This article has been accepted for publication in a future issue of this journal, but has not been
fully edited. Content may change prior to final publication. Citation information: DOI
10.1109/TPWRD.2015.2407883, IEEE Transactions on Power Delivery
Fault Analysis for Distribution Networks with
Current-Controlled Three-Phase Inverter-
Interfaced Distributed Generators
Qianggang Wang, Student Member, IEEE, Niancheng Zhou, Ling Ye
Abstract-- The fault current of a three-phase inverter-
interfaced distributed generator (IIDG) depends on the control
strategy employed during grid faults. A new short-circuit current
calculation method for IIDGs is developed in this study according
to the current control and reactive power support during the low-
voltage ride-through operation period. To investigate how ride-
through time relates to the short-circuit current of IIDGs, short-
circuit responses under different fault conditions are compared.
The short-circuit current of a multi-IIDG distribution network is
determined with the proposed technique in consideration of ride-
through time and sequence current control. The correctness of the
proposed method is verified by simulation.

Index Terms--short-circuit current, sequence components,
inverter interfaced distributed generator, current control, ride-
through time, distribution network.
I. INTRODUCTION
D ISTRIBUTED generators (DGs) in a distribution network
change the power flow and short-circuit current.
Protection and reclosing devices are affected by the short-
circuit current generated by DGs [1]. Three-phase inverter-
interfaced distributed generators (IIDGs), including
photovoltaic, fuel cell, wind power, and micro-turbine, are
widely utilized in power systems because of the fast and
flexible control provided by their power electronic devices [2–
4]. The basic control modes of IIDGs can be divided into
voltage and current control according to the different tracking
variables in the inner-loop control [5]. The fault features of
IIDGs are different from those of synchronous generators
because the short-circuit current of IIDGs is limited by the
maximum current rating of the inverter; in addition, the fault
response speed is within milliseconds [5, 6]. The short-circuit
current of IIDGs, particularly current-controlled IIDGs, mainly
depends on the control strategy, which acts as a current source.
Traditional fault analysis [6] based on the voltage source
equivalent has become inadequate to calculate the short-circuit
current of IIDGs and estimate its impact on protection and
reclosing devices. Therefore, the aim of this study is to analyze
the fault of a distribution network integrated with current-
controlled three-phase IIDGs.
When the terminal voltage of an IIDG drops after a grid
fault, the output current of the inverter increases. Transient
simulation [1] and physical experimentation [7] help explain
The authors are with the State Key Laboratory of Power Transmission
Equipment & System Security and New Technology, Chongqing Unversity,
China (e-mail: yitagou@cqu.edu.cn).
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the short-circuit behavior of IIDGs but are unable to
analytically calculate the short-circuit current. Under the
assumption of constant output power before and after a grid
fault, a current source model based on the phase frame of a
current-controlled three-phase IIDG was established for short
circuit calculation in [8, 9]. However, its controller was
designed to control both positive- and negative-sequence
currents to flexibly regulate the output power of the inverter
during a grid fault [10–13]. Thus, IIDGs must be modeled
based on the sequence component frame for fault analysis.
Several distribution system analysis tools (i.e., CYMDIST [14])
have been utilized to develop IIDG models for short circuit
calculation in sequence networks. However, the developed
models do not allow for the dynamic reactive power regulation
of IIDGs by positive- and negative-sequence current injections
[14]; such regulation is important for IIDGs to ride through
different types of grid faults. Furthermore, the transient fault
responses of IIDGs cannot be theoretically explained by the
aforementioned tools. A short-circuit current source model that
provides reactive power support for a current-controlled three-
phase IIDG was established in [10]. The IIDG only produces
positive-sequence current, and the power fluctuation caused by
the negative-sequence component is ignored. However, this
IIDG was designed to inject negative-sequence current to
enhance its output performance during an asymmetric grid
fault. The model in [10] cannot obtain the negative-sequence
current of three-phase IIDGs during an asymmetric fault.
The injected negative-sequence component of short-circuit
current can restrain the DC voltage and power fluctuations of
IIDG and ensure its safe operation [11–13]. Although a unified
formula for positive- and negative-sequence currents was
proposed to adjust the IIDG operating features during a fault in
[12, 13], these studies do not consider the interaction between
the sequence currents of IIDG and sequence networks and
cannot provide a solution to short-circuit currents in a
distribution grid with multi-IIDGs. The terminal voltages of
IIDGs at different nodes differ from one another, and their
ride-through time also differs [15] depending on the low-
voltage ride-through (LVRT) requirement. The ride-through
time sequences of IIDGs affect the current distribution of a
multi-IIDG system at different periods. Currently, no short
circuit calculation tools and models of IIDG consider the ride-
through time (self-protection).
The advantage of sequence component-based fault analysis
is that the sequence networks are decoupled for a balanced
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10.1109/TPWRD.2015.2407883, IEEE Transactions on Power Delivery
three-phase distribution network. An unbalanced three-phase
distribution network with single- and two-phase lines cannot
be analyzed directly through the plain sequence component
method because of the coupling of three sequence networks
[16, 17]. However, compared with the phase component
method, the sequence component method can decrease the
scale and complexity of short-circuit current calculation, and
the weak coupling among sequence networks can be solved by
parallel processing [18]. The sequence components of short-
circuit currents can be utilized in the protection and control of
IIDG under an asymmetric fault.
This paper proposes an analytical method to calculate the
short-circuit currents of a multi-IIDG distribution network
based on the short-circuit characteristics of current-controlled
three-phase IIDGs under a grid fault. The proposed technique
can effectively address the mutual coupling of sequence
networks for an unbalanced distribution network. The current
source models for positive- and negative-sequence components
are established in consideration of the reactive power support
and converter capacity constraint of IIDGs during LVRT.
Terminal voltage and ride-through time, which affect the short-
circuit current of IIDGs, are investigated. The method is
verified with PSCAD/EMTDC, where IIDGs are represented
by the models in [11]. The errors arising from the difference
between analytical and simulation results are analyzed.
II. ASYMMETRIC FAULT ANALYSIS OF A DISTRIBUTION
NETWORK WITH IIDG
A. Short Circuit Calculation Principle
Grid voltage includes positive-, negative-, and zero-
sequence components during an asymmetrical fault and a
three-phase IIDG can eliminate its zero-sequence current via
suitable control [19, 20]. Thus, after an asymmetrical grid fault,
IIDG injects only positive- and negative-sequence currents into
sequence networks as a dynamic current source. In the single-
IIDG system in Fig. 1, Es is the equivalent substation voltage
and Zs is the short-circuit impedance. ZL1 and ZL2 are the
impedances of L1 and L2. The positive- and negative-sequence
impedances of lines are equal. Their zero-sequence
impedances are 3ZL1 and 3ZL2. ZT is the transformer impedance.
The composite sequence network when a single-phase-to-
ground fault occurs is shown in Fig. 2 under the boundary
conditions of sequence voltages U 3 , U 3 , U 30 and currents I3 ,
I3 , I30 of fault node 3.
Fig. 1. Distribution network with an IIDG.
In Fig. 2, U 2 , U 2 , and U 20 are the sequence voltages of IIDG
at node 2. U  , U  and I , I are the positive- and negative-
sequence components of the terminal voltage and short-circuit
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current of IIDG. According to the relationship between the
node voltages and branch currents in Fig. 2, the terminal
voltage of IIDG can be expressed as
E (Z  ZL1  2ZL2  ZΣ0 )  I (Zs  ZL1 )2
U   s s 
2Zs  2ZL1  2ZL2  ZΣ0
(Z  ZL1  2ZL2  ZΣ0 )(Zs  ZL1 )
I [ZT  s ] (1)
2Zs  2ZL1  2ZL2  ZΣ0
U   Es  U   ( I  I )(Zs  ZL1  ZT ) (2)
where Z0=ZT(Zs+3ZL1)/(Zs+3ZL1+ZT)+3ZL2. The relationship
among substation voltage E s , system impedances, terminal
voltage U  , U  , and short-circuit current I , I of IIDG
represents the network constraint of the composite sequence
network in Fig. 2. An iterative method is necessary to solve
this constraint because of the nonlinear coupling between the
short-circuit current and terminal voltage of IIDG, which
depends on its current control. IIDG is assumed not to be
connected to the network and that the initial terminal voltage
after a fault can be obtained. According to the initial voltage
and current control of IIDG, the sequence components of the
short-circuit current can be obtained and would be substituted
into (1) and (2) to update the terminal voltage until
convergence. Notably, the current of IIDG has a strong
correlation with LVRT control.
I3+
E s I U 2
+
U 3
U 
I3

I  U 2 U 3
U 
I30
U 20 U 30
Fig. 2. Composite sequence network when a single-phase-to-ground short-
circuit fault occurs at node 3.
B. Short Circuit Calculation Model
Under an asymmetrical fault, the output current of an IIDG
contains positive- and negative-sequence components. Current
and voltage can be described in space vector forms
i(t)i(t)i(t) and u(t)u(t)u(t), where i(t)[ia(t), ib(t),
ic+(t)]T, i(t)[ia(t), ib(t), ic(t)]T, u(t)[ua(t), ub(t), uc(t)]T, and
u(t)[ua(t), ub(t), uc(t)]T. To maintain the active and reactive
power of IIDG as constants P* and Q*, coefficients, , and 
are introduced based on the unified control strategy in [13] to
form a new current reference for IIDG.
P[u (t)  u (t)]  Q[u (t)  u (t)]
i (t)  (3)
| u (t) |2 (1   ) u (t)u (t)   | u (t) |2
where  and [1,1], [0,1], u and u are the orthogonal
voltage vectors of u(t) and u(t), uh (t ) [uhb(t)uhc(t), uhc(t)
uha(t), uha(t)uhb(t)]T/ 3 . h,  stand for the positive- and
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negative-sequence components. Different sequence current
control strategies can be obtained by selecting different
coefficients , , and  [11–13]. For example, different values
of  and  correspond to five types of asymmetric current
control in [11] while Q*=0. In (3), after a grid fault, the short-
circuit current of IIDG can be divided into two voltage-
controlled current sources (positive and negative sequence).
Ensuring that the current total harmonic distortion (THD)
and peak current of the inverter are within the limit is
necessary. However, owing to the fluctuation component of the
denominator in (3), the output current contains harmonic
components, and the available range of  determined by
harmonic limits is very small. Thus, =0 is employed to reduce
the current harmonic to zero [19]. IIDG should prioritize the
provision of reactive power support after the grid fault.
Considering the demand of the dynamic reactive power of DG
[21] and the inverter capacity constraint during LVRT, P*i and
Q*i can be calculated as
U s+i
Qi i [Qi0  kqi Sn2i Qi*20 (1
U ni
i Pi*0 , Pi*0  [0,
Pi  
2
i Sni  Qi ,
2
Pi*0  [0,
where i stands for the i-th IIDG; i= U s+2i  U s-2i Imaxi/(UniIni) is
the capacity factor of the inverter after the fault; Usi+ and
Usiare the positive- and negative-sequence components of
terminal voltage; Imaxi is the maximum allowable current; Sni,
equations and (4) to (7) can be applied to calculate the short-
circuit currents of a distribution network with IIDGs in
consideration of LVRT control. Given that the equations are
nonlinear and complex, the short-circuit currents have to be
solved effectively by iteration.
C. Short Circuit Fault Characteristics
The short circuit capacity of the substation in Fig. 1 is 240
MVA. L1 = 1 km, L2 = 0.5 km, ZL+ = ZL- = j0.47 Ω/km, ZL0 =
3ZL+, P0* = 0.8pu, and Q0* = 0.6pu. The IIDG parameters are
shown in the Appendix. A distributed generation plant may
contain multiple IIDGs that are connected by a collector
system. The short-circuit current of an IIDG is limited, and
multiple IIDGs can provide a significant contribution to short-
circuit current during a grid fault. Therefore, short-circuit
currents under different IIDG capacities are calculated to study
the impact of control parameters of IIDG and fault types. IIDG
capacity Sn can be changed by increasing the number of three-
phase IIDGs at node 2 in Fig. 1. The short-circuit currents of a
single-phase-to-ground (phase A) and a two-phase-to-ground
)], 0<Qi  Sni (4) (phases B and C) at the end of L2 are shown in Fig. 3.
Comparison of Figs. 3(a) and 3(b) shows that the change
Sn2i  Qi2 ] ranges of positive-sequence currents and the magnitude of the
(5) currents become small because of a small kq. The different
Sn2i  Qi2 ]
coefficients lead to significant differences in the sequence
components of short-circuit current under the same conditions.
1.3 1.3
1.2 Single-phase fault 1.2 Two-phase fault
1 1
Is+, Is-/pu
Is+, Is-/pu

0.8 0.8
Uni and In are the rated capacity, voltage, and current; kqi is the Analytical Simulation
Is+ Is+
reactive power support factor; and Pi0* and Qi0* are the active 0.6
Is- Is -
0.6
Analytical Simulation
and reactive power reference in normal operation. 0.4 0.4 Is+ Is+
Is- Is -
The relationship between the short-circuit current and 0.2 0.2
0 10 20 30 40 50 60 0 10 20 30 40 50 60
voltage of IIDG can be determined from (3) to (5). The Sn/MVA Sn/MVA
capability of reactive power is decided by kqi, and the positive- (a)
1.3 1.3
and negative-sequence current control of the i-th IIDG is 1.2 Single-phase fault 1.2
determined by i and i. Assuming that the sequence 1 1
components of terminal voltages of m IIDGs are U si+ and U si
Is+, Is-/pu
Is+, Is-/pu

0.8 0.8
(i=1, 2, …, m), the sequence short-circuit currents are
0.6 0.6
P U +  QiU si  ( Pi  Qie-jπ/2 )U s+i

0.4 0.4
Is+i  i +2si  (6) Two-phase fault
U si  iU si 2 i   iU si
U s+2 2
0.2 0.2
0 10 20 30 40 50 60 0 10 20 30 40 50 60
Sn/MVA Sn/MVA
 ( P U   Qi iU si  )  i ( Pi   Qi i e jπ/2 )U si (b)
Isi  i i +2si  (7)
U si   iU si 2 i   iU si
U s+2 2

where U si+ and U si are the sequence components of orthogonal
voltage that lags and leads U + and U  by /2, respectively. The
si si
terminal voltages of IIDGs are determined by the short-circuit
current injections and the network equation, as shown in (1)
and (2). In return, the voltages affect the short-circuit current
injections through (6) and (7). This problem can be formulated
based on the interaction between the short-circuit currents and
voltages of IIDGs, the parameters of the distribution network.
Nonlinear algebraic equations combined with network
Fig. 3. Short-circuit currents under different fault types: (a) =1, =1, and kq=1.
(b) =1, =1, and kq=1.6.
When kq=0, the controller regulates the output power of
IIDG according to the proportion of active and reactive power
reference in the normal operation. When =0, IIDG only
injects positive-sequence current to the grid under an
asymmetrical fault. The short-circuit current of IIDG enhances
the support to the terminal voltage because of the increase in
connection capacity. The short-circuit currents of IIDGs are
determined by LVRT control and network equations.

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This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI
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III. INFLUENCE OF RIDE-THROUGH TIME ON SHORT-CIRCUIT
CURRENT OF IIDG
The duration of the short-circuit current of an IIDG is
decided by its ride-through time. According to the German
E.ON and China SGCC grid codes [22, 23], ride-through time
tr can be obtained by using the IIDG terminal voltage after a
fault. A simulation was conducted based on the LVRT
requirements in the rules [23]. The simulation results of short-
circuit currents for 1 and 15 parallel IIDGs (the capacity of
each single IIDG is 2 MW) when a single-phase-to-ground
fault occurs are shown in Fig. 4. The simulation parameters
and fault conditions are similar to those in Fig. 3(a).
The supporting effect of the injected current on terminal
voltage improves with the increase in IIDG connection
capacity. For this reason, the ride-through time of the 15 IIDGs
is longer than that of the single IIDG in Fig. 4. The fault
voltages of phase A (lower than that of phases B and C) in the
single IIDG and 15 IIDGs are 0.362 and 0.409 pu, and tr are
0.943 and 1.036 s in Fig. 4. Fig. 5 shows the voltage of LVRT
(phase-to-ground voltage for a single-phase fault and phase-to-
phase voltage for a two-phase fault [23]) and the trend of tr
with capacity as decided by the voltage of IIDG during a fault.
0.4
1 IIDG
0.2
is/kA
when Sn  30 MVA. tr changes to 0.625 s and presents a
tendency to climb straight with the increase in capacity when
Sn > 30 MVA. If multiple IIDGs are connected to a grid, the
different voltages at the connection points of IIDGs would lead
to differences in ride-through time during a fault. The voltages
of the other IIDGs change because of the disconnection of
several IIDGs; this condition will affect their trip actions.
Besides the interaction between short-circuit currents and the
grid, the short circuit calculation should also consider the
influence of ride-through periods on the injected currents.
IV. SHORT CIRCUIT CALCULATION FOR A DISTRIBUTION
NETWORK WITH MULTI-IIDGS
A. Network Equivalent Circuit
Fig. 6 shows a distribution network with n nodes and m
three-phase IIDGs. Only the current source based on the
sequence components of the IIDG at node i is shown. Nodes
from 2 to (m+1) are IIDG nodes, and node 1 is the main source
node. E s is the main source voltage, and Zs+, Zs, Zs0 are the
positive-, negative-, zero-sequence short-circuit impedances.
The short-circuit fault occurs at node f. U f , U f , U f0 and If , If ,
If0 are the voltage and current sequence components at node f,
is+ is-
and ZTi and ZTi0 are the short-circuit and zero-sequence

0
impedances of the transformer at node i. IIDGs are considered
-0.2 tr=0.943s voltage controlled current sources in Fig. 6, and they do not
-0.4
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 inject zero-sequence current into the grid.
t/s
6
4 15 IIDGs
2 Isi U si
is/kA

0
-2 Isi
-4 tr=1.036s U si

-6 Es U f If
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2
t/s

Fig. 4. Short-circuit currents under different connection capabilities. Isi U si

0.7 1.2 Isi

U si
0.6 
1.15 U f If
0.5 1.1 tr=1.036s
0.4
Us/pu

tr/s

1.05 tr=0.943s Ii0

0.3 Analytical Simulation U si
0.2 Ua Ua 1
Ub Ub U i0 U si
0.1 0.95 0
Uc Uc Sn=2MW U f0 I f
0 0.9
0 10 20 30 40 50 60 0 10 20 30 40 50 60
Sn/MVA Sn/MVA
(a)
0.55 0.7 Fig. 6. Schematic of short circuit calculation of a multi-IIDG system.
0.5 0.6
0.45 Power reference Pi* and Qi* can be obtained with (4) and (5).
Analytical Simulation 0.5
0.4 By substituting them into (6) and (7), short-circuit current Is+i
Us/pu

Uab Uab 0.4

tr/s

0.35 Analytical
Ubc Ubc 0.3 Simulation and Isi can be calculated, and the terminal voltage sequence
0.3
Uca Uca 0.2
0.25 components can be achieved. The same process is
0.2 0.1 implemented to update the current at the next step; the short-
0.15 0
0 10 20 30 40 50 60 0 10 20 30 40 50 60 circuit current and voltage of IIDG can be obtained by iteration.
Sn/MVA Sn/MVA To calculate tri of each IIDG, the examination voltage of IIDGs
(b)
can be obtained by transforming sequence voltage into phase
Fig. 5. Ride-through times under (a) single-phase-to-ground fault and (b) two- voltage. Then, the IIDGs that would be disconnected next time
phase-to-ground fault. and their trip time are determined. Based on the combination of
In Fig. 5(b), the fault voltage is less than 0.2 pu and tr = 0 IIDGs that are still connected to the grid, the short-circuit

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This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI
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current and voltage of each IIDG should be re-calculated. from the fault point by the voltage in the normal component
Voltage is used to determine the next tri and the ride-through network. Assuming that the initial sequence currents of the i-th
IIDGs next time. IIDG are Isi+（0） =0 and Isi（0） =0, the positive- and negative-
B. Short Circuit Iterative Calculation sequence node voltages of the normal component network
U （k） and U （k） during the k-th iteration can be calculated as
An unbalanced distribution network can be modeled based
on phase components by path matrix T to represent the U （k）  Ζ  Ζ    I  ( k 1) 
relationship between equivalent node currents (flowing out of   （k）     
U   Ζ Ζ    I  ( k 1) 
the node) Ie and branch currents Ib . Branch impedance matrix
Zb is utilized to represent the relationship between Ib and node I(k 1)  [I ,Is2(k1) ,, Is((mk1)1) ,0,,0]T

voltage drops U b . The procedure to construct the matrices, I(k 1)  [0, Is2(k1) ,, Is((mk1)1) ,0,,0]T (11)
source, line, transformer, and load models can be found in [17,
where I  Es / Zs is the positive-sequence equivalent current of
24–26]. The node voltages can be written as
the main source, and each of the IIDGs is equivalent to a
U  EE s  U b  EE s  Zb Ib  EE s  ZbTIe current source. The fault node voltage of the normal network
 EIs Zs  ZbTIe  ZbT[ Is  Ie1 ,  Ie2 ,,  Ien ]T  ZI (8) contains the negative-sequence component because of the
negative-sequence current injected into the normal network.
where U and I are the node voltage and current vectors, E s Fig. 7 shows the composite sequence network for the fault
=[ E sa , E sb , E sc ]T and Is =[ Isa , Isb , Isc ]T are 31 main source node with the negative-sequence voltage obtained from the
boundary conditions under different types of faults.
voltage and its Norton equivalent current vectors, E is a 3n3
matrix composed of n 33 identity matrices, Zs is a 33 short
circuit impedance matrix, and Z is a node impedance matrix
using phase components. For multiphase lines and nodes, If (k) If (k) I0(f k )
missed phases of node voltages and currents in (8) may exist U f (k ) U f (k)
[25, 26]. If node i is a two-phase node that includes phases A
and B and node j is a two-phase node that includes phases B (a)
and C, then sub-matrix Zij of Z can be obtained with a three-
phase form by setting the corresponding impedances of the I0(f k )
missed phases to zero.
If (k ) I(k )
f

0 Zijab Zijac 
  U f (k ) U f (k )
Zij  0 Zijbb Zijbc   (9)
0 0 0 

(b)
The phase components in sub-matrix Zij can be transformed
into sequence components as follows: If (k ) If (k )

1 a a2 0 Zijab Zijac   1 1 1  Zij Zij Zij0 

1      U f (k) U f (k )
Zij0  A1Zij A  1 a2 1 0 Zijbb Zijbc  a2 a 1  Zij Zij Zij0   (10)
3    0 0 0
1 1 1 0 0 0   a a 1 Zij Zij Zij 
2

(c)

Given that unbalanced lines exist in the distribution grid,
sequence impedance sub-matrix Zij becomes full, and the
sequence coupled impedance matrix is characterized by weak
mutual coupling. Node impedance matrices Z+, Z- of positive-
and negative-sequence networks and their coupled impedance
matrices Z+-, Z-+ can be obtained with (8) to (10), in which
impedance ZTi at node i with IIDG is disregarded. If the three-
phase distribution grid is balanced, the sequence networks can
be decoupled without the coupled impedances.
The fault network in Fig. 6 can be decomposed into normal
and fault networks by adopting the superposition principle.
Only injected current at the fault point exists in the fault
network. The IIDGs inject positive and negative short-circuit
currents into the normal component network as a voltage-
controlled current source; this condition affects the current
Fig. 7. Composite sequence network with negative-sequence voltage: (a) A
single-phase-to-ground fault, (b) BC two-phase-to-ground fault, and (c) BC
two-phase fault.
The impedances of different phases in node phase
impedance matrix Zff at node f are balanced; hence, node
sequence impedance matrix Zff+-0 is full and symmetrical [26],
i.e., Z+-=Z-+. The node sequence impedance matrix involves the
coupling of sequence networks. The fault currents of fault
node f in Figs. 7(a) to 7(c) can be expressed respectively as
U f (k )  U f (k )
If (k )  If (k )  I0(f k )  (12)
Z ff  Z ff  Z 0ff  3z f  2Z1 0

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(Zff  Z0ff  3zf  2Zff0 )U f (k)  (Z0ff  3zf  Z2 0 )U f (k) phase-ground fault and minimum phase-to-phase voltage for
If (k)  
ff ff
0
ff

(Z  Z  3zf  2Z )(Z  Z  3zf  2Z )  (Z  3zf  Z )
0
ff
0
ff
0
ff
0
ff
0 2
2
the other faults); and Ta, Tb, UTa, and UTb are the parameters of
If (k ) (Z ff  Z2 0  2Z ff0 )  U f (k ) U f (k ) 0(k )
the LVRT examination curve. According to tri|Sj-1 of IIDGs in
If (k )  , If  If (k )  If (k ) (13) the set of Sj-1, the next trip time is
Z ff  Z2 0  2Z ff0
tj1 min(tri | Sj1) min(tri | Sj2), min(tri | Sj1)  min(tri | Sj2)
U f (k) U f (k) tj   , i Sj1  (18)
I(k)
I (k)
 (14) tj1 , min(tri | Sj1)  min(tri | Sj2)
  
Z  Z  z f  2Z
f f
ff ff ff

The IIDGs that need to be cut should meet tri|Sj-1=min(tri|Sj-1)

where Z1+-0=Zff+-+Zff+0+Zff-0, Z2+-0=Zff+--Zff+0-Zff-0. Given that and iSj-1. Sj is then updated for the next step. Fig. 8 shows
the injected current in the fault network is only from the fault examination voltages Urx and Ury of the x-th IIDG and y-th
point, the fault components of node voltages U （k） and U （k） IIDGs. Two IIDGs were disconnected at tj-1 and tj successively
during the k-th iteration step are provided by because they exceeded the ride-through regions.
T
 Z1f  Zif  Znf Z1f  Zif  Znf  If (k) 
U （k）          (k) 
  （k）  Z1 f  Zif  Znf Z1 f  Zif  Znf  If   (15)
U  Z0  Z0  Z0 Z0  Z0  Z0  I0(k) 
 1f if nf 1f if nf   f 

By using (11) and (15), the node voltages in the k-th

iteration step are U （k） U （k） U （k） , U （k） U （k） U （k） .
According to Fig. 6, the sequence components of the terminal
voltage of i-th IIDG can be written as

Us+（ k）
 Ui+（k） Isi (k 1) 
  （k）    （k）  ZTi  (k 1)   (16)
i

Usi  Ui  Isi 

Fig. 8. Ride-through time sequence of multi-IIDG.
Pi* and Qi* of the i-th IIDG at the k-th iteration step can be
calculated by substituting U s+（i k） and Us（i k） into (4) and (5). The disconnection of several IIDGs (the x-th IIDG in Fig. 9)
Short-circuit current Is+（i k） and Is（i k） of the i-th IIDG can be when the set changes from Sj-2 to Sj-1 may result in min(tri|Sj-
obtained from (6) and (7). Equation (11) is then utilized for the 1)min(tri|Sj-2). In Fig. 9, the trip action of the x-th IIDG at tj-1
next iteration step calculation, and the above steps are repeated leads to the instantaneous disconnection of the y-th IIDG that
until the results meet the accuracy requirement. closely connects to the x-th IIDG. The trip at tj should be
merged into that at tj-1, namely, Sj-1=Sj. Then, the examination
C. Ride-Through Time Sequence voltages and ride-through times of IIDGs in Sj-1 are calculated
When a short circuit fault occurs in a multi-IIDG system, in the new combination. The set of the next step is updated.
several IIDGs are disconnected according to the LVRT
requirements. Then, the terminal voltages of ride-through
IIDGs connected to the grid change. The ride-through time
sequence of IIDGs and the combination of ride-through IIDGs
at different fault periods should be determined for the short
circuit calculation. We assume that tj (t0=0) is the time at the j-
th trip action, and Sj is the combination of ride-through IIDGs
after the j-th trip action (S0 includes m IIDGs).
The combination of ride-through IIDGs is Sj-1 during the
period from tj-1 to tj. The examination (phase-to-ground and
phase-to-phase) voltages of the ride-through IIDGs can be
obtained by symmetry transformation. From Fig. 8, the ride-
through time of the i-th IIDG during tj-1 and tj is
Fig. 9. Cascading trip of IIDGs during a grid fault.
 0 , Uri | Sj1 UTa
 The short-circuit currents and examination voltages of the
 Tb Ta multi-IIDG system during tj to tj+1 can be obtained according to
tri | Sj1  Ta  (Uri | Sj1 UTa ), UTa Uri | Sj1 UTb , i Sj1 (17)
 UTb UTa the set of ride-through IIDGs Sj after j-th trip action. Then the
  , Uri | Sj1 UTb
 next calculations are implemented for the ride-through time
sequence and short-circuit current. The flow chart of the
where |Sj-1 means that only the IIDGs in the group of Sj-1 proposed short circuit calculation method for a multi-IIDG
operate connected to the grid; Uri is the examination voltage of system when a fault occurs at node f is shown in Fig. 10. Node
the i-th IIDG (minimum phase-to-ground voltage for single- matrices Z+, Z-, and Z0 of pre-fault positive, negative, and zero

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sequence networks and their coupled impedance matrices Z+-, test feeder [27] which represents a highly unbalanced feeder
Z+0, Z-+, Z-0, Z0+, and Z0- are calculated by integrating the including single-phase lines, two-phase lines and three-phase
models of the line, source, transformer, and load (modeled as lines with different mutual impedances between phases. The
the equivalent impedance) in [17, 24] and (8) to (10). The feeder is modified by adding 4 identical IIDGs on the main
combination of ride-through IIDGs (Sj) should be modified feeder, and each one has a capacity of 200 kW. Since the
during each j-th step of the iteration. small-capacity IIDGs are connected to the feeder serving a
mixed set of loads, the load current will contribute to the short-
circuit current (especially for a resistance grounding fault).
Therefore, the loads are represented by the equivalent
impedances to verify the proposed method.
A. Case 1: Balanced Distribution System
The balanced test system is shown in Fig. 11. The short-
Is+（
i
k -1）
Isi+（0） Is（
i
k -1）  （0）
I si circuit currents and examination voltages when a single-phase-
to-ground fault occurs at node 6 are shown in Fig. 12(a). The
U （k） U （k） I f ( k ) I f ( k ) control parameters P0i* = 0.8pu, Q0i* = 0.6pu, i = 1, i = 1, and
I 0f ( k )
kqi = 1 are similar for each IIDG. The short-circuit currents
U （k） U （k） increase to a steady value according to the power reference and
U （k） U （k）
voltage during a fault. The analytical trip times of IIDG3,
U s（
+ k）
i U s（
 k）
i
IIDG2, and IIDG1 are 1.718, 1.733, and 1.952 s. The
analytical results of trip times agree with the simulation results.
Is+（
i
k）
Is（
i
k）
The trip of IIDG decreases the voltages of the other ride-
through units because the fault point is at the end of the feeder.
Is+（
i
k）  +（k 1）
I si Is（
i
k）

Is（
i
k 1）

k）  
Is+i Is+（
i I si Is（
i
k）  +
Us i U s（
+ k）
i
U si U s（
 k）
i

U s+i U si
Fig. 11. Single-line diagram of a balanced distribution system.

1.8
1.6 Simulation Is1+ Is3+ Analytical Is1+ Is3+
Is+i Isi Is2+ Is4+ Is2+ Is4+
1.2
Is+/pu

0.8

0.4

0
0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7
t/s
0.8
Simulation Is1-
Is3- Analytical Is1- Is3-
0.6 Is2- Is4- Is2 - Is4-
Fig. 10. Flowchart of the developed short circuit calculation method.
Is-/pu

0.4
V. TEST RESULTS
The proposed method is applied to balanced and unbalanced 0.2

distribution networks with multi-IIDG. The results obtained 0

from the proposed method are verified by simulation with 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7
t/s
PSCAD/ EMTDC. The model of IIDGs is from [11]. The 1.4
Ur1 Ur3 Ur1 Ur3
system parameters are shown in the Appendix. 1.2 Simulation
Ur2 Ur4
Analytical
Ur2 Ur4
Case 1: A typical 24.9kV balanced distribution system with 1
Ur/pu

4 feeders and 48MW IIDGs is analyzed. The capacity of each 0.8 Ur=0.9pu
IIDG is 2 MW, and the rated voltage is 0.69 kV. We assume 0.6
that 4 identical IIDGs connect to the grid by a transformer at 0.4
each node. The short-circuit current is significantly larger than 0.2
0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7
the current of local loads because of the high installed capacity t/s
of IIDGs, so the impact of loads can be ignored in the case. (a)
Case 2: The unbalanced system is a modified IEEE 13-node

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2 and IIDG2 are disconnected at the same time (the analytical

Simulation Is1+ Is3+ Analytical Is1+ Is3+
1.6 Is2+ Is4+ Is2+ Is4+ trip time t = 2.142s). Zero-sequence voltage and current exist
1.2 in the neutral-grounded system when a grounded fault occurs.
Is+/pu

Given the current control of IIDGs, their short-circuit currents

0.8
do not include zero-sequence component. The negative-
0.4 sequence voltages of IIDG1 and IIDG2 are smaller than that of
0
0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7
IIDG3 and IIDG4 after the fault, which is affected by the
t/s unbalanced line and load conditions. And the negative-
1.2 sequence currents of IIDG3 and IIDG4 are larger than that of
Simulation Is1- Is3- Analytical Is1- Is3-
1 the others, while their positive-currents are slightly lower than
Is2- Is4- Is2- Is4-
0.8 that of IIDG1 and IIDG2. The maximum relative error of the
Is-/pu

0.6 positive- and negative-sequence short circuit-currents is 4.76%.

0.4
0.2
0
0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7
t/s
1.4
Simulation Ur1 Ur3Analytical Ur1 Ur3
1.2 Ur2 Ur4 Ur2 Ur4
1
Ur/pu

0.8
Ur=0.9pu
0.6
0.4
0.2 Fig. 13. Single-line diagram of an unbalanced distribution system.
0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7
t/s 2
(b) Simulation Is1+ Is3+ Analytical Is1+ Is3+
1.6 Is2+ Is4+ Is2+ Is4+
Fig. 12. Short-circuit current and examination voltage of IIDGs: (a) single-
1.2
Is+/pu

phase-to-ground fault at node 6 and (b) two-phase-to-ground fault at node 6.

0.8
Although the trip actions lead to a slight decay in the
0.4
terminal voltage of IIDG4, IIDG4 continues to ride through the
fault. When the fault is cleared at t = 2.5 s, the connected 0
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7 2.9
IIDGs return to normal operation. Given the small electrical t/s
1.2 -
Is3- Analytical Is1- Is3-
distance between IIDG2 and IIDG3, the deviation between Simulation Is1
1 Is2- Is4- Is2 - Is4-
their trip times is small. Adjusting the electrical distance
0.8
between two units adequately may lead a cascading trip. Fig.
Is-/pu

0.6
12(b) shows the short-circuit currents and voltages when a
two-phase-to-ground fault occurs at node 6. The voltage sag is 0.4
more serious than that of a single-phase-to-ground fault. The 0.2
analytical results reveal that IIDG3, IIDG2, IIDG1, and IIDG4 0
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7 2.9
are disconnected from the grid successively at t = 1.251, 1.313, t/s
1.4
1.715, and 2.385 s. The change times of the short-circuit Simulation Ur1 Ur3 Ur1 Ur3
1.2 Analytical
current of IIDGs are similar to those in the simulation. Ur2 Ur4 Ur2 Ur4
1
Ur/pu

B. Case 2: Unbalanced Distribution System 0.8 Ur=0.9pu

The IEEE 13-node test feeder is shown in Fig. 13 where 0.6
node 684 is a two-phase node of phases A and C, and node 611 0.4
is a single-phase node of phase C. Fig. 14 shows the short- 0.2
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7 2.9
circuit currents and examination voltages when a two-phase- t/s
to-ground fault occurs at node 684 and a single-phase-to- (a)
2 Is1+ Is3+ Analytical Is1+ Is3+
ground with 1.5Ω fault resistance occurs at node 611. The Simulation
1.6 Is2+ Is4+ Is2+ Is4+
IIDGs have the same control parameters (P0i* = 0.8pu, Q0i* =
0.6pu, i = 1, i = 1, and kqi = 1). The analytical trip time of 1.2
Is+/pu

IIDG3 is 1.089s, and then IIDG4 is disconnected after the trip 0.8
action of IIDG3 in Fig. 14(a). The trip time of IIDG3
0.4
simulated by PSCAD/EMTDC is 1.1 s, which is approximately
equal to that of the analytical method. 0
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7 2.9
Given the large electric distance from the fault node, IIDG1 t/s

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This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI
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0.5 Is1- Is3- Analytical Is1- Is3- VII. REFERENCES

Simulation
Is2- Is4- Is2 - Is4-
0.4 [1] N. Nimpitiwan, G. T. Heydt, R. Ayyanar, and S. Suryanarayanan, “Fault
current contribution from synchronous machine and inverter based
0.3
Is-/pu

distributed generators,” IEEE Trans. Power Del., vol. 22, no. 1, pp. 634–
0.2 641, Jan. 2007.
[2] J. M. Guerrero, F. Blaabjerg, T. Zhelev, K. Hemmes, E. Monmasson, S.
0.1 Jemei, M. P. Comech, R. Granadino, and J. I. Frau, “Distributed
generation: Toward a new energy paradigm,” IEEE Ind. Electron. Mag.,
0 vol. 4, no. 1, pp. 52–64, Mar. 2010.
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7 2.9
t/s [3] S. D. G. Jayasinghe, D. M. Vilathgamuwa, and U. K. Madawala, “Direct
1.4 integration of battery energy storage systems in distributed power
Simulation Ur1 Ur3 Ur1 Ur3
1.2 Ur2 Ur4
Analytical
Ur2 Ur4
generation,” IEEE Trans. Energy Convers., vol. 26, no. 2, pp. 677–685,
Jun. 2011.
1
[4] A. Yazdani, and R. Iravani, Voltage-Sourced Converters in Power
Ur/pu

0.8 Systems. New York: Wiley, 2010.

0.6 Ur=0.9pu
0.4
0.2
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7 2.9
t/s
(b)
Fig. 14. Short-circuit current and examination voltage of IIDGs: (a) two-phase-
to-ground fault at node 684 and (b) single-phase-to-ground fault with fault
resistance at node 611.
The analytical trip times of IIDG3 and IIDG4 (disconnect at
the same time) is 2.441s in Fig. 14(b). Different ride-through
times of IIDGs during a fault will affect the short-circuit
current and voltage, and even change the ride-through times of
the other connected units. IIDG1 and IIDG2 continue riding
through the grid fault with fault resistance because their
terminal voltages are still higher than 0.9pu after the trip action
of IIDG3 and IIDG4. When the contribution of loads after the
fault is taken into account, the sequence voltages of IIDGs
become diminished, and their short-circuit currents will be
increased, which is especially noticeable for the fault with high
fault resistance. When the fault is cleared at t = 2.7s, IIDG1
and IIDG2 resume to normal operation. The current injection
of IIDGs in different fault periods depends on the combination
of the ride-through IIDGs and their control strategy, and it will
change the short-circuit current through the protection devices.
VI. CONCLUSION
A method to calculate the short-circuit current of a multi-
IIDG system was developed. The short-circuit current of IIDG
was formulated based on sequence current control and reactive
power support during a grid fault. The mutual coupling of the
sequence networks of an unbalanced distribution grid can be
addressed by using the proposed technique. This research
posits that the negative-sequence current injection from IIDG
should be considered aside from the reactive power support
and inverter capacity constraint during an asymmetrical fault.
The proposed method was verified by simulation. The result
shows that IIDGs are disconnected one by one according to
their ride-through time after a grid fault. The short-circuit
current (through the protection) is changed because of the
output currents of connected IIDGs. The method can provide
abundant information for engineers to better understand the
fault responses of IIDGs and design an improved protection for
the stable operation of distribution networks.
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This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI
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VIII. APPENDIX
A. System Parameters of Balanced Distribution System
1) The IIDGs have the same parameters as follows:
a) Pn = 2 MW, Un = 0.69 kV, fn = 50 Hz;
b) Lf = 0.12 mH, Cf = 700 F;
c) Udcn = 1.5 kV.
2) Transformers T1, T2, T3, and T4 have the same
parameters as follows:
a) Sn = 10 MVA, VI/VII (Yn/  ) = 24.9/0.69 kV;
b) XT = 0.06 p.u., RT = 0.03 p.u.
3) The parameters of the substation are as follows:
a) En = 24.9 kV, Es = 1 p.u.;
b) Short circuit level = 240 MVA, X/R = 10.
4) The line lengths and impedance (per km) are
a) L1 = L2 = 6 km, L3 = L4 = 1 km, and L5 = 14 km;
b) The self-impedance per phase is ZLs=j0.783Ω/km, and
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10
the mutual impedance between phases is ZLm=j0.313Ω/km.
B. System Parameters of Unbalanced Distribution System
The network, load and substation parameters are based on
typical data supplied in [27].
1) The IIDGs have the same parameters as follows:
a) Pn = 200 kW, Un = 0.69 kV, fn = 50 Hz;
b) Lf = 1.1 mH, Cf = 130 F;
c) Udcn = 1 kV.
2) The step-up transformers of IIDGs have the same
parameters as follows:
a) Sn = 600 kVA, VI/VII (Yn/  ) = 4.16/0.69 kV;
b) XT = 0.06 p.u., RT = 0.03 p.u.
IX. BIOGRAPHIES
Qianggang Wang (S’13) received his B.S. degree from Chongqing University,
Chongqing, China, in 2009. He is currently pursuing his Ph.D. degree at
Chongqing University, Chongqing, China. His research interests include power
system operation, microgrids, and power quality.
Niancheng Zhou received his B.S., M.S., and Ph.D. degrees from Chongqing
University, Chongqing, China, in 1991, 1994, and 1997, respectively. He
worked at Chongqing Kuayue Technology Co., Ltd. from 1997 to 2003. He is a
professor at the College of Electrical Engineering, Chongqing University,
China. He was a research fellow of Nanyang Technological University,
Singapore, from 2010 to 2011. His research interests include the analysis and
operation of power systems, microgrids, and power quality.
Ling Ye received her B.S. degree from Chongqing University, Chongqing,
China, in 2013. She is currently pursuing her M.S. degree at Chongqing
University, Chongqing, China. Her research interests include power system
operation and power quality.