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Switching Characteristics
The Ideal
Switch The practical
Switch
4. Infinite off-state resistance, i.e., zero leakage current when in the non
conduction state
5. No limit on the operating speed of the device when it changes state, i.e., zero rise
and fall times
Typical switching waveforms for an ideal switch are shown in Figure shown below,
where isw and vsw are the current through and the voltage across the switch,
respectively, and DTs is the on time. During the switching and conduction periods,
the power loss is zero, resulting in a 100% efficiency.
Cont…
With no switching delays, an infinite operating frequency can be achieved. In
short, an ideal switch has infinite speed, unlimited power-handling capabilities,
and 100% efficiency.
It must be noted that it is not surprising to find semiconductor switching devices
that can almost, for all practical purposes, perform as ideal switches for a number
of applications.
Cont…
2. Limited switching speed that is caused by the finite turn-on and turn-off times.
This limits the maximum operating frequency of the device.
3. Finite on-state and off-state resistances, i.e., there exists forward voltage drop
when in the on-state and reverse current flow (leakage) when in the off-state.
For simplicity, DTs is shown to include the off-time and the on-time period of the
switch. Moreover, other issues such as temperature dependence, power gain, surge
capacity, and over voltage capacity must be considered for specific devices in
specific applications.
The average power dissipation, Pave, over one switching cycle is given by:
Ts
1
P ave
Ts i
0
sw v sw dt
Cont…
Cont…
Semi Conductor
Devices
• Fast Recovery
Very low trr (less than 1μs)
Power level at several hundred volts and several hundred amps
Normally used in high frequency circuit
Cont…
• Schottky
(a) The junction if carriers did not (b) Equilibrium distribution of ionised
diffuse: + ionised donors,- ionised impurities and free carriers
acceptors, + holes and - electrons
Cont…
A depletion layer, or alternatively a space charge layer (scl), is built up at the
junction as a result of diffusion caused by the large carrier concentration
gradients. The holes diffuse from the p-side into the n-side while electrons
diffuse from the n side to the p-side, as shown in figure below
Electron and hole movements: ---- diffusion flows, ─── drift flows
The n-side, losing electrons, is charged positively because of the net donor charge
left behind, while the p-side conversely becomes negatively charged.
Cont…
The n-side, losing electrons, is charged positively because of the net donor charge
left behind, while the p-side conversely becomes negatively charged. An electric
potential barrier, ξ, builds up, creating a drift current which opposes the diffusion
flow, both of which balance at thermo dynamic equilibrium
There are no free carriers in the scl. The zero external bias, built-in, junction
potential or scl potential is given by
KT j NAND
φ ln
q n 12
where q is the electron charge, 1.6 x 10 -19 C
k is Boltzmann’s constant, 1.38 x 10-23 J/K
Tj is the junction temperature, K.
Thus
ϕ = = kT /q j = 0.0259 eV at room temperature, 300 K
Cont…
The pn junction under forward bias (steady-state)
If the p-region is externally positively-biased with respect to the n-region as
shown in figure below the depletion region become narrow and current flows
freely.
The emf positive potential supplies holes to the p-region, while the negative emf
potential provides electrons to the n-region. The carriers both combine, but are
continuously replenished from the emf source. A large emf source current flows
through the diode, which is termed forward-biased
Cont…
The pn junction under reverse bias (steady-state)
If a bias voltage is applied across the p and n regions as shown in figure below,
With the p-terminal negative with respect to the n-terminal, then the scl widens.
This is because electrons in the n-region are attracted to the positive external emf
source while holes in the p-region are attracted to the negative emf potential. As
the scl widens, the peak electric field ξm at the junction increases.
The only current that flows is the small leakage current which is due to carriers
generated in the scl or minority carriers which diffuse to the junction and are
collected. The junction is termed reverse-biased
Cont…
The first bipolar transistors were mainly pnp, and were fabricated by alloying
techniques and employed germanium semiconductor materials. Most transistors
are now npn, made of silicon, and utilise selective diffusion and oxide masking.
The n+ region which serves as the source of injected electrons is called the
emitter and forms the emitter junction with the p-base, while the n-region into
which electrons are swept by the reverse bias np junction is called the collector
and, with the p-base, forms the collector junction
Cont…
ic ic α
β
ib ie ic 1 α
The factor β, relating the collector current to the base current, is defined as the
base-to-collector current amplification factor
If α is near unity, β is large, implying the base current is small compared with the
collector current.
Consequently, the collector emitter voltage Vce(sat) is less than the base to emitter
voltage Vbe(sat). The voltage breakdown phenomenon is of particular importance
to the high-voltage, power-switching BJT, and is due to the characteristics of the
device structure and geometry.
Cont…
BJT Protection
Transistors must be protected against high currents and voltages to prevent
damage to the device. Since they are able to absorb very little energy before
breakdown, semiconductor fuses cannot protect them.
Thermal conditions are vitally important and can occur during high-frequency
switching. Some of the most common types of BJT protection are over current and
overvoltage protection. Electronic protection techniques are also frequently used
to provide needed protection for transistors.
Over current protection turns the transistor OFF when the collector–emitter
voltage and collector current reach a preset value.
Since the BJT has a negative temperature coefficient, the increase in temperature
causes a decrease in resistance and results in an even higher collector current.
One such method of over current protection limits the base current during an
external fault. With the base current limited, the device current will be limited at
the saturation point, with respect to the base current, and the device will hold
some value of the voltage.
A good base drive circuit must satisfy the following general requirements.
They have unique features that make them potentially attractive for switching
applications.
Although in steady state the gate draws virtually no current, this is not so under
transient conditions. The gate-to-source and gate-to-drain capacitances have to be
charged and discharged appropriately to obtain the desired switching speed, and
the drive circuit must have a sufficiently low output impedance to supply the
required charging and discharging currents.
Cont…
The circuit symbol of a power MOSFET is shown in figure below.
Power MOSFETs are majority carrier devices, and there is no minority carrier
storage time. Hence, they have exceptionally fast rise and fall times. They are
essentially resistive devices when turned on, while bipolar transistors present a
more or less constant VCE(sat) over the normal operating range.
Cont…
Power dissipation in MOSFETs is Id2RDS(on), and in bipolars it is ICVCE(sat). At low
currents, therefore, a power MOSFET may have a lower conduction loss than a
comparable bipolar device, but at higher currents, the conduction loss will exceed
that of bipolars. Also, the RDS(on) increases with temperature.
An important feature of a power MOSFET is the absence of a secondary
breakdown effect, which is present in a bipolar transistor, and as a result, it has an
extremely rugged switching performance.
In MOSFETs, RDS(on) increases with temperature, and thus the current is
automatically diverted away from the hot spot. The drain body junction appears
as an antiparallel diode between source and drain.
Thus, power MOSFETs will not support voltage in the reverse direction. Although
this inverse diode is relatively fast, it is slow by comparison with the MOSFET.
Recent devices have the diode recovery time as low as 100 ns. Since MOSFETs
cannot be protected by fuses, an electronic protection technique has to be used.
GATE DRIVE CIRCUITS FOR MOSFET
MOSFETs can switch much faster than BJTs. They are becoming popular now for
low power applications.
The drive power requirement for a MOSFET is much less than that of a BJT.
The GTO is a power semiconductor switch that turns ON by a positive gate signal.
It can be turned OFF by a negative gate signal. The GTO symbol is shown in
Figure below.
The name thyristor is a generic term for a bipolar semiconductor device which
comprises four semiconductor layers and operates as a switch having a latched on
state and a stable off-state.
Numerous members of the thyristor family exist. The simplest structurally is the
silicon-controlled rectifier (SCR) while the most complicated is the triac.
The silicon-controlled rectifier (SCR)
The basic SCR structure and doping profile in figure shown below depicts the
SCR as three pn junctions J1, J2, and J3 in series. The contact electrode to the
outer p-layer is called the anode and that to the outer n-layer is termed the
cathode. With a gate contact to the inner p-region, the resultant three-terminal
thyristor device is technically called the silicon-controlled rectifier (SCR).
Cont…
The anode and cathode would both be expected to be good emitters of minority
carriers into the n2 and p1 regions respectively because of their relative high
concentrations with respect to their injected regions.
The n2 region is very wide, typically hundreds of micrometres, and low
concentration, typically less than 1014 /cc. Even though the hole lifetime may be
very long, 100µs, the base transport factor for hole minority carriers, bt-n2 is
low. The low-concentration provides high forward and reverse blocking
capability and the associated reverse-biased scl’s penetrate deeply into the n2
region.
The two-transistor model of the SCR shown in figure below can be used to
represent the p2-n2-pl-nl structure and explain its characteristics. Transistor T1
is an npn BJT formed from regions n2-pl-nl while T2 is a pnp BJT formed from
SCR regions p2-n2-pl.
Cont…
SCR turn-on
the collector current of the npn transistor provides the base current for the pnp
transistor. Also, the collector current of the pnp transistor along with any gate
current IG supplies the base drive for the npn transistor. Thus a regenerative
situation occurs when the loop gain exceeds unity. The base current of the pnp
transistor T2 with dc current gain α2 is which is supplied by the collector of the
npn transistor. The current Ico is the collector junction reverse bias leakage
current. The collector current of the npn transistor T1 with a dc current gain of
α1 is given by
Ib2 1 α 2 IA Ico2
which is supplied by the collector of the npn transistor. The current Ico is the
collector junction reverse bias leakage current. The collector current of the npn
transistor T1 with a dc current gain of α1 is given by
I c 1 1 I k I co 1
Cont…
1 α 2 I A I co2 α 1 I k I co1
Since IK IA IG
GTO frequency limitations and the need for an external parallel connected
capacitive turn-off snubber (to limit re-applied dv/dt), have motivated its
enhancement, resulting in the gate commutated thyristor, GCT.
The SCR on-state regenerative mechanism is avoided at both turn-off and turn on
switching transitions thereby yielding a device more robust than the GTO.
As with the GTO, an inductive series turn-on snubber is still required to cope with
the initial high di/dt current.
The GCT switch is thermally limited, rather than frequency limited as with the
conventional GTO. Electron irradiation trades on state voltage against switching
performance.
The light triggered thyristor (LTT)
The light triggered thyristor is series connected in HVDC applications. Five inch
wafers offer 8kV ratings with onstate voltages of 2.3V at 3000A, with surge ratings
of up to 63kA.
Turn-off time is 350µs, and turn-on requires about 40mW of light power for 10 µs,
with a half microsecond rise time.
Because of this low turn-on energy, multiple cascaded amplifying gates are
integrated to achieve modest initial current rises limited to 300A/µs. Reapplied
voltages are limited to 3500V/µs.
The triac
The triac is a thyristor device that can switch current in either direction by
applying a low-power trigger pulse of either polarity between the gate and main
terminal.
The main terminal I-V characteristics, device symbol, and four trigger modes for
the triac are shown in figure below.
Cont…
The MCT has a thyristor type structure with three junctions and pnpn layers
between the anode and cathode.
The advantage of an MCT over IGBT is its low forward voltage drop. n-type
MCTs will be expected to have a similar forward voltage drop, but with an
improved reverse bias safe operating area and switching speed. MCTs have
relatively low switching times and storage time.
The MCT is capable of high current densities and blocking voltages in both
directions. Since the power gain of an MCT is extremely high, it could be driven
directly from logic gates.
Cont…
An MCT has high di/dt (of the order of 2500 A/µs) and high dv/dt (of the order of
20,000 V/µs) capability.