analyzer (EDX or EDA) is also used to provide elemental identification
and quantitative compositional information.
Typical Applications
1. Aerospace
2. Automotive
3. Materials
4. Minerals
5. Glass, Ceramics and Refractories
6. Healthcare
7. Medical Devices
8. Semiconductors
9. Electronics.
CHAPTER2
LITERATURE REVIEW
Most of the metallic materials functioning at high temperature need to have
oxidation resistance. This resistance can be achieved when the chosen materials develop
through oxidation, an oxide film which acts as a diffusion barrier while keeping a good
adherence. Several studies have shown that the oxide layers as SiO2, Cr2O3, and α-Al2O3
provide a satisfactory protective role, a protection based on the formation of a layer of α-
Al2O3. Al2O3 is the most powerful principle. In this prospect, α-Al2O3 is a very good
candidate. Before reaching the most stable Al2O3 [1].
The techniques which allow us to detect and characterize transition Al2O3 formed as
thin layers (1 to 3 μm) are scarce and provide ambiguous answers. Indeed, the most common
technique, the XRD, provides patterns for various Al2O3 which are relatively close to each
other. Moreover, it seems that, in many cases, several transition phases can be simultaneously
present [3].
In previous studies, transmission electron microscopy (TEM) was used to probe the
oxidation of either an intermetallic alloy, Fe3Al, or an ODS (oxide dispersion strengthening)
FeCrAl alloy strengthened by very small Y2O3 particles, PM2000 [4].
The formation of transition Al2O3 for various heat treatment conditions was
evidenced and the transition to the α-Al2O3 was studied. The formed oxide scales were
characterized using analysis techniques such as scanning electron microscope (SEM), energy-
dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), Fourier transform infrared
spectroscopy (FTIR), and X-ray photoelectron spectroscopy (XPS). The present study aims at
examining whether FTIR and XPS analysis may provide a simple probe to various structural
varieties of Al2O3 for applications of high temperature materials [5].
CHAPTER3
Pure alluminium
oxides
Unwanted particles
The sem machine scans in less than 50 microns of a alluminium oxide particles in a
analysis of the detailed configurations of particular sized particles as shown in the above
image . the sem image shows number of percentage cantains pure aluminum particles present
in the tatol material of the unwanted materials like dust, oxidation particles and other
compound materials found in the testing materials as present in the figure 3.1.
The sem machine scans in less than 50 microns of a alluminium oxide particles in
a analysis of the detailed configurations of particular sized particles as shown in the above
image . the sem image shows number of percentage cantains pure aluminum particles present
in the tatol material of the unwanted materials like dust, oxidation particles and other
compound materials found in the testing materials as present in the figure 3.2.
The sem machine scans in less than 50 microns of a alluminium oxide particles in a
analysis of the detailed configurations of particular sized particles as shown in the above
image . the sem image shows number of percentage cantains pure aluminum particles present
in the tatol material of the unwanted materials like dust, oxidation particles and other
compound materials found in the testing materials as present in the figure 3.3.
The sem machine scans in less than 50 microns of a alluminium oxide particles in a
analysis of the detailed configurations of particular sized particles as shown in the above
image . the sem image shows number of percentage cantains pure aluminum particles present
in the tatol material of the unwanted materials like dust, oxidation particles and other
compound materials found in the testing materials as present in the figure 3.4.
The sem machine scans in less than 50 microns of a alluminium oxide particles in
a analysis of the detailed configurations of particular sized particles as shown in the above
image . the sem image shows number of percentage cantains pure aluminum particles present
in the tatol material of the unwanted materials like dust, oxidation particles and other
compound materials found in the testing materials as present in the figure 3.5.
The sem machine scans in less than 50 microns of a alluminium oxide particles in a
analysis of the detailed configurations of particular sized particles as shown in the above
image . the sem image shows number of percentage cantains pure aluminum particles present
in the tatol material of the unwanted materials like dust, oxidation particles and other
compound materials found in the testing materials as present in the figure 3.6.
The sem machine scans in less than 50 microns of a alluminium oxide particles in a
analysis of the detailed configurations of particular sized particles as shown in the above
image . the sem image shows number of percentage cantains pure aluminum particles present
in the tatol material of the unwanted materials like dust, oxidation particles and other
compound materials found in the testing materials as present in the figure 3.7.
The figure 3.8 and graphs are shows the percentage of carbon,oxygen and pure
alluminium present at raw material of alluminium oxide.
EDX AND SEM provides detailed high resolution images of the sample by rastering
a focussed electron beam across the surface and detecting secondary or backscattered electron
signal. An Energy Dispersive X-Ray Analyzer (EDX or EDA) is also used to provide
elemental identification and quantitative compositional information.
The above graph shows the plot the graph x-axis and y-axis in x-axis the current in
volts and y-axis log scale and mid point is base line of the graph. So that in the graph the
percentage of carbon,oxidation and pure alluminium oxide present it. It is clearly shows the
three elements of metals are present in the different ratios of percentages indiacates the as
shown in the graph.
Atom %
C-K O-K Al-K
Base(342)(94)_pt1 1.39 51.96 46.65
Base(342)(94)_pt2 39.25 60.75
Base(342)(94)_pt3 27.43 72.57
CONCLUSIONS
The aim of this work was to determine whether IR spectroscopy and XPS could allow us to
easily distinguish the different structural varieties of Al2O3 and therefore be used as a rapid
diagnostics to evidence the phases present in the protective layers of high temperature
materials. It was thus possible to determine the FTIR spectra of Al2O3 phases and the XPS
analysis at different temperatures of oxidation and to evidence a continuous evolution leading
to the simultaneous presence of several Al2O3 phases. These results have allowed us to
determine some characteristic IR and XPS peaks, that is, signatures, for the various transition
Al2O3 phases and α-Al2O3. Using these IR and XPS signatures, it is possible to detect the
presence of transition Al2O3 naturally grown on Al2O3-former alloys. A detailed example is
presented for the oxidation of PM2000 ODS alloy. Indeed, many high temperature metallic
materials develop Al2O3 scales that can act as protective layer against an aggressive
environment. In the first stage, mixed Fe, Cr oxides, and transition Al2O3 appear; afterwards
Al2O3 oxides become gradually the majority as the oxidation temperature increases before
transformation into the most stable α-Al2O3 structure. Although the physical properties of the
transition Al2O3 differ, their identification is not straightforward.
FUTURE SCOPE
We want to mention that the measurements such as high temperature dc magnetization and
mossbaucer spectroscopy will provide us information about magnetic ordering in these
materials near and above the neel temperature. The dielectric and magnetic properties of Al
doped Ni-Cd ferrite nanoparticles suggest that these materials are very good for the
manufacturing of multi layer inducator chips (MLICS),high density data storage devices.The
important size dependent superparamagnetic properties of Ni0.2,Cd0.3,Fe2.5-xAlxO4
nanoparticles unambiguously make Ni0.2,Cd0.3,Fe2.5-xAlxO4 as promising candidates for
various practical applications such as MRI contrast enhancement agents ,magnetic probes for
biomolecules and magnetically guided drug delivery.
REFERENCES
[1]. R. Molins and A. M. Huntz, “Recent improvements in the understanding of alumina film
formation and durability,” Materials Science Forum, 461–464, 29–36, 2004.
[2]. S. Chevalier, R. Molins, O. Heintz, and J. P. Larpin, “Which tool to distinguish transient
alumina from alpha alumina in thermally grown alumina scales?” Materials at High
Temperatures, 22, 527–534, 2005.
[4]. A. M. Huntz, P. Y. Hou, and R. Molins, “Study by deflection of the oxygen pressure
influence on the phase transformation in Al2O3 thin films formed by oxidation of Fe3Al,”
Materials Science and Engineering A,467, 59–70, 2007.
[5]. L. Maréchal, B. Lesage, A. M. Huntz, and R. Molins, “Oxidation behavior of ODS Fe-
Cr-Al alloys: aluminum depletion and lifetime,” Oxidation of Metals, 60, 1–28, 2003.
[7]. A. H. Heuer, T. Nakagawa, M. Z. Azar et al., “On the growth of Al2O3 scales,” Acta
Materialia, 61, 6670–6683, 2013.