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A comparative study of Spark Plasma Sintering (SPS), Hot Isostatic Pressing (HIP)
and microwaves sintering techniques on p-type Bi2Te3 thermoelectric properties
G. Delaizir a,*, G. Bernard-Granger b, J. Monnier a, R. Grodzki a, O. Kim-Hak c, P.-D. Szkutnik b, M. Soulier b,
S. Saunier c, D. Goeuriot c, O. Rouleau a, J. Simon b, C. Godart a, C. Navone b
a
Institut de Chimie et des Matériaux Paris Est (ICMPE-CNRS), UMR 7182, 2 rue Henri Dunant, 94320 Thiais, France
b
Laboratoire des Composants pour la Récupération d’Energie, CEA/LITEN/LCRE, 17 rue des Martyrs, 38054 Grenoble, France
c
Centre Sciences des Matériaux et des Structures, de l’Ecole Nationale des Mines de Saint-Etienne, 158 Cours Fauriel, 42023 Saint-Etienne, France
A R T I C L E I N F O A B S T R A C T
Article history: The sintering of a synthesized p-type Bi2Te3 nano-powder has been investigated by three different
Received 28 July 2011 techniques. Sintering techniques such as Hot Isostatic Pressing (HIP), microwave sintering and Spark
Received in revised form 1 March 2012 Plasma Sintering (SPS) also known as electric field-assisted sintering technique (FAST) have been
Accepted 12 April 2012
compared in terms of sintering parameters i.e. temperature, pressure, and power, microstructure and
Available online 23 April 2012
thermoelectric properties of the prepared ceramics. This study demonstrates that the highest figure of
merit ZT has been obtained using microwaves or SPS techniques. Ceramics observations reveal
Keywords:
differences in microstructure as well as the presence of intra-granular precipitates in the pellets sintered
A. Ceramics
by the three techniques. We finally conclude about the relationship between properties and
D. Microstructure
D. Thermal conductivity microstructure to get optimum thermoelectric materials.
D. Electrical properties ß 2012 Elsevier Ltd. All rights reserved.
0025-5408/$ – see front matter ß 2012 Elsevier Ltd. All rights reserved.
http://dx.doi.org/10.1016/j.materresbull.2012.04.019
G. Delaizir et al. / Materials Research Bulletin 47 (2012) 1954–1960 1955
sintering techniques in terms of microstructure and thermoelectric Scanning Electron Microscopy (SEM FEG, LEO 1530 equipped with
properties. Like the SPS, this technique is also currently used in Energy-dispersive X-ray spectroscopy, EDX) and Transmission
industrial process. Electron Microscopy (MET, JEOL 2000Fx) operated at 200 kV. X-Ray
Diffraction (XRD) was performed using a D8 Bruker equipment.
2. Experimental
2.3.1. Harman method
2.1. Powder synthesis Usually ZT is determined thanks to individual measurements of
the Seebeck coefficient S, the electrical conductivity s and the
p-Type bismuth telluride (Bi0.49Te3Sb1.51) is synthesized by thermal conductivity l. The Harman method allows measuring
mechanical alloying (MA) in a planetary ball milling equipment directly ZT without these three factors with only one measurement,
using appropriate amount of high purity antimony (Alfa, 99.999%), in adiabatic conditions, from resistivity measurements in alternative
bismuth (Sigma–Aldrich, 99.999%) ant tellurium (Sigma–Aldrich, and direct currents as described as follows. When a direct current is
99.999%) powders. Powders were charged into a hardened steel applied to a thermoelectric material, Peltier effect is established:
vial with a ball-to-powder weight ratio of 20:1 and sealed in an Qp = S T idc (Qp: heat exchange between the ends of
argon atmosphere to prevent the oxidation during MA process. The material, idc: direct current). In adiabatic conditions, heat exchange
central shaft rotation rate was as high as 400 rpm during 9 h:30. by diffusion (Qd) is compensated by heat transported by Peltier
effect: Qp + Qd = 0 (with Qd = l Surf Dl/l; Surf: section of
2.2. Sintering techniques sample, l: length of sample). So we have:
Table 1
Physical characterizations of the p-type Bi2Te3 ceramics processed by SPS, HIP and microwaves.
Sintering Compactness Electrical Seebeck Charge Mobility Power factor Thermal ZTc Concentration of
technique conductivity coefficient carriers (cm2/Vs) (W/mK2)b conductivity precipitates
(S/m)a (mV/K)a (cm3) (W/mK)a (precip./nm2)a
SPS 99% 60,600 221 1.5E+19 257 2.96E3 1.29 0.68 3.1 105
HIP 97% 156,000 160 5.0E+19 194 4.0E3 2.06 0.53 1.2 105
Microwaves 90.5% 49,600 230 2.3E+19 133 2.62E3 1.06 0.74 1.6 105
a
Standard deviation over estimated to 3%.
b
Standard deviation over estimated to 8%.
c
Standard deviation over estimated to 10%.
Fig. 2. SEM photographs of initial p-type Bi2Te3 powder (a), at higher magnification (b).
G. Delaizir et al. / Materials Research Bulletin 47 (2012) 1954–1960 1957
p--type
carriers concentration (at.cm-3)
HIP
CIC
not the creation of vacancies or anti-site defects [17] by the
4,00E+19 µonde
creation of a second phase and the evaporation of tellurium during
2,00E+19 sintering. To explain this behavior, different p-type materials
(Bi1xSbxTe3 with 0.9 x 1.7) have been studied. Fig. 3 shows
0,00E+00
0,5 0,7 0,9 1,1 1,3 1,5 1,7 1,9 the evolution of charge carrier concentration as a function of x for
-2,00E+19 the three different techniques (SPS, HIP, microwaves). The
evolution is linear in the case of the SPS sample. The amount of
n-type
-4,00E+19
antimony in the alloy is directly linked to the charge carrier
-6,00E+19 concentration (creation of positive charge carrier). However for x
-8,00E+19 less than 1.3, the material still remains n-type (the number of
x in Bi1-xSbxTe3 holes created does not compensate the number of electrons in the
material). The SPS technique is well known to allow short
Fig. 3. Evolution of the charge carrier concentration as a function of x in Bi1xSbxTe3
sintering time and lower sintering temperature in comparison
for the three sintering techniques (SPS, HIP and microwaves).
Fig. 4. SEM photographs of ceramics processed by SPS (a and b), HIP (c and d) and microwaves (e and f).
1958 G. Delaizir et al. / Materials Research Bulletin 47 (2012) 1954–1960
with conventional techniques. These conditions can prevent the occupation of Te sites with Bi and Sb atoms, which can be described
evaporation of tellurium from the material during the sintering. as follows [18]:
This directly affects the charge carrier concentration and, as a
consequence, we observe a linear relationship between the Bi2 Te3 ¼ 2BiTe= þ 2V Bi þ V Te þ 32Te2ðgÞ þ 2 h
amount of antimony, x, and the charge carrier concentration.
In the case of the HIP sample, the alloys Bi1xSbxTe3 with
0.9 x 1.7 are always p-type materials. The HIP sintering Sb2 Te3 ¼ 2SbTe= þ 2V Sb þ V Te þ 32Te2ðgÞ þ 2 h
temperature is higher than the SPS one (THIP = 480 8C and
TSPS = 360 8C) and even higher than the Bi–Te eutectic (417 8C). where VTe is Te vacancy and V Bi ðor SbÞ is Bi or Sb vacancy.
This probably induces the apparition of a second phase with Conversely, negative charge carriers seem to be favored in the
vacancies or anti-structure defects at the origin of positive charge microwave sample. This is not surprising because as previously
carriers. In p-type Bi1xSbxTe3 (or Bi2Te3–Sb2Te3) alloys, the holes mentioned; some tellurium evaporation is observed which is at the
are usually created by the anti-structure defects generated by the origin of the creation of vacancies and negative charge carrier.
Fig. 5. TEM photographs of ceramics processed by SPS (a and b), HIP (c and d) and microwaves (e and f).
G. Delaizir et al. / Materials Research Bulletin 47 (2012) 1954–1960 1959
Intensity (Counts)
well for the two ceramics.
3000
The thermal conductivity, k can be divided into two compo-
nents: the lattice thermal conductivity (kL) and the electronic 2500 Te
thermal conductivity (kE). The lattice thermal conductivity kL was 2000
determined by the Wiedemann–Franz relation kL = k LsT, where C
Bi
1500 O
LsT is the electronic thermal conductivity, kE, L is the Lorentz Sb
&
number (L = 2.0 108 V2/K2 for heavily doped semi-conductor
Sb
1000 Te &
[6]), s is the electrical conductivity and T is the temperature in 500
Te