IS 15262:2002

ISO 4287:1997

Indian Standard
GEOMETRICAL PRODUCT SPECIFICATIONS
(GPs)– SURFACE TEXTURE: PROFILE
METHOD — TERMS, DEFINITIONS AND
SURFACE TEXTURE PARAMETERS

ICS 01 .040.17; 040.20

@ BIS 2002

BUREAU OF INDIAN STANDARDS

MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG
NEW DELHI 110002

December 2002 Price Group 7

Engineering Metrology Sectional Committee, BP 25

NATIONAL FOREWORD

This Indian Standard which is identical with ISO 4287 : 1997 ‘Geometrical Product Specifications
( GPS ) — Surface texture : Profile method — Terms, definitions and surface texture parameters’
issued by the International Organization for Standardization ( ISO ) was adopted by the Bureau of
Indian Standards on the recommendation of the Engineering Metrology Sectional Committee and approval
of the Basic and Production Engineering Division Council.

The text of ISO Standard has been approved as suitable for publication as an Indian Standard without
deviations. In the adopted standard, certain conventions are, however, not identical to those used in
Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear referring to this standard, they should be
read as ‘Indian Standard’.

b) Comma ( , ) has been used as a decimal marker while in Indian Standards, the current practice
is to use a point ( . ) as the decimal marker.

Technical Corrigendum 1 to the above International Standard has been incorporated,

In this adopted standard, reference appears to certain International Standards for which Indian Standards
also exist. The corresponding Indian Standards which are to be substituted in their place are listed
below along with their degree of equivalence for the editions indicated:

International Standard Corresponding Indian Standard Degree of Equivalence

ISO 3274:1996 Geometrical Product IS 15261 :2002 Geometrical Product Identical

Specifications ( GPS ) — Surface Specifications ( GPS ) — Surface
texture : Profile method — Nominal texture : Profile method — Nominal
characteristics of contact ( stylus ) characteristics of contact ( stylus )
instruments instruments

ISO 4288:1996 Geometrical Product IS 15263:2002 Geometrical Product do

Specifications ( GPS ) — Surface Specifications ( GPS ) — Surface
texture : Profile method — Rules texture : Profile method — Rules
and procedures for the assessment and procedures for the assessment
of surface texture of surface texture

The concerned Technical Committee has reviewed the provisions of the following International Standards
referred in this adopted standard and has decided that they are acceptable for use in conduction with
this standard:

International Standard Title

ISO 11562:1996 Geometrical Product Specifications ( GPS ) — Surface texture : Profile

method — Metrological characterization of phase correct filters

Addifiona/ /nforrnation — This standard is the national adoption of ISO 4287:1997, as such only the
English text has been reproduced. If the French text is required, reference should be made to the
original ISO publication.

For the purpose of deciding whether a particular requirement of this standard is complied with, the final
value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in
accordance with IS 2:1960 ‘Rules for rounding off numerical values ( revised)’. The number of significant
places retained in the rounded off values should be the same as that of the specified value in this
standard.
 IS 15262:2002
ISO 4287:1997

Indian Standard
GEOMETRICAL PRODUCT SPECIFICATIONS
(GPS)– SURFACE TEXTURE: PROFILE
METHOD — TERMS, DEFINITIONS AND
SURFACE TEXTURE PARAMETERS
1 Scope method — Metrological characterization of phase
correct filters.
This International Standard specifies terms,
definitions and parameters for the determination 3 Terms and definitions
of surface texture ( roughness, waviness and
3.1 General terms
primary profile ) by profiling methods.
3.1.1
2 Normative references profile filter
filter which separates profiles into longwave and
This following standards contain provisions which, shortwave components [ ISO 11562 ]
through reference in this text, constitute provisions
of this International Standard. At the time of NOTE —There are three filters used in instruments
publication, the editions indicated were valid. All for measuring roughness, waviness and primary
standards are subject to revision, and parties to profiles (see figure 1), They all have the same
transmission characteristics, defined in ISO 11562,
agreements based on this International Standard
but different cut-off wavelengths.
are encouraged to investigate the possibility of
applying the most recent editions of the standards 3.1.1.1
indicated below. Members of IEC and ISO k profile filter
maintain registers of currently valid International filter which defines the intersection between the
Standards. roughness and the even shorter wave components
present in a surface ( see figure 1 )
ISO 3274 : 1996, Geometrical Product
Specifications ( GPS ) — Surface texture: Profile 3.1.1.2
method — Nomina/ characteristics of contact kc profile filter
( sty/us) instruments. filter which defines the intersection between
the roughness and waviness components
ISO 4288 : 1996, Geometrical Product ( see figure 1 )
Specifications ( GPS ) — Surface texture: Profile
method — Ru/es and procedures for the 3.1.1.3
assessment of surface texture. If profile filter
filter which defines the intersection between the
ISO 11562 : 1996, Geometrical Product waviness and the even longer wave components
Specifications ( GPS ) — Surface texture: Profile present in a surface ( see figure 1 )

As Ac Af
Wavelength

Figure 1 —Transmission characteristic of roughness and waviness profiles

1
IS 15262:2002
ISO 4287:1997

3.1.2 3.1.5
coordinate system primary profile
that coordinate system in which surface texture See ISO 3274.
parameters are defined
NOTE —The primary profile is the basis for evaluation
NOTE — It is usual to use a rectangular coordinate
of the primary profile parameters.
system in which the axes form a right-handed
Cartesian set, the X-axis being the direction of tracing
colinear with the mean line, the Y-axis also nominally 3.1.6
lying on the real surface, and the Z-axis being in an roughness profile
outward direction (from the material to the surrounding profile derived from the primary profile by
medium ). This convention is adopted throughout the suppressing the longwave component using the
rest of this International Standard, profile filter Ac; this profile is intentionally modified
3.1.3
real surface See figure 1.
surface limiting the body and separating it from
the surrounding medium NOTES

3.1.4 1 The transmission band for roughness profiles

surface profile is defined by the k and kc profile filters ( see
profile that results from the intersection of the ISO 11562 :1996,2.6 and 3.2).
real surface by a specified plane
2 The roughness profile is the basis for evaluation
See figure 2, of the roughness profile parameters.
NOTE — In practice, it is usual to choose a plane
with a normal that nominally lies parallel to the real 3 The default relationship between kc and k is given
surface and in a suitable direction. in ISO 3274: 1996, 4.4.

k
Y

—.—.
—-—-
.- ._. J

Figure 2 — Surface profile

2
 IS 15262:2002
ISO 4287:1997

3.1.7 3.1.10
waviness profile evaluation length
profile derived by subsequent application of the in
profile filter Af and the profile filter kc to the primary length in the direction of the X-axis used for
profile, suppressing the longwave component assessing the profile under evaluation
using the profile filter kf, and suppressing the
shortwave component using the profile filter xc; NOTES
this profile is intentionally modified
1 The evaluation length may contain one or more
sampling lengths.
NOTES
2 For default evaluation lengths, see ISO 4288:1996,
1 The nominal form should first be removed from 4.4. ISO 4288 does not give default evaluation length
the total profile by best-fit least-squares methods, for W-parameters.
before applying the Af profile filter for separating the
waviness profile. For circular nominal form, it is
3.2 Geometrical parameter terms
recommended that the radius should also be included
in the least-squares optimization and not held fixed
3.2.1
to the nominal value. This procedure for separating
P-parameter
the waviness profile defines the ideal waviness
operator. parameter calculated from the primary profile

2 The transmission for waviness profiles

band 3.2.2
is defined by the kc and Lf profile filters (see R-parameter
ISO 11562:1996, 2.6 and 3.2 ). parameter calculated from the roughness profile

3 The waviness profile is the basis for evaluation of 3.2.3

the waviness profile parameters. W-parameter
parameter calculated from the waviness profile
3.1.8 Mean lines
NOTE — The parameters defined in clause 4 can
3.1.8.1 be calculated from any profile. The first capital letter
mean line for the roughness profile in the parameter symbol designates the type of the
line corresponding to the longwave profile profile evaluated. For example, Ra is calculated from
component suppressed by the profile filter kc the roughness profile and Pt is calculated from the
primary profile.
( See ISO 11562:1996, 3.2)
3.2.4
3.1.8.2 profile peak
mean line for the waviness profile an outwardly directed ( from material to surrounding
line corresponding to the longwave profile medium ) portion of the assessed profile connecting
component suppressed by the profile filter Af two adjacents points of the intersection of the
profile with the X-axis
( See ISO 11562:1996, 3.2)
3.2.5
3.1.8.3 profile valley
mean line for the primary profile an inwardly directed ( from surrounding medium
line determined by fitting a least-squares line of to material ) portion of the assessed profile
nominal form through the primary profile connecting two adjacent points of the intersection
of the assessed profile with the X-axis
3.1.9
sampling length 3.2.6
lp, lr, lw height and/or spacing discrimination
length in the direction of the X-axis used for minimum height and minimum spacing of profile
identifying the irregularities characterizing the peaks and profile valleys of the assessed profile
profile under evaluation which should be taken into account

NOTE — The sampling length for the roughness lr
and waviness profiles ho is numerically equal to the
characteristic wavelength of the profile filters kc and
Lf, respectively. The sampling length for primary profile,
/p, is equal to the evaluation length.
NOTE — The minimum height of the profile peaks
and valleys are usually specified as a percentage
of Pz, Rz, Wz or another amplitude parameter, and
the minimum spacing as a percentage of the sampling
length.

3
IS 15262:2002
ISO 4287:1997

3.2.7 slope of the assessed profile at a position x,

profile element
profile peak and the adjacent profile valley See figure 4.

See figure 3. NOTES

NOTE — The positive or negative portion of the 1 The numerical value of the local slope, and thus
assessed profile at the beginning or end of the the parameters PAq, RAq and WAq, depends critically
sampling length should always be considered as a on the ordinate spacing AX.
profile peak or as a profile valley. When determining
a number of profile elements over several successive 2 A formula for estimating the local slope is
sampling lengths, the peaks and valleys of the
assessed profile at the beginning or end of each dz.
_J
=L (Z,+~– 9z,+z+ 45z,+1 – 45z,_1 + 9z,_* - Z,_~)
sampling length are taken into account once only at CLx 60AX
the beginning of each sampling length.
The above formula should be used for the sample
3.2.8 spacing stipulated in ISO 3274 for the filter used, where
ordinate value z, is the height of the ith profile point and AA’ is the
z(x) spacing between adjacent profile points.
height of the assessed profile at any position x
3.2,10
NOTE — The height is regarded as negative if the profile peak height
ordinate lies below the X-axis, and positive otherwise.
Zp
3.2.9 distance between the X-axis and the highest point ,
local slope of the profile peak
dz
See figure 3.
cl%’

line

Figure 3 — Profile element

Figure 4 — Local slope

4
 IS 15262:2002
ISO 4287:1997

3.2.11 3.2.14
profile valley depth material length of profile at the level c
Zv Ml(c)
distance between the X-axis and the lowest point sum of the section lengths obtained, intersecting
of the profile valley with the profile element by a line parallal to the
X-axis at a given level, c
See figure 3.

3.2.12 See figure 5.

profile element height
Zt 4 Surface profile parameter definitions
sum of the height of the peak and depth of the
valley of the profile element 4.1 Amplitude parameters ( peak and valley)
See figure 3.
4.1.1
3.2.13 maximum profile peak height
profile element width Pp, Rp, Wp
Xs largest profile peak height Zp within a sampling
length of the X-axis segment intersecting with length
the profile element

See figure 3. See figure 6.

Ml,

r
- x

Sampling length

M (c] = M(l . M(2

Figure 5 — Material length

Sampling [ength
-i

Figure 6 — Maximum profile peak height ( example of a roughness profile )

5
IS 15262:2002
ISO 4287:1997

4.1.2 when using existing technical documents and

maximum profile valley depth drawings because differences between results
Pv, Rv, WV obtained with different types of instruments are not
always negligibly small.
largest profile valley depth Zv within a sampling
length 4.1.4
See figure 7. mean height of profile elements
Pc>Rc, Wc
4.1.3 mean value of the profile element heights Zt within
maximum height of profile a sampling length
Pz, Rz, Wz
sum of height of the largest profile peak height Pc, Rc, We = ~ f Zt,
Zp and the largest profile valley depth Zv within m izl
a sampling length
See figure 9.
See figure 8.
NOTE — The parameters Pc, Rc, WC require height
NOTE — In ISO 4287-1 : 1984, the Rz symbol was and spacing discrimination. It not otherwise specified,
used to indicate the “ten point height of irregularities”. the default height discrimination shall be 10% of Pz,
In some countries there are surface roughness F/z, Wz respectively, and the default spacing
measuring instruments in use which measure the discrimination shall be 1% of the sampling length.
former Rz parameter. Therefore, care must be taken Both conditions shall be met.

Figure 7 — Maximum profile valley depth ( example of a roughness profile )

Iv
L— —L

I
—.
Samp(ing length
. ..- ———-— —.— ——— .

Figure 8 — Maximum height of profile ( example of a roughness profile )

6
 IS 15262:2002
ISO 4287:1997

,
SampUng length

Figure 9 — Height of profile elements ( example of a roughness profile)

4.1.5 root mean square value of the ordinate values

total height of profile Z(X) within a sampling length
A
Pt,Rt, Wf
sum of the height of the largest profile peak height
Zp and the largest profile valley depth ZV within
Pq, Rq, Wq =
~J-+: @’(X) dx

the evaluation length with 1 = lp, h- or lW according to the case.

NOTES 4.2.3
1 Since Pt, Rt and Wt are defined over the evaluation skewness of the assessed profile
length rather than the sampling length, the following Psk, Rsk, Wsk
will always be true for any profile. quotient of the mean cube value of the ordinate
pt > p=; Rt > Rz; Wt > Wz
values Z(x) and the cube of Pq, Rq or Wq
respectively, within a sampling length
2 In the default case Pz is equal to Pt. In this case
the use of Pt is recommended. Rsk= +[+ ~zs(x)dx]
4.2 Amplitude parameters ( average of
ordinates ) NOTES

1 The above equation defines Rsk; Psk and Wsk are

4.2.1 defined in a similar manner.
arithmetical mean deviation of the assessed
profile 2 Psk, Rsk and Wsk are measures of the asymmetry
of the probability density function of the ordinate
Pa, Ra, Wa
values.
arithmetic mean of the absolute ordinate values
Z(X) within a sampling length 3 These parameters are strongly influenced by
isolated peaks or isolated valleys.

Pa, Ra, Wa=+jlZ(.)l& 4.2.4

o kurtosis of the assessed profile
Pku, Rku, Wku
with 1 = lp, lr or lW according to the case. quotient of the mean quartic value of the ordinate
values Z(X) and the fourth power of Pq, Rq or Wq
4.2.2 respectively, within a sampling length
root mean square deviation of the assessed
profile
Pq, Rq, Wq

7
IS 15262:2002
ISO 4287:1997
NOTES root mean square value of the ordinate slopes
dZ/dX, within the sampling length
1 The above equation defines Rku; Pku and Wku are
defined in asimiiar manner.
4,5 Curves and related parameters
2 Pku, Rku and Wku are measures of the sharpness
of the probability density function of the ordinate
NOTE — All curves and related parameters are
values.
defined over the evaluation length rather than the
3 These parameters are strongly influenced by sampling length, as this provides more stable curves
isolated peaks or isolated valleys. and related parameters.

4.3 Spacing parameters

4.5.1
4.3.1 material ratio of the profile
mean width of the profile elements Pmr(c), Rmr(c), Wmr(c)
PSm, RSm, WSm ratio of the material length of the profile elements
mean value of the profile element widths Xs within 141(c) at a given level c to the evaluation length
a sampling length
m Ml(c)
Pmr(c), Rmr(c), Wmr(c) = —
PSm, RSm, WSm = ~ ~ xS, In
m ,=1

See figure 10. 4.5.2

material ratio curve of the profile
NOTE — The parameters PSm, RSm, WSm require
( Abbott Firestone curve)
height and spacing discrimination. If not otherwise
specified, the default height discrimination shall be curve representing the material ratio of the profile
10% of Pz, I&, WZ respectively, and the default spacing as a function of level
discrimination shall be 1% of the sampling length.
Both conditions shall be met. See figure 11.
4.4 Hybrid parameters
NOTE —This curve can be interpreted as the sample
4.4.1 cumulative probabilityfunction of the ordinate values
root mean square slope of the assessed profile Z(x), within an evaluation length.
PAq, RAq, WAq

Sampling length

Figure 10 — Width of profile elements

8
 IS 15262:2002
ISO 4287:1997
f-lean line

\ ‘1

L Evaluation Length

--------d 020’0 ’0’”’”%

Figure 11 — Material ratio curve

4.5.3 4.5.4
profile section height difference relative material ratio
P&c, R&, W6C, Pm~ Rm~ Wmr
vertical distance between two section levels of meterial ratio determined at a profile section level
given material ratio R&, related to a reference CO

Pmr, Rmr, Wmr = Pmr, Rmr, Wmr (Cl)

where
Rdc =“C(Rmrl ) - C (Rmr2); (Rmrl c Rmr2)
Cl = CO – R& ( or PI% or W6C )

CO = C ( PmrOj RmrO, WmrO )

NOTE — The above equation defines R6c; P6c and
JJ’& are defined in a similar manner. See figure 12.

o 10 20 3(J 413 50 .50 70 so 90 100

RmrO Rrnr

Figure 12 — Profile section level separation

9
IS 15262:2002
ISO 4287:1997

4.5.5 See figure 13.

profile height amplitude curve

—
sample probability density function of the ordinate NOTE — For profile height amplitude curve parameters,
Z(X) within the evaluation length see 4.2.

Mean Line
\
\ ———.
I
l.: 1
441’

I
Evacuation iength
I
P—
—
.— Amplitude density

Figure 13 — Profile height amplitude distribution curve

10
 IS 15262:2002
ISO 4287:1997

Annex A
(normative)
Text equivalents
In order to facilitate alphanumeric notation by means of computers, the following text equivalents
are recommended :

Parameter Text equivalent

PAq Pdq
RAq Rdq
wAq Wdq

I P& I Pdc I
I R& I Rdc I
w& Wdc

as Ls

I Ac I Lc I

I af Lf

11
IS 15262:2002
ISO 4287:1997

Annex B
(informative)
Flowchart for surface assessment

_li_.l-

E
Roughness
algorithm profi(e Pecordlng

0
Primary profi~e

I AC

I
I
Characteristic

Parameters of
roughness. waviness
and primary profiles
function:

At

algorithm

I
T I

Figure B.1

12
 IS 15262:2002
ISO 4287:1997

Annex C
(Informative)
Comparison of basic terms and parameter symbols between
ISO 4287-1:1984 and ISO 4287:1997
Table C.1 — Basic terms

Clause in 1997 Basic terms, 1997 edition 1984 edition

/ edition “’-’7
1 I

3.1.9 Sampling length 1 [p, lw, h-’)

3.1.10 Evaluation length I [n I In I

3.2.8 Ordinate value I Y I z(x) I

3.2.9 Local slope — &
z
3.2.10 Profile peak height Y. Zp
3.2.11 Profile valley depth I Y. Zv I
3.2.12 Profile element height I — I Zt I
3.2.13 Profile element width I — I Xs I
3.2.14 Material length of profile at the level c Vp Ml(c)

1) The sampli lengths for the three different profiles are named : lp ( primary profile ), /w
( waviness proi ), lr ( roughness profile).
IS 15262:2002 .
ISO 4287:1997

Table C.2 — Parameters of surface texture

Clause in Parameters, 1997 edition 1984 I 1997 I Determined within

1997 edition !dition edition evaluation
~
in
4.1.1
I Maximum profile height RP
,
Rpp)
, ,
x

4.1.2
I Maximum profile valley depth %
R+’) x

4.1.3 I Maximum height of the profile Ry

I R#)I I x

4.1.4 I Mean height of the profile R,

I RC2)
I I x

4.1.5 I Total height of the profile — R@ x

4.2.1 Arithmetical mean deviation of the R, Rap) x

assessed profile

4.2.2 Root mean square deviation of the Rq Rqz) x

assessed profile

4.2.3 Skewness of the assessed ~rofile Sk Rsk2) x

4.2.4 Kurtosis of the assessed profile lx

4.3.1 Mean width of the profile elements Sm RSm2~ x

4.4.1 Root mean square slope of the Aq RA@ x

assessed profile

4.5.1 I Material ratio of the profile Rmr(c)z) x

4.5.3 Profile section height difference — R&#) x

4.5.4 Relative material ratio tp Rmr2~ x

— Ten point height ( deleted as an R, —
ISO parameter)

1) This sampling length is h, lW and lp for R-, W- and P- parameters respectively; lp is equal to fn.

2) Parameters which are defined for three profiles: primary profiles, waviness profile and roughness
profiles. Only the roughness profile parameter is indicated in the table. As an example, the three
parameters are written Pa (primary profile), JVu(waviness profile) and Ra (roughness profile). I

14
 IS 15262:2002
ISO 4287:1997

Annex D
(informative)
Relationship to the GPS matrix model
For full details about the GPS matrix model, see D.2 Position in the GPS matrix model
lSO/TR 14638.
This International Standard is a general GPS
D.1 Information about this International standard that influences chain link 2 of the chains
of standards on roughness profile, waviness profile
Standard and its use
and primary profile in the general GPS matrix,
ISO 4287 is a major rewrite and reorganization as graphically illustrated in figure D.1.
of ISO 4287-1 : 1984 that, together with D.3 Related International Standards
ISO 11562 and ISO 3274, additionally defines
the waviness profile, the primary profile and their The related International Standards are those of
parameters in a consistent manner, the chains of standards indicated in figure D.1.
I
Global GPS standards

Fundamental General GPS matrix

Chain link number 1 2 3 4 5 6
GPS
Size
standards Distance
Radius
Angle
Form of line independent of datum
Form of line dependent on datum
Form of surface independent of datum
Form of surface dependent on datum
Orientation
Location
Circular run-out
Total run-out
Datums
Roughness profile
Waviness profile
Primary profile
Surface imperfections
Edges

Figure D.1

Annex E
(informative)
Bibliography
[1] lSO/TR 14638:1995, Geornetrica/ Product [2] VIM :1993, /ntemationa/ vocabdary of basic
Specification (GPS) — Masterplan. arid genera/ terms in rnetro/ogy. 61PM, IEC,
IFCC, ISO, IUPAC, IUPAP, OIML.
15
Bureau of Indian Standards

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Review of Indian Standards

Amendments are issued to standards as the need arises on the basis of comments. Standards are also reviewed
periodically; a standard along with amendments is reaffirmed when such review indicates that no changes are
needed; if the review indicates that changes are needed, it is taken up for revision. Users of Indian Standards
should ascertain that they are in possession of the latest amendments or edition by referring to the latest issue
of ‘BIS Catalogue’ and ‘Standards : Monthly Additions’.

This Indian Standard has been developed from Doc : No. Bp 25 ( O1O4)

Amendments Issued Since Publication

Amend No. Date of Issue Text Affected

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