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IRG4PC40KDPbF
INSULATED GATE BIPOLAR TRANSISTOR WITH Short Circuit Rated
ULTRAFAST SOFT RECOVERY DIODE UltraFast IGBT
Features C
Short Circuit Rated UltraFast: Optimized for
high operating frequencies >5.0 kHz , and Short VCES = 600V
Circuit Rated to 10µs @ 125°C, VGE = 15V
Generation 4 IGBT design provides tighter VCE(on) typ. = 2.1V
parameter distribution and higher efficiency than G
Generation 3
IGBT co-packaged with HEXFREDTM ultrafast, @VGE = 15V, IC = 25A
E
ultra-soft-recovery anti-parallel diodes for use in
bridge configurations n-channel
Industry standard TO-247AC package
Lead-Free
Benefits
Generation 4 IGBTs offer highest efficiencies
available
HEXFRED diodes optimized for performance with
IGBTs. Minimized recovery characteristics require
less/no snubbing
Designed to be a "drop-in" replacement for
equivalent industry-standard Generation 3 IR IGBTs TO-247AC
Absolute Maximum Ratings
Parameter Max. Units
VCES Collector-to-Emitter Voltage 600 V
IC @ TC = 25°C Continuous Collector Current 42
IC @ TC = 100°C Continuous Collector Current 25
ICM Pulsed Collector Current 84 A
ILM Clamped Inductive Load Current 84
IF @ TC = 100°C Diode Continuous Forward Current 15
IFM Diode Maximum Forward Current 84
tsc Short Circuit Withstand Time 10 µs
VGE Gate-to-Emitter Voltage ± 20 V
PD @ TC = 25°C Maximum Power Dissipation 160
W
PD @ TC = 100°C Maximum Power Dissipation 65
TJ Operating Junction and -55 to +150
TSTG Storage Temperature Range °C
Soldering Temperature, for 10 sec. 300 (0.063 in. (1.6mm) from case)
Mounting Torque, 6-32 or M3 Screw. 10 lbfin (1.1 Nm)
Thermal Resistance
Parameter Min. Typ. Max. Units
RθJC Junction-to-Case - IGBT 0.77
RθJC Junction-to-Case - Diode 1.7 °C/W
RθCS Case-to-Sink, flat, greased surface 0.24
RθJA Junction-to-Ambient, typical socket mount 40
Wt Weight 6 (0.21) g (oz)
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IRG4PC40KDPbF
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)CES Collector-to-Emitter Breakdown Voltage 600 V VGE = 0V, IC = 250µA
∆V(BR)CES/∆TJ Temperature Coeff. of Breakdown Voltage 0.46 V/°C VGE = 0V, IC = 1.0mA
VCE(on) Collector-to-Emitter Saturation Voltage 2.10 2.6 IC = 25A VGE = 15V
2.70 V IC = 42A See Fig. 2, 5
2.14 IC = 25A, TJ = 150°C
VGE(th) Gate Threshold Voltage 3.0 6.0 VCE = VGE, IC = 250µA
∆VGE(th)/∆TJ Temperature Coeff. of Threshold Voltage -13 mV/°C VCE = VGE, IC = 250µA
gfe Forward Transconductance 7.0 14 S VCE = 100V, IC = 25A
ICES Zero Gate Voltage Collector Current 250 µA VGE = 0V, VCE = 600V
3500 VGE = 0V, VCE = 600V, TJ = 150°C
VFM Diode Forward Voltage Drop 1.3 1.7 V IC = 15A See Fig. 13
1.2 1.6 IC = 15A, TJ = 150°C
IGES Gate-to-Emitter Leakage Current ±100 nA VGE = ±20V
For both:
Square wave:
15 60% of rated
voltage
I
10
Ideal diodes
5
0
0.1 1 10 100
f, Frequency (KHz)
100 100
IC , Collector-to-Emitter Current (A)
I C , Collector-to-Emitter Current (A)
TJ = 150°C
TJ = 150 o C
TJ = 25°C
10 10
TJ = 25 oC
V GE = 15V V CC = 50V
20µs PULSE WIDTH 5µs PULSE WIDTH A
1 1
0.1 1 10 5 7 9 11
VCE , Collector-to-Emitter Voltage (V) VGE, Gate-to-Emitter Voltage (V)
40
4.0
30
3.0
20
IC = 25 A
2.0 IC =12.5 A
10
0 1.0
25 50 75 100 125 150 -60 -40 -20 0 20 40 60 80 100 120 140 160
TC , Case Temperature ( ° C) TJ , Junction Temperature ( ° C)
Fig. 4 - Maximum Collector Current vs. Case Fig. 5 - Typical Collector-to-Emitter Voltage
Temperature vs. Junction Temperature
1
Thermal Response (Z thJC )
D = 0.50
0.20
0.1 0.10
PDM
0.05
t1
0.02 t2
SINGLE PULSE
0.01 (THERMAL RESPONSE)
Notes:
1. Duty factor D = t 1 / t 2
2. Peak TJ = PDM x Z thJC + TC
0.01
0.00001 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)
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IRG4PC40KDPbF
3000 20
VGE = 0V, f = 1MHz VCC = 400V
Cies = Cge + Cgc , Cce SHORTED I C = 25A
Cres = Cgc
2000
Cies 12
1500
8
1000
4
500
Coes
Cres
0 0
1 10 100 0 20 40 60 80 100 120 140
VCE , Collector-to-Emitter Voltage (V) QG , Total Gate Charge (nC)
3.00 100
V CC = 480V RG = 10Ω
Ohm
V GE = 15V VGE = 15V
TJ = 25 ° C VCC = 480V
I C = 25A
Total Switching Losses (mJ)
Total Switching Losses (mJ)
2.50 10
IC = 50 A
IC = 25 A
IC = 12.5 A
2.00 1
1.50 0.1
0 10 20 30 40 50 -60 -40 -20 0 20 40 60 80 100 120 140 160
RG, Gate
RG Resistance ((Ohm)
Gate Resistance Ω) TJ , Junction Temperature ( °C )
Fig. 9 - Typical Switching Losses vs. Gate Fig. 10 - Typical Switching Losses vs.
Resistance Junction Temperature
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IRG4PC40KDPbF
8.0 1000
10Ω
RG = Ohm VGE = 20V
T J = 150 °C T J = 125 oC
125°C
6.0
100
4.0
10
2.0
10
TJ = 150°C
TJ = 125°C
TJ = 25°C
1
0.8 1.2 1.6 2.0 2.4
Forward Voltage Drop - V FM (V)
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
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IRG4PC40KDPbF
100 100
VR = 200V VR = 200V
TJ = 125°C TJ = 125°C
TJ = 25°C TJ = 25°C
80
I F = 30A
I IRRM - (A)
t rr - (ns)
I F = 30A
IF = 15A
60 10
I F = 15A
I F = 5.0A
40
I F = 5.0A
20 1
100 1000 100 1000
di f /dt - (A/µs) di f /dt - (A/µs)
Fig. 14 - Typical Reverse Recovery vs. dif/dt Fig. 15 - Typical Recovery Current vs. dif/dt
800 1000
VR = 200V VR = 200V
TJ = 125°C TJ = 125°C
TJ = 25°C TJ = 25°C
600
di(rec)M/dt - (A/µs)
IF = 30A
Q RR - (nC)
I F = 5.0A
400
I F = 15A I F = 15A
IF = 5.0A I F = 30A
200
0 100
100 1000 100 1000
di f /dt - (A/µs) di f /dt - (A/µs)
Fig. 16 - Typical Stored Charge vs. dif/dt Fig. 17 - Typical di(rec)M/dt vs. dif/dt
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IRG4PC40KDPbF
90% Vge
Same type
device as +Vge
D.U.T.
Vce
430µF
80%
of Vce D.U.T. 90% Ic
10% Vce
Ic Ic
5% Ic
td(off) tf
t1+5µS
t1 t2
trr
GATE VOLTAGE D.U.T.
Ic
trr
Qrr =
∫ tx
Ic dtdt
id
10% +Vg
+Vg
tx
10% Irr
10% Vcc
Vcc
DUT VOLTAGE
Vce
AND CURRENT Vpk
Irr
10% Ic
Vcc Ipk
90% Ic
Ic
DIODE RECOVERY
WAVEFORMS
5% Vce
td(on) tr
∫
t2
VceieIcdtdt
Eon = Vce
∫
t4
t1 Erec = VdVdidIcdt dt
t3
t1 t2 DIODE REVERSE
RECOVERY ENERGY
t3 t4
Fig. 18c - Test Waveforms for Circuit of Fig. 18a, Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr Defining Erec, trr, Qrr, Irr
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IRG4PC40KDPbF
Vg GATE SIGNAL
DEVICE UNDER TEST
CURRENT D.U.T.
VOLTAGE IN D.U.T.
CURRENT IN D1
t0 t1 t2
L D.U.T. 480V
RL=
4 X IC @25°C
1000V Vc* 0 - 480V
50V
6000µF
100V
Figure 19. Clamped Inductive Load Test Circuit Figure 20. Pulsed Collector Current
Test Circuit
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IRG4PC40KDPbF
Notes:
Repetitive rating: VGE=20V; pulse width limited by maximum junction temperature
(figure 20)
VCC=80%(VCES), VGE=20V, L=10µH, RG= 10Ω (figure 19)
Pulse width ≤ 80µs; duty factor ≤ 0.1%.
Pulse width 5.0µs, single shot.
20.30 (.800)
19.70 (.775) 5.50 (.217) NOTES:
2X
4.50 (.177) 1 DIMENSIONING & TOLERANCING
PER ANSI Y14.5M, 1982.
1 2 3 2 CONTROLLING DIMENSION : INCH.
3 CONFORMS TO JEDEC OUTLINE
-C- TO-247-AC.
14.80 (.583)
4.30 (.170)
14.20 (.559) 3.70 (.145)
LEAD ASSIGNMENTS
Hexfet IGBT
2.40 (.094) 1.40 (.056) 0.80 (.031) 1 -LEAD
GateASSIGNMENTS
1 - Gate
2.00 (.079) 3X 1.00 (.039) 3X 0.40 (.016) 2 - Drain
1 - GATE 2 - Collector
2X 2 - DRAIN
0.25 (.010) M C A S 2.60 (.102) 3 - Source 3 - Emitter
3 - SOURCE
5.45 (.215) 2.20 (.087) 4 - Drain
4 - DRAIN4 - Collector
3.40 (.133)
2X 3.00 (.118)
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.12/03
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Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/