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⁕ The finite width of slits is the basis for understanding Fraunhofer diffraction.
⁕ According to Huygens’s principle, each portion of the slit acts as a source of light waves.
⁕ Therefore, light from one portion of the slit can interfere with light from another portion.
⁕ The diffraction pattern is actually an interference pattern.
⁕ The different sources of light are different portions of the single slit.
SINGLE-SLIT DIFFRACTION
At point P1,
and r2 is
(a/2) sin
So the condition for first minimum,
a
sin
2 2
or a sin
This is satisfied for every pair of rays, one of which is from upper half
of the slit and the other is a corresponding ray from lower half of the
slit.
SINGLE-SLIT DIFFRACTION
Problem: 2
In P-1, what is the wavelength ’ of the light whose first
diffraction maximum (not counting the central maximum)
falls at 15o, thus coinciding with the first minimum of red
light?
172.20.10.3
SINGLE-SLIT DIFFRACTION
At point P2,
path difference between
r1 and r2 is (a/4) sin
So the condition for second minimum,
a
sin or a sin 2
4 2
This is satisfied for every pair of rays, separated by a distance a/4.
In general, the condition for m TH minima,
a sin m m 1, 2, 3, . . .
There is a secondary maximum approximately half way between
each adjacent pair of minima.
SINGLE-SLIT DIFFRACTION
Problem: E42-5
2
x sin
INTENSITY IN SINGLE – SLIT DIFFRACTION
Phasor showing
a) Central maximum
b) A direction slightly shifted
from central maximum
c) First minimum
d) First maximum beyond the
central maximum
(corresponds to N = 18)
INTENSITY IN SINGLE – SLIT DIFFRACTION
From diagram,
E 2 R sin
2
Em
Also
R
Combining,
Em
E sin
2
2
sin
Or , E Em
where
2
INTENSITY IN SINGLE – SLIT DIFFRACTION
a. Not resolved
b. Just resolved
c. Well resolved
DIFFRACTION AT A CIRCULAR APERTURE
Problem: SP42-5
Interference
Diffraction 2
sin α
I , DIF m, DIF α
Interference + Diffraction
2
sin α
I m cos 2
α
DOUBLE-SLIT INTERFERENCE AND DIFFRACTION COMBINED
Adding all the phasors, we get the resultant E 1 due to the first slit.
is the phase difference between the light waves at the point P,
emitted from bottom edge of the first slit and top edge of the
second slit. E2 is the resultant due to the second slit. E is the
resultant of E1 and E2.
DOUBLE-SLIT INTERFERENCE AND DIFFRACTION COMBINED
From the figure,
E 2E1 sin
2
where
2 2
or ( )
Also sin sin cos .........( A )
2 2 2 2
and ( d a) sin
2
a
Adding sin to both sides of above eqn, we get,
2
d sin which is
2
DOUBLE-SLIT INTERFERENCE AND DIFFRACTION COMBINED
Substituti ng this in eqn( A ), we get,
sin cos
2
From sin gle slit diffractio n, we have,
the electric amplitude at P due to one slit,
sin
E1 Em
sin
E 2E1 sin ie, E (2Em ) cos
2
2
sin
m (cos )2
DOUBLE-SLIT
SINGLE-SLIT DIFFRACTION
INTERFERENCE PATTERN
PATTERN
DOUBLE-SLIT INTERFERENCE AND DIFFRACTION COMBINED
Problem: SP42- 6
Problem: SP42- 7
2
where N is the number of slits
N
L
2 N
λ
d sin θ θ mλ
N
MINIMUM AT θ
+θ
mth PRINCIPAL
MAXIMUM AT θ
MULTIPLE SLITS
Width of the maxima: Other principal maxima
λ
d sin θ θ mλ
N
d sin cos
cos sin
m N
1
d d cos
sin m N
m d cos m N
ANGULAR HALF WIDTH OF mTH
N d cos PRINCIPAL MAXIMUM AT
mth PRINCIPAL
MAXIMUM AT θ
MULTIPLE SLITS
Problem: SP43- 1
Problem: E43-5
Grating spectrometer
Problem: SP43-2
A diffraction grating has 1.20 x 104 rulings uniformly
spaced over W= 2.50cm. It is illuminated at normal
incidence by yellow light from sodium vapor lamp which
contains two closely spaced lines of wavelengths 589.0nm
and 589.59nm. (a) At what angle will the first order
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maximum occur for the first of these wavelengths? (b)
What is the angular separation between the first order
maxima of these lines? (c) How close in wavelength can
two lines be (in first order) and still be resolved by this
grating? (d) How many rulings can a grating have and just
resolve the sodium doublet lines?
DIFFRACTION GRATINGS
Problem: E43-9
Problem: E43-11
Δθ m
D
Δλ d cos θ
To achieve higher dispersion we must use a grating of smaller
grating spacing and work in higher order m .
DISPERSION AND RESOLVING POWER
Resolving power
Ability of the grating to resolve two nearby spectral lines so that
the two Lines can be viewed or photographed as separate lines.
To resolve lines whose wavelengths are close together, the lines
should be as narrow as possible.
For two close spectral lines of wavelength 1 and 2, just
resolved by the grating, the resolving power is defined as
1 2
R 1 2
2
DISPERSION AND RESOLVING POWER
Resolving power
We have,
Δθ m
D
Δλ d cos θ N d cos
Putting second equation in first equation,
N d cos
m
d cos
R Nm
Resolving power increases with increasing N
DISPERSION AND RESOLVING POWER Intensity patterns of two close
lines due to three gratings A, B, C.
Resolving power
N = 5,000
d = 10 m
R = 5,000
D = 1.0 x 10-4 rad/m
N = 5,000
d = 5 m
R = 5,000
D = 2.0 x 10-4 rad/m
N = 10,000
d = 10 m
R = 10,000
D = 1.0 x 10-4 rad/m
DISPERSION AND RESOLVING POWER
Problem: SP43-3
x-ray diffraction
producing Laue’s
pattern
X-ray tube
X-RAY DIFFRACTION
When a monoenergetic x-ray beam is
incident on a sample of a single crystal,
diffraction occurs resulting in a pattern
consisting of an array of symmetrically
arranged diffraction spots, called Laue’s
spots.
The single crystal acts like a grating
with a grating constant comparable
with the wavelength of x-rays, making A Laue pattern of a
the diffraction pattern distinctly visible. single crystal.
Since the diffraction pattern is decided Each dot
by the crystal structure, the study of represents a
the diffraction pattern helps in the point of
analysis of the crystal parameters. constructive
interference.
X-RAY DIFFRACTION
Problem: SP43-5
Problem: E43-25