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1370C
IRL3705N
HEXFET® Power MOSFET
l Logic-Level Gate Drive D
l Advanced Process Technology VDSS = 55V
l Dynamic dv/dt Rating
l 175°C Operating Temperature RDS(on) = 0.01Ω
l Fast Switching G
l Fully Avalanche Rated
ID = 89A
Description S
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer
with an extremely efficient and reliable device for use
in a wide variety of applications.
Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case ––– 0.90
RθCS Case-to-Sink, Flat, Greased Surface 0.50 ––– °C/W
RθJA Junction-to-Ambient ––– 62
8/25/97
IRL3705N
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 55 ––– ––– V VGS = 0V, ID = 250µA
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.056 ––– V/°C Reference to 25°C, I D = 1mA
––– ––– 0.010 VGS = 10V, ID = 46A
RDS(on) Static Drain-to-Source On-Resistance ––– ––– 0.012 Ω VGS = 5.0V, I D = 46A
––– ––– 0.018 VGS = 4.0V, I D = 39A
VGS(th) Gate Threshold Voltage 1.0 ––– 2.0 V VDS = VGS , ID = 250µA
gfs Forward Transconductance 50 ––– ––– S VDS = 25V, ID = 46A
––– ––– 25 VDS = 55V, VGS = 0V
IDSS Drain-to-Source Leakage Current µA
––– ––– 250 VDS = 44V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 16V
I GSS nA
Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -16V
Qg Total Gate Charge ––– ––– 98 ID = 46A
Q gs Gate-to-Source Charge ––– ––– 19 nC VDS = 44V
Q gd Gate-to-Drain ("Miller") Charge ––– ––– 49 V GS = 5.0V, See Fig. 6 and 13
t d(on) Turn-On Delay Time ––– 12 ––– VDD = 28V
tr Rise Time ––– 140 ––– I D = 46A
ns
t d(off) Turn-Off Delay Time ––– 37 ––– RG = 1.8Ω, VGS = 5.0V
tf Fall Time ––– 78 ––– RD = 0.59Ω, See Fig. 10
Between lead, D
LD Internal Drain Inductance ––– 4.5 ––– nH
6mm (0.25in.)
G
from package
LS Internal Source Inductance ––– 7.5 –––
and center of die contact S
VSD Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 46A, VGS = 0V
t rr Reverse Recovery Time ––– 94 140 ns TJ = 25°C, IF = 46A
Q rr Reverse RecoveryCharge ––– 290 440 nC di/dt = 100A/µs
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by ISD ≤ 46A, di/dt ≤ 250A/µs, VDD ≤ V(BR)DSS,
max. junction temperature. ( See fig. 11 ) TJ ≤ 175°C
Pulse width ≤ 300µs; duty cycle ≤ 2%.
VDD = 25V, starting TJ = 25°C, L = 320µH
Calculated continuous current based on maximum allowable
RG = 25Ω, IAS = 46A. (See Figure 12)
junction temperature; for recommended current-handling of the
package refer to Design Tip # 93-4
IRL3705N
1000 1000
VGS VGS
TOP 15V TOP 15V
12V 12V
10V 10V
8.0V 8.0V
ID , D ra in -to -S o u rc e C u rre n t (A )
ID , D ra in -to -S o u rc e C u rre n t (A )
6.0V 6.0V
4.0V 4.0V
3.0V 3.0V
BOTT OM 2.5V BOTT OM 2.5V
100 100
10 10 2.5 V
2 .5V
20 µ s PU LSE W ID TH 20 µ s PU LSE W ID TH
T J = 2 5°C T J = 1 75°C
1 A 1 A
0.1 1 10 100 0.1 1 10 100
V D S , Drain-to-Source V oltage (V ) V D S , Drain-to-Source V oltage (V )
1000 3.0
I D = 77 A
R D S (o n ) , D ra in -to -S o u rc e O n R e si sta n ce
I D , D r ain- to-S ourc e C urre nt (A )
2.5
TJ = 2 5 °C
TJ = 1 7 5 ° C
100 2.0
(N o rm a li ze d )
1.5
10 1.0
0.5
V DS = 2 5 V
2 0 µ s P U L S E W ID T H V G S = 10 V
1 0.0
A A
2.0 3.0 4.0 5.0 6.0 7.0 8.0 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
6000 15
V GS = 0V , f = 1 MH z I D = 4 6A
C iss = C gs + C gd , C ds SH O R TED V DS = 4 4V
4000
9
3000 C os s
6
2000
C rs s 3
1000
FO R TES T C IR CU IT
SEE FIG U R E 13
0 A 0 A
1 10 100 0 20 40 60 80 100 120 140
V D S , D rain-to-S ource Voltage (V ) Q G , Total Gate Charge (nC )
1000 1000
OPE R ATIO N IN TH IS A RE A LIMITE D
BY R D S(o n)
I S D , R e v e rse D ra in C u rre n t (A )
10µ s
I D , D ra in C u rre n t (A )
100
100µ s
100
TJ = 1 75°C
1 ms
T J = 2 5°C 10
10m s
T C = 25 °C
T J = 17 5°C
VG S = 0 V S ing le Pulse
10 A 1 A
0.4 0.8 1.2 1.6 2.0 2.4 2.8 1 10 100
V S D , S ource-to-Drain Voltage (V ) V D S , Drain-to-Source Voltage (V)
100
RD
LIMITED BY PACKAGE VDS
VGS
80 D.U.T.
RG
ID , Drain Current (A)
+
-VDD
60
5.0V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
40
0
25 50 75 100 125 150 175
TC , Case Temperature ( ° C)
10%
VGS
Fig 9. Maximum Drain Current Vs.
td(on) tr t d(off) tf
Case Temperature
Fig 10b. Switching Time Waveforms
D = 0.50
(Z thJC )
0.20
Thermal Response
0.10
0.1
0.05 PDM
Notes:
1. Duty factor D = t1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.01
0.00001 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)
800
ID
E A S , S in g le P u ls e A va la n c h e E n e rg y (m J)
TO P 1 9A
33A
15 V BO TTOM 46 A
600
L D R IV E R
VD S
400
RG D .U .T +
V
- DD
IA S A
10V
tp 0 .0 1 Ω 200
I AS
Current Regulator
Fig 12b. Unclamped Inductive Waveforms Same Type as D.U.T.
50KΩ
12V .2µF
QG .3µF
5.0 V +
V
D.U.T. - DS
QGS QGD
VGS
VG
3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
IRL3705N
+
- +
-
RG • dv/dt controlled by RG +
• Driver same type as D.U.T. VDD
-
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
VGS=10V *
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
VDD
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
Ripple ≤ 5% ISD
1 0 . 5 4 (. 4 1 5 ) 3 . 7 8 (. 1 4 9 ) -B -
2 . 8 7 ( .1 1 3 ) 1 0 . 2 9 (. 4 0 5 ) 3 . 5 4 (. 1 3 9 ) 4 . 6 9 ( .1 8 5 )
2 . 6 2 ( .1 0 3 ) 4 . 2 0 ( .1 6 5 )
-A - 1 .3 2 (. 0 5 2 )
1 .2 2 (. 0 4 8 )
6 . 4 7 (. 2 5 5 )
6 . 1 0 (. 2 4 0 )
4
1 5 . 2 4 ( .6 0 0 )
1 4 . 8 4 ( .5 8 4 )
1 . 1 5 ( .0 4 5 ) L E A D A S S IG N M E N T S
M IN 1 - G A TE
1 2 3 2 - D R AIN
3 - SO URCE
4 - D R AIN
1 4 . 0 9 (.5 5 5 )
1 3 . 4 7 (.5 3 0 ) 4 . 0 6 (. 1 6 0 )
3 . 5 5 (. 1 4 0 )
0 . 9 3 ( .0 3 7 )
3 X 0 . 6 9 ( .0 2 7 ) 3 X 0 . 5 5 (. 0 2 2 )
0 . 4 6 (. 0 1 8 )
1 .4 0 (. 0 5 5 )
3X
1 .1 5 (. 0 4 5 ) 0 .3 6 (. 0 1 4 ) M B A M 2 .9 2 (. 1 1 5 )
2 .6 4 (. 1 0 4 )
2 . 5 4 ( .1 0 0 )
2X
NO TE S :
1 D I M E N S IO N I N G & T O L E R A N C IN G P E R A N S I Y 1 4 .5 M , 1 9 8 2 . 3 O U T L IN E C O N F O R M S T O J E D E C O U T L I N E T O -2 2 0 A B .
2 C O N T R O L L I N G D IM E N S IO N : I N C H 4 H E A T S IN K & L E A D M E A S U R E M E N T S D O N O T IN C L U D E B U R R S .
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
http://www.irf.com/ Data and specifications subject to change without notice. 8/97
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