Professional Documents
Culture Documents
Irg4Ph40Kd: Insulated Gate Bipolar Transistor With Ultrafast Soft Recovery Diode Short Circuit Rated Ultrafast Igbt
Irg4Ph40Kd: Insulated Gate Bipolar Transistor With Ultrafast Soft Recovery Diode Short Circuit Rated Ultrafast Igbt
IRG4PH40KD
INSULATED GATE BIPOLAR TRANSISTOR WITH Short Circuit Rated
ULTRAFAST SOFT RECOVERY DIODE UltraFast IGBT
C
Features
• High short circuit rating optimized for motor control, VCES = 1200V
tsc =10µs, VCC = 720V , TJ = 125°C,
VGE = 15V
VCE(on) typ. = 2.74V
• Combines low conduction losses with high G
switching speed
• Tighter parameter distribution and higher efficiency @VGE = 15V, IC = 15A
E
than previous generations
• IGBT co-packaged with HEXFREDTM ultrafast, n-ch an nel
ultrasoft recovery antiparallel diodes
Benefits
• Latest generation 4 IGBT's offer highest power density
motor controls possible
• HEXFREDTM diodes optimized for performance with IGBTs.
Minimized recovery characteristics reduce noise, EMI and
switching losses
• This part replaces the IRGPH40KD2 and IRGPH40MD2
products
• For hints see design tip 97003 TO-247AC
Absolute Maximum Ratings
Parameter Max. Units
VCES Collector-to-Emitter Voltage 1200 V
IC @ TC = 25°C Continuous Collector Current 30
IC @ TC = 100°C Continuous Collector Current 15
ICM Pulsed Collector Current Q 60 A
ILM Clamped Inductive Load Current R 60
IF @ TC = 100°C Diode Continuous Forward Current 8.0
IFM Diode Maximum Forward Current 130
tsc Short Circuit Withstand Time 10 µs
VGE Gate-to-Emitter Voltage ± 20 V
PD @ TC = 25°C Maximum Power Dissipation 160
W
PD @ TC = 100°C Maximum Power Dissipation 65
TJ Operating Junction and -55 to +150
TSTG Storage Temperature Range °C
Soldering Temperature, for 10 sec. 300 (0.063 in. (1.6mm) from case)
Mounting Torque, 6-32 or M3 Screw. 10 lbf•in (1.1 N•m)
Thermal Resistance
Parameter Min. Typ. Max. Units
RθJC Junction-to-Case - IGBT ––– ––– 0.77
RθJC Junction-to-Case - Diode ––– ––– 1.7 °C/W
RθCS Case-to-Sink, flat, greased surface ––– 0.24 –––
RθJA Junction-to-Ambient, typical socket mount ––– ––– 40
Wt Weight ––– 6 (0.21) ––– g (oz)
www.irf.com 1
2/7/2000
2 www.irf.com
15
S q u a re w a v e :
6 0% of rate d
volta ge
10
I
5 Id e a l d io d e s
0
0.1 1 10 100
f, Frequency (KHz)
100 100
I C , Collector-to-Emitter Current (A)
I C , Collector-to-Emitter Current (A)
TJ = 150 °C
TJ = 150 °C
10 10
TJ = 25 °C
TJ = 25 ° C
1
V GE = 15V
20µs PULSE WIDTH
1
V = 50V
CC
5µs PULSE WIDTH
1 10 4 6 8 10 12 14
VCE , Collector-to-Emitter Voltage (V) VGE , Gate-to-Emitter Voltage (V)
www.irf.com 3
30 4.0
V GE = 15V
80 us PULSE WIDTH
25
3.5
I C = 30 A
20
15 3.0
I C = 15 A
10
2.5
5
I C = 7.5 A
0 2.0
25 50 75 100 125 150 -60 -40 -20 0 20 40 60 80 100 120 140 160
TC , Case Temperature ( °C) TJ , Junction Temperature ( ° C)
Fig. 4 - Maximum Collector Current vs. Case Fig. 5 - Typical Collector-to-Emitter Voltage
Temperature vs. Junction Temperature
1
Thermal Response (Z thJC )
D = 0.50
0.20
0.1 0.10
P DM
0.05
t1
0.02
SINGLE PULSE t2
0.01 (THERMAL RESPONSE)
Notes:
1. Duty factor D = t 1 / t 2
2. Peak TJ = PDM x Z thJC + TC
0.01
0.00001 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)
4 www.irf.com
2500
20
VGE = 0V, f = 1MHz VCC = 400V
Cies = Cge + Cgc , Cce SHORTED
I C = 15A
Cres = Cgc
Cies
1500 12
1000 8
500 4
Coes
Cres
0 0
1 10 100 0 20 40 60 80 100
VCE , Collector-to-Emitter Voltage (V) QG , Total Gate Charge (nC)
3.0 100
800V
V CC = 480V RG = 10 Ω
Ohm
V GE = 15V VGE = 15V
TJ = 25 °C 800V
VCC = 480V
2.8 I C = 15A
Total Switching Losses (mJ)
Total Switching Losses (mJ)
IC = 30 A
10
2.6
IC = 15 A
IC = 7.5 A
2.4
1
2.2
2.0 0.1
0 10 20 30 40 50 -60 -40 -20 0 20 40 60 80 100 120 140 160
RGRG , GateResistance
, Gate (Ω)
Resistance(Ohm) TJ , Junction Temperature ( ° C )
Fig. 9 - Typical Switching Losses vs. Gate Fig. 10 - Typical Switching Losses vs.
Resistance Junction Temperature
www.irf.com 5
10
8
10
6
10
TJ = 15 0°C
TJ = 12 5°C
TJ = 2 5°C
1
0 2 4 6 8 10
Fo rwa rd V oltage D rop - V F M (V )
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
6 www.irf.com
VR = 2 0 0 V VR = 2 0 0 V
T J = 1 2 5 °C T J = 1 2 5 °C
T J = 2 5 °C T J = 2 5 °C
160
I F = 16A
I F = 1 6A
I IR R M - (A )
120
t rr - (ns)
I F = 8 .0 A
I F = 8.0A
10
I F = 4 .0A
I F = 4 .0 A
80
40
0 1
100 1000 100 1000
d i f /d t - (A /µ s) di f /dt - (A /µs)
Fig. 14 - Typical Reverse Recovery vs. dif/dt Fig. 15 - Typical Recovery Current vs. dif/dt
600 1000
VR = 2 0 0 V
T J = 1 2 5 °C
T J = 2 5 °C
500
I F = 4 .0A
d i(re c)M /d t - (A /µs)
400
I F = 16 A I F = 8.0 A
Q R R - (nC )
I F = 1 6A
300 100
I F = 8 .0A
200
I F = 4 .0A
100 VR = 2 0 0 V
T J = 1 2 5 °C
T J = 2 5 °C
0 10
100 1000 100 1000
d i f /d t - (A /µ s) di f /dt - (A /µs)
Fig. 16 - Typical Stored Charge vs. dif/dt Fig. 17 - Typical di(rec)M/dt vs. dif/dt
www.irf.com 7
90% Vge
Same ty pe +Vge
device as
D .U.T.
Vce
430µF 9 0 % Ic
80% 10% Vce
of Vce Ic Ic
D .U .T.
5 % Ic
td (o ff) tf
t1 + 5 µ S
t1 t2
trr
G A T E V O L T A G E D .U .T .
Ic
trr
Q rr =
∫ Ic dt
tx
id d t
1 0 % +V g
+Vg
tx
1 0 % Irr
10% Vcc
V cc
D UT VO LTAG E
Vce
AN D CU RRE NT V pk
Irr
1 0 % Ic
Vcc Ip k
9 0 % Ic
Ic
D IO D E R E C O V E R Y
W A V E FO R M S
5% Vce
td (o n ) tr
∫
t2
E o n = VVce
ce ieIcd t dt t4
t1
D IO D E R E V E R S E
E re c =
∫ Vd Ic dt
V d id d t
t3
t1 t2
REC OVERY ENER GY
t3 t4
Fig. 18c - Test Waveforms for Circuit of Fig. 18a, Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr Defining Erec, trr, Qrr, Irr
8 www.irf.com
V g G A T E S IG N A L
D E V IC E U N D E R T E S T
C U R R E N T D .U .T .
V O L T A G E IN D .U .T .
C U R R E N T IN D 1
t0 t1 t2
L D.U.T. 800V
RL=
4 X IC @25°C
1000V Vc*
0 - 800V
50V
6000µ F
100 V
Figure 19. Clamped Inductive Load Test Circuit Figure 20. Pulsed Collector Current
Test Circuit
www.irf.com 9
NOTE S:
3 .6 5 (.1 4 3 ) -D-
5 .3 0 (.2 0 9 ) 1 D IM E N S IO N S & T O LE R A N C IN G
1 5 .9 0 (.6 2 6 ) 3 .5 5 (.1 4 0 ) P E R A N S I Y 14 .5M , 1 98 2 .
1 5 .3 0 (.6 0 2 ) 4 .7 0 (.1 8 5 )
0 .2 5 ( .0 1 0 ) M D B M 2 C O N T R O L L IN G D IM E N S IO N : IN C H .
-B- -A- 2.5 0 ( .0 8 9)
3 D IM E N S IO N S A R E S H O W N
1.5 0 ( .0 5 9) M IL LIM E T E R S (IN C H E S ).
5 .5 0 (.2 17 ) 4 4 C O N F O R M S T O J E D E C O U T L IN E
T O -2 4 7A C .
2 0 .3 0 (.8 0 0 )
1 9 .7 0 (.7 7 5 ) 5.5 0 (.2 1 7)
2X
4.5 0 (.1 7 7) LEAD A S S IG N M E N T S
1- GAT E
1 2 3 2- COLLECTO R
3- E M IT T E R
4- COLLECTO R
-C-
1 4 .8 0 (.5 8 3 ) 4 .3 0 (.1 7 0 )
* 1 4 .2 0 (.5 5 9 ) 3 .7 0 (.1 4 5 ) * LO N G E R LE A D E D (2 0m m )
V E R S IO N A V A IL A B L E (T O -2 47 A D )
T O O R D E R A D D "-E " S U F F IX
TO PAR T NUM BER
2 .4 0 (.0 9 4 ) 1 .4 0 ( .0 56 ) 0 .8 0 (.0 3 1 )
2 .0 0 (.0 7 9 ) 3X 3X
1 .0 0 ( .0 39 ) 0 .4 0 (.0 1 6 )
2X
0.2 5 (.0 1 0 ) M C A S 2 .6 0 ( .1 0 2 )
5 .4 5 (.2 1 5 ) 2 .2 0 ( .0 8 7 )
3 .4 0 (.1 3 3 )
2X 3 .0 0 (.1 1 8 )
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111
IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936
Data and specifications subject to change without notice. 6/00
10 www.irf.com