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XBar & R chart

PROCESS… PART… GAUGE…


Process SHEARING Description NAA347HC Description VERNIER CALIPER ME-VC-31
Work Cell MFG CELL Feature LENGTH Resolution 0.02
Factory MALLIK Upper spec 2.00 R&R 3.14%
Location Bangalore Target 1296 U/M mm P/T
Contact 7259029860 Lower spec 0.00 Study month Jul-22
Reference NAA347HC Calibration due 2/1/2023

Date 05.07.2022 05.07.2022 08.07.2022 09.07.2022 10.07.2022 12.07.2022 13.07.2022


Time
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27

X1 1.14 1.28 1.24 1.04 1.18 1.06 0.88

X2 0.92 0.90 1.10 1.10 1.26 1.24 1.06

X3 1.24 0.84 1.32 0.92 1.02 0.96 1.02

X4
X5
X6
Xbar 1.10 1.01 1.22 1.02 1.15 1.09 0.99
R 0.32 0.44 0.22 0.18 0.24 0.28 0.18

Enter "C" to display calculated limits


Sbgrp size: 3 C Enter "U" to display user-provided limits

Xbar Chart
2

1.8

1.6

1.4

1.2

0.8

0.6

0.4

0.2

R Chart
1
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0

Control Chart Constants Calculated Limits User Provided


n d2 A2 D4 Control Limits
IXMR 1 1.128 2.660 3.267 Rbar = 0.265714285714286 RCL 0.15
XbarR 2 1.128 1.880 3.267 UCLR = (Rbar)(D4) = 0.265714285714286 x 2.574 = 0.6839485714286 UCLR 0.2
3 1.693 1.023 2.574 Xdouble bar = 1.08190476190476 XCL 0
4 2.059 0.729 2.282 UCLXbar = Xdbl bar + (A2)(Rbar) = 1.08190476190476 + ( 1.023 x 0.2657142857143 ) = 1.354 UCLX 0.72
? !
I
Facility/Location: MALLIK
Capability (Cp, Cpk) Calculator Process: MFG
KPI / O: KPI
Key characteristic: Length
Month of study: JULY
Study manager: MUTHU

Gauge used: VERNIER CALIPER


MEASUREMENT SYSTEM INFORMATION: Gauge resolution: 0.02 mm
GR&R results: 3.14%

Based on an examination of the associated control chart, does


the process appear to be in a state of statistical control (Y/N)? Y
Cp Cpk
Lower Engineering Process Average‡
Specification Limit: LSL = 0.00 * from control chart: Xbar = 1.082 *
Upper Engineering
Specification Limit: USL = 2.00 * Upper Available Tolerance:
UAT = USL - Xbar
UAT = 0.9180952

Engineering Target:
(Used only if spec is two-sided)
T= 1296.00 * Lower Available Tolerance:
LAT = Xbar - LSL
LAT = 1.0819048

Upper Process
Specification type Type -- §
and skewness
Capability Index CpU = 1.96
Skew n/a CpU = 2 x UAT / NV

Engineering Lower Process


Tolerance: ET = -- § Capability Index CpL = 2.30
ET = USL - LSL CpL = 2 x LAT / NV

Average Range† Process Capability Index:


from control chart:
Rbar = 0.265 * Cpk = min(CpU, CpL)
Cpk = 1.96
Number of measurements Modified Capability Index:
in each sample for which
a range was calculated:
n= 3 * Cpk' = min(Cp, Cpk) Cpk' = -- «

Standard deviation:
(Required if data are not time-ordered,
or if process is not in statistial control.)
s= * Enter "P" for Performance
Indices (Pp& Ppk)
Performance indices require
a standard deviation (s) entry.

Appropriate d2 for
the sample of size n: d2 = 1.693 NOTES:
† Use MRbar if IX-MR control chart was used.
Natural Variation of the process ‡ Use Xdouble bar if Xbar & R control chart was used.
NV = 6 x Rbar / d2
NV = 0.939 * User supplied data.
« Applies only when target is not centered in spec.
Potential § Target is not bracketed by LSL and USL. Be sure LSL < T <
Process Capability Cp = -- USL.
Cp = ET / NV

Table of d2 values:
n d2 Engineering Tolerance (ET) & Process Variation (NT) n
2 1.128
3 1.693
Proc. Var,
4 2.059 NV
5 2.326
6 2.534 Spec, ET Tgt
2.534
7 2.704
8 2.847 2.847
2.847
9 2.970 0 200 400 600 800 1000 1200 1400
10 3.078 3.078
3.078
3.078
3.078
3.078

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