Shot Test: Fault Type L1-E

|Z| Phi % % of t nom t act. Dev. ITest Result

1.121 Ω 70.00 ° n/a 535.0 ms 537.0 ms 0.3811 % 1.631 A Passed
621.1 mΩ 60.00 ° n/a 535.0 ms 542.9 ms 1.479 % 1.631 A Passed

-1
-0
X0/Ω
1 .0
.5 -1500 -1000 -500 0 500 1000 R/mΩ
Shot Test: Fault Type L2-E

|Z| Phi % % of t nom t act. Dev. ITest Result

1.130 Ω 60.00 ° n/a 535.0 ms 536.9 ms 0.3556 % 1.631 A Passed
481.4 mΩ -150.00 ° n/a 535.0 ms 544.8 ms 1.83 % 1.631 A Passed
 -1
-0
X0/Ω
1 .0
.5 -1500 -1000 -500 0 500 1000 R/mΩ
Shot Test: Fault Type L3-E

|Z| Phi % % of t nom t act. Dev. ITest Result

845.4 mΩ 110.00 ° n/a 535.0 ms 541.8 ms 1.274 % 1.631 A Passed
597.0 mΩ -60.00 ° n/a 535.0 ms 535.6 ms 0.1184 % 1.631 A Passed

-1
-0
X0/Ω
1 .0
.5 -1500 -1000 -500 0 500 1000 R/mΩ
Shot Test: Fault Type L1-L2

|Z| Phi % % of t nom t act. Dev. ITest Result

671.4 mΩ 120.00 ° n/a 535.0 ms 541.9 ms 1.288 % 1.631 A Passed

-1
-0
X0/Ω
1 .0
.5 -1500 -1000 -500 0 500 1000 R/mΩ
Shot Test: Fault Type L2-L3

|Z| Phi % % of t nom t act. Dev. ITest Result

509.9 mΩ 50.00 ° n/a 535.0 ms 540.4 ms 1.009 % 1.631 A Passed
 -1
-0
X0/Ω
1 .0
.5 -1500 -1000 -500 0 500 1000 R/mΩ
Shot Test: Fault Type L3-L1

|Z| Phi % % of t nom t act. Dev. ITest Result

1.544 Ω 60.00 ° n/a no trip no trip n/a 1.631 A Passed
1.000 Ω 80.00 ° n/a 535.0 ms 529.4 ms -1.05 % 1.631 A Passed
1.000 Ω -80.00 ° n/a 535.0 ms 536.8 ms 0.3291 % 1.631 A Passed
679.5 mΩ -140.00 ° n/a 535.0 ms 540.7 ms 1.073 % 1.631 A Passed
 -1
-0
X0/Ω
1 .0
.5 -1500 -1000 -500 0 500 1000 R/mΩ
Shot Test: Fault Type L1-L2-L3

|Z| Phi % % of t nom t act. Dev. ITest Result

1.467 Ω 70.00 ° n/a 535.0 ms 532.4 ms -0.4938 % 1.631 A Passed
1.148 Ω 120.00 ° n/a 535.0 ms 540.2 ms 0.9749 % 1.631 A Passed
443.1 mΩ -50.00 ° n/a 535.0 ms 535.6 ms 0.1111 % 1.631 A Passed
529.8 mΩ -150.00 ° n/a 535.0 ms 537.7 ms 0.5081 % 1.631 A Passed
1.405 Ω -70.00 ° n/a 535.0 ms 537.7 ms 0.5032 % 1.631 A Passed
. -0
-1
X0/Ω
1 .0
.5 -1500 -1000 -500 0 500 1000 R/mΩ
.
Test State:
Test passed
Test performed offline: Test results are simulated!