XBar & R chart

PROCESS… PART… GAUGE…

Process BENDING Description NAA347HJ Description VERNIER CALIPER
Work Cell MFG CELL Feature LENGTH Resolution 0.01
Factory STIPL Upper spec 15.20 R&R
Location Bangalore Target 15 U/M mm P/T
Contact 7259029860 Lower spec 14.80 Study month Sep-19
Reference NAA347HJ Calibration due 25.07.2020

Date 03.09.2019 04.09.2019 05.09.2019 06.09.2019 07.09.2019 09.09.2019 10.09.2019

Time
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27

X1 15.05 15.02 15.04 15.03 15.04 14.98 15.02

X2 15.03 14.97 15.02 14.97 15.02 14.99 14.96

X3 14.97 14.96 14.98 15.05 14.99 15.03 14.99

X4
X5
X6
Xbar 15.02 14.98 15.01 15.02 15.02 15.00 14.99
R 0.08 0.06 0.06 0.08 0.05 0.05 0.06

Enter "C" to display calculated limits

Sbgrp size: 3 C Enter "U" to display user-provided limits

Xbar Chart
15.2

15.15

15.1

15.05

15

14.95

14.9

14.85

14.8

R Chart
0.4
0.35
0.3
0.25
0.2
0.15
0.1
0.05
0

Control Chart Constants Calculated Limits User Provided

n d2 A2 D4 Control Limits
IXMR 1 1.128 2.660 3.267 Rbar = 0.062857142857142 RCL 0.15
XbarR 2 1.128 1.880 3.267 UCLR = (Rbar)(D4) = 0.062857142857142 x 2.574 = 0.1617942857143 UCLR 0.2
3 1.693 1.023 2.574 Xdouble bar = 15.0052380952381 XCL 0
4 2.059 0.729 2.282 UCLXbar = Xdbl bar + (A2)(Rbar) = 15.0052380952381 + ( 1.023 x 0.0628571428571 ) = 15.070 UCLX 0.72
? !
I
Facility/Location: STIPL
Capability (Cp, Cpk) Calculator Process: MFG
KPI / O: KPI
Key characteristic: HOLE REFERANCE
Month of study: Sept
Study manager: MANAS

Gauge used: VERNIER CALIPER

MEASUREMENT SYSTEM INFORMATION: Gauge resolution: 0.02 mm
GR&R results: 7.50%

Based on an examination of the associated control chart, does

the process appear to be in a state of statistical control (Y/N)? Y
Cp Cpk
Lower Engineering Process Average‡
Specification Limit: LSL = 14.80 * from control chart: Xbar = 15.005 *
Upper Engineering
Specification Limit: USL = 15.20 * Upper Available Tolerance:
UAT = USL - Xbar
UAT = 0.1947619

Engineering Target:
(Used only if spec is two-sided)
T= 15.00 * Lower Available Tolerance:
LAT = Xbar - LSL
LAT = 0.2052381

Upper Process
Specification type Type L --- T --- U
and skewness
Capability Index CpU = 1.77
Skew 0.00 CpU = 2 x UAT / NV

Engineering Lower Process

Tolerance: ET = 0.4 Capability Index CpL = 1.87
ET = USL - LSL CpL = 2 x LAT / NV

Average Range† Process Capability Index:

from control chart:
Rbar = 0.062 * Cpk = min(CpU, CpL)
Cpk = 1.77
Number of measurements Modified Capability Index:
in each sample for which
a range was calculated:
n= 3 * Cpk' = min(Cp, Cpk) Cpk' = -- «

Standard deviation:
(Required if data are not time-ordered,
or if process is not in statistial control.)
s= * Enter "P" for Performance
Indices (Pp& Ppk)
Performance indices require
a standard deviation (s) entry.

Appropriate d2 for
the sample of size n: d2 = 1.693 NOTES:
† Use MRbar if IX-MR control chart was used.
Natural Variation of the process ‡ Use Xdouble bar if Xbar & R control chart was used.
NV = 6 x Rbar / d2
NV = 0.220 * User supplied data.
« Applies only when target is not centered in spec.
Potential
Process Capability Cp = 1.82
Cp = ET / NV

Table of d2 values:
n d2 Engineering Tolerance (ET) & Process Variation (NT) n
2 1.128
3 1.693
Proc. Var,
4 2.059 NV
5 2.326
6 2.534 Tgt Spec, ET
2.534
7 2.704
8 2.847 2.847
2.847
9 2.970 14.75 14.8 14.85 14.9 14.95 15 15.05 15.1 15.15 15.2 15.25
10 3.078 3.078
3.078
3.078
3.078
3.078