M I L-ST D-4 1 4

11 blvs7
-
~M
ORfkMOO$-10

MILITARY STANDARD

SAMbLING PROCEDURES AND TABLES

FOR INSPECTION BY VARIABLES
FOR PERCENT DEFECTIVE

1.

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 —- _ .—- .—

mL-sTD-414
11 JEW 1957zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA

OFFI CS OF TEE ~ANT SECRETARY OF DE~

Wuhlngk m $ 5 , D. c .

Supply and Logi.ti.. 11 J U I U lb7

Sarnpflng Procedures and Table. for fa.p. ctlo. by

Varl.bl.. for Pe=cent Ddectlva
M I L-ST D-4 1 4

1. Thi. .tandard h.. ~en approved by the De Pru’ne.t of Defense

and i. mandatory for . . . by the Departm. rAto of the Army, the Navy. and
the M. force, ●ffectivm 11 June 1957.
2. h ●ccordance rnth e.tabli.bed proc.dur., the Sfandardi.. ticm
Diwl. im k.. d-.ifp.t.d tha Chemical -Ca rp. Bureau of Ordnance. -d
Air For.. , r.. p.ti..ly, . . Amp N.v-Air For.. custodian. .1 thi.
.tandard.

>. Recommended correction.. sddltlenn, or deletion. .hould be

I .: ●ddr . . ..d to the Stanbrdi. atior. Divi. iom, Of fic. of the As. imta.t Sec...
aary of Def.a.e (Su@y and Logistic.), Wa.hin@an Z5. D. C.

,.

I l.

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U J lvl-hn-ls

Esu
INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . “ii

SECTION A GENERAL D&9tiRIPT30N OF tibfPL3t4G PL.#JS . . . . . 1

Table,:
Table A-1 U3LConveraion Table . . . . . . . . . . . . . . .
Table A-2 Sample Size Code tiNers . . . . . . . . . . . . . . :
Table A-3 Operating Cha r.c t e ri* t ie Curve . 1 0 . Sampfiq
Plmm of S.ctiOa# B, C, and D (Graph- for
San@. Sise tie Letters B t hough Q) . . 5

SECT I ON B VAR3ABIL1TY UN3U40WK-STANDARD

DEV~TION METHOD

Pa r: J SINGLE SPECIFICATION LIMIT . . . . . . . . . . . . . . 35

Ex8mpl. *:
Example B- I Example of Cdcafattoiw:, Simgle
sPeciflcatiOn fAmil-Form 1 . . . . . . . . . . . 37
Example B-2 Example of Calculations: Sin~le
Sp*cificatiea Ltmit-l%rm 2 . . . . . . . . . . . 38
Table.:
Treble E.- I M..ter Tabie for Normal ●nd Tighteoed
3nmpecti0n (Form l-Sinnle fAmit) . . . . . 39
Table B-Z Maater Table for Redueed impection
(sOrrnl-singl. LiJnii) . . . . . . . . . . . . . . 40

Part H DOUBLE SPECIFICATION UhUT . . . . . . . . . . , . 41

1s Examplea:
Example B-3 tiample of Cdcrdatiomm: Double Specifi.
c8tioa LAnit-Cke AQL vai.4 far Upper
and Lawe r Specification Limit Combined . . . 43
Exarn@e B-4 Example of Calculatinna: Double Specifi-
cation Umit-DIfferem AC3L values for
Upper sud fmwer Specification Umitm . . . . 44
T , blem:
Table B- 3 Mmmter Table for Normal ●nd Tightened
Impecti.n (Double Limit and f%rm 2-
I ... siI l# le LiI nif) . . . . . . . . . . . .. . . . . . . . . 45
Table B-4 Mssier Table for R=duced faspectiom
(Double LImitmnd Form Z-Single Limit) . . . 46
I Table B-5 Table for 3SatimatiaEthe Lot P. rcent
De fective . . . . . . . . . . . . . . . . . . . . . . . . 47

Part f3J EST1MATION OF PROCESS AVZSAGE AND

C3UTE- FOR RZDUCEL AND TIGHTENED
I INSPECTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5?.

Table, :
I Table B-6 Value. of T for Tigbtenad k#p8!cti011 . . . . . . 54
Table B-? ~ts of Estimated k; P.rcent
Defective far Roduc=d Inspection . . . . . . . . 56
Table L-8 Value. of F for h4asimum Standard
Deviafioa.[MBD) . . . . . . . . . . . . . . . . . . . 58
I
APP=dk B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

‘iii

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xlL-mTb414
11 Juts 1097

coNTmzTa-caitinmd

SECTION C VASliABILfTY ZINKNOWN-~S METHOD

Part 1 sU40LSSPECZF1CATION LZMIT . . . . . . . . . . . . . . . .zyxwvutsrqponmlkjihgfedcbaZY

61 .

k x m lfb:
E8urlph c-l Eauanph of Ckicniatidm: Simsle
S~cificatiOa Umit-FOrm i . . . . . . . . . . 63
3hampie C-Z Exuriplm of Cakuiati0a9: StnSle
Specification Limit. Form 2 . . . . . . . . . . 64
Tsblea :
Tsbie C-1 Mast-r Tabie for Normal ●nd Tightene4
Inspection (Form I_ Siql. Limit) . . . . . . . 6S
Tabi* c-z Msst.r Tabls for Reduced lnapecUorI
(FOrml-SiOgl. LImlt) . . . . . . . . . . . . . . 66

b7
1“ Part u DOUBLE SPEC1IVCATION L3M3T . . . . . . , . . . . . . . .

Exaf+em:
Ex.mple C-3 Example of Caleulxtioms: Doubl. Sp.eUi -
catiem LiniIt-Oae AQL value [or Upper
and tiwer Spocifieu40m Limit Ckmblaed . , . . 69
Example C-4 Exunple o{ Caiculaiiom: Double Specif{ -
c-ion Limit-D4ifar8st AQL vahm. for
UpPer u8d Lower SPRIcZflcacJon LImitm . . . 70
Table,,
Table C-3 A.hmI.r Tabl. for fdmnul .md Ti#hte.ed
~P=c~a (-ble Limit 4 Ferm z _
Sias!e Z&nit) . . . . . . . . . . . . . . . . . . . . 71
Table C-4 Maater Tabl@ #or Reduced lmpectiom
(Dauble L&nit - Fown&Simgle IAnIt) . . . . 7Z
T.ble C-5 Ttile for Ectinmiinsthe Lot Percent
Dekctive . . . . . . . . . . . . . . . . . . . . . . . 73

Part Zu ESTIWTZON OF PROCESS AVIXfAGE AND

cRZT3ZRJA PVR REDUCED AND TZOHTSNED
INSPECTION . . . . . . . . ., . . . . . . . . . . . . . . . . . . . .

Table.:
Table c-6 Vaium. of T Ior .Tigbtmmd h,pecticm .“. . . . . 80
Table C-7 z-bits Of Eotiated kt S%rcemt
Defective for R.duced Z.cmp.ectioa . . , . .. . . B2
Tablo C-8 Value. of ~ 10, M&um Awe ra~e
Rsn#e(w) . . . . . . . . . . . . . . . . . . . . . 84
.,.
APWIUUB C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85

SEC7WN D VARZASZL3TY WWN

P8rt 1 SZNOZ.E SPSCW1GATZON3A3AZT . . . . . . . . . . . . . . . . ST

Exmpleo :
Exumple D-l ZZxampta of Caieubtlms: Siasis
*c4fkati0n Z.imit-rofm 1 . . . . . . . . . . 89
&urnpZm D-3. Example of c +I e uidzioM : Si+e
Smcification ZAtaia_FOsm Z . . . . . . . . . . 90
Ttbim.,
Tabic D-l Msst*r Table fof N orm a l d Ti#btened
Zzmpoeuom {Form 1-Sk+ Umlc) . . . . . . ,9I
Tmbb D-Z titer Table [or Reducmd tJ1.p~=tiO_
(FOrml-Slr@*LimitJ . . . .. . . . . . . . . . . 9s

1!
~.—— “-
.. . . . .,.—
....=_
 comzNls-cOfmffwd
-
P*T5 u DOUBLE 5PECfF1CAT10N LlhffT . . . . . . . . . . . . . 95

3 ha m pfe * :
3kAmpfe D-3 Esampk af Cdctdationw Double SpecUi-
cation L6mit-Oa* AOL vahm UpPar and
fmwer Specification. fAmit Combirmd . . . . . 97
Exunple D-4 Emmple of .Calculatioms: Double +pecUi -
c-tion L6mit-D3ffereut AOL value- for
UpVr d kwer Specification Limits . . . . 98
Tables:
Table D-3 Master T*le for Normal and Tightened
fn. pectim (Double Limit and Form Z-
Sim gle um lt ) . . . . . . . . . . . . . . . . . . . . . 99
T.bla D-4 M a st e r T&ble for Reduced 3nop.ctiom
[Ooubk Limit..d Form Z-Single Limit) . . . . 101
T.ble D-5 T-ble for Estimating the fat Percentage
Defective . . . . . . . . . . . . . . . . . . . . . . . . 103

P*rt Ul SST1MATION OF PROCB AVESAG!C AND

CSJT&R3A FOR REDUCED AND TIGHTENED
INSPECTION . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . 104

Tsble#:
Table D-6 Value. of T for Tightened frt. pection . . . . . . 106
Table D-7 Limit- of Ectinutod IAX Percent
Defective for Reduced hmpecfiom . . . . . . . . 108

APP* 6 D........ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110

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mlL-8’m-414
llhfislm?

I N T RODU CT I ON

Thi. Stamdardwa. prepmred to meet ● growing IIeeo for tbe U. of standard

●u’npliq ptmm for Jampection by vari*ble. in ti~rnmatn procurement, DIIpply
and .torage, and maintenance ia.pciion opa ratiozm. Tbe variabf.. sampJ&s
plane .pply to ● ●in@e quality characteristic which can be rnea.tirmd on ● coattn-
tm.. scale, and for which quality i. ●xpressed in term. cd percent de fectiue. The
theory unclerlying the developrne.t of the wari.bte. .aniplim~ plaua, including the
oparatiq charact=rimtic curve.. a.awne. that rnea.urem.mt. of tba quattty char.
●cteristic ● re independent, identicslfy di.tribufed normal random varisblea.
1. comparium with atfributa. ..mpfing pfmn., warlah!es umpfiag plamm
have tbe ●dvanta~e of ummfly remdtin~ & cmmide rsble .avinem in #ample ●i-
for .xmnparabl. a..uruice . . to the correctness. of decision. in judging . .in#le
quality characteristic, or for the .arne sample size. greater a.mirance is ob-
I tained using variable, plan.. Attribute. sampling pfan. have the advantage of
greater simplicity, of being applicable to either .ingle or rnuttiple quality char-
acteristi c., and of requiring no knowledge about the distribution of the contlaueu.
rn. a.ur. rmenc. of a ny d t he quality cfur. txeridc..

It 10 imporfsmt to mot. tfut variable. .amptfmp pha. ● rm mot to be um.d

i.di. crirninat.ly, ,impfy bec.u.e. it i. po..ible to obf.in vaxi.bk. tnea.urarnemt
,data. fn conmlderq appfieatlon. where the rmrmatity or irtde~nde.ce ● .smnp-
tion. may be que.ticmcd, the user i. ●dvi.ed to cm-..ult hi. technical agency to
detci-rh in. the fe.. ibility of appfi calion.

Thi8 Srandard 1. divided into four .ectimm. Section A describe. @n. rat
procttlur. a of the .amplimg plan.. Secfic.m. B utd C de.crib. .Pcifi. procedure.
and ●pplic ation. of the .arnpIing plan. when w.=iability i. unknovr., In Section B
the .stirn.te of lot .%and. rd d.vi.tion i. used .s lh. fn. i. 10. an ● .timat. of the
unknc.w. variability, and in Section C the average rams. of the sunpf. 1* used.
Section D desc=ibes the plan. when variability is known.

Each of Se c t iono B. C, and D i. divided into fbree part.: (l) SAMPJIIW PIUM
for the Single S~cifieuiom Limit Ca.e, 111)Sampfimg Plans for th. mubl. Spc-
ific. tion Limit Case, and (3JJ) Procedure. JorEsthnation cd Proce.. Average and
Criteria fer Tighmned ● rid Reduced Ja. pection. For tba ●ingle s~cification
limit ca. e, Lhe ●cceptability trite rio. i. giv=n im two foran.: Form 1 amd Form Z.
Either of the fonnc may be u.ed, ●ii-ici they ● rc idettticti a. to .ainple sise -d
deci ion for lot ●cceptability or rejeetabilify. III deciding whether w u.= Form 1
or FQrrn Z, the followin~ poiDt . should be bo=n. in mind. Form I provide. the lot
●ccept ability cri~. rion without ●.titn.tirtg 10I percent defective. The Form 2 101
acceptability criterion require. emtirnates of Jot percent defective. Theme e#li -
mate. at.o .r. ~quimd for e stiznatbn of tha proea ● a ●verage.

Operating Characteristic Curve. fn Table A-3 how fhe r=latioa.ftip betweem

quality and percent of lot. expected to be ●cce~able for the quality cbaractari.tic
inm~et.d. A. stated, the .e Ope rating Characfe ri ‘tic Cur-. are &sed 011tbe
..#urnpiari that meam. mment. ● re .ekctedat raadanalrom a ciorsnti distribution.

The c orre spending ●unpfin~ plan. in SectiW. S, C. ~d D w. m mstcbed

●. closely ., po.. ible ~der ● .y.tem Of fix e d .unpfe .I se with re. pcct to their
Opcraling Characteristic Cu?wes. O~raUng Chsracteristjc Cum. in T.bf. A-3
h..= been computed for the .mpling p]a n. b... d orj th. ..timate of lof .tudard
deviation ef unknown ..ri.bility, Thy are eqully .pplie.ble ior .arnpllns plan.
hoed on th. averaga range of the .awIpI. of unfmown variability and theme bam.d
on known variabUity.

C.rtaim cln..cmri.:ic. concerning the sunpliag phm. in S..tiom. B amd C

-d tbosa la S9ction D dwufd b, moud. Pkn. baa.d on fba ● mtima& ot umk=09m
Wariablllty require fe~r .M@e wit. for cm~ra~e . ..”ranca -baa tb ● d.
Mate of lcM .taadard tiwl.si~ i. “..d than _bg. ib .~..ae rua~. d ffn .-+
in u.ed: on fhe ottwr tid, plan. Vsbg the .W~.gG r~ge of the #AM@. r.quira

VII

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 mb61v—414
11 June 19s7

●imphr compuuttmm. Plarm umlnn bm=variablltty -qutre con*l&rablT f-r

sample tmk far comwrabk amUJrMC* tbaI ● ich=r of the plans whw =TIabtuty
1s uakam: @we wer, tba roquir=mw.t of k#umII -rkbiUty Is ● ●rtnsent am.
The user 1s. dvised to co.milt MS tectalcal~uc~ bdom WPIYLW cunptiaj
piano U.tng bDOwa w8rIAbuuy.

Tath B-8 provids ● values of tbe f~ctor F to compute tfia maxfmum standard
dewiation hfsD. The hfSD se-s M ● ~uide for the magnitude of tht eatirnate of
lot standard de-scion when u-in Plazm for tbm double spcff ication limit c--e,
based on the ● intimate of lot .taa~rd deviation of un.bn- .arimtdUty. SimifArly
Table C-8 provides vmlue- of the Iactor f to com~te the maximum average range
MAR. The MAR ●or.ew m a g de for tbe magnitude of the average ruige of the
●rnple wk. usin# planm for “ket do.bfe .pecific.tia. limit . . . . . ba.ed . . the
ave rage range of the cunple of unba m w a riddlit y. T ba e dm a t e of lot ●tmdard
deviation or ● verage range of the ●mpk, U it is Iem thm the hfSD or MAR.re.
●t=ctively. hslps *O immure. but doe. mot guarmt.e, lot accept. bfllty.

AU ●ymbols and their definition. ● re gimn III tha a-ix to Part JU cd the
applicable #*ctim. h Ulumtratim of the com~tiom and proc.durma .~ed IIJ
the .unpling plans i. give. i. the ●nmplec uf Part- I and 11 of t be spplk a ble
.e c t ion. The computathmm irwolve simple ● rithmetic operation. such am .dditina,
●ubtractio”. multiplicuion, &d dIvimion of mwnbera, or ● most, the taking of ●
.quare root of ● number. The user should become funiliarwith the g.neral pro-
cedure. of Sectian A. and refer to she ●pplicable sectioa for detailed iawtructiom
regarding ●pccific procedure.. cornpu. ions. md tables for [he Barnpliag plan..

I
 ~1 4
1 1 J m fe 1 4 s7

1, SECTION A

1’ GENERAL DESCRIPTION OF SAMPLING PLANS

1’
Al. SCOPE unit of product. Tfm se pfwm may be used
whether pracuremrml inspection i. pe r.
All Pur Thi 8 Sammkrd =stablimhes km’rmd at the plant of ● prime coatract?r.
mmplnng +’ P anm and procedures for inopec - wbcontractor or vendor. or ● t destination,
ticm by variable ● for use in Gove rnm e nt -d -S9 0 m a y be uaod when AppTOPrU1O in
P*.c. reme.t. s.ppfyuad stora~., and rnAJ l- ●ppfy and storage. and main fanaace fL18pec-
t e t t s.c c inspe c t ion op8rati0rIm. when .ppli - tion ofm ra t t om .
cabfe this Standard #hall. be referenced in
the specification, contrzct, or in8pcctien in- A3. CLASSIPTCAITO?f OF DEFECTS
.tructic.r. m, and the provision, set forth
AZ. I Mtthodof Cia8sifring~fect@. Asf8m -
herein shall #ovem.
.ificat, c.n al defect- . . the ● rmine ratio. of
defect. of the unit of product claasifi. d
Al. ? III*PC ction. lnmpeclion i. tiw pro . . . .
of measur, ns. ●xamining. testing. gaging. 0. according to their irnporfaace. A defect 19
● deviation of the unit of product fr-am, re-
othe rwise comparing the “unit of product”
(See Al .4) with the appkabfe requirememla. quirement. of the specifications; drawiags,
Purcha.e da~cripfia”., and aay cbu~c
the reto in the contract or orde r. Defects
AI.3 lnspccti- by Variables. I nspe c t ion by
variables i. inspection wherein r+ specified normally belong to one of fhe fOllO*g
classes; however. defects may be plkced k
quality characte-ri. tic (See AI.5) on a unit
of proeuct i. measured on . continuous other ciao. cs.
.cale. .u. h ● . pound-. iwheo, feet per sec- AZ. 1.1 Critical Defeeto. A criticaf defect
ond, etc., And ● rneamtreme. t is recurd. d. i. .“. that iudeme. t and axmrience indicate
coule reeult ;.. hazardou. “or unssfe condi-
A1.4 Unit of Product. The unit of product tions for individual. u.ing or m.imaining
i. the entity of product in.xcted in order the product; or, formajnr end it.rn9 unit~of
to dew rrnine it; measurable quality char- product, such a. ships, a irc ra ft , or fa m ba . ●
1’ ● cteristic. Thim may be a single article, a
pair. a ●et. ● component of an end product,
d.f. ct that could prevent fmrforrnaaco of
t he ir tactic-i fumction.
or the end product itself. The unil of prod-
uct may or may K.t be the sune ● s the unit A2. I.2 Major Defects. A major defect i8 a
of purchame, supply, production, or defect. other than critical, thaf coutd result
thipmer.t. in failure, ormateritlly reduce the usability
of the unit of product for its intended fmrpobe.
A 1.5 Quality Characteristic. The quality
I charact. riatic for varxablee
that characteristic
in. pecti4n is
ef i unit of p,oduct that
A2 . I .3 M inor Defects. A minor defect is
on. that doc n not materially re duc e the usa-
is actually m.a. uzed, to determim confor- bility of the unit of product for itm intem&d
mance with ● given requirement. Purposa. or i- ● deprfurc from ●stablislmd
atandard9 hating .0 signUi CUIt bOa CinI OrI
A1 . b Specificaticm Limit.. The ●peclflca- the effective u.e or operation of th@ unit.
tion Iimtt(e) is the requi rerncnt that ●
quality characleri. tic .hould meet. Thi* A3. PERCENT DE FECTTVE
req.~rement may be exprenmd ● n ● . upper
●prc~f ication limit; or 6 lower pacification A’3.1 =.PT89.88. Of NO. CMtfO_ co. Tti
limit, called herein ● .in~le specification e$fcnt of nonc onform a nc e of pro dues 9fnff
limit; or bolh upper and lower .~cifieatiem be expre-scd i. terms of percent &faetive.
limit., called herein a double ●~cificmion
A3.Z Percent f%.feetiwe. Tbe percent d.-
limit.
fe c t iv-.~a c t e rim t ic of ● I i% .
lox of prodv;t”i. th~ number of unit. of prad-
A 1.7 Sampli.~ Plans. A sampling pfan 1.
uct de fectiwe for that cfuractc ri.tic divided
a PrOCedUr* *h*ch ●peciiies the rmxnber c.< by the tataf number of unitm of product And
unit s of product from ● lot which ● re to h
itmpected, arid th. cril. rion Xor aecepfabil - multidimd by on. hundred. Expressed ● man
.auatiorx Pe rc e n: rkfectiv8 -
ity of the lot. Sampling pfazm desipated in
thi. Standard are ●pplicable to the insPc- Number of Aefectivea x 100
... tfon of ● chgfs quality cbaracteri-fke of a Numbs r of dtm
 1

.—. — .. .
Mk+m+la
lx J lfffe 1 9 5 7

Ad. ACCEPTABLE QUALITT LEVEL

A4. 1 Acce@abZc Ouaiil bwl.
Tba =-
a CBOmlnaf
● A6.2 Choice of SarnfAim Plain. SunpUaB
value ●xpr*s.e.i in farm. of percaat d8f*c - ~D u!d PIWCEOU-9 a:e pro-dad in d8C -
tive .Pcif ied for ● sbigle quUity character- tion B if Variddlity 10 uabnown amd the
iatic. Grtain numeried vaftws o; AOL .taadamf de rf.uion mathd is !mwd, h Soc -
r=~img f ra m .04 to 1S.00 parce.nt am ●hO-a ticm C U variability i wunbaewn a?id the range
i. Table A- 1. Whe. . ran- of AOL VUW- matbod i c uced. and in Secfioa D if .ariabUity
i. .pecified. it dull he treated ● s if it wore is bnown. Urdesa otkrwi.e ●pcffied, un.
equal to the WdUC of AQL for which ●mfa2i0c b-n variabiUty, ●-d=rd dewiafim method
plms ● re lu-whed and which i~ bcluded ●unF41rtd plans. and the ●ceef=ablfifv crl -
within the AOL range. When the •~c~ted terbr. d Farm 2 (for the 9ic@e specification
AOL i- a particular value other tb& tivme iimit case) Aaif be used.
for which oamplhg pfanm ● re furniched, the
AOL, which i- to be used in ●pP2yihg the A7. SAMPLE SELECTION
yovi.ions of this Standard, .Itafl be ., .ho~
m Table A- 1. A7 . I Determination of Sample Sise. The
.Unpl. .,- h, tha mm’lfmr of unttm of prod-
A4.2 Specifying AOL1 c. Tin particular AOL uct drawn frcan ● lot. Retati~ samph aIws
vafue le be used for ● ●ingle quality char- ● m Aesimated by cute letters. The 8 a m pf4
● ctarimtic of a given product must be ●pee- sise cod= Iette r“depcitds on the.inq=ticm
ified. fn the CM. of a double ●Pcifi.athm le.ve: and the lot ●1=4. There ● m fiva h-
limit. ● ith. r an AOL value it #PcUied for
• f=c t iOa le =J ~: L U . fU . IV. -d v. ff~e -~
the total percent de fecti.. muaida of bath othe rwhe ●pecffiod Ia-fmctien Ieval IV shali
up~r -d lower specification Umita, o. t-e k used. The ●unple .i.e cod. letter appli-
AOL value. are specified. om. for the uppe r cable to the .pcifi.d izi.pectim l.wel arid
lim it and another for the lower Ifmit. for lots of given sise .hdl be obtained from
Table A-2.
AS. SUBJbflmAL OF PRODUCT
NOTICE-5P. c ial Reservaticm for
A5. I lat. The tsrrn ,,1ov hall nmmn ,virt-
Critical CharackrnB1ic8. Tbe Go.errm’i.nt
cpecti~lot, -’ i.e., a collection of unit. of
re. e.vo. tbe rmhl to in smct emryunit mb-
product from which ● sample is dram! ad mkkd hy the ;uppfier fos critieti etir.c -
inopec~td to dete rm”me complhrme with fhe te!rimko, uad t o reject the remainder of the
I
acceptability criterion.
I lot Immedlafelyafter ● de fe c t is fouud. Tbo
A5. 1.1 Formation of Lots. Each la; shall, GOvemirnent timo rcr:rvee tht right to ●am-
● s far ● mla practicable, con.iwt of unit. cd pfe fo~ criticmf d. f.c t c e vm ry let aubmittad
product of ● .ingla type, gssde, ~Ass, size, by tk ●uppUer arid to reject any I-* if A
or cornpo. itkn manufactured under e.. en- sample dr.wm thrnrefr~ is fo-d to c ont a in
ri.Ily the same conditimit. ow or m ore . criticti da fects.

A5.2 Lot Sise. The lot ● im 1. tha number A7.2 Dr.wimB of Samples. A sample 10 om.
of unit. d product in ● lot, and may differ or mere unit. ol product drawn from . lot.
f re m t he qua nt it y de.i#r.atmd h fbs comtraet UnItc of ttn munfdo Aa2i be, ,al~ct,d with-
or order a, ● lot for prod”ctlar., ●biprnellt. O* re #a rd to t?bdr q.safity.
or Ether Purpo..,.

A6. LOT ACCEPTABILITY

A6. I Acce Sabfiity Criferien. The ●cca@- Proe.dure ● for ● 8tLmatfmg 22n preeomm
●bility of a lot of m a t e ria l ●iknitidbr awrage @ criteria for ticbtaned and re -
imapc:kta ddf be detennh.d byum of ~ dweed in. fmcftan bared = th Umpacthn
of the .ampling plait. a..oeiaf.d~tb. .pec - romiito of pmeedinc lots are provided in
ffied value of t he AOL{S). Tbi. Standard Part uf of dactiorm B. C. and D.
provide 8 ●ampliag plaa. baaad ombaowa 4
b- variability. fn the Iatfar can AS. SPECIAL PVOCEOURE POR APPLI-
two affa mativo met+, ● m provitid, - CATION .F M I X ED V ARI ABLBS-
bared on the e ●tfmaia of im ●fattdard dovi. AlTT21BLfTES BA?APLJNG PLANS
atioa and the die r on lb am rqe range of
the t-fate. These .r. r. f.rred to . . the
standard dowiatio. method and tbe rinse
method. For tha case of a single cpeeifiea -
tiatl unlit, lb acc.ptabiu~ criterion I-

--
 I
i
i

● lu prwid=d for tin Miad w8*bl9D-

●ttrlbcuaa -Wunpum g phmm bon18 ad that
tbOM h ,T=tih A-S a- z-t W#idk.]

Condltlon A. Amptm wwI&mc. oximta

I W tbm produ ct cubmittod for iaapctioa IS
● mhctod by Ch #Upfli, Z tO meat tfM ,IWXiZ A lot
Ikatlan ltmit(s) by ● ●creemlng proee ● m mcdm Ui* ●ccef%abi me of
I f rmn ● Iarae r qus.mtity of product which 1. the fouo’wln’ Comtitiem. i. .*tL.fic.&.
not being produced wltbln tba ,Pclfication
Ilmlt(al. A. 7bo lot com~i4s
Camdltkm with
ttn apprsprmta variab14 ● ●cca*bllIty crl -
CodltiaQ B. Other condltiorm adst terlm of section B, C. or D.
tbt warrant tb= u, . of a .arlablac-
mttributem •ara~i4is *-. Caa6itLm B. The Ist cmIPU*s +tb
tbe ●cceptabif ity crita rkm of pra gra pb
A9.2 Definition.. 1 1 .1 .2 of bAIL-sTD-!05.

A9.Z. 1 in.pactlom by Attrlbut8s. fnspectioa A9.4. 1 U Condition A ia not ●atiefied, pro.

by ●ttribute. I* inwpectkoa w ba rdc . tba unit coed iri accordance with tk ● tt tibute ● oM’l -
of product is Chsdfied simply m defective plirig plan to meet Condition B.
or mandcfectiwe with reapact to a given re -
qtiire.mom 07 s.t of nqutrnmentm. A9.4.2 lf Condition B ia not cati;lied, the
lot doe # not meet the 8ccepabilicy crlte rian.
A9.Z.Z Mind Variabla ● -Attrib* ● lnmP8c -
tion. tinnd varimhle ● -attributes inmp8ction A9.5 Se=rltY of Iaaopaetion. The proce-
~mgpcction of ● ●arnfie by sttributa ● . in dures for .e ve rit y ❑ f m .pe c t i.m rel=rred to
● ddition to inspection by variable. mmlready in ~rarraph A8 a re ne t ●ppficsbl. for
mad. of ● previo.a ●unple, be fore . de - mixed Vaziable..attribum. inm~ction.
e k i,on .a o ~o.,*: ca~qsi!iv.o r .*I- c-bili~ ~
● M ctihmtie. ‘. ‘- NOTICE- When Gouerrmtemt drawin#..
SPedfiCatiOmn, or othc.r data ● re u.e4 tar
A9.3 Selection of Samplirtc Plans. The UIY prmme other than In connection wltb a
miaad *arlable.. att Yi- S -plmg plan definitely relamd Government procurement
stall h ●elected in UCOdUICe with thn opa ratloa. thm Lbit.d States Gow rrunent
fcdlovim~ tbe=aby imzur, no re. pm. ibility or my ob-
ligation wbtcoevcr; and the fact that the
A9.3.1 Select the vsrlableo #vnpliag plm Co.ernnteztt may have form.latd. f.rnimbed.
M ● ccorduaca with Section B, C, O, b. or In uIy way ●pplied the ●aid Lrswiags,
●wcificationa, or other data (* II@ t. ‘=
rm~arded by implication or otherwime ● in
mY m-e r licerming the tilde r or any otha r
I pcr*On or corporation, or conveying any
rights or p rmis. ion to m-nufbctufe, u**.
or ●ell aay patented invention thu may in
I mn7 =*T h ra~-td tbreto.

—
 m
m
ror spd56d A03. va3u.eI Use thh AQl
Vazue
a236q WiIhin mmu r-got

— to 0.049 0.04
““”
0.050 to 0.069 0,O65

0.070 to 0.109 0.10

O.lloto 0.164 0.15

0.165 to 0.Z19 0.Z5

0.Z80 to 0.439 0.40

6610 1JOIB35DF31
0.440 to 0.699 0.65
111 to 180 Be&c I
0.700 Ie 1.09 1.0
181 to 300 Et DFH_j
1.10 to 1.64 1.5
301 to 500 C32GIK
).65 to 2.79 Z.5
501 to 800 DFHJL
2.80 to 4.39 4.0

4.40 to 6.99 6.5

801 t“

1.301 to
1.300

3.200
I EGIKL

FHJLM
7,00 to 10.9 10.0
3.ZO1 to 8.000 Gl Lhi N
11.00 to 16.4 15.0

m
8.001 to 2z,000 HJMNO

ample .i;e code letter. given in body of

Uble ● re appli. abze when the indicated in-
●ptctim levelw are to be “med.

. - --,-
 I

m L-sm -4 1 4
1 1 Sm n 1 *

T AB- A-S

Opra CinC Clm r.e t e .si.t ic Ct M W9 . for Sun@iD* Plan.

of t%cti~m B, C, 4 D

-.
 TABLE A.3

CH ARACT ERI ST I C CU RV ES FOR SAM PLI N G PLAN S BASEO ON ST AN OARO OEV I AT I OM M ET H OO

OPERAllNGzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA ii!
;f
SAM PLE SI Z E COl)E LETTER
W
4:
B
I Cures * m?l~s p-i bed - ml,. +ti 0“4!.- .V1.wlty “. “.o.lld* iq.k.llnl )

!!
a

—
 .——. .—— .. . ——. .—

T ABLE A.3

oPERAnN o WARAC7 ERI ST I C CU RV ES FOR SAM PLI N G PU J 4 9 SASEO ON ST AN OARO OEV I AT I ON M ET H OO

.4

-0 10 so 30 40 w M ‘m 00 w 100
U % RAT I N O CW# fWT ERI ST I C CU RV ES FOR SAM PU N O PLAN S BASEO ON ST AN OARO OEV I AT I ON M ET H OO
ii~

.
----- .—.__— ._

T ABLE h .3

I Y ERAT I N O CH ARACT ERI ST I C CU RV ES FOR SAM PLI N G PLAN S BASEO ON ST AN DARD 0 EV I A7 1 0 N M ET M OD

SAM FI -E SI Z E CODE LET T ER

E
I b, * t 9 # w q pm , be d m m m ,.dt i ●* 9 k “- ..I .W, m “.”l* +.do”t 1

wzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA

bo

‘0

#
40 w w !m a 40 loo
-0 10 IQ 30

M,I., rq!lmom - Ut Is#.ul 44,1, 1“1, I., - I“tpn,

”,
 t!zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA

7 ASU A.3

OPERAnN G CH ARAC~RI ST I C CU RV ES FOR SAM PLI N G PL;N S BASEO

ON ST AN OARO OWI AT I ON M ET H OO

SWR_E SI Z E c ow LET T ER

F :,
,,
[ c orm f“ S* , ,1 9 .1b
, ,,,d m .,”,. 9A,4 9.#t“- ?wI.bm, “
* “,”(++ ,,uk,td )

.- .- .-
hl-,t Wllrdc fhh-lM hh
-rw . nM-#An.u.O..,o .
-94 d Iuo9 k , - m,t”b.+”, !
OUAU1’V
0? W3Mt?lC0LOTS I 1.,.md 4./.,!1..)
 *

T ASU A.3

OPET iAT I N G CH ARACT ERI ST I C CU RV ES FO+7 SAM PLI N G PI AN S QASED ON ST AN DAm OEV I AT I ON M E I MOO

wu SI Z E COW $ lT ER

F I Ce nfh.e d I ,
 T ABLE A .3

OPERAT I N G CH ARAC7 ER1 5 T fCCU 1 7 V ESFOR SAM PLI N G PLAN S 8 ASEC ON ST fi?!DLRD DEV I I I T I ON M ET H OD
ii
SiM FLE S1Z E COOE LET T ER
:~
G *
I C.*.B IV ..v96, p!ru b.n.d w <a’. ..IM •.~ l.- .W1.bflllrw. “...lld+ ~.i..l.nl )

loo

Ri

10

_—
 -.

T M LE A. ;

OPERAT I N G CH ARACT ERI ST I C CU RV ES FOR SAM PU N Q PL+W 8 ASE0 ON ST AN OARO OWI AT I ON M E T M OD

SAM FLE SI Z E CODE LET T ER

G ( Con!lnw d)

Ii
x

OUUllY Or SWMlllfO 10U ( h pod tihdb, I

% .- - - - k.+.bl. B-m, 1“9101. -d hv., m”,

I
l___
 *

-----
T ABLE A-3

WERAT I N Q CH ARACT ERI ST I C CU RV ES FOR SAM PLI N G PLAN S BASED ON ST AN DARD OEV I AT I ON M ET H OO

SAM Ft E SI Z E CODE LET T ER

“
H
I t iw l & ,@h, ,h., b.sd m ,,”,, 44 W4 know,.“i,blll!, “, ,,,,d,+ wI.,IA )
 .

T ABLE A.3

OPERAT INO CH ARACT ERI ST I C CU RV ES FOR SAM PLI N 6 PLAN S BASEO ON ST AN DARD OWI AT I ON M ET H OO
 T ASLE A.3

OPERAllN O CI WACT ERI ST I C CU RV ES FOR SAM F1 .lN O PLAN S SASEO ON ST AN DARD DEV I AT I DN M ET H OD

SAM P.-E S1Z E CODE LET T ER

I
I hi la st +q tlmt k.d m rm~. AA -t h- .wI*WI, u. .m..lhlb H.1..lrd )

m
. e
-a
 .,

T ABLE A -3

OPERAT I N O CH ARACT ERI ST I C CU RV ES FOR SAM PLI N 1 3 PLAN S BASED

ON ST AN OARD OEV I AT I ON M ET H OD

SAM PLE SI Z E COOE LET T Efi

I ( Contllwl )

?s
 T AM E A-3
y
OPERAT I N O CN AI I ACT ERI ST I CCU RV ES FOR SAM PU N O PLAN S BASED ON ST AN OARO OEV I AT I I ?N M ET M OD
E!j
SAM W SI Z E COOE LET T ER
?&
J *
f Cnns for ‘u#l., ph. h,,d m m ,, ●w O..*k-l .“lMI, “, “Al+ b+’.w I
 .- .——
I

T ASK A .,3

O~RAT I N O CH ARACT ERI ST I C CU RV ES FOR SAM PLI N I J PL~N S 8 ASErI ON ST AN DARD DEV I AT I ON M ET N OD

SAM RE SI Z E CODE LET T ER

J (Conm .t d)
lb.., k M @”, ,1.., b.).t - Is.,. AM##Lu.n,O-l.bill* Um “,-II* Iqwdmf )

I
 .-
,,. 2

TABLE A. 3
y
CH ARACT ERI ST I CCU RV ES FOR SAM PLI N G PLAN S BASEO ON ST AN OARD OEV I AT I ON M ET H OD
OPERhTINQzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
3
Sf+@LE SI Z E CODE LET T ER
g“ !!
K +
{ C-w , * ,1.@q ,1,., b,,d m ,..,; 4.* “a h.- W,bdll, w, ,,,,”1;4$ qulw.1”1j

!3
 .,

T ABLE h .3

OPERAT I N O CM bRACT ERI ST I C CU RV ES FOR SAM PLI N G PLAN S BASED 0 :1 ST AN DARD DEV I AT I ON M ET H OO

SAM FLE SI Z E COOE LET T ER

K ( Ce nnn.t ~ )
{ -t b *I p-t h-i m lul\s - “4 i- .ul.w ~ .9 ●* * * W+ +!”.1 -1 I

ht ., ~,, m- “ bm+tl. dm lt t ,1“,!, 1- -d ,“,,o,wz

 T A9 LE A-3
=!5
c @ERAnN o CH ARACT ERI ST I C CU RV ES F(X I SAM PU N G PLAN S BASED ON ST AN DARO DEV I AT I ON M ET H OO :x

SAM Ft E S1Z E CODE LET T ER

L
t *8 f- Wt }1 - b-d m m ,, dn4 -8 in- vul,blhtj w, cud!+ WIV,lon!I

1
f
 o

T ASLE A.3

cmmo CM bRACT ERN WI C CU RV ES FOR SAM PLI N G PLAN S BASED ON ST AN DAR5 DEV I AT I ON M ET H OD

SAM Ft E SI Z E COOE LET T ER

L t Con!h..d )
 T ABLE A -3 :!E
~f
OI WM T I N O ChARACT ERI ST I C CU fWES FOR SAM PLI N G PLAN S BASED ON ST .AN OAROOEV I AT I ON M ET H OD
gln
~y
SAM PLE SI Z E CO@E LE T T EI I
Cm $
!4 ” a
,:
I h,,, 1 “ ,,q,!h, ,hns b,,,d m ,,.9 , ,A,b ,,* hnw mvwl,blhl,w, ,,nwdl,ll, ,,u(v,M }

Tli+n*d m m a I t ofbl,npw l,* $.h

-W!* 9 ! - * h “01...19 ul
91UW * - - s 4 4 1 9 !?I M -. ou4m of WBulmo Lois [ h ,,remtW.nil,. )
?&I,%f,~,,, m,-, “, 8.,,,!,,,, O@,, c“.,, f- w,,, ,“,,,,,,..
,
 T ABLE A -3 ’

OPERAT I N G CH ARACT ERI ST I C CU RV ES FOR SAM PLI N G PLAN S BASEO ON ST AN DARD DEV I AT I ON M ET H OO

SAM PLE SI Z E CODE LET T ER

M ( Contln..d )

I W-.sa ?0?snplhl, ,19.s b-d m ““,0 604 “d i.- ..rl.bnll, “. “m!h!lf @!mlWd)

,.

...
..

il
m+dall?--dtiwr-ehzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
etiti—rti-1, “
mb9md d b- * - ● lnwm Wm of WSM171C0
1.079 { 1 .pt m ! 4 .1 ..!1 .,I
m ,, ~., * - ..9 k +. 0 “.l,t , L“.1 . 4 - W.* I h+.,llo...

I
 T ASLE A .3

OPERAT I N G CH ARACT ERI ST I C CU RV ES FI X ? SAM PLI N G PLAN S BASEO ON ST AN OARD OEV I AilON M ET H OO

SAM Ft E SI Z E CODE LET T ER

N
f I& w , b ,udq ,!,”, b,,.d m ,,”,, “I hd -4 t .- .“l.b.t,l, “. ,,, ”l,tq ~.,.di,,, )

t hl* . dm#w9*s!h**-t.4 bh
-=@-- nM-h.b9..9wwnl8 . I
-d 94e h , 4 4M”MI., aumm or woumo LOU I I. ,,,,”1 ..h.th. I
w., nw, - - “. Auvl.bl. 0“.!1!,1“,1, t. “-”, M*,*,*).”
 m

T AGLE A. S

OPERAllN Q CH ARACT ERI ST I C CU RV ES FOR SAM PU N G PLAN S GASED ON ST AN OARO OEV I AT I ON M E T H OO_..
 -.
.. .

T ABLE A.3

DPERAT I N G CH ARACT ERI ST I C CU RV ES FOR SAM PU N G PLAN S BASED

ON ST AN DARD DEV I AT I ON M ET H OD

SAM PLE SI Z E COOE LET T ER

o
i G“, 1“ a+, ,Im, $,,,4 m ,,.,. 44 W, t-mm.ar,.bdlt,w
.— -—-—-—. -——

T ASLE A .3

OPERAnN G CH ARACT ERI ST I C CU RV ES FOR SAM PLI N O PLAN S BhSED ON ST AN DARD DEV I AT I ON M ET H OO

SAM Pt E SI Z E CODE LET T ER

O I Contln.*d)

I Cnrm fw “w-q PIM1bm.d m r9ng.4M -4 k.- v“i.bill!, “. .,,,.lhl~ qll.,1-l I

r5
 .i

T ABLE A. 3
~1 5
OPERAT I N G CH ARACT ERI ST I C CU RV ES FOR SAhiPLI N Q PLAN S BASED ON ST AN OARO oEV I AT I ON M ET H OO
gi
SAM Ft E S! 2 E COOE LET T ER
:
!/
P d:
t C4 WW8
t - ,qll., ,Im, b.,.d m rq. ..fbti .,, &.cu vwl.btit+,,,, ,,,.”1,+ ,,.,..1”1 )

W +., d lb ,Wcmld It, *ml*4 1,“

-w. **ti .,-,, .
*4 d M k , - 4M”MI* 9UALIT7Of 9u9Ul~D LOTS I 1.,,,w,TI d,f,,l),, I
MA) f,~,,, 0! unu “. kr@.b!. Ow l,!, L,.,t, t- w.,+ b!,,.,,,o”,
 .—— _ _

T ABLE A .3

CU RV ES FOR SAM PLI N G PLAN S BASED ON ST AN OARO OEV I AT I ON M ET H OO

SAM PLE SI Z E COOE LET T ER

P I Conllnw d1
( e --m 1 - -I )I ul W m I re ,, d -4 i“- .“k bllllj “, “oa t I d+ t q.lnl.! )

lbdat?l-wddbf,-?-abb
---**”O--*, “
Wdd-b@--dak$*Mm OUALIWOr SWUl17t0 101S I 1.,.r.m$ #.1..lh.1
lb,,, nw,., - -. “. k~,.,,. 0,.1!,, L“.1, I- -..1 In,,,,,,..l.
 ,.$,

TASK A -3

opERAT I N G CH ARACT ERI ST I C CU RV ES ,FOR SAM PLI N G PLY RA5 E0 ON 5 T ,AN DAR0 DEV I AT I ON M ET H OC

SAM Ft E SI Z E c ooE LET T ER

Q
I Cum l fw t .w h”, 0 1 ,”, },,.4 m f.”,, ..* W . . . b.- .“i,blm y “, ,,,m ,, d,, _“,.,!M ! )

mmkuilm~tibl,~,,bb
-.w oM * uba l -,,.
-04 d a k * d 41,+.MI.. 1
OUAUW OP $uBMITrCo
LOTS ( h ,.,,,”9 ,.1,,1,.,)
W., flpt .I - W. k.pl.bl. IWI~ L...l, l,, f.x.,1 I,TV,,I,W
 ., .,

T ASLE A.3

OPERAllN Q CH ARACT ERli~lC CU RV ES FOR SAM PLI N G PI AN S BASED ON ST AN DARO DEV I AT I ON M ET H OD

SAM PLE S1Z E COOE LET T ER

Q ‘( Cmfln.,d )
I h, f- ,+* , ,S.., b.,d 01 ,,.,. dt i m m ,bin.., .w hb,hly “. ,,,4 + w @vdc d I
 SSCTIW B

VARIABIIJTY uNKNowN-sTANDAmf DEvlAnoNzyxwvutsrqponmlkjihgfedcbaZYXW

Pa rf I

SINGLE SPEUF3CAT10N LUA3T

S1. SAM PI J N G PLAN FOR SINGLE BS. Z.2 Accepu bilit y brm a nt . T he a c c .pc -
SPECIFICATION LXM!’T dilit y corutaaf k. correewmt .gtotbemun-
ple size mentioned ia pnagraph B2.2.1, ia
Thi. pArl Of the Standard deocribe. the indicmed in the column of the nuster table
procedure* for us. whh plani for ● oingle cor re~pmxling to tbe applicable A(2L value.
ape .ifiution limit when variability y of fhe Table B-1 i. entered from the fop for nor-
lot with re.pect to the quality charae%eri. - mal inopecfion ● nd from the bottom for
tic i. unknown ● nd the .tandard deviation tightened inspection. Sampling plum for re-
method ia u#ed. The acceptability criterion duc e d inspection are providd_ in Table B-2.
i. given in two equivalent iorm9. Tbeoe are
identified as Form 1 -d Form.2. B3. LOT-BY-WT ACCEPTABILITY PRO-
CEDURES WHEN PURIM 1 LS USEI?
B1.1 Use of SamPtinfl PlaJw. To deter-
min. whsther the lot me=t. the ● ccept -
B3. 1 Acceptability Criterion. Tbe degree
ability criterion with respect to ● particu-
of conformance of ● q uafit y cb8ractericti c
lar quality cfuracteristic a.ud AQL. -Iue.
with respecf lo ● single specification limit
the applicable campling plan shafJ be uced
.W1 be judg.d by th~, qusntity (u-XJI* or
in ● ccordance with lb. proviaionm of S.c -
fl-L)/i..
uc.n A, Generai Description of Sa m plm g
Pla n. .-d t h.. e in % hi, pa rt Of t h. St a nda rd.
B 3.2. Corn tatien. TtIt following quantity
B 1.2 Drawi..qof Samplem. AfI .amplew ● hall .haff b- (“-X)/’ ., (x-L)/., d,-
be drawn in accordance -’th paragraph A7. Z. pendiagon whether the specification limit i,
~ qper or lower limit, +ere
B1. 3 Determination of Sample Size Code
~. Th e .smpla ●zce cod ● letter ●ha U i. tk upper specification limit.
be selected from Table A-Z in ● ccordance L i- tbe lower specification limit,
with parasraph A7. 1. X i. the sample mean. and
. i. the ● .tirnate of lot ●sn&rd de.rlatioa.
B2 SELSCTING THE SAMPLING PM
WHEN FORhf 1 IS USED B3.3 Acc a bilit y Crit e rfon. Cum pa re t he
BZ. 1 Maater sampling Tables. Th= muter a bift t yw m st -nt k . ff (u-x )/m or (x - f.)/a ia
●anmlmn tables for mlana based or. -ria- e qua l t o .a r gre 8 t e r t lun k , t he lot m e e t s t he
bilit~ -MI for ~ ●ingle specification =c c ~t iI f.ft y c rit e rion: if (U -X )1 .* * (X -f-)1 ~
limit vben using the ctaadard deviation ia l.m m U u8 k or ne ra t ive , 3 hrm t he M & e s
method ● re Tables B-1 .nd B-Z, Table B- I not m e e f t he • =e ~llit y criterion.
in .m=d ler norm.] and tighter.ed iriapection
art< Table B - Z for reduced im spe e t ioit . M. t31JM3tMRY FOR OPXRATION OF
B 2. Z Obtaining the Sa?nPlinK PI a n. ~~MNG PLAN WREN FORM s m
The
.mnpl.tig plan cons.st. .1 ● .unple .i.e 8d
m ● ~noc ia fe d ●Cc .e pt a bilit y COt I .unt . 1 T he
sampling plan i. obtained from Mater The foLIowfnr ‘soP* •~marise ‘he PrO -
Table B-1 -, B-.?. =~u... t.. . . mllowed:

B2.2.1 Sam Ie Sise. The #a m ple .ise - Z* (1) Daterrnirw the sxmple .i.ecode lti -
●houm m ~ t e ma.,.. tabl - eo.-.. p-.fing *O ter from Table A-2 by uming the let sise and
.-.1. ..cnple ●ice cute tetter. in.pccfion leeel.
 M I L-m -4 1 4
1 1 J t 3 3 3 e1 9 5 7

(2 ) Obfai. Pk. from Mamer Tab)= B-1 cpecifteation limit. The percentage of Ma-
or B-z by .eleeting the sample size n and coaforming produc t is cstimattd by wiieria’
the ac..ptabill$y constant k. T~le B-5 with the quglity index and the
sample ● ize.
(3) Select at random the sampl= of n
unit . lrorn the let; inspect ● nd record the B6 . Z GE-I utatio” of Qtufit
mea. urernem of she quality characteristic ~-lit y~-X )~rnpE~
fer each utiit of t he sa m ple . if the specification limit i. ● a upper limit
U, or OL . (X - L)/t if it is a Io-er Jimit L.
(4) Cmnp.te the s.mpIe m e a n ~ and
estimate of lot sts”dard dcvistic.n . . and Th* quaatitie.. X ● md s. ● re the ●arnpl.
mean ● nd e.timm e of lot standard deviation.
● ISO compute the quantity (u-X)1. for an
respectively.
u per specification limit V or the q~ntity
A-L)/. for ● k.wer .peciticatio~ lids 3..

15) M the quantity (u-X)/s or (X -W.

i. e qua l c o or gre a t e r than k, the 10I meets W.
lot
~e
●bove
-ii-t -d P.,. em d.f=~t i-
the upper specification
in d
limit, or
the ●c.ept.bilicy criterion: it’ (u-X)/. or
(X -L)/. i. [e .. (ha --- k or ne ga t ive , t he s t he by ?z.. t h. estimated percent defective below
lot doe ’ rw t m e e l Iheaccepttii lily criterion. the lower .pecifi catian limit. T be ● stimated
Pc*.=.: defective PU or PL i. obtained by
B5. SELECTING THE SAMPL3NG P2AN enterina Tabk B-5 w it h Ou or QL and the
WNEN FOfU d Z 5 S USED ●ppropriate ●a nple size.

S35.1 h4asccr Sampling Table.. Th. ma. ter 336.4 Ac c e pt a bilit y Crit e rion. Gm pa re t he
.ampJmg tables for plans based onvariabil - estimated lot pereent deIectivepU or pL with
ity unknown for a single specification limit the maximum allowable percent defective M.
when using the m~nd-rd de ria t it m m e t hod U PU Or Pl, 1. eqUf to or leas thn U, t he
lot rne e t s t he acceptability criterion; if Pu
sre T a ble . B-3 ● nd B-4 of Part If. Tsble
or p~ is gre a ie r t ha n M or if Qu or Q is
B-3 is used for normal a“dai~htened inm pe c -
e ion and Table B-4 .fc.r reduced.inspection.
,negative, then t he 1 0 : doe s not m e e t \he
acceptability criterion.
B 5.Z Oblainin~ the Sampling Plan. The
sarnpli”~ plan co. ss.ts of . .unpl. ,Ize and B7. SIJ71SMARY FOR OPERATION OF
sn ● ssociated maximum alk.w=ble percent SAMPL3NG PL.AN WHEN PORM 2 3S
da$eclive. The samplin~ plm i. obtained USED
from MaDter Table B-3 or B-4.
The fellc.rnng step. .umrnariz.e the pro-
65.2.1 Sample Size. T)M ●mnple mice n is c e dure . t o be fa llc .u.e d,
● hewn m the ma. tcr table cortespendin~ 10
each sam>le .iz. code letter. (1) Determine the ●mple .i=e code let -
ter from Table A-2 byu. ing the lot size md
135..?.Z Maxim. mAllow8ble Pe rc e nt De fe e - the inspection level.
t $ ve . T he rrm x im .t n ● llowable p.=. ent de-
=live M for ample ● stimate. correspond. (Z) Obtain plan from Master T=ble B-3
img to the .unple size m=nt ioned in or B-d by .elecfi.~ the .unple .ixa n a t t d
pa:agrmph 95.2.1 is ittdicated in t he c olum n the maximum allowable percent defective M.
of the nm.ter table .xxre.pondiytg to the
●Pplic=ble AOL value. Tabl. B-3 i. =nt=,.d (3) Select ● t random the # a m ple of n
from tbe top for normal inspection -d from unit . frm n t he Iof; inspect UId record t he
the bottom lo, lsght e r.e d in. pe e t ion. Sa m - m.asurernemt of the quality charact. rimic
-li>g pla n. lc I r re duc e d inspection ● rm pro- cm each .unh of the ●ample.
v-ld ea ,. ~a~,e ~-,.
(4) Cmnpute3h= sample mean X arid the
ectimale of lot .ta”dard devfatian . .

(5) Compute the quality index Q

Jfi:
B6.1 Acceptability Criterion. The dc~ree (U -X )/ * if ● n upp. r .pe.ific.tie,. limit
of conformance Of a quallty characteristic
●P.*ified. or OL = (x. L)/. if ● lctwerspec -
iiication 1;...;. L <. snecif; ed.
with respect m ● ai.ngle specification limit
ha ll b, judged hy the percent of rmnem-, - (6) Det~rmb-Ic the estimated lot pe re e nt
Iorm,ng product outsidt the upper or low+r de fecnive pu er pL from Table B-5.
%. Ex_pie B. z for .a cemplete ●xample of thb. prOc*dure.

:38
 M u.-sm 4 l4
1 1 Juoe 19S7

fi) ff the e.timated lot percerndefective is~reatertl.an U Orif QuOr C3~ is aepti e,
PU Or PL i. ~ud t o or 1 ... t ha n t he maxi. then the lot doe. ml meet the ●ccepmbi r IIY
mum .dlowable percent defective M. t he lot c rit e rion.
m e e t . t he ●c c .pt ~bil$ t y c rit e riom if PU Or PL

EXAMPLS B-1

Exmnple of Calcufatio.s

Single Speci!icatlon Limit-Form I

Variability Unknown - Standard Deviation M e t hod

ExAmple The rn.timum temperature of ope ra t ion for ● cer:aindevic. i. .pecifi.d ● . .?09” F.
A lot of 40 item. i. submitted for inspection. Zn. pection Z-evel IV, normal inspec-
tion, with AQL = 1-% i. to be u, cd. From Tables A-2 ● nd B-1 i! i. aee : that a
marnplc 01 sise 5 i. required. Suppose the measurement. obtained are ● . <c.11ow.:
197.. 188-, 184” ,205-, and ZOl ‘: and compliance wfth the acceptability criterion i.
10 be determ%nea.

Line
.— Information Needed Value Obta{ned Explanation

1 Sample Si. e: n 5
~ Sum of Z.@.ur.m..t.: IX 975

3 Sum of Squared Me,, ureznentn: XX2 1 9 0 ,4 3 5

4 Correction Factor (CF): (I X)z/n 1 9 0 ,1 2 5 (975)2/5

5 Corrected Sum of Sqmre. (SS): s“X~CF 310 190,435 - 190,125

6 Variance (V): SS/(n-1) 77.5 310/4

1 Estimate of Lat Standard Deviation .: fi 8.S.1 -s

8 Sample Mean X : ZXln I 95 97515

9 Specification Limit (uppe r): u 209

10 The quantit~ w -X )/c 1.5.9 [209 - 195)/S .81

II Ae c e pt ~iI it y & na t a nt : k 1.53 S.. Table B-1

lZ Ac c e pt iilit y Criteriozx f2mpare w-X)/O with k 1.59> 1.s3 See Par&. B3.3

The lot rne e t m t he .c c e pt a bilt t y criterion. mince (U. ~)/s is ~remt=r than k.

NOTE: If ● ■ingle lower spcffieat{on limit L is given. fhen compufe the q~ntilY ~-~)f~ in
Iin. 10 -d com~re il with k, the lot meet. the =ccept8bility *rii=.iQn. if (~-Ll/* is
equal to or greafer than k.
 !.

M 2 ~-4 1 4
1 1 J une 1 9 5 7

Single Specification Limit-Form ,?

Variability Unknown - St a nda rd De t ia t ion Method

CUmple The maximum temperature of operation for ● certain device is specified ● s 209” F.
I A JOI of 40 items is ●ubmilted for inspe c t ion. 2 nspe c t ion Uvel IV, norm a l inspec-
tion, with AOL = 1% in 10 be u.e d. From Table- A-2 and B-1 it i. .een that a
I sample of .ize 5 is required. S.ppome the measurements obtained art ● . follow.:
197., 188-, 184.,205-, and 201 ‘; and compliance with the acceptability criterion in
t o be de t e r rnit ie d.

Lim e
— Inforrntiion Needed Vmlue Ob:.ined t k pl .nati.n

J Sample Size: n 5

z Sum .3[ Mea. urcme.ta: XX 975

3 Sum ef Squared Measurement.: 1X2 190,435

4 Correction F=ctor (CFh (IX)zln 190,125 (975)2/5

5 Corrected Sum of Squares (SS): lX~CF 310 190.435 - 190,1Z5

6 .V.4@I<. (v): SS/(n-11. 77.5 310/4

7 Estimate of b: Standard Deria:icm .: fl 8.81 J-7X5

8 Sample Mean X: Z X ln 195 97515

9 Spe c ific a t ion Lim it (upPe r): u Z09

10 O~lit y 2 ndm c au . (u-x ),, 1.59 (Z09-195]/8.81

11 .Z.19% S.. Table B -5

‘“t ” ‘f b’ ‘e rc e n’ D’* ”’ %
1 ?, M u. A21mv=ble Percent De:.: M 3.32% .%. Table B-3

13 Acceptability Criterion: Compare Pu vilh M 2.19% < 3.32% See Para. B6.4

T 3 U le t rmet. the ●cccptablzsty critarion, ●6nce pu is 1.-0 tti M.

NOTE: U a sin@. lower specification limit L is Siven, then compute the quality index OL =
(X-L)/s i“ line 10andobuLn the ● .timate of lot percent defective p . Compar. PL rnth
M; the lot meets the acceptability criterion. it pL is equal to 0? 1-
C*S lbn M.

! - -- -—--M
 ...
I
I

TABLE B-1zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
St a nda rd De via t iom M e t hc .d
M I st e r T a ble Fa r N orm a l & .d Ti~htened fn. pectlo. for Pla I J s Ba se d on V a ria bilit y U nk now n
[Single Specification Limit– Form 1)

Acceptable (
-
a llt y .CVCIS (normal inspection)
.—
Sa m ple size
Gi- ,1 0 ,1 5 .25 .40 .65 1.50 2 .s0 4 .0 0 m 10.00 15.00

T
code le t t e r m
k +k k kk T k k k k k k k

l-k
B 1 .1 2 .958 .7 6 5 .5 6 6 .341
7 v . .
c $ 1.45 1.34 1,17 1.01 .8 1 4 .617 .393
—
D 5 1 .6 5 1.53 1.40 1.24 I .07 .8 7 4 .67S .4s5
k
E 7 2 .0 0 1 .8 8 ).1 5 1,62 1.50 1.33 1,;l 5 .9 5 5 .7s5 .516

F 10 t i .?.24 2 .1 1 1 .9 8 1 .0 4 1.72 1.58 1 .4 1 1 .2 3 1 .0 3 .82n .611

— — 1 —
G 15 2 .6 4 2.53 2 .4 2
I 2 .3 ?. 2 .2 o 2 .0 6 1 .9 1 t.79 1,65 1 .4 7 1 .3 0 1 .0 9 .8 8 6 .6 6 4

g
34 20 2 .6 9 2.58 2.47
I 2.36 2.24 ,?,11 1 .9 6 1.8.? 1.69 1 ,5 1 1 .3 ) 1 .1 2 .9 1 7 .6 9 s

,1 25 2 .7 2 2.61 2 .5 0 1 1 .4 0 !3..26 2.14 1 .9 8 1.85 1.72 1 .5 3 1 .3 5 1 .1 4 .9 3 6 .7 1 ,?

- — —
J 30 2 .7 3 2 ,6 1 2 .5 1 2 .4 1 2 .2 .9 2 ,1 5 2.00 1.86 1 .7 3 1 .5 5 1 .3 6 1 .1 s .9 4 6 .7 2 3

1
K

L
35

40
1 .1 7

2 .7 7
.?.6 5

?.,6 6
2 ,5 4

2 .5 s
I 2 .4 5

.3 .4 4
2 .3 1

2 .3 1 ’
2 .1 8

2 .1 8
2.03

2.03
1..99

1.89
1 .7 6

1 :7 6
1 .5 7

1 .5 8
1 .3 9

1 .3 9
1 .1 8

1 .1 8
.9 6 9 .1 4 5

.7 4 6
+ .9 7 1

L
— — — — .
5 .4 50 2 .8 3 2 .7 1 2 .6 o 2 .5 o 2 .3 5 2 .2 2 2,08 1.93 1 .8 0 1 .6 1 1 .4 2 I .Z I 1 .0 0 .7 7 4
+
N 75 2.90 2 .7 7 2.66 2.55 2 .4 1 2 .2 7 2.12 1.98 1.84 1 .6 5 1 .4 6 1.Z4 1.03 .ao4

o 100 2.92 2 .8 0 2 .6 9 2 .5 8 2 .4 3 2 .2 9 2.14 2.00 1.86 1 .6 7 1 .4 8 i.2 6 1.05 .819

—

L
P 150 2 .9 6 Z.84 2 .1 3 2 .6 1 2 .4 7 a .3 3 7,1! 2.03 1.89 1 ,7 0 1 .5 1 1.29 I .07 .841
--t-
Q zoo 2 .9 7 2.85 2 .7 3 2 .6 .? 2.47 2.33 2,1[ 2.04 1.89 1 ,7 0 1 .5 1 1.29 1.07 .845
—
.0 6 5 .1 0 -t.1 5 .25 .4o i .65 I ,0( 1.50 Z.50 4 .0 0 6 .5 0 ,0.00 I 5.00
— — i
Ac c e pt a bleC a lit , ,fVela light e ne d inspe c t io!

A2 1 AOL w due 8 ye k n pe rc e nt de -a .
[Irst t unpllq pla n be lc w ●rrow , t ha t is, bot h sa m ple OI Z .Sa s w e ll a o k va 2 ue . Whe n na m ple sise e qudt e r e =c e e do lot ~~
1:::, ,V.V ,t e rn ht h. lot must be inspected.
 TABLE 23-2 “StandardzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPON
De via llm M e t hod ~E
M a a t e r T a ble for Re duc e d lnm c .e c t im for Pla na Bre e d On V a rla bilit v U nk m w m
(Single Sp’c.ifi..tl.n Litnit-F. rm I )
I I “Ac ua lit y Le ve lo

I Sa m pI e size Sunple
.0 4
I .0 6 S I .1 0 .1 5 x.— .4 0

EEE
Z.50 4,00 6.50 i65i

m
Code latter size —.
I
-L k
—
k
—.
k
.—
k k k k

J+~~
l.lz .9 5 8 .1 6 5 .5 6 6 .1 4 1

I
1 .1 2 .9 5 8 .7 6 5 .5 6 6 .1 4 1
— — _—
D 3 1 .1 2 .9 5 8 ,7 6 $ .5 6 4 .1 4 1

E 3 I,lz .9 5 .9 ,1 6 5 ,5 6 6 .3 4 1

T 4 I 1 ,4 5 1 .3 4 1.17 1 .0 1 ..9 1 4 ,6 1 7 .3 9 3
— .— —. — —
G 5 1 ,6 5 1 .5 1 1.40 1.Z4 1 .0 7 .8 7 4 ,6 7 5 ,4 5 5
i t
H 7 Z oo 1.$8 i.7 5 1 .6 2 1 .5 0 1 .3 3 1 .1 5 .9 5 5 .7 5 5 .5 3 6
-i-
1 10 z Z .1 1 1.9a 1 .8 4 1 .7 Z 1 ,5 8 1 .4 1 1 .2 3 1 :0 1 .8 2 8 .611
— .
J 10
I Z.Z4 Z.11 1.9a !.8 4 1 .7 2
k
1 .5 0 1 .4 1 1 .2 3 1.03 .828 II

-1--
K 15 Z.53 Z.4Z Z.)z Lzo 2 .0 6 1 .9 1 1 .7 9 1 .6 S 1 .4 7 1 .3 0 1.09 ..986 .664
*

T
L Zo Z.58 Z.47 z.16 Z.Z4 Z.11 :.9 6 1 .8 Z 1 .6 9 1 .5 1 1 .1 1 I.lz .91? .695
— — — —
u Zo 2.58 Z.47 Z.36 .LZ4 Z.11 1 .9 6 1 .8 z 1 .6 9 1 .5 1 1 .3 3 I.lz .917 .6 9 5

N 25 z.61 Z.50 2.40 2.Z6 2 .1 4 1 .9 0 1 .8 5 I I ,7 Z 1.51 1 .3 5 1.14 .936 .7 1 2

t-t

d
0 10 2.Z8 .?.!5 2 .0 0 1 .8 6 1 .7 3 1 .5 5 1 ,3 6 1.15 .946 .7 2 J
— — — — —- .— —
P 50 Z.Y5 2 .Z Z Z .0 8 1 .9 1 1 .8 0 1 .6 1 1 .4 Z I.zl 1.00 ,1 1 4
*
Q 75 Z.41 2.27 2 .I Z 1 .9 8 (.8 4 1 .6 5 1 .4 6 1.24 1.01 .8 0 $
— —— .— I
All AQLvm 3 ue s ● re in pe rc e nt de fe c t ive .
f2 rot dunplln,g plm be low t rrow . t ha t it , both m m -qde nize no w e ll • ~ k va lue . Whe rt a e m ple oize equal, or exceed. lot
~~;;, e ,:,, ,,,m i“ t he ,0 , lll”,t t., ,m pe t t e d.
 Pa rt n
DOUBLE SPEC337CATZ034 3XM3’I

S8. SAbfPLLNG PLAN FOR DOUBLE the maxfzmIM tiowable percent de fecfivc by
SPECIFICATION ~ ML for the lower lim it , m a d by M for fhe
uppe r lim ft . If one AOL is asci~e 3 to both
This part of the Stan-dard describe. the IiAt. contbi.ed. designate the timum
procedures for use with plain for ● double Ulowable percerd d-f% by ht. Table B -3
specification limit w he n variability of the i. ● ntered from 3be 30p for marnul flupe c -
lot with re.p. ct to the quality cluracteristic t ion a nd from the bottom for tisbtaaed fLl-
i. unknown and the standard deviation method Wpecffon. Samp3fng pfuu for reduced fn-
is used. spect.ien ● re provide d io T a ble B -4 .

Bfl.1 use of Sampling Phm .. T CI determine B 10. DRAwU?G OF SAMPLES

whether the lot meets the ●cceptability cri-
I terion with respect
characteristic
to a particular
a“d AQL value(.)
quality
the a ppli-
Sample# shall
ance with paragraph
be elected
A7.2.
in accord-

cable campli”g plan ●ha31 be used in accord-

anc. with the provisions of Section A, Ge n- B11. ;:&-.o;&O T ACCEPTABILITY
e ra l Description of Sampling Plans, and .
t hose in t his pa rt of the Stamdard.
B 11.1 Acceptability Criterion. The degree
B9 . SEI J 2 CT I ?J G THE SAMPLING PLAN
01 Conformaa Ce or a WlA3ity elaaractcria3fc
A sampling pJa. for each AOZ. value with re. pect to m doubje mpacification limit
.hall. be ● elected from Table B-3 or B-4 m .hafl be judged by the percent of r.onconform-
[C.;J”WS: % P.tiuct. The percentage of manconforrn -
img product i. e .t im a t e d by e nt e ring T a ble
B9. 1 Determination of Sample .Stze Code B-5 w it h t he qua lit y index and fhe ’.a m ple
ktter. The .arnple i.. cone letter .hal; .ize.
be selected im m Table A-Z in ● ccordance
with paragraph A7.1.

B9. Z Maater Sampling Table.. The master

satnplmg table. for plum based on variabil-
ity .“kt-mwn for a double specification limit U is the upper specification limit,
when using the standard deviation mctbod L ia the lower sp.cificacion limit,
are Tables B-3 and B-4. Table B-3 i. u.ed X is t he sample mea., and
10. normal and tighlened ir.spection amd s is tkm estimate of lot standard deviation.
T=ble B-4 for reduced impectiom
B 11.3 Pere=nt Defective i. the Lat. The
B9. 3 Obtaining Sampling Plan. A sampling aualitv
. . of a lot shall be cx~r.a~terms
da”
.— consists of a .arrml. ..ze and the as- of the lot pe rc =nt de ie c t i~c . I t a e st im a t e
soeiated maximum allowable perceni defec- +3 3 be de.i~ted by p~. PUO Or P. m e
tive(s). The sampling plan to be ●pplied i. ia dic st e n c m ifornunc e with
inspection shtil be ob-iaed from WSter :::;52ptL upper .Pe.tllctiorl limit, PF
Table B-3 or B-4. w.ilh .e. pee: to fbe lowez .pecifiutio. lima .
-d P for bot h .Pe c ifia t i.n lim it - e om -
B9.3.1 Sample Size. The .unple #ize o is
bimed. The emtimstea p mid p
show ” in t he m a t e r t a bla s c orre a pe =ding
determined by wIterins + ● ble B- Y . ‘w’ r=.pe c be-
t O e a c h sunple size c od. le t t e r.
t ive ly +f.h QL a nd f)” m d t he sample ● isc.
B9 .3 .2 M -.im um Allow a ble Percent Defec. The eotinute p Zhmfzbe determined by ●dding
*. T h. maximum allowable pe rc e m
the corresponding ectinuted percent defec-
defective for #ample estinuLe. of pert.mt tive- pL a nd p“ found in t he t ible .
de fe. civ. for the Icxmr. upper, or both .pec.
ificatiori limit. c om bine d, c orre sponding to B12. ACCEPTABILITY CRITERION AND
the sample .ize mentioned ia paragraph SUMMARY FOR OPERATION OF
f3 9 .3 .1 0 in show n in t he COhm m of t he m a s- SAMPLING PLANS
t e r table corresponding to the applicable
AQL value(s). U different AOL, S ● re a .- B 12.1 be AOL value for both Upper and
sign=d t o each .pe cification limit, de .ignm fe Lower s’ ecxlncatson Lwm umd.
M I L-ST D-4 1 4
1 1 J urI e 1 9 5 7

B 1 2 .1 . I Ac c e pt a bilit y Crit e rion. 4 Carapare tdu, the lot meets the ●ccepubi.fityc riteria;
t he ● stimated lot pe.rcatt delective P = PW + otberwimm, the lot doe. not nwet the ace~.
PL with the maximum ● llowable p=rcent abf3ity criteria. U .mither QL or Qv or botb
d. fective M. 11p in ●qual to or less tfun M, are me~tiive, then the 101does not meet the
the lot meets the accepmb{lity criterion: if acceptability criteria.
p is grcatertban Mor ii eifher Qu or QLor
both ● re n.@ive ,then the lot does not meet BI Z .Z .2 Surnm a ryfOr Ope rt iia na l Sa m pffrt &
the ●cceptability criterion. Pla n. 3 n c a . e g w he re ● t erenf AOl. walue
~st a blishe d le . t he uppe r a nd la w e r .pe c -
B 1 2 . 1 .2 Sum m a ry lor Ope ra t ion of Sa m plin# ific a t ion lim it for ● single quality cfuract=r -
Pla n. I n c a se s w he re a ●m .glc ACfl. va lue is istic, the following steps sunururi’e the
~lishe d for t he .tmer and lower .pccifi - procedures to be US=CL
cation limit c om bine d for ● .in8 1 e qua lit y
c ha ra c t e rist ic , t he follow ing m t e p. ■um m a - (1) Deterrninethe ample .izecod=
rize t he proc e dure s t o be use d le t t e r from T a ble A-2 by twin, the lot size
a nd fnspe c t im t le ve l.
(1 ) Delerminc the ample size code
letter [rem Table A-2 by “sing the let .i%e ‘(.?) Se le c t t he sa m pling pla n from
● nd the iriap. ction level. Master Table B-3 arB-4. Obtain the.ampfe
.ize . and the maximum allowable percent
(2 ) Se le c t pla n from Master Table defective Mu and M’. corr=apondi.g to the
B-3 or 8-4. Oblain the ample size “ ● nd AOf. va2ues for the uppe r a nd low e r speci-
the maximum allowable percent defective M. fication limft., respectively.

(3 ) Se le c t ● t ra ndom t he sa m ple .a f (3) Select .1 random the ..nt ple of

“ unit . I m rn t he lot : i.sp. ct and r-cord the fr.rn tie lot; ia. pe.t and =ecord the
n unit e
mea. ur. merit of the quality characteristic meas”remerd of the quality cfur. cterimtic
on each unit O( the amp]=. on each unit in the .mrIple.

(4) Compute t he ●m ple rne sn X (4) Compute the sa m ple m e a n X

a nd c .t im lt c Of lc .t .tand=rd dcviatic.n s. a nd e st im a t e . 1 0I .t a m la rd deviation s’. ,,
(5) Compute the quality indices (5) Compute the quality ittdice.
QU = (u-X)/. and QL= (X. L)/,. Qff = (u-X )1 . a nd OL = (x - L)/a .

(6) Determine the estimated lot (6) Deterrniae tbe estimsted lot
p.,r.n: d. fecfiv. P = PU + PL from Table percent defective ~ and p~, correspand-
B-5. iag \othe percent defective* shove fhe uppe r
a nd be low t he low e r .peciIscaticm limit-.
(7) lf the e.tirnated lot percent de- A2eodetermi”e the combin.d percent delec -
fective p i. equal tc. or 1,.. than the maxim- tive p = pu 4 p~.
um ● llowable pt zc e n% defective M, the )ot
meet, the ●cceptability criterion; if p is (7) 11all tbre=of the f.dlowin~ corl-
ur.~t=, th=n M Or if either W or QL - dition.:
bolhar. ne~.tive, then the 101doe. not met
the ●cceptability criterion. (a) ~ i. equal t. 0? 1... thll
% ●
B] 2 .2 Different AOL Valueo for Upper and
Lower specification Limit. ~] PL !9 =LNJ81tO 0, h.. t3UII
‘L.
B 1 2 .2 .1 Accernability Crit’eria.5 Gmpare (c) p is equal to orlemmthanfbe
th. e.tirnated 101 fJC,C.llt dd e c t ive s pL a nd larger of ML ● nd bt U ,
PU w it h t he c m ? c .pn.ding rnt im um a llow .
able p.rcem defective. M a re sati. fied, fh= lot meet. the ●cceptabifhy
compare p = F.L + Pu wfth tke%~#~fa?L criteria; ofhe=wi. e the lot does mat meet the
and Mu. If pf, i. ●qual to or Iesn than htL, acceptability criteria. ff either OL or Gff
PO i. =qu*: to or le.. than MII. and P im or both ● re negatiwe, then the lot does not
.@al to or 1.*s than the larger ‘of ML “and tne=t tbe acceptability e=iter ia.

+S.. Et im ple B. 3 {or . c m nple t e ●x a m ple of ibis proc.dure.

*W Example B.4 lot a c m m pl=t e exatnple of thfs procedmre.

42
 Z41L-STD-414
Ii June 1$S7

I 3SXAZ4PLC E-+

i Example of Cdcu3ati0nm

I Double spa Mlutino Ltmtt

I
V a ria biN t y ?.bbna m n . St ut da rd Z k uia t ic m M .t hod

0 .. AQ L V a lue fa r bot h Upper and Low e r Specification. Lim it Cm m bine d

E-de Tbc minimum temperature of operation for a c=rtAtn device 48 speetfied 8.180- F.
The m a sim w nt .m prst .re h 209” F. A lot of 40 it e m . i- submitted for imopection.
3nmpection Level 3V. normal in.pect(on, wtth AOL. s 1% im to be ..d. From Tablam
A-2 and B-3 it is ne e n t ha t s sample of ●i=e 5 is zequird Suppo* e t he rne ...re .
1’ m c nt m obt a ine d ● re 8 . fof3 0 w .: 1 9 7 ”, 1 8 8 ”, 1M ., 2 0 5 ”, m d 2 0 1 -; ● nd c m npliuw .

1’ w it h t he a c c e pt a bilit y c rit e rion i. w b. determined.

Line
— Znforrnatian Needed Value Obtained Explanation

1 Sample Sise: n s

2 Sum 01 Measu.. mant.: SX 975

3 Sum of Squared M e a sure m e nt : XX2 190,435

4 Corre c t ion Fa c t or I CF): (2 x )z/n 190,125 (975)2/5

5 Corre c t e d Sum of Squa rc a (SS): X X ~C~ 310 190,435-190.125

6 V a ria nc e (V ): SS/(n- 1\ 77.5 310/4

7 Est im a t e of Lot St&rd Deviation s: & 8.81 m

s Sample Mean ~: ~1. 195 9?5)5

9 Upper Specification Limit: U 209

10 Lowe r Specification LitnAt: L 180

II QtuIity Index: Qu - (U-X)/s 1.59 (zo9-1951/a.nl

12 C3udity tid=: OL = & L)I. 1.?0 (195-180)/8.81

13 Eat. of L9t Percen5 hf. Ab0V8 U: 2.1 9% .%- Table B-5

%
14 Est. of Lot Percent Z)ef. below L PL .64% Se e T a blm B-5

15 Tataf E81. Pe.rcm13 hf. & La& p = pu + pL 2.85% 2.19% + .66%

16 Max. Nlowable Percent Da f.: 3.4 3.32% See Table B-3

17 Ac c e pt a bilit y Crit e rion: Com pa re P . Pu + 2.85% < 3.3.2% See Para.

p~ w it h M 812.1.2 (7)

‘3& lot meet. the ●cceptability criterion. Ante P s Pu + PL i. 1=. s t~ M.

I ,..
43

—
m& 6w 14
1 1 J one 1 9 5 7
EX AM PLE B-4

Exampl* of cazcU2Mf0m

DOnbla Spcffiuti.=n Z.imtt

Vari&i3fty Uakm - 5tsadard Deviation Method

Different AQ3. Value. ior Upper and Luwer Specification l.imitc

Example The minimum temparamre of optra3foa for ● certiin dewice i. .pecified ● - 180- F.
The rnu5mumtempQ=a3ure ii 209” F. A lot of 40 items in subrnkted for inmpm=3ion.
f.mp=ctic.n L=v=l I v, norm a l im W=CCI CQI . --I * ACZ L = 1 % foI * = uppe r -d ~~ =
2 .5 % for t ha 1 0 ue r spe c ific a t ion lim it is to be used. From Tables A-Z and 23-3 it
is ●.en t ha t . sample of sise 5 ia re quire d. Suppcme the measurements obtained
are aa follows: 197. , 188. , 184”. 205”, and ZOI. ; and c om pliuc e w it h t he a c c c pt -
ability criteria i. 10 be determined.

~ Information Needed Vat.. Obtain. d Explanation

1 Sample Size: n 5

z Sum of Mesmmements: ZX 975

3 Sum of Squared Meaour.m.mta: XXZ 190.435

4 Correction Factor (CF): (ZX)2/n 190.125 W75)215

5 Corrected Sum of Squares (SSh lX~CF 310 1 9 0 .4 3 5 -1 9 0 ,1 2 5

b Variance (V): SS/(n-1) 71.5 3 1 OI 4

7 Estimate of Z.ot Stam&rd Deviation s: fi 8.61 m

k Sa m ple Me= X X X ln 195 97515

9 U pp=r Specification Limit: w Z09

10 Lower Specification Limit: L ,1s0”

11 CluaIity 3ndex: Q“ . (u-X)/o 1.s9 [209 -195) /6.s1

lZ OAity index: (ZL = (X. fJ/. 1.70 (195 -180) /n.81

13 Est. of z.&4 Percenf DA ● hove U: ~ 2..19% See Table B-5

14 Ea t . of f..of Pe rc e nt De f. be lsw k . PL .64% see Table B-S

is T ot a l E.;. P. rc e nt & f. in Lot ,: p . PU ● pL 2.85S 2.19% + .6W

lb M u. Allowfahlc Pereent Def. • bov~ U : MU See Table B-3

17 M u. Allowable Percent Def. below & ML 9 .0 0 % See T*1. B-3

la Acceptability Criteria: (s) Com p-rc PU 2.19%. 3.3.?% See Para.

Blz. z.z(7 )(a)
@) ;;;p;f pL .bf+ < 9.80% see Psra.
BIZ. Z.2(7)(bj
(c ) Com pa re p Z.esn c 9.80% S.. Para.
Wifh M L BIZ..2.Z(7)IC)

~e lot meet. tbE ●cceptability criteria. ●be 18(s), (b); ad (c)are •ati~fied; i.-.. PU ~
pL<M Lsndp<Lt L.
44
 T ABLE B-3 S1 a nd* rd De vit t lon Method
M int e r T sble for N orm 8 1 a nd T ight e ne d t na pc c t ion for Plm s Blse d on V a ria bilit y U nk now n
(Double Spe c ific a t ion Lim it a nd F.rm 2 -Single Spe c ific a t ion Lim it )

Ac c e pt a ble ~ t I norm .1 in! ●c t im

Sample cite .0 6 5 .1 0 .1 5 .2 s .40 I .0 0 i~ 1.50
.04
code letter ~
M M M M M M ii- M

B 3 7.59
v v
c 4 1 .5 3 5.50 10.9Z 1 6 .4 5 Z Z .8 b 2 9 .4 5 3 6 .9 0

D 5 1.31 3.3Z 5.83 9.80 1 4 .3 9 Z O.1 9 Z b.5 6 3 3 .9 9

; - i +
E 7 0 .4 2 2 1 .o6 Z.14 3.5s 5.35 8.40
‘Zzo I““l 4 ‘0$0
r 10 v v v 0 .3 4 9 0 .7 1 6 1 .3 0 Z,17 3.26 4.77 1.Z9 10.54 15.11 ZO.14 Z1. S7
— —.
G 15 0.099 0.186 0.31Z 0.503 0.818 1.31 Z.11 3.0s 4.31 6.56 9.46 13.71 18.94 z5.61

H Zo 0.13s o.2zn 0.165 0.544 0,846 1.Z9 2.o5 Z.95 4.09 6,17 8 .9 Z 1 2 .9 9 “1 2 ..0 3 Z 4 .5 3

I Z5 0.155 0.250 0.380 0.:51 0.017 1,29 Zoo Z,86 3.97 5.97 1 3 .6 3 1 1 Z .5 7 1 1 7 .5 1 1 Z L9 7

J 30 0.119 0.280 0.413 0.581 0.079 I ..?9 1 .9 8 z,03 3.91 5 .0 6

’47I “024
‘2’61 I “s’
K 35 0.110 0 ,2 6 4 0 .3 8 8 0.5}5 0,847 1.23 1 .8 7 Z,68 3.70 5 .5 7 8.10111.871 16.651 Z2.91

L 40 0.17 9 0.275 0.401 0.566 0.873 1.z6 1 .8 8 z.71 3.72 5 .5 B s.0 9 1 1 1 .8 5 [ 1 6 .6 1 I z2 .8 6

M 50 0.16 3 0.Z50 0.36 3 0.503 0.789 1.17 1 .7 1 Z .4 9 3.45 5 .2 0 7 .6 1 1 1 .Z 3 1 5 .8 7 Z Z .0 0

N 75 0.14 7 O.zze 0.33 0 0.467 0.7.20 1.07 1.60 2 ,Z 9 3.ZO 4 .8 7 7 .1 5 1 0 .6 3 1 5 .1 3 2 1 .1 1

o I00 0.14 s O.zzo 0.31 7 0.447 0.68 9 I.oz 1.53 2 ..?0 3,07 4 .6 9 6.91 [0.32 14.75 ZO.66
—
P 150 0.13 4 O.zo 3 0.Z9 3 0.41 3 0.63 8 0.949 1.43 Z .0 5 z.#9 4 .4 3 6.57 9.86 14.ZO Zo.oz

Q zoo 0. ;3 5 O.zo 4 0..294 0.41 4 0.63 7 0.945 1.4Z Z .0 4 Z .nl 4 .4 0 6.53 9.81 14. IZ 19.9Z

.06 5 .10 .15 “.25 .40 x I .00 1 .5 0 Z.50 4 .0 0 6.5o 10.00 15.00
—
Ac c e M a bilit v Qua lit v Le ve lt ( ;ht e m insrmcticml -5
-.

All AQLa ndt a blc vslue t ●re inpe rc e nt de fe c t ive .

a
 ,—

T ABLE 23A
M ut e r T a ble fa r Re duc e d fnvpe c c lm [m Pla n. Bared o Vsrlablllty thkn.awn
(Double Spe c U {c a t ion Lim it -d Form 2 - St t t gt eS !clfic atim Limit)

Ac c e pt a b = ~ 10
a m ple c it e sa m ple -j 7
..?5 .4 0 zi- 1.00 1 .5 0
:x I * I e t t sr 8 1 ;0 —
I }.( t .. , -ii- =2 M 3 .4
— .— — —
I
B 3 7 .5 9
--

c 3 7 .5 9

D 3 1 .5 9

E 3 7 .5 9 18,06 26.94
t
F 4 v 1 .5 3 S .5 0 10.9Z 16.45
— — —

I
G s
v
1.33 3 .3 2
!
5 .8 3 9 .8 0 1 4 .3 9 I 2 0 .1 9 I Z 6 .Sb I 3 3 .9 9

H 7 0.412 1.06 2,14 3 .5 s 5 .1 5 8.40

A
a
1. 10 0.349 0.716 1.30 Z,17 3 .2 6 4 .7 1 1.Z9
—
J 10 , 0.349 0.716 1.30 “Z.17 3 .z6 4 .7 7 7.Z9

K 15 0. ( 2 0.s03 i. fllfl 1.11 Z.11 3 .0 5 4 .3 1 6,56 9.46 I 13.11 I 18.94 ] Z5.bl

L I Zo I 0.228 0 .3 6 5 0.544 0.846 1.29 “~2.a5 1 .9 5 4 .0 9 6.17

4-4-4-=
— —
M. Zo 0.ZZ8 0 .3 6 5 0.544 0.946 1.Z9 2.05 2 .9 5 4 .0 9 6.17

N Z5 O<Z 5 0 0 .3 8 0 0.551 0..977 I,zv ,?.00 2 .8 6 3 .9 7 5.97

o 30 0 .2 8 0 0 .4 1 3 0.581 0.879 1.Z9 ,1.9s 2 .8 3 3 .9 1 3.86

0 .3 6 3 0.503 0.789 1.17 1.11 Z .4 9 3 .4 5 5 .2 0 -=l=t+t-

0 ,3 3 0 0 .4 6 7 0 .7 2 0 I .07 1.6o Z ..?9 3,20 4 .8 7 1 .1 5 1 0 .6 3 1 s.1 3 2 1 .1 1
_l-1-LK — —
All AQL a nd t -ble va lue s ●re {a pe rc e nt de fe c t ive .
first ounpllng PIU bdow ●rrow , t ha t is, bot h #unple oize a. well m M va lue . “Whe n c unplo sise e qua 2 @or e x c e e ds lot
Jy:a, e.e~y item in tha lot m um t b. in#pecled,

I
 —
.—— _ —. _____

TABLE B-5
TSWO for Eotkmtlq th~ &t Pe, CCIIIDe fe c t ive U # lnS St a nda rd De vl.ilon M # t he dl
zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
 .- .

TABLE B-5-Conthed EZzyxwvutsrqponmlkji

T hblofor E!t im .t lng t he t it Pe rc e nt D*(ectlve U#lng S;mdard Devlaiion MQ~hod
k!’

1
 -.
.,,

TABLE B-5 -Conllm .w d

Table for Eot lm a t la g t bo bt Pe rc e nt De lt c t ive U sln@ S1 -d~?d De via t ion M a t hod

. ,.-
. .

,.
 J

T ABLE B-5 -Cont lnue U E

T m blc for Eot lm a t ln[t ho lm t Pc rc e rI t D6 fe c llve U c @St m da rd De fla t ion M e t hod
k F

i.

I
 .—. . .—

TABLE B-5-Cadimed

Tatdo for Eattnutlq tho kt Pore a nt Def*ctlwe UOlag Standard Derlatien ,Mothod

a
“

E
-“
“.
 ML-rm-414zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
1 1 J 5 fffa 1957

Pmrt m

C5TZMATZON Or PBOC= AV~E AND ~TER3A FOR

REDUCED A35D TIONTU4CD =PECT I ON

B13. ESITbfATfON OF PR~ AVBR- and the ~rremmondtnsedmtid 1c4 +rcud

AGE &fOcfiw ~ & p=,-respectively. iw mad
from tfm fable. Tbe ectinuted proceco ● v-
The ●verage percent defectiwa. b-cd crage ~ i* * ~ifhnwfic meaaef fbe fad3-
up. = group of le t - subm it t e d for origfnd vtdual e.ttrnmted tot perce.t defective- pu’ c.
inspe c t ion. i. c a fle d t he proc e o- ● vora gc . 6tmitarly. the etiimated procem ● ● =rage
Origina f im spe c t im i i. t he firm im * pe c fiOn Of $L it tbe arithmetic mean of the individual
~ -~c b? ety of p~ ●bm t t t e d ● ctfaut9d 30t pareemt &facUwa pL’8.
for ●c c e pt a bilit y a . dfot ia guf.k d from f3 M
im m pec ;ie . of produc t w bfc h t i. be e n re m t b- B 13.L2 Uoubl. SpecW. UtImI Limtc. The
m ift e d a ft e r prior re & c ft c m . 3 % . pro-.. . ●timated Iof percent defecfive ● c &-
a ve ra ge .fuU be ..timated from flm r..uft. .termIned from Table B-5 for the pfaim ba .e d
of in. peetic.. of samples dr.wmfmrn a .pee- on t he st a nda rd de via t ion m e t hod. T he qt uf -
ified number of precedfq lot . for t he pur- It, imdf... Qu d 0= sti ba e-vu-f.
~.= Of d=~=rda ia g ●.v9 rit y of ia c p.c fia n T a bfe B-5 i- e nze re d ●e pa r.t e ly w lfh ~ a nd
d.rin~ the c..r.e of . cmdr.cf in accordance QL d t he -unP5 e ●ia e , d t he e or--m pm d-
with ~rag,.ph B14.3. AD, 1- sM1 b- iu- fa g ~ a nd PL us re a d f m m t he t 8 ble . T h.
cIuded only once in ●stinuffag lb pxocem. e a t it rm t .d lot pe rc e nt de fe c five t . p = p .+
.verqe. The ..ti_t. ef Uw prw.. ●wr- PL. The eatimuted proc. ●S a=rage p is se
=K= i. d=. i~t=d by PU -be. eompufed wifh ● rifbm.fic mea. of the individtuf c ..t inut e d
re. pect to an upper ●pee fficatier. lisnit, by lot ~rcenf defective- p’..
PL w.h=. c,.mpyte,d w+fh rc.pecf to ● lower
.P=c ,f,.~t * - I .m t t . m d by p w he n c om put e d D 13.Z.3 S cfal Cam. It the qtulity index
w it h re . pe e t t o a double .pe c ffic a t io. fim it . OIJ or C3L< a negative ‘numb=.. the. Table
.-. B-5 i. entered bvdimrenardins the negative
B 1~.1 Ahn.rm A R.muft.. l%. r.. ult. of .ip. f-i---- , ‘i. tbi.- a., ‘h. c.. fi&ated
inspection ef product _ufaetured under lc.t percent de fecfive above ftm uppa r limit
. ..”diti... mot” typfcd of ..IuI p.odmeficm or below fbe lo=. Zimit i. obtafned br mzb-
.3u15 be exeluded frmn the ● .tinnted pre- tractiq the PCrcenuge found i m the” table
ce.. avera~e. from 100%.7

B 13.2 (hnputmtion of the Est5nuted %0. .BIL. NORMAL TIGHTENED, AND m-

. estimated procem- ● =r- DUCED IkBP33CTfON
atm
‘~ t. t e ● r thmetic
‘h mean of fhe .atfmafed
l~t percent defective. computed from b Thts S-* rd esti5fah*d campfiag
.amptia~ iit.p. ction *..uft. d the px e c e dt m s pfam for normal, t ight e ne d, a nd re duc e d
t e n (1 0 ) lc I t . .M a . m a y be ot he t w f. e de c ig. iM pa c t iOn.
na t e d. b orde r to e.tirnate tbe lot percent
dal.etive, tba quality Ucea QU tiler QL
shaff be cmn~ted for ● ub lot. Tbom ~e:
C3U = (u-X)/c md QL= (X. L)/a. @em pus.
Sr*pb 3511.2.) B 1 4 .2 -a s 3 1 WWe t fon D9 rt m , t ba c 0 ur9 *
Of hm c uon. M rnuz t irnc t t a n ●ha ff be

fisbt m nd e r ‘r.duc 8 d LrJ sp.c fic m 1 . ~ m r-

quir9 d b • c c or~ w t t b pr.sr.~ B 1 4 .3
d n1 4 .4 .

B14.3 Tishtaa8d 311spectioa. TI~btarnd h.

●poetfon ●balf b- fmtitmad whn tha c cti -
matid pro- ●a .nragm wmpidmd from tfm

When Form I -Sfngl. Spectff~tfon ~ 1. rm .d for t ba acmptabfflty criterion. tbe “octl -

mafe of 1 0 1 pe rc e x t l & fe e t fve pu.or pL 1 0 m ot obt a .lm e d;fm orde rt oe w t im a t e t he proc.am ● v8r -
~s=. it i* n=c=a~=rr to complete paragrapba B6.2 uuf B6.3 of Form L
7FOraXUnP18. U ~ . -.50-0 = 1.60. us~ ●SMPZO SCM SO,PU = 100% - 30.93% = 69.071b,
P1. 9 ~-n -P* 69.07s + S.sk . 74*.

52

. ..-
 IzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA

XIL-STD414
II 11 June 19S7

preceding ten (101 108. (Ot ..& 04h*r rlwn - b estimated lot percent defective is eqtnt
bar of lat. de. i~ted) 1. =crnrduue with to =ero for a ●pe dfie d num be r of c onm e e u-
Kr=zr&pb BIXZ i- srestcr than the AQL, t iw e tot, (gee Table B-?).
-d w he n m ore t ha n A c =rt a ~ num be r T of
Cad6tfon c. PrOdnctiM is ●t a

I
t he m lots have e.timafes of flx pe rc e nt de -
fe c t ive sx c e e diq t he AQL. The T vdttbs ●teady ra t a .
● re given in Table B-6 far the procea. .v-
erage c om put e d from 5. 10. Or 15 Iots.e Normal impaction ●hall he r.in.tated if any
NormmI inspection shall he reinstated if the oaac of the following condition. occ. ra undc r
..t inut .d pre c e s. ● ve r-ge of lot s und=r re duc e d inspection.
t ight e ne d i..prc t ion is c qud t o or 1 ..8 t k m n
t he AQL.
Condition D. A lot i. rejected.
Condition E. TM e m t im a t e d prc .c e m●
B 14.4 Reduced Im.pectiom. Re duc e d ilI - ● .e ra gc is gre a t e r t ha m t be AQL.
.pe c t ion m a y be inm it um d prc .vid. d t ha t ● ll
of t he follow ing condition- are ●atiofied: Condition F. Produc t ion be c om e .
irre guI ~r or de la ye d.
Condition A. The preceding ten [10)
lot. (or .uch other mmnber cd lm. de. igruted) Condition G. Qther condition. .. .
have been under nornul ia.peclio. a nd nom ~? ~brrmt that normal inspection .hould
ha s be e n re je c t e d. be reinstated.

Condition B. The e ctimated percent B 14.5 Sampling P1 8 m . 1 .. Tightened Or Re-

defective for each of theme preceding lot. io duced lmpecthm. Sunplu-ig plan. ior t ight -
1=.. U- the appUcable lower limit shown ene d and reduced in.pecticm .re provibd in
in Table B-7; or km =ertak .arnplirIg plan. , Section B, Part. 1 and U.

I:

I ..
 M I fA3 T D-4 1 4
1 1 J w m 1 SS7

Cuve] t49mbar
Z.5 10.0 15.0 Of bta

4 4 5
6 :
8 9 1: ‘0 i5

4 4 4 5
1 1 10
9 10 1: 15

4 4 4 5
10
1: 1: 1; 15

4 4 4 5
10
I 1: 1! 1: 15
I .
4 4 5
.: 10
11 1: 1: 1s

4 4 4 5
a a a 10
11 11 11 15

4 4 5
: a a 10
11 11 11 15
,
4 4 4 5
8 8 10
11 11 1: 15

4 4 4 5
a e 8 10
11 11 11 15

4 4 5
8 : 8 10
..
11 11 11 15

4 4 4 4 4 5
L 6 6. 8 io
a 999910 11 1: 1: 15
/
4 44 4 4 4 5
M 6 7 8 8 a 10
9 : 11 11 11 15

4 4 4 5
s 8 8 10
11 11 11 15

4- — 4-- -4 5
“8 a a 10
I 10 I 11 11 11 15

mm ● re m 9mp31a# pluu prwuad la thio Staa&rd far Unse code lctirs dAO1.wshm9.

..-. —-
 unmlTP514
11 Jrmd 19s7zyxwvutsrq

T AB= B-6<0nfif=d sUmdard D8dmnua U8fbd

vdtms of T [or TiKhtaud Impaction

Th. top figure ia ..ch ilock refers t. fbe preced~g 5 10C~. the ~ddfe fi-re ~ ‘e
preceding 10 let. and the boftom fipre to the preceding 15 let-.

Ti@encd ia.pection i. required whom tbe numb. r of lnta wltb e~tfmates of percent
de fe c t ive ●bove t bm AQL from t he pre c e diq 5. 10. Or 15 Lets is srester tbmn th= xiveri wdue
of T in lhe table. ad tbe pro.en~ average from them. 10t@ .=.=.da tba AQf-.

N1 estirnatew of the tot percent defective are c.btained f rem T8ble B-5.

-.
—
—.

T ABLE B-7 Slm dt rd De vI a 4 4 0 n M !t hod I“

::
Llm lt # 0 1 & # t im ~t t d Lut Pe rc e nt De fe c t ive for Re duc e d Z a .pe c t ion

sa m ple t ll* Ac c e pt a ble Ouili!y Le ve l.

code letter .04 .063 1 .10 I .15 I .25 .4 0 I .6 5 [ 1 .0 [ 1 ,5 I 2 ,5 T5-
I
23 * ● * ● * [ZB]** [I O]* * [lZ ]* * ( 9]**
I

.77 5
c ● ● ● ● * ● ● [45]** [II]** [22]** [15]** [IO]** [ 7]0. 15.00 10
& 15

E
●

●
●

●
●

*
*

●
●

[25]**
*

[18]**
[31]**

[14]**
[25]**

[11]..
[18]*.

.00
,10
[13]*O

.00
.88
[ 9]**

.1 1
z.65
.
0.00
4.40
6.S0

1.38
5.96
.74
9.96
10.00

4.24
10.00
6.06
15.00
&

9.09
15.00
5

5
10

10
15

.es 2.49 4.00 6.50 i & 15

=
? .000 .000 .000 .003 .044 .>06 1.05 t ool 5 .1 9 iO.47 5
F ● ● ● ,0 0 0 .0 0 1 .016 .101 .317 .74 1.80 3.56 6 .5 0 1 0 .0 0 15,00 10
.0 0 2 .0 2 9 .123 .369 .81 1.50 2.50 4.00 & I i 4 Is

v .000 .000 .000 .002 .011 .041 .136 .123 .84 1.64 ),s0 6,06 1 1 .5 1 5
G ,000 .003. .006 .018 .057 .143 .310 ,643 1.14 2,23 3.94 6.50 I0.00 1 5 .0 0 10
.003 ,010 .02s .062 .151 .315 .6.?6 1.00 1.s0 2.50 4.00 & A L 15

H
.000
.004
.013

.001
.000
.010
.029

.002
.002
.03.3
,0s0

.006
.005
,040
.10!!

.014
.017
.111
.?.1s

,037
.04.s
,2.3s
.396

.083
,121
.445
.65

.185
.266
.78s
too

.36o
.521
1.31
1.50

.653
1,14
2.40
2,50

1.33
Z.24
4.00
,&

Z .4 9
$
-1- 4.29
6.5o
1

4.59
7.40
10.00
A

7.74
1
1 2 .0 7
1 5 ,0 0
A

lZ.4>
5

s
10
15

1 .009 ,020 .039 ,071 .1 4 6 .214 .509 ..963 1.39 2.48 4 .0 0 6.50 10.00 15.00 10
,0 3 .1 .043 .077 .133 .248 .40 .65 I .00 1.50 2,50 A 1 A & 15

,002 .005 .012 .023 .054 .113 .231 .431 .750 1.47 Z .6 6 4,81 1.98 lz.69 5
J ,011 .0 2 1 .0 5 0 .0 8 7 .1 6 9 .306 .550 .909 1.44 Z.50 4 .0 0 6.50 10.00 15.00 10
.0 2 7 .0 s2 .0 8 9 .1 4 6 .2 s .40 .65 1.00 1.50 A A ,A h -+- A 15
-.. + 1

●T h=i* m rc no m m plia g plain provide d Ant h!o St a nda rd for t he se c ode I e lt e ro a nd AOL vdue i.
 .—— ,. —.- -—___—_ ,._

T ABLE B-’f-ConU nue d St a nda rd DevlaIkIn M,t~d

Lim lt o of Cc t im a lc d Lx P~rc e t N De le c t l}e for Re duc e d hw pe c t im

Sunple OI Z R Ac c e pt a ble @di}y Levels Numha r

code le t t e r .0 4 .0 6 5 .10 .1s .25 .40 .65 1,0 ! 1,5 2.5 4.0 6.5 10.0 15.0 of &to

.004 .008 .017 .03.? .069 .137 .210 ,483 .8.?1 1.57 2.19 4 ,9 6 8 .1 s 1 2 .0 8 5
K .017 .033 .059 ,099 .186 .3Z.9 .577 .940 1.47 2.50 4.00 6.5b 10.00 15,00 10
.012 .058 .091 .15 .25 .40 ..65 1.00 1.50 L h a 1 & 15

.005 .011 .022 .040 .082 .157 .300 .5, ?5 .876 1.64 2.88 5.08 a.z9 13.03 5
L .020 .038 .065 .108 .199 .343 .596 .961 1.49 2.50 4.00 6,50 I 0.00 15.00 10
.035 .ObJ .10 .1 5 .2 5 ,4 0 .6 5 1 .0 0 1 .5 0 6 A 4 h A Is

.0 0 8 .0 1 6 .0 3 0 .0 5 ?. .1 0 2 .1 8 7 .3 4 5 ,5 0 7 .9 5 9 1 .7 6 3 .0 1 5 .2 1 8 .5 0 1 3 .2 s 5
M .0 2 5 .0 4 5 .0 7 5 .1 2 0 .2 1 5 .3 6 { .6 2 1 .9 8 9 1 .5 0 2 .5 0 4 .0 0 6 ,5 0 1 0 .0 0 1S.oo 10
.0 4 .065 .10 .1 5 .2 5 .4 0 .6 5 1 .0 0 b 1 A & & & 15

.0 1 4 .0 2 6 .0 4 4 .0 ?2 .1 3 4 .2 3 5 .4 1 4 .6 .9 1 1 .0 8 2 1 .9 2 3 .2 4 S.!iz 8 .0 1 1 3 .6 0 5
N .0 )1 .0 5 4 .0 8 1 .1 3 6 .2 )6 .3 8 9 .6 5 1 .0 0 1 .5 0 2 .5 0 4 .0 0 6 .5 0 1 0 .0 0 1 5 .0 0 10
.0 4 ,0 6 5 .1 0 .1 s .2 5 .4 0 A A 1 k A A & & 15

.0 1 s .0 3 2 .0 s3 .0 8 5 .1 5 3 .2 6 1 .4 5 3 .7 3 3 1 .[4 9 ,?.0 1 3 .3 6 5 .6 7 8 .9 8 1 1 .0 0 5
0 .0 1 4 .0 5 8 .0 9 1 .1 4 J .2 4 5 .4 0 .6 5 ‘ 1 .0 0 1 .5 0 ,?.5 0 4 .0 0 6 .5 0 1 0 .0 0 1 5 .0 0 10
.0 4 ,0 6 5 .1 0 .1 5 .2 5 b A k , , , , & L 1$

.0 2 3 .0 3 9 .0 6 4 .1 0 1 .1 7 7 .2 9 6 .5 0 1 .7 9 9 1.Z31 2.13 3 .5 2 5 .8 7 9 :2 2 1 4 .0 7 5
P .0 3 8 .0 6 4 .1 0 .1 $ .2 5 .4 0 .6 5 1 .0 0 1 .5 0 2 .5 0 4 .0 0 6 .5 0 I o.oo 1 s.0 0 10
.0 4 .0 6 5 b A 1 A A A b & A a & A 15

.025 .044 .069 .108 .1!38 .312 .525 .830 1,276 2.19 ~.59 5.96 9. N. 14.19 5
Q .04 .065 .10 .15 .25 .40 .65 I .00 1.50 2.50 4.00 6,50 10.00 15.00 10
& A & i A b A & 8 i 1 i 1 A 15

Ml AQL sa d t ~blo va lue s, ●x e * pt t hre e in t he bra c k e t s, 8 re in pe rc e nt de fe c t lvo.

VAf3met he flrot figura I n dlraetZom o{ ●rrow and c orre sponding num be r of I ot m . fa ●a c h bloc k t ha t op (I gure rofc rc t o t he
prc c e dlos 5 ,1 0 t s, the m5dd2* figure to t ho pre c e ding 1 0 ”lot t , snd t he bot t om figure t o t he prt e e dlng 1 5 lot o.
“
Re duc e d 6 nspe c t le a I I WY ba Sr@it ot e d w he n w a ry ●ttlrmtd lot P rc snt de fc c t ivc !from t he pre c c dins S, 1 0 , or 1 S le t o it ~ F
bdow t ha flpr* c ivm t n t he t a bl* ; rc duc od inspe c t ion for sa m pling PI M C m m k .d (* * ) la fho t lblc ra quire o t ha t t ha ●a t lm t iod
lot po?c e nt dc foc t lvo 1 0 e qt t a f t o sa ro for t he num be r of c ont e e ulive lot s I ndic a t e d I n bra c k e t o. la sddlt lon, ●ll ot he r c e ndlt lont r?
for rodue a d I nspe c t ion, in Pm t 2 2 3of Se c t ion B. m ut t be ost it fi.d.
s
~g
N1 ●aih’natem of t he lot pa rc e nt defe c t I v* a re Obt a ine d from T a ble B-5 .

,:
 sample tiaa ‘ Sample tepll le Oudit y L.c ve lo (in ercec
code Imttr Oise .04 .0b5 .Io .15 z— T
-. .6 5 I .0 0 1.50
—
34 3

c 4 .3 1 9 ,)53 .374 ,3 9 9 .4 J Z .4 7 Z .S2 8

— .
D 5 ,Z 9 4 .1 0 8 .Jz) .346 .)7 3 . .4 0 8 .4 5 Z .s1 1

7 .2 4 z ,Z 5 3 .Z b6
EzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA .Z 8 0 .Z9S .318 .3 4 5 ,M 3 1 .4 Z 5 .4 8 9
I
F 10 .214 .2 Z 4 .2 3 s .2 4 8 .Z bl .Zlb .Z98 .5 Z 4 .3 5 9 .4 0 3 .4 b0
—
G 15 .18?. .I.521 .19s .202 .211 ,Z zz .,2 1 5 .2 4 8 .262 ,Z84 .3 0 9 .344 ,386 .442

H Zo .177 .18J .190 .197 .z06 .z1 6 .Z Z 9 .Z 4 2 .255 .Z17 .302 .3)6 .371 .43Z

I Z5 .114 .180 .181 .1 9 3 .203 ,Z lz .Z zs .2 3 8 .251 ,27) ,291 .331 .372 .4z6

m J 30 .1 7 3 .1 1 9 ,1 8 5 .1 9 2 .201 .Z lo ,2 2 J .2 3 6 ..?4 9 .?70 .Z95 .320 .369. .4Z3

m
K J5 .1 7 0 .1 7 6 .1 8 3 .1 8 9 .198 .Z 0 8 .Z zo .Z J Z “,2 4 5 .?bb .Z91 .323 .364 .416

L 40 .1 6 9 .I lb .1 8 2 .I E.5 .190 .2 0 7 ‘.Z 1 9 ,2 3 2 .2 4 5 .Z 6 6 .290 .3Z3 .363 .416

— —.
M 50 .1 6 6 .1 1 2 .1 7 8 .1 8 4 .194 ,Z OJ .Z 1 4 ,Z Z 7 .2 4 1 ,Z bl .Z 8 4 .3 1 7 .1 5 6 .408

N 75 ,lb2 .1 6 1 3 .1 7 4 ,1 8 1 .189 .1 9 9 .Z ll .Z Z J .Z 3 5 .Z5S .Z 7 9 .3 1 0 .3 4 8 .399

0 100 .1 6 0 .lb6 .172 .179 .la7 ,1 9 7 .2 0 8 .Z 2 0 .Z 3 1 .2 S3 .Z 7 b .3 0 7 .3 4 5 .393

— —
P 150 .1s0 .Ibl ,170 .175 .1 8 5 ,1 9 1 Z06 .21b .Z 3 0 .Z 4 9 .z71 . 30Z .3 4 1 )81

Q 200 .151 .1 6 3 .lb8 .1 7 5 .1 8 3 .1 9 1 ;,Z 0 3 .2 1 5 ..?Z 8 .Z 4 8 .Zb9 30Z .3 3 8 .3 8 6

L —

T he M SD m sy b, obt a lm dby m uh’iplylm g the factor F by the diN e re a c e balwoen the uppr spa c lflc ~t lc m I lm il U a nd low e r
spe e 5 fic t iia n lim it L Tha formula lt MSD = F{ U-L). The M SD s+m e t m I gulda for the magnitud- of the ●oiimatc of let
otaad~rd de via t ion whtnu81a[ plmc for t h* double specification Ilmh came, bm .t d e n t he eatlmat. of 108ctandard davlatlea of
um bow n v~riability. The estimua of lot ot a a da rd de via t ion, if it I c I F-o I hm t he M SD, he lps 1 0 im ure , but doe - not uua r M I e e ,
I pt acceptability.
NOTE: Therm Is s c orr* opondlng a c c c pt a blllt y c onst ud I n Tikle 6.1 for ●a c hvdue of F. For re duc e d lnope c t le n. find
t bm a c c c ~t a bil!t y c om m nt of T a ble B-Z In Table B-1 and u,e the corresponding vahe of ~.
 M x ~1 4
1 1 J uno 1 0 S7

APP@Du B

~efinitkons

, 5!!!!9! Red Definition

m Sample ●ix. for ● .i=~le lot.

x X bsr ~P1. M==. Arit hm e t ic m e a n Of .m up3 m m e .sure m e m m i~~m

● .I x l.qlc lot .

. E.t inut e c d lot c t a ndm rd de via t ion- St a nda rd de via t ion of ●un -
ple m e a sure m e nt [m m a ●insle lot . (Se e & x m pI e * ia Se c t 4 0 n
3 3 .)

u U pp=r ●pe c ffic ~t iOm lim it .

L Low e r ●pecificalfiOn limit.
k The ●cceptability eon. tant @ven i~ Table. B- 1 and B-2.

t Qu Q ●ub U Quality index for u.. with Table B-5.

I
I QL Q ●ub L Ouality index for u.. with Treble B-5.

% p sub U Sample ● .tirnale of the lot percent defece .. above U from

! Table B- 1..

p s“b L Sampl. estimate of the 101 percent defective below L from

‘L
Table B-S.
I
P Total .ampl. e.timate of the lot pe rc e nt defective P = PU + P~
I
,, M Maximum ● llowable percent defective for .-pie eatinutea
~iven in Table. B-3 and B-4.

% M sub U Mtimum allowmblc Pcrceat defective ● bove U given i. Table.

B-3 and B-4. (For uoe when differeot AOL valuea for U and
L are specified. ]

ML M sub L zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
Maximum Alowable pe rc e x a f dcfecfive below L given in Table-
B-3 and B-4. (For we when differenl AQL vtiuea for U &
L ● re #pacified. )

P p ba r Bamp3e ● intimate of the proc e e m pe rc e m f de fe c t ivw i.e ., t he

e st inut e d proc e a ● ●ve ra ge .

p bar sub U T be e st im a t e d proc e . m8 va ra ge fa r u uppe r specification limit.

%

Pf, p b-r ●ub L The eslimatad procenm sv.rqe for ● 10W* r ●pacification Mmft.

T The maximum number of eattnnted prece. s sveragam wbkb

may ● x c e e d t b# AQL Blve rI in Table B-6. (For u.e in deter-
mining ●pplication O! ti~hteaed inspection. )
1’
F A lactez ua.d in d.te rmim.i~ the ~um Standard Deviation
(hLSD). The F valu=s are given In Table B-8.
i
I > Greater than

< ham than

I .x sum of

Ml
 MZL-STD-414
11 JufM2 19s9

SEC’ITON c

VARIABILITY UNSNOW7J-3LMJGE METBOD

Part 1

sZNG LE SPECI FI CAT I ON UT

Cl. SASIPLUJG PLAN FOR SINGLE CZ .2 .2 Ac c e p-ilit y Com st it . The accept-

SPECIP3CATZON LDdIT ability COa.t-t k. correspo~w tithe sun-
I ple mi. e mentioned in paragraph CZ. Z. 1. is
‘This part d the SUmZ. rd describes the indicated in the column of the master t.ble
prO.y@ur=~ fOr. u*e wilh PlaM for s Si=ule corre. poading m the applicable AQL value.
rep..c1ficati0n knit whcri variability O{ cbe Table C-1 i. enmred lrom the 1 0 P lo. nc .r -
lot w it h re m pe c l 1 0 t he qt m lily c ba rse t e ri. - rn.1 im pe c t ion ●m d from th. bottom for
t ic M u.k now m a nd t he Z WC nm t lm d i. use d. tightened inspection. Sampling plans for re-
T he -c c e pt a bilit y c rit e ric .t i i# give = in lw o duced inspection a*e provided in Treble C-Z.
e quiva le nt form .. T h. m c a rc identified as
Fo,rm 1 d Form Z. C3. WT-BY-L&fT ACCEPTA=ITY PROZ
I CEDURES WffEN FORM 1 IS USED
C1.1 use of SUnpliag Plan.. To deter-
mine whether t he . 1 0 C m e e t , t be ACCCpt - C3 . 1 AccepUbiZity Criterion. The degree
ability criterion wJth respect to a particu. of coaormance of a quazmy characteristic
lar quality characteristic •~d AQL vaZue. with re8pect to ● #ingle specification :imit
the .“pplic~ble ●amplih~ PI- ● hall be t re e d ●haZl be judged by the quantity (u-X)/R or
in .c c orda nc e w it h t he provisions of Sec- {X- f.)lsi.
tion A, General Demcripciou of Sampling
pl.m.. b the... in thi. part of the Sc.ndard.
:/::1 -i: ‘iw%”%(ilwz
Cl.2 Dra w ing of Sa rnp3 e .. AN .a rm ple s sbdl depending on whether the specification Iimi!
be dra w . m a c c orda nc e w lt b pa ra gr@iA7 .2 . is = upper or ● lower lirnis. where
I
Cl.3 Determination of Sample Size Code U im the upper specification limit.
Letter. T he sample sme cod e letter •hd~ L is fhe lower specification IimIt.
=ected from Table A-2 in ● ccordance
X is the sample mean, and
w it h par~raph A7. 1.
~ i. the ●verage range of the # a m ple .

CZ SELECT3NG THE SAMPLINO PLAN 3 n t his Standaqd. K ia the average range of

w H EN FORM 1 ls USED ,.bKrmip ranges. 3 2 a c h d die subSro.p.
CZ .1 Master Samplin~ Tmblec. The matter consists of 5 mea*u*emenl.. except for tbOa*
●mplmfi tal plans with ●unple ●ke 3, 4, or 7 in which
C* co r DlaM b- ed on varia -
blIity u---n for ~ single ●peef.fieation u** fbe ●k group ● im 19 fh sum a s i.h

limit wbenuakg & ra a g. unfk oda ro T a ble s

sa nw 3 e sise . Z m w a npufiq K 338= Ord=r Of
C-1 ●nd C-Z . T a bia C-1 b .u..d for nor- Ihc sample meam=rem=iits u .-de c =u* t b=
mal ● nd ti~htened inspecfi.m uuf Table C-2 rer.-iimd. Smkgrwpa af cnumcrmive nn.. -
for re duc e d izupoc t ion.
urements must ba formed d the range of
.xh .ubgroup obtalwd. X is the ●weraae of
CZ.Z Obt ining t he Sunpt inS P3 a n. T he tbe individnaZ ●bgroup nngea.
.unp3 im ~ pla in c c m sa st mO{ . .unple ● X ● -d
● m ● soc ia t e d a c c e pI AbU iv C- t a ut . f The C3. 3 AeceptsbIlltY Crite Finn. compare the
.unplimg plain ia obtain.d from Maater q.mtity (u - m (X- L1
Table C-1 or C-Z. ‘Kwithtbe
●bilitv cor.8cant LOrZf (u-XI/X or (X- “C’%%
L)
equal “t o or Creater than k. the lot meats tbe
CZ. Z.1 Sam le Si=e. Tbe sa m ple size a it ●.ccptab13icy c rito rloix u (u-X)/R or
.homa ,n~ 1 e nla’ter t a ble CC4 rrm # p0 ~ tO (X- 2.)1X ia less tbm k or m.’afiva. tbea the
each ●mple .1== e-de Iater. lot deem not met the .c..ptability e ritoricm.

1Se. Appendix C for definitions of afl cymbolo us id b t be ●a m pllng pl~o bac.d on varIablltty
uak90wm- raaga mmbod.
%we f+ample C-1 f.r ● c m I I p3 e t o ●x unple of t bi. proc e dure .

al

._ . ..-
I
3A1L-m-414
11 June 1957

CL f3uMM~Y FOR OP3IRATION OF CO. f.CfT-BY-LOT ACCEPTABI w P%

SNAP LANG PLAN WHEN FORM 1 LS CEDU3432S WNEN FOR3A 2 3S USED
USED
c6. 1 Ac c e pt a bU it y Crit e ric .n. T he de gre e
Th$ follow ing 8tepm um un.riz. the pro- of conformance of ● qutilty characteristic
cedure. fn be followed: with respeet CC.● ●imgle .pecificstimi limit
.hafl be judged by tbc p.r. mit of notlccm-
(1) Determine the ●ample .i, c cede let- fomnirt~ p.od. ct out. ide the upper er lower
ter from Table A-Z byu. iq the 101.ize and specific aticm limit. The percentage of rm n-
the in. pecti.an level. conforming product i. estimated by emtering
Table C-5 with the quality iadex and the
(2) Obtain plan from Mater Table C-1
#ample ●i*e.
or C-Z by .elecfin~ the sample ●ize n and
the acceptability ccm.taat k.
c6. ?. Computation c.f Quality Index. The
quality izidex Or, . (U- ZC)CIR hall be com -
(3) select *1 random the .;rnpl. of m
“nit. from the lot: in. pect .nd record the puted “if the sp%cificaticm limit i. an IIppcr
meamurernenx of the quality charactari. tic lim it U , O= QL = (X - L)c/K if it is a lower
for ●=ch uait of the sample. limit L. Tbe q“amitie., X ● nd R, ● re the
sample mean and ●verage ran~e of tbe samp-
(4) Compute the .;rnple mean X and the le, respectively. The compmatioa of K i.
●vera~e range of the .arnple ~, .md ● l.o ●xplairted in paragraph C3.2. The facbar c
compute the quantity (u- X)IR for am upper is provided in Master Tabl=s C- 3 an& C-4
●pe. ificatiomlirnit V or thequamtity (X- L)/R corresponding to the .unple size code letter.
for . lower specification limit L.
C6.3 fhtimate of Pe rc e nt De fe c t ive in bt .
(5 ) (u-X)/R
ff t h= qua nt it y c.r (X. L)/R The quditv of a 1.s1 hall be expre.. ed by
i. equal to or greater thas k, the lot meet. PU. the =.timated percent de fe~tive in the
the ●cceptability criteriow if (u. X)/11 or lot ● bov= t he uppe r specification limit, or
(X- L)llf i. I.*9 than k or negative, then the by PL. the ● .ti-@d p.r. =ntd=fectiv= belo-
lot doe. not meet the ●cceptability criterion. thc lower ●pccificatiort lirnii. The ●.tima~ed
Percent de f=cti~. PU O, PL i. mbt~im=d by
C5. SELECTING THE SAMPLING PLAN .mteri+j Table C-5 with Qu or QL .nd the
WHEN FOR64 2 3S U SED ●pp. Opri~t= ●AMPlt ●i*e.
C5 .1 M a # le r Sa m plinj? T a ble .. The ma. ter C6.4 Acceptability Criterion. Compare the
●amplmx table. for plana ba. ed o= varisbil - e.timated 1m percent defective PU or pL with
ity unka&n for a single specification litit the m~imutn aZlew.hle perceM defective
when u.iq the rang. m e t hod a r= T a ide c C- 3 M. U .pU or pL is equml to or le.. Uun M .
● nd C-4 of Part IL Table C-3 is used for t he lot m e e t . t he ’ ●cceptmbitity criterion, if
nc.n’nal and tightened inspection ●nd Table pu or pL is grekter than M or U QU Or QL
C-4 for re duc e d inm pe c t im i. i~ ne ga t ive . t he n t he lot doe s not m e e t t he
acceptability criterion.
C5. Z Obtaininz the Sampltng Pllrl. Th ●
sampling ptan con. i.t~ of m .U I WI ]e .ize and Cl. SUMMARY OF OPERATTON OF SAM-
an aooo~ik.d maximum a 3 1 0 w & le percent PLING PLAN WHEN FOR3d 2 IS USED
def ●ctive . The ●amplfq ptam ic obtdncd
from Ma.t=r Table C-3 or c-4. Tha fellowinK ,tep~ ●un’unar 3s9 the
ptwedures to be fa llow e d:

(1) Demwime ihe -ample .ise code lel -

ter from Table A-S ~u~inn the lot dae and
C5 . Z .Z M a x d8 m t m AI I c .w a ble Pe re e nt Defec- the iriapecttosi Iov@l.
tive. The madrnwn allowable percemt de-
=ive M for s-pie e ot im .t e s c orre s~nd- (Z ) Obt m i. pla n from t .m a t e r I a ble C-3
ing 1 0 t be sa m ple ●iz= m e ~t ie t ie d in or C-4 by .e le c t irg t he -a m ple sk = n. t he
pa ra gra ph C5 .Z .1 i. indic a t e d t n t be COI U M I I fa c t or c , a nd t be m a x im um ●llow a ble pw . -
Of t he rnm m s.r t a bt e c orre a pe nding t o t he c e a t de fe c t ive M .
a pplic a ble AfZ L va lue . T a ble C-3 ii e nt e re d
from lb. t op f-r ~orrna l ia a pe c t ia n m a d from (3) Select ●t random the sample of n
the botfom for ti~htened in. pecticm. Sun- unit. {ram the 10C inopect and re c ord t he
P~ Pla ru for re duc e d inspe c t ic m a re pr.a - meamm.mem al the qua zit y c ha ra c t e rist ic
vide d in Table C-4. on e a c h nut ; of t he 8 sM ple .

3 Se e 3 c x Am ple c -z t a r a c om ple t e example of thim pru..dur..

62
 M I L-sin-414
1 1 June 1 0 5 7 I

(4 ) t im put e t he ●unple m e -m X 4 t he (7) Uthe ● .timaled lot pcrcentdelective

av.ra~c raaSe of the ●ample K. PU or PL i. eqtml to or Ie*. thaa the md-
m um a zlow a ble pe rc e nt de fe c t ive M . 3he lot
(5) Comp@= t he q.=lit y “ inde x QU = zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFE
meets the acceptability criterion; it PU or
(U -X )c /K M t he upper speckfieation limit U pL img.e a t e r t ha n M or U Ou or O’i.% =_~
iripecified, or QL = (X- L)CIK i3 the lower -i”.. them the lot doe. W1 meet the ● ccept-
.pccificatirm limit L ia .pecif ied.
●biliw criterion.
161Decermirie
.-, ——— the ● .limaled 10s m.rc.r..
defective PU or pi. from Table C- 5.-

~PLJl c-1

Example of Ca3culati0n*

Single Specification Limit-Form 1

Variability Unknown - Range Method

EXarnple The lower .pecifie.tion limit for electrical r.miataace of ● certtim ●lectricti com-
ponent is 620 ohm.. A lot of 100 item. is submitted for inspection. Inspection
Level IV, normal inspection, t it h AOL = .4 % i. t o be used. From Tablet A-2 ud
C- 1 it i. ..en that a sample of size 10 i. required. Suppose that value. of the’
sample resistances in the order reading from left to right ● re . . follow -:
643. 651, 619, 627. 650, (R, = 658 - 619 = 39)
67o, 673, 641, 538, 6 5 0 , (Rz = 673 - 638 = 15)
and compliance with the ●ccept ability criterion i. to be determined.

. Line
— 3 nf. rrn.t i.. N e e de d Value Obtained EXP1anatiom

1 Sample Site: n 10

.? Sum 01 Measurements: I X 647o

3 Sample Mean X: XXI. 647 6470/10

4 37 (39+35)/2

5 Speckfieatio. Limit (LOwer~ L 620

6 The qu~tl~ (X- L)/It .7s0 (647-620)/37

7 Accep3AZZity Camsmt: k .811 &- Tabla’ C-1

8 Ac c e pt a bilit y Crit e rion Com pm m (X - L)/l! .710< .811 ● &e Pa ra Lc 3 .3

with k

The lot doe. not meet tbe ●cceptability criterion. .irIce (X- k.)f~ is 1c99 than k.

= U ● .imK1e .PP=r .Pe c ific a t i.. lim it U im give ., t he n c om put e t b. qua nt it y (u-X l/X kn
line 6 ● a d c m m pa r= it with k the lot meet. t he a c c e pt a bU it Y c rit e riom , if (U - rnf~ i-
e qua l 1 0 Or gre a t e r [ha m k .

.-—
MIL-ST13-414
11 June 1957

EXAMPLS c-2

12xample 01 Calculation.

Single Specification Limit-Form Z

Variability U.knowmi - Rang. Method

Ex. mple A lo.ver specification limit for electrical re. i.tan.e of ● certain electrical com-
ponent i. 620 duns. A 10I of 100 item. i. submitl.d for inspe c t ion. Zaspection
Level lV. normal in. Dection. wishzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
AQL - .4 % i. m be used. From Table. A-2 mad
C- 1 is is seen thal ; sunple of ●izc 10 i. required. Suppo. e lh. v*Iu=. Of the
sample reaiatance. in the order readimg from left m. right are as follows:
643. 651, 619. 627. 6S8. (R, = 658 - 619 = 39)
670. 673. 641. 638, 650. (R2 = 673 - 638 = 35)
●nd c om plia nc e with the acceptability criterioo i. 10 be determined.

Line Inlorrnati.n Needed Value Obtained

—
I Sample Size: m 10

z Sum of Measurememtm: IX 6470

3 sample M,.. x: ZXJ. 647 6470110

4 Average Range ~: XRlne. of subgroup. 37 (39.3S)12

5 Factor c 2.405 See Table C-?

6 Sp=. ific*tiO. Limit (~we. ): L 620

7 Q.a2ity Zndex C3L = IX- L)CIX 1.76 (647-620)2.405/37

8 2.54S See Table C-5

‘ct. ‘f bt ‘ercent “f.’ PL
9 Max. Allowable PerceIIt De f.: M 1.14% See Table C-3

10 Acceptability Criterion: Compare pL with M 2.54%> 1.14% See Para. C6.4

The jot doe. mat meet the acceptability criterion. ■ince pL is gr=ate. than M.

-E: U . .ingl. upper specification limit u i. Rive., th=. compute the quaii3y frufax QU ~
fU-X)c/3! in line 7 d obtain the eotimate of lot percent defe.tive PU . -m pr= PU
w it h M : t he le t m e e t . t he ●c c e pt a bilit y c rit e rion, U p“ ia ●qu~ io or i’z* . ~hn M .

M
 . .. ——. _.

T ABLE C-1 Rm I rn M e t hod

M a st e r T t ble fa r N orm a t a nd T ight e ne d Z n$ pt c t lon for Pla ns Ba se d a n V ~ria bI llt y unknown
(Single Spe c ific a t ion Llm lt - ra rm I I

m l in pe c t im l 1
sa m ple t 1 se -
K 2.50 15,00
c ode le t t e r
k Y- T
-
B .587 . 50?, .401 .2 9 6 .1 7 8
v
c .s’3 8 .!325 .450 .364 .Z ?b .1 1 6
— — —
D .5 6 5 .498 .431 .)52 ,2 ?2 .1 8 4

E .SZ 5 .465 .405 .336 .2 6 6 .189

F .6 5 o .519 .307 .424 .~4 1 ..?5?.

G .6 8 4 .6 1 0 .516 .452 .3 6 0 .2 1 6

H .7 ,?3 .6 4 7 .371 .484 .3 9 8 .1 0 5

1 .7 3 0 .6 5 4 .577 .490 .4 0 3 ,3 1 0
— — —
J ,7 3 4 .6 5 8 .581 .494 .4 0 6 .~lj

K .7 4 6 .6 6 8 .591 .s03 .s1 5 .3 2 1

L .7 5 4 .6 1 6 .598 .510 .421 .3 2 7

— — —
M .1 b8 .6 8 9 +.610 .!21 .43Z .3 3 6

24 .7 8 0 .701 ,621 .530 .441 .3 4 s

0’ .7 9 1 .111 ,631 ,539 .449 .3 SB

— — —
P .8 0 7 .7z6 .644 .552 .460 x
--1--
Q 230 1.21 1,21 1,16 1 .)2 1 ,,0 6 .9 9 6 .9 3 2 .8 7 o .3 0 9 .728 .6 4 6 .5 s3 .46z .3 6 4
I I — — —
.0 6 3 .1 5 .25 ,40 .65 1.00 1.50 2 .9 0 4.00 +6 .5 0 1 0 ,0 [ 15.00
I .10 I I #2
Ac c e pm ble Oua lify Le ve ls (t lgl med I m pe c m)
[ — 4
AU AC2 L v~ue o ●re in ge rc e nt de fe c iivo. i$ !
,“:: t ir,t &a m plln$ pla n be low ●rre w , t ha t {s, bot h sa m ple -lie S* w e ll a s k va lue . Whe n sunplt # it s e qua .lo or ●x c e e d@le t
a ●, 9 w ory I t e m 2 a t ha lot m nm t bn ln# pe c t e d.
4s
‘i
 -— .—

T ABLE C-2 Ra a [e Mtthod

:6
Mantar Table for Reduced Tnnpeclion for Plan~ Based on V a ria bLllt y Unknown
(Siogle SpeciflcalIon Llmi!-Form i}

:ept&l
Sa m ple iia a Sa rnpls J
.15 1.50 2.50 4.00 6,S0 10.00
c ode la t t e r ●{SC
-i- 7 k k k k k
.
I EEE
B 3 .581 ,502 ,401 .1 9 6 .1 7 8
*
c 3 .2 9 6 .1 7 8

D 3 * ,2 9 6 ,1 7 8
--1-- E 1

4
.2 9 6 .1 7 8

; .2 1 6 .1 7 6

G 5 .6 6 3 .614 .565 .498 I .43, 1,.3s2 .2 7 ?. .1 8 4

33 7 .6 1 J .569 .s2s .2 6 6 .1 8 9

1 10 I .861 .8[[ .7 5 s ,703 .6 5 0 .1 4 1 . .2 5 2

—
J 10 .916 ..9 6 3 .811 ,7 s5 .703 ,650 .579 I ,50? I .424 .3 4 1 .2 s2

K 15 9 .958 .9 0 J .850 .1 9 2 .738 .684 ,610 5J6 ,4 5 2 .3 6 0 .276

L. 25 1.10 1.0s
T 1.01 .9 5 1 .896
—
.B3 5 .179
—
.723 ,6 4 7 .s7 1 .4 0 4 .398 .30$

M 23 1.10 1.05 ;.01 .9 5 1 .896 .815 .179 .723 .6 4 7 ,s11 .484 .398 .10s

1.10 1.o6 1.02 ,9 5 9 .9 0 4 .E43 .707 .130 .654 .371 .490 .40~ .Jlo
+
N JO

1.11 1,07 I ,0.? .9 6 4

.
.9 0 0 .E4e .791
—
.734
—
-u--
,658 .5s1 .494 .406 .JIJ

P 60 1 .1 6 1 .1 1 1.06 1.00 .9 4 .9 .E85 .826 .768 .6.99 .6 1 0 .5 2 1 .4J2 . JJ6

Q 8s 1.17 I.IJ 1.08 I.oz ,9 6 2 .899 .8J9 .7E0 .701 .621 .5)0 .441 ,34s
— —
I E M
i
 x f~1 4
1 1 J fffw 1 9 s?

Pa rf 1I

DOUBLE SPECIFKATION Lf3 d3 T

C8. SAAfPLDfG PLAN POR DOUBLE mmtimum ● llowable ~rc e m t defectively ML

SPECIFICATION LtMIT for the lower Iindt. ad by MU for the upper
limit. If ~ AOL i8 88sinmd to bofh limits
T his pa rt Of t he Sf-rd de sc ribe s t he c.mbiaed. designate tbc -urn aflo.able
proc e dure s for t ue w it h pla in [or ● double percemtdelecfiveby M. Table C-3 is entered
c pe c ific a fioa I im ft w he n va ria bt t ify Of t he tram fhe cop for aornul inspection and from
le t w it h re spe c t t o t be qua lit y c ha ra c t e rist ic tbe bottma for tAIhtamd inspection. Sam-
ia u.knc. wm ● nd the range method is umed. plim8 P1W9 Sor
— . . roduce!ttmpaction ● re pr. -
vialed iii Table G-4.
A. 1 u..
c------- a{ S-.11..
-. —— ..- .. —”.Pla
.—— Tc, determine
n.. .—-—
~hethe r the 8.x meet. tbc .C eept.bility c ri- C1 O. DRAW7NG OF SAMPLES
te rion *ith rcapeet to a partiastar quality
char.eteristic .~d AQL. vtiue(. ), the .ppli - sample. .fmfl be ● lected in ● c c ord -
cabl. ●ampliag F.lao ● U be used in accord- aace with ~raarapb A7. Z.
atxe with the pre. i.imm of Section A, Gen-
eral De.eription d SunplinS PIMa, ● wJ C1l. ;~~OT-~;~O T ACCEPTAB1_
the. e in thi. part of the Staadard.

C9. SE LECITNG THE SAMPLING PLAN Cl 1.1 Acceptability Criterion. The degree
of c.nfo~aracteristi.
A ●unplhg plaa for ● ach AQI. .tiue with re. peel to . doub_fe .~cific. tion limit
.N1 be .clectcd from Table C- 3 or C-4 ● m hall be Judg.d by tbc percent ei wnco. -
10 U OU .. , . . . ..- . . . . . . . -.. ICr.rni.g producL The per.enta~e of no.-
Cwderming product is estimated by entering
C9. 1 Determination of Sunple Size Code Table C-5 with the quafity imd=x ● nd the
~. Th ● .unple .s. code letter =hfi ‘ample :Ue.
b. ● elected from Table A-Z in accord-ee
with paragra~ A7.1. Cf 1.2 timputatioa of Ouality bdicei. The
qualify inchcea Q {u .Cxl [R and QL=
C9. Z hta-tor SamIIlimX Tabla-. The master (X- L)c/R cbdl be !o&uted. -here
munnlinn tablem [or mlam hmed On variabil -
ity ~fca~wu for a d~ble specification limit u im the upper specification limit,
wbeo um ing the range rn.tbod ● re Tablea C-3 L ia the low e r .peeificalion limit,
● nd C-4. Tsble C-3 is used for norrna f and c is ● iacfor provided in Tables C-3 and
tightened im.pectiom and Table C-4 for ra - C-4,
duced Lrup.ccfion. x i. fbe ●mple mean, and
u i- the ●verage range of the sample.
C9. 3 Obtaintng Sampling Plan. A ●sM@in4
plm Comai,ts of ● ●ampfe sise - the sl - b tbh Standard. R is the >verage rmge of
●octatad maximum attowablo percent dafac - tba ●bsroup rauKc& ~cb of tie sti#*0Up9
tiw-e(. ). The cunplin3 plan to be ●pplied in consimt. of 5 meuurement$. ex’c=pt for those
kn#pect&a stmfl be ~bt ie d from Maater pduu dtb ●rnple ●is. 3, 4, or 7 in which
Table c-3 or c-4. case flu ●uba ro.p ●is. h th= ● ame ● e the
s-pfa ● ~e. 3a computing R, the Order Of
C9.3. I Sun 10 Si=e. The ●antple sise m Is fbe .unple meamtrernemm ● s nude mat be
.bownbiitdl,.. .Orr..pmdiag to ratahad. subgroup of co-ecutive meu -
each ●unple ●ice code le t fe r. urementi mnot be formed and tbe range of
etch ●ubgreup obtahed. K ia the ● -erase
C9. 3.2 Maximum Allowable Percent DeIe c - of t he individud ●ubgroup ranges.
five. The maximum-t allowable PC rcrnnt de-
~tive for cunple e .t irna t e c of pe rc e nt Cf 1.3 Percent Defective In the Lint. The
def ● e t iv. for t he low e r, qpsr, or bot b ● p.c - qua lify of ● lot ●ha ll b e exprew~ed SrImrm-
of the lot ~rc.nt dof=cfi.=. Its •c~~** W~
be dosipawed bY P L, PUO 0? P. The ● gtiwta
PU iadic*eD contmrmca ~tb respect to tbe
UPPG r spockfieatien Mnait. p with resp.ef to
the lower .peckfi.atim lAU. - P fOr
b o t h spaekfieation limlta combined. TIM

67

.
 —

CIZ. Z.1 A.c=ptabitity

=.cirnatc. p.Laad pU ● baJl be determined by Critdria. 5 timp8re
entering Table C-5. r.mpacti..l~ the estimated lot Per.cenc de fcctive~ Pt. ~
‘iJb Qt.
● nd Qu ● nd the ●ampl* ● i=.. The =~tim~te
P with the corresponding maximum aTiow-
p shall he dew rmined by ●ddin~ the co rres -
8e Ie percent defective M ● nd Mu ● lso
pcmdimg estimated percent defective. compar.
PL p . pL + Pu with tk e larcer Of ML
amd PU found iii the t a ble . ● nd Mu. 2f pL ia equal to or 1=6s ~h~ Mb
PU is equal to or lees than b4u. d P is
C12. ACCEPTAB1~ CRZTER20N AND equal to or 1=0s than the larger of btL ~
SUMMARYzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
FOR 0PE2tAlTUN OF Mu. Ihc lot meet8 t he *cceplability c ritcri=,
SAMPLING PLAN S otheruase.7be lot does not meet the scce Pl -
ability criteria. 33 ● ither QL or OU or bot h
Cl 2.1 O!ie AQt- value for both Upper ● nd ● re negative, then the lot does not meet the
b-e r + Cit,catmm Limit Cmnbmed. aeceptabitity c riteri&
Cl 2.1.1 Acceptability Criterion. 4 Compare
Cl 2.2.2 “Summary far O~~atic.n -f ~mPliWf
che eetimamd lot percent delectlve P . p“ +
PJan. & ~.ses m.h.re ● cliffere.t AQL value
PL -ilh the maximum ● l10-abl* Prc=nt ~tmblished (or the upper ●nd k.wcr .Pec -
dcfcc:ive M. U p is equal to or less than M.
ificatio” limit fc.r a sim~ie quality character-
$h. lot meets the ●cceptability criterion, if
istic, the fol Jmnimg steps ●m-.mari=e the
P i. e,e*t=, th*n MOr if either QU ‘r ‘Lor procedures to be used:
both .re negative, Ihenthe Jot does not meet
the ●cceptability criterion. (1 I Dcternai~e the sample ai.e &d.
letter from Table A-2 by using the lot ● i=c
C12.1.2 Summary for Operation of Sampliag and inspection Jewel.
Plain In came. where ● .ingle AQL value 1.
=blished forth. um~er and lower s~ecifi - (2) Select the sampJitig plan from
C~t;ori limit cornbin;~ for a ●i=gle quality Master Table C-3 or C-4. Oblain the amp-
.haracleristic. the following steps summa- le size K .. the factor c. -d the m~mum
=i.. lh. procedure. to be used: ● llowabJe percent defective. MU and ML.
. corre. pondi=g to AOL VaIUeS fo, the uPP=r
ll)”Dctcrminc the sample si. ecode ● nd lower Specific atiec. limit., respectively.
letter from T.ble A-2 by using ‘the Jot sic
and the in, pe. tie. level. (3) Select ● t random lhe ●a m ple of
a utit.from the 10C inspect and record the
(2} Select plan from M a a t e r Table measurement or the quality characteristic
C-3 or C-4. Obtain the sample ttie n. th= on each unil in the .UTIPIC.
factor c, and the maximum mfloumble per-
cent defective M. {4) Ckmpute the ●ample mea. X ● .d
●.e r.~e ra m s-k of tbe ●unpJe R.
13) Select m random, the ●ample of
n unit. from the lot; respect and record tbe (5) Compute the qualiJy imdicec QfJ
mea. urem.. t of the quality characteristic . (u- X )c /R. a nd OL =(X -L)CfU .
or. ● .ch unit of the sa m ple . (6) Determine the ● .timm~ed lot
percent defective. pU amd pL. corresponding
(4) Compute the sample m e a n X ● nd
average rmge of tbe ●ample R. to the p.r. em defective. above the upper
and below the lower specificticw limitt.
IS) -mpt tbe quality indite. OU AJSO determine lbe combined percent detec-
. IU. X)c/K arid QL, F= (X. L)C/R. tiV= p - ~ + pL.
(6) Determim the emtimtiad lot (7) 32atl three of the lollowlris cos-
y-fi=nt d= f=ctiv= P * PU + pL frOm T~bl= dbt~ons:
(a) PU is =q-~ tO Or lEM tbu
~u.
(7) 2f the eotinuted lot percent de- (b) P,. ia aqtml co or I=*w th*m
fective pi. equal to erlem. thui the maximum
d20wable percent defective M. fbe 10Jmeets ML-
{c) p is equal toor Jesmtin the
the acceptability criterion, if p ia graatar l.rger of ML and Mu.
lIIM M or U either Ou or QL Or both am
negative, then the lot doe. awt meet tbe ac- ● re ●aticfied. fh lot m.mtm tbe accepfAbi21ty
ceptability trite rion. criteria; otherdse the lot hew not meet the
scc=ptability criteria. If either Oz., or QU or
C#w.~r Different AOL va.luet for Upper a~d both ● re =gative. fba. *h. lot dw* tit UI**C
p8 c uLc m U 0 m La m I L. the acceptability criteria.

4 t ie ~pk C-3 for . c a m pl,e t e ●x a m ple d t bi. proc.dure.

SW *PI= c.4 for . =om**t* exunpZe of Ma PrO=~ur*.

-. -—.. . .
 M I L-ST D4 M
llJunelDS7

EXAUPIX C-3

Example of Calculations

Double Specification Ltrnit

Variability Unknown - Aver age Rsnge Method

One AQL Value for Both Upper and Low e r Spe c ific a t ion. Limit Combined

The ●peclficstioni [or elec:riea2 recisfaace -f a certaiu electrical cOrnponeu5 *

65o.o ● 30 ohm.. A lot of 100 it e m . is ●ibm it t .d for I n* pe t iia r& fm spe c fi.. Uw e2
I V , norm a l int pe c t ie a , w ft b AOL . .4% ii to be used. From Tuble. A-2 and C-3 it
is ● eer. that ● samfle of size 10 1. required. Suppose t he va fue a of the ●mnp2e
resistance in t he orde r re a ding frm -n le ft t o ri~ht a re ● s follow s:
6 4 3 , 6 5 1 , 6 1 9 , 6 2 7 , 6 5 B. (Rl . 658 - 619. = 39)
67o. 673. 64). 630, 65o. (R2 s 673 - 638 c 35)

and compliance with the acceptability criterion i. m be determined.

*. Znf.armatiom Ne.ded V .lu. Obtti~md Zcxpla.atien

1 Sunpl. Sise: . 10

2 sum of Mea. u,. m.clt.: xx 6470

3 .%mpl. U ... X: XXI. 647 6470/10

4 37 (39 + 35)/2

5 .?.405 See Table C-3

6 680

7 fawer Specification Ltmit: L 620

8 Ct udit y Index Cfu . (U-X) c/R 2.15 (680 -64Y)z.405/37

9 Ouality Zndex: C3L = IX- L)e/11 1.76 (647-620)2.405/37

10 .35s See Table C-5

~-t. of Lut p--t D=f. ● b- u: w
11 Est. of 3A Percent Def. baleu L pL ..2.54% see Tsble C-5

I 12 Tota2 Est. Parcant Def. h fak P = Pu + PL : 2.89% .s5s + 2.54s

13 Max. A210wable Percent Def.: M 1.14% SOe Table C-S

14 Acceptab12ify Crt t e rloa : Ca rnpa re p - 2.e98 >1.14s See P*ra.

Pff + PL t it b 64 CIZ.1.Z(7)

T be lot dtm. nut meet t be ●cceptabifify crilerlOn. since p = p“ + pL 1~ greater ~ M.

de

—
 x m .-sT D-4 l4
1 1 J ut e 1 9 5 7
I EXAMPLE c+

~ph of Cakuhuom
I
Doub3 e Spe c ffic a t lom Lim I 1

I V.riab33ity Unknown - ~we ra ~e Ra nge Method

Diffe re nt AQL Values for Upper and Lwer Specification Limit-

I ZZ.unple The ●pe c ifi.a t ic m . f.r e le c t ric a l re a isc a nc e of ● c e rt a in e le c t ric a l c m npone ~t i-

6 5 0 .0 ● 3 0 da rns. A J * 1 of 1 0 0 it e m s im ● ubm it t e d for inspe c t ion Z n.pe c t im i 3 AV .1
I V , rm rm m z im pe c ziou, vifb AQ3 . . 2 .5 $ fa r t he uppe r a nd AQL E 1 % fa r t bc low e r
spe c ific a t ion lim it i. I e be used. From Tablet A-z and C-3 it i. ● ce= that ● .am -
P1. of size 10 is reauired. SuPrmse the values of the sample resistances in the
irder reading fmm left to right “a-re a. follows:
643. 651. 619, 627, 658. (R, = 6S8 - 619 = 39)
670, 673, 641, 638. 650, (Rz = 673 - 638 = 35)
and compliance with the ●cceptability c*iteria i. co be determined.

Intc.rrnation Needed Value Obtained

Sample Six.: n 10

Sum of M e .. urc m e nt .: 1X 647o

3 .%rnplc M e a n X : IXf. 647 6470/10

4 Average Z 4 .nge ~: X3tlno. of .ubgroups 37 (39 + 351/2

5 Fa c t or c 2.405 See Table C-3

6 Wp=r specificatio~ Limit: U 680

7 kwer Specification Limit: L 620

I 8

9
0ua2ity index

OuaIity fndex:
Qu = (u-X)

QL = fX-L).
c/R

/R
Z.15

1.76
(680-647)2.405137

(647-620)2.405137

10 ~s~. Of ~t Perce=: Dcf. =bOv= u: FU .35% See Table C-5

11 ~.t. ‘=f kt p=c.mt D=f. belOw fA PL 2 .s4 % See Table C-5

lZ Tad Ems. Per.emt Del. in tit: p = PU + PL 2 .8 9 % .3s% + 2.54%

I
13 MAX. A130wab1= Percent Def. ● bove U: Mu 1 .4 2 s S.. Table C- 3

14 - A330wabla Percent Def. below 3A M’ 3 .2 3 % See Table C-3

I 15 Acceptability Criteria: (a) CDmpmre PU .3s% <7.42% See Pars.

with Mu clz.z.z(7)(d
(b) Compare PL 2.54s . 3.Z3U See Para.
with ML C12.Z. Z(7)lb)
(c) ~t~p~ue p 2.898 <7.42s See Pars.
CIZ.Z.Z(7)(C)

T he 1 0 t rt m e t m t t m ●c c e pt a bilit y c rit e r& , sla t s 1 5 (-). (b) a nd (c J ● re sa t isfie d; i.e .. PU <

M fJ . pL<M ~uldp <M u.

. . ,______
 ———— . .. —_. —

Rt rm e M c ihc .d
T ABLE C-3
M a m e r T bbl. fe r N e rm a l .nd T lt ht e nc d fnsm c t ionf.r Pla n. B.ne dm v..i.hllt t .. lI A.,w .
(Double Spe c lfic a t lon ~lm lt ●ndf;r Form Z -Single ~pe c iflc ”~fion Lim it ; ‘“””’---”

4 c c e pt a ble C m lit y Levels (normal in# pe c t lon]

Sumplc *IS* Ssm ple
c e de I c lle r * 11* fa :t o?
.0 4 .0 6 S .1 0 m- .2 5 .4 0 .6 5 1 .0 0 1 .5 0 Z .5 0 4.00 1 ZE-1 1 0 .0 0 1 s.0 0
MMM T M M MM M M M M M
B 3— G .7 .5 9 lfI .8 6 Z 6 .9 4 3 1 .6 q 4 0 ,4 7
~vv
c 4 z.a34 t .sl 5 .5 0 1 0 .9 1 \b.4 5 ‘ 2 2 .S6 2 9 .4 3 3 b,9 0

D 5 2.474 1.42 ‘3.44 5.93 9 .9 0 1 4 .4 7 Z O.Z 7 2 6 .S9 3 3 .9 5

E 7 2.8)0
B v
.2 8 .8 9 I .9q 3.46 5.JZ 8 .4 7 1 2 ,]s 1 1 ,s4 2 ).s0 3 0 .6 6

r 10 2.405 .Z J .5 8 1 .1 4 Z.05 3.Z3 4.77 7 .4 2 1 0 .7 9 I 5 .4 q 2 1 .0 6 2 ?.9 0

—
G 15 LJ79 .0 6 1
iiir!t .1 3 6 .2 s3
I
.430 .7 8 6 1 .]0 Z.lo 3.11 4.44 6 .7 6 9 .7 6 14.09
TI
1 9 .3 6 ’ 2 % 9 2

34 2s Z.358 .1 2 5 .2 1 4 ,>3 6 .5o6 .8 2 7 1 .2 7 (.95 Z,8Z 3.96 5 .9 8 8 .6 5 12. s9 1 7 .4 0 2 3 ,7 9

4
w
1 30 2.353
It
.1 4 7 .2 4 0 .3 6 6 .53? .8 5 6 1 .z9 1.q6 ,?.81 3.q2 5 .8 8 s. 5 0 12.36 1 7 .1 9 2 3 .4 1

J 35 2 .3 4 9 .lbS .2 6 1 .3 9 1 .5 6 4 .8 8 3 1 .3 1 1.98 2.82 3.90 5 .8 5 8 ,4 2 12,24 1 7 .0 3 z3 . zi

-tt-
m 4b 2 .3 4 6 .)6 0 .2 3 2 .3 7 5 .5 3 9 .8 4 2 1 .Z 5 1,B8 2.69 3.73 5 .6 1 0 .1 1 11,04 1 6 .5 5 2 2 .3 8

L 50 2 .3 4 2 .1 6 9 .Z bl .)8 1 .s4 2 .8 1 8 1 .2 5 1,60 Z.b3 3.64 S.4 7 7 .9 1 12.57 1 6 .2 0

+- ?.2 .2 6
—
M 60 2 .3 3 9 .1 3 S .2 4 4 .3 5 6 .5 0 4 .1 .5 1 1 .1 6 1.74 2.41 3.44 5 ,1 7 1 .s4 1 1 .1 0 I $ .6 4 ,?1 .6 3
++-
N 85 2 .3 3 5 .1 5 6 1 .Z 4 Z I .3 5 0 .4 9 3 .7 5 5 I .lz 1.61 2.37 3.30 4 .q7 1 .1 7 1 0 ,7 3 1 5 .1 1 2 1 .0 $

0’ 115 2 .3 3 3 .1 3 3 .2 3 0 .3 1 3 .4 6 8 .7 1 8 1 .0 6 1.58 Z.zs 3.14 4 .7 6 6 ,9 9 1 0 .3 7 t 4 .1 4 2 0 .3 1

—
P 113 2 .1 1 1 .z3 q .2 1 0 .3 0 3 .4 Z 7 .6 5 S .972 1.46 1.0s 2.93 4.47 6.60 9 .8 9 1 4 .i5 1 9 .8 8
-t-t I
0. 230 z,j3 0 .4 3 Z .661 .q76 1 .4 7 1 2 .0 .5 lz.q2 4 .4 6 1 6 .5 1 1 9 .!3 4 I 4 .1 O 1 9 .0 2
—
.2 3 .40 .65 1 $ .0 0
— -!Asl.& 4OOI6JOI1OJO
pa rc a nt da fa c t lve .
,ceeptable (3 dlt y Levelo (N:htemd I nspe c t ion)
-L
 Ra n[a M e t hod ~
TABLE C-4 -!5
M a a m r T a ble # or Redueed Z m pe c t ic m for Pla n, Ba oe don V Srla billt y U m k m w n ~$
(Doubl* Spe c lfic a lion k lt a nd Form ?-Single Spt c U ic t t ion LlmII]

Ac m pt a blo Oua Z {t I AV CI 1
Smnpl* 81SC Sa m p1 0
I c e de le t t e r ●I X *
.065 .10 .1 5 I ..?5 I ,40 I .6 5
L
I 1 .5 0 2 .$ 0 in- 1 0 .0 0
MM M [hI ’l MIM M MM M -ii-
I *
1 .9 1 0 1.99 18.06 2 6 .9 4 3 3 .6 9 40.47
1, 1 .?1 0 7.59 18.86 2 6 .9 4 3 3 .6 9 40.47

1 .9 1 0 7.59 18.86 Z 6 .9 4 3 3 .6 9 40.47

1 .9 1 0 1 !5 9 1 .s.8 6 2 6 .9 4 3J069 40.47

2 .2 3 4 1 .5 3 1 0 .9 2 1 6 .’5 2 Z .8 b 2 9 ,4 5 3 6 ,9 0
i -
G 5 Z .4 7 4 1.42 3.44 !.9 3 9 .9 0 1 4 .4 7 2 0 .Z 7 G- 3 3 .9 5

: H 7 2 ..5 3 0 , Z8 1.99 3.46 5 .3 Z 8 .4 7 I f?.J s 1 7 . S4 Z 3 .SO. J O.6 6

I 10 2 .4 o5 .5 8 l,i’ 2 .0 5 1 .2 3 4 .7 7 7 .4 2 1 0 .7 9 1 5 .4 9 z1 .0 6 2 1 .9 0
—
J 10” Z .4 0 5 .2 1 .5 8 1 .1 4 Z .0 5 ).Z 3 4 .7 7 7 ,4 2 1 0 .7 9 G G Z 7 .9 0

4 K

L“Z S
15 z. 3 7 9

Z ,M B .214
v
.2 5 3

.3 3 6
.4 3 0

.5 0 6
I.1!
.7 8 6

.S2 7
I ,J O

l.z7
Z .1 0

1 .9 5
3 .1 1

Z .8 Z
4 .4 4

3 .9 6
6 .7 6

S.9 .3
9 .1 6

8 .6 5
1 4 .0 9

I Z . S9
1 9 ,3 0

1 7 .4 8
Z 5 .9 Z

Z 3 .T 9

M 25 2.358 ,214 .1 3 6 .5 0 6 .8 2 7 1.21 1 .9 5 2 .8 2 3 .9 6 5 .9 8 8 .6 5 I Z .S9 17.48 Z3,79

N I 30 Z.353 .240 .3 6 6 .5 3 7 ,S5 6 1 ,2 9 1 .9 6 2 .8 1 3 .9 2 5 .8 8 8 .5 0 1 2 .3 6 17.19 2>,42

-1-- z.349
$
Z.339
.261

.144
,3 9 1

.3 5 6
.5 6 4

.5 0 4
.8 8 3

.7 5 .1
1 .3 3

1 .1 6
1 .9 8

1 .7 4
2 ,8 2

2 .4 7
3 .9 0
—
3 .4 4
5 .8 5

S.1 7
8 .4 2

7 .5 4
la .z4

1 1 .1 0
17.03

15.64
Z3,ZI

2 1 .6 3

Q 05 Z.J3S .242 .3 5 0 .4 9 3 ;7 5 5 l.l Z 1 .6 7 2 .3 7 3 .3 0 4 .9 7 1 .Z 7 1 0 .1 3 15.17 2 1 .0 5

I
ML ba d t a ble w a lue c tra in pc rc m t d. f.c t lve .
% de Z 3 rdt # a m pN nszdm b.k w ’.rrtm r, t ha t ,,, be t b c c m ple ,l.e a ~ w eNa*
$ II &
M vsJ u* . ‘ WI..SamPle S1S. OqU~C or ,xc.,do 10,
 ... .. —.— — —-. —

TABLE C-5
Ec U m a t I nI lha Lot Pe rc e nt De fe c t ive U SI I I g Ra ns* M e t he dl
Tabh forzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA

L-... . ..-

I
 T ABLE C-5 -ConU I N e d
Ttbh for E# t im a t ln# t ba Le t Pe rc e nt De fe c t ive U a lng Rune M e t hod

. ,. “

.“ .- ...
. ,.. . .
., ,.” ,..
. . .“ . .

. . ,.” .“
;,. . .
.. t.. ,-
.. .“ ,,*
.. ,,. ,,.
I .. ,.. ,.”

,- ,.a ml
9..,= ,-
*“ ,.. ,,.
. 6.. 0,”

. . . . ,-

. . . .. . ..

4.. .“ ,,.

. . .,” ,..

.. . “
. . ...
“ ,.- **
.“ ,.9 .s
4 .. ,.. .*
i . t.” ..”

a * ..
).. ,.* . .
i ,A ,a ,,.
l.. ,.” ,..
,.. ,.0 ,,..
1.. ,.” ,,.

. ,.9 4 * ..

. . *..I
,,. ,.n *.S
“ ,. .
. ,.= D..
s.. ,.” .
,. ,- !..
,.” A. 9-
,s ,.. -
,. m “

1
I
 .

TABLE C-5-ConUnursl
Tabh for Estimating tbo Let Par.ml t3ef@c11veUcla: Ilmte Method

I
 — ‘-- —-

T ABLE C-5 -Cont inue d

:!
Table fer Eot lm a t lng t he l-a l Pe rc rn! De fe c t ive U olnc Ra nge M e t hod

I
 _—

TABLE C-5-ContlauedzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
..
T * M o for Est im a t lq t t m Lot Percm! De fe c t ive U # inS Ra a [t Method
.\.
.

. . ..
 EST I M AT I ON OF PROCU S AV ~GfZ AN D CRfT ERfA f=OR
R=U CED AN (3 T 1 Gf4 T EN E0 3 N SPECT I ON

C 13. fig~MATION OF PROCESS AVER- c orre sponding e .lim a t e d lot prcent dcf. c-
Uve p or p . re m pe c five l~, is re d from
t he t a ~)e . Tk ..tirnated proce.. .ver.~e
Tbe .verag. percent de fe c t ive , ba se d % i~ the -it f-=*ic M-= Of the individu~
~POa ● group of lot . .ubm t t t e d for c .ri~iii.l -.t it n.t e d lot pe rc e nt d. fe c t iva . pu’s. Sim -
I n. pe c t m n. i. c a lle d [be prc .c e . a ● ve ra se . itarly. t be estimti.d proces8 ●.=r8ge PL
OrigiM 1 im . pe c t ie rt im t he fir.t inspe c t ion of i. fbe srifhmetic mean of the individual esti-
. pa rt ic ula r qua nt it y Of produc t .ubmitted mated lot perceot defective. pL’..
le. ●cceptability . . diati~uiah.d from the
ia. pe. tion of praducl which hambeen re. ub - C13..?.2 Dc.uble Spc c ific a t ioa U m it . The
rnisted after prior rejection. The pr.acc.. e.timateii lot pe,=.nl de fcct, ve shall be de-
● vera~e shall be e.timated from the remdtm t e rm i~e d {m m T a ble C-5 fc .r the Plan. baaed
of im. peetion of ●mple. drawn from . .pec - cm the rmt~. method. The qua lit y iridice.
Uied numb. t of pr. ceditq lot. for the pur - OU a nd OL shall be computed. Table C-5
PO.. of delerminiag .everity of imapection is cmter.d #.parately with Cfu ad QL ● nd
durimg the .our. e cd ● co=t?.ct in aecordaace the .ampfe .izc, and the c.rrespohdi:g Pu
with paragraph C14.3. Ay lot .bdl be in- -d PL ● re read from the table. The ● sti-
citided md, ante (m rt.dnutfri~ chm proc... m.ted lot percem defective i. P . PU + P .
avera~c. The e.timate of thepmcc.. aver- Tb. e.lirnated proce.. ● verage p i. ct+●
age i. de. igriated by p“ wbem cwnpuc.d with ● rithmetic mea. of the i.divid.af ..tinuted
re m pe c t t c . ● n upper .pecific.tion limit, by 10I percemt defective. p,..
(JL -b.. ..mP.ted rnth respect to a lower
.p. cifi..tic.n limit, and by p when computed C13. Z.3 Special C.. e. If the quality iade.
with respect to ● double .pe c ifi..t ion I lm ft . Ou or 01. i. . aegativ. amber, lhen Table
. C-5 i. entered bydi. regarding the negative
C1 3 .1 Abnorm a l R.. uft .. T h. ra .ult . of .iar.. Howcwer , ii. thi. c-.. the ..timat=d
ic!. pectitin of produc t rna m uf. c m re d unde r lot perce.m defective above the uppa r lim it
ccanditions aot typica3 of u.tmf production or below the lower limit i. obthic.ed by .ub -
hall b. excluded from the emtimaled pro- Cr.cting fh~ percentage lc.und in the table
ctm. ● verage. from 100%.

Cl 3.2 Compufatio. of tbe EsUnmted Pro- C1 4 . NORMAL TIGHTENED, AND RE-

Ce.. Average. Th e estmuted pracemm ● vmr - “DUCED I k SPECT I ON
.;. 18 the a%hrnetic mean of 4(I. e-hated
lot percent d. fecti.=m computed from tbe T bia St a nda rd e sm blisbe d ●u’nplfng
●ampliag i.. pectioa re. ufto of the precedlmg P(U fa r norm a l, tightened. and reduced
ten ( 10) lot. er ● . may be otberwi. e de. ig - IEmpectk.n.
matad. & order to eatim.t. the lot p.rc e m
C14. 1 At Start of fa. pectiom. Normal in-
defective, the qua3ity hdie.. Q“ a ndlc w OL
spection .hd3 be use d ● t t he st a rt of ia s Pe e -
9 ba ll be Coin ● d for a a c h lot . T b... ua : U& uateoc otb.rwise dacignated.
Ou = (u-X )C r X a nd Ot , = (X - L)c /I L (Se e
parwraph Cl 1.2. ) C14. Z ZturirIg 3aspection. Qurimgfhe courm
6 of iwrnctiim, normal &xctio. sbdl be
C1 3 .7 ..1 S& l* Spe c ific & 3 An& T be UDd vba . imspoctian Coaiitimms are ●uch
e m ilm ue a lot pe rc e nt d ● 1e e t lva ●bQ b. d.- (&85 tibteaed or re duc e d iM m c c ?ion io not
I a rm in.d from T a bl. C-S fort h #_ t i.d r.4dTd Lm ● ccordume -itb” paragrmpfu
on t he r~c t ue t bod. T& qdit y M -x Ou C14.3 d C14.4.
● bd k uood for t ba e ~e ti u-r • ~.
tb8 cu. d . tir
Ific.tlmiMrnft er Q~ ler Cl 4.3 Tisbtened fxukmcfion. Tishw..d ia-
●p.cuictiom ulmlL T&l* c-s b tirti 9D0ct10m 91M31 be ttmtituted wbem tbe estj J
dfb C)uor QL ● nd (h* ●rnfla ●ti=. d ~* &t&f procemi ●verage computed from td
 prec.di.# t.. ( 10) lots (or ●uc h other aem- t he ● stimat.d lot percent defective i- ~
ber of lot. de.i~nat.dl in ● ccmrdaoee .ith to sero for b ●vclfied ~r of towau-
para~raph Cl 3-Z is greater than th= AQL, tiv. 10CC(see Table C-?).
sod when mere than ● cc.rlaln ~r T of
theme hats have emtimatea O! the percem COm dI t k l c. Produc t ion i- ●t ●
de le c c t ve .x e c e disg the AQL. Tba T -va lue s ●t e a dy ra t a .
●r.give. ln Table c-6 for tbeprocem ●wer,r
age compted from 5, 10 or 15 101*.8 r40r- Normal Iaspectlen ● hall be reinstated M ‘my
mal in. p.ctioa hall be reiiut.ted i[ the one of the following cooditiea. eccvra t i.r
e.tinuted proces. ● verane of Iota her reduced ia.~ctiOU.
Cightea.d im.pecxic.n is ●qtd to or le.. tkn
Cm dit bm D. A M k re je c t e d.
the AQ t..
condition E. Tbe ● ettmatad procema
Cl 4.4 Reduced ln9PccUon. Iled=ced in- ●va age 1. greater tbao tite ML
●pecti.a rrmy b. uutitutad providd that all
of the following conditions ● rc catiafied: t k m dit i.. F. Prehcttom become,
1. irregular or de la ye d.
Conditioa A. The preceding ten {10)
lot8 (or .uch other number of Iota deaigrmted) Camdittc.aG. Dt be r condition. w
have bee. under norm81 inspe c t ion a nd non. may warrant Umt normal impaetio. . bauld
ha . be .m re je c t e d. b. r.ltwtated.

thmdicioa B. The e c t t nu:e d pe re e m t Cl 4.5 S- Pling PIUIO for Tfuhta.d or Re -

defective for each d theme preceding Ietm i- dimed LompeCroon. Sam #w P~ i or tight-
le.. than tbe applicable lower limit #bow. ened -d re duc e d in@p@c t ioa ● re provide d in
in Table C-7; or for certain ●ampiius plar.a. Se c t io. C, Pa rt m 1 a a d U .

... ,... .. .. .. .. .. .

Qa
M I L-sT D-4 1 4
1 1 J m e 1 9 s7

TABLE C-6 Range Me3b0d

V A.e . of T for T i~ht .ne d k .spc c t ion

Sample #ix. Acceptable DIM Sy Lewd ‘e c t k e ] Number

T?.
code letter .04 .065 .10 .15 .25 .4( .6 s 1 .0 6.5 10.0 15.0 of Wm
44
B . . . . ● . . . :
8 : 1:

T -L
2 4 5
c ● . . ● ● . ● 3 4 : :8 10
5 6 9 10 11 15

23 3 4 .4 4 5
D ● . . ● . . 44 5 1 7 8 10
56 7 F 10 10 11 15

z z 3 4 4 4 4 5
E . ● . . > 4 5 :7 ‘7 7 8 10
4 s 7 89 10 10 11 15
-

d-
z 3 3 44 44 5
F . . . 4 4 5 2 67 78 : 10
5 5 6 8 99 10 11 11 15
—
4 4,4 4 4 5
6 : 10
G 1: ! ; : ! : 9 1;
-t--t 11 1: 1s
,-
3 “3’ -3 3 4 4 44 4 44 4 4 4 5
H 5 b 6 6 77 7 7 n 8 8 10
: ; 7 7 e s 99 10 10 1: 11 11 11 15
—

$
3 3 3 4 4 ,4 44 4 44 4 4 4 5
.1 5 b 6 6 6 7 7 7 -8 8 8 10
7 : 7 8 8 9 :9 10 10 1: 11 11 11 15

4 4 4 4 4 4 4 4 4 5
J ; : 6 6 6 7 : 7 78 : : 8 10
7 7 0 8 9 : +9 10 10 10, 11 11 11 11 15
—
4 4 4 4 4 4 4 4 44 4 4 4 5

$
K : 6 6 6 7 80 8 8 8 10
7 8 8 8 : ; 10 1: 1: 11 11 11 11 11 15
— — —
4 4 4 4 4 4 4 4 4 44 4 4 4 5
L 6 6 6 6 7 7 7 7 7 a 8 a a 10
a a 9 9 9 9 10 JO 10 11 1: 11 11 11 15
— — —
4 4 4 4 4 4 4 4 44 4 4 4 5
M 6 6 7 7 7 : e 88 8 8 8 10
a 9 9 : ;1 0 10 10 11 11 11 11 11 11 15
— —
4 4 4 4 4 4 4 4 4 4 4 4
N 7 7 7 7 7 7 ; a a 8 : 8 a 8
9 9 91 01 0, 10 10 11 L1 11 11 11 11 11
— — —
4 4 4 .4 4 4 4 4 4 44 5
0 7 8 80 10
9 Ii 1:1 :1 :1 : 1! 11 ,? 11 11 15
— — *
uid MLvm3umm.

----
 M lL% T n4 1 4
11 Juna 1 0 S7

TABLEzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFED
C-6 -CooU foJ a d R.-g. Method

zIT m
Vale. d T for T i@t -.d Lm spc uoa

z
A. c e ble Ouatit 5A ,.1 s [ill

‘=%!7
.10 .15 ..?5 .40 .6s 1.0 1.5
44 4 “4 4 44 44
77 788 f5a a8
10 10 10
w 11 11 11 11 II 11
I I 1

Q-lx
4 44 4 4 4 45
7 : laa : : a : a a 10
10 10 11 11 11 11 11 !1
+ 11 11 11 1: 15

The S-D
.- fiiwm in each block refers to the precedim 5 lot., the middle li~rc to the
preceding 10 lots and lhc bottom figure to the pre&ding I S-lot..

Tightened inspection i. required when the number of lots with ● .timatem of percent
defective above th= AOL from the precedin~ 5, 10. or 15 lots i. ~rester fhan the given vtiue
of T in the table, and the pr-.e =m a ve ra a e from these lat. exceeds the AQL.

Aff estimates of t he lot percem defective are obtained from Table C-5.

al
 T ABLE C-7 RWI SQ M e t hod
Llm it # of ht im x c d Lot Pe rc e nt De fe c t ive (or f2 e duc c dfn,pe c t k

Ssrnple * ize Ac c e pt a ble Oudit y Le ve ls N um be r

c ode le t t e r ,04 .0 6 5 .1 0 .1 $ .2 5 .40 ! .b5 I ,0 1 .5 .?.5 4 .0 6 .5 1 0 .0 1 5 ,0 or z.a t o

B ● ● o * ● ● ● ● ● [42]*. [28]** [18]** [121.. [ 9]**

.17 s
c ● ● 4 ● ● ● ● [45]** (31)** [221.. [15j** [[O]** ( 7]** I S.oo 10
& Is

0.00 .74 6.06 s

D ● ● ● * ● ● [)1]** [25].* [18].* [II]** [ 9]** 4.40 9.96 15.00 10
6.50 10.00 , 15

.00 0.00 .19 3.s2 8.45 5

E ● ● ● ● [JO]** [23]** [17/.. [13].. [IO}** .35 1.84 5.74 10,00 J5.OO Jo
1.84 4.00 b. 50 b A Is

.000 .000 ,00 .061 .s3 .?.04 4.92 9 .6 6 5

r ● a * [191** [141** [II]** .008 .104 .40 1.37. 3 .0 1 ’ 6 .0 6 1 0 .0 0 I 5 .0 0 10
.1 5 8 .5 0 1 .1 4 ,2 .3 0 4 .0 0 6 .5 0 & i 15

.000 .000 .000 .0 0 6 .040 .148 .5)6 1.41 3.27 6.30 11.01 5
G [12]** [loI** [ 8)** .002 .015 ..060 .19z .449 .90 1.94 3.63 6.50 to.oo 15.00 10
.0.?0 .014 .199 .4 6 6 .9 0 1 .5 0 2 .s0 4 .0 0 A & 1 15

.0 0 0 .0 0 0 .0 0 2 .0 0 4 .0 1 4 .0 4 Z .1 1 2 .Z 4 8 , .4 9 8 1 ,1 2 2 .2 0 4 .2 7 1 .4 0 1 2 .1 3 5
H .0 0 3 .0 0 9 .0 2 0 .0 4 7 . .1 0 1 .2 0 9 .4 2 2 .7 5 5 1.26 2 .)4 4 .0 0 ..5 0 1 0 .0 0 I 5 .0 0 10
.0 1 1 .0 2 5 .0 5 2 .0 9 6 .1 9 9 .1 7 4 .6 5 1 ,0 0 1 .5 0 2 .s0 , , A & 15

.001 .002 .004 .0 1 0 .0 2 8 .0 6 9 .1 6 .2 .3 2 6 .6 0 0 1 .2 7 2 .4 2 4 .5 2 7 .6 8 1 2 .4 3 5

I .0 0 6 .0 1 5 .0 3 2 .0 6 1 .1 1 0 ..?5 2 .4 7 8 ..5 2 2 1 .3 4 2 .4 2 4 .0 0 6 .5 0 I 0 .0 0 1 5 .0 0 10
.0 1 7 ,0 3 7 .0 6 7 .1 1 8 .2 3 0 ,4 0 .6 5 I ,0 0 1 .5 0 2 .s0 L a A A 15

.0 0 1 .0 0 4 .0 0 7 .0 1 7 ,0 4 2 .0 9 4 .2 0 2 .J sb .6 9 1 1 .3 9 2 .S7 4 .1 1 7 .9 1 1 2 .6 5 5
1 .0 1 0 ,0 2 1 .0 4 2 .0 7 5 .1 5 1 .2 8 1 .5 1 b .8 6 1 1 .3 9 ?..4 7 4 .0 0 6 ,5 0 1 0 ,0 0 1 5 .0 0 10
.0 .?2 ,0 4 4 .0 7 9 .1 3 1 .2 4 B .4 0 .6 5 I ,0 0 1 .5 0 2 .s0 b A i A 15

●T h-rc ~rc no t unpllng plm o provide d I n t his St a nda rd for t he -e c ode I e t t e ra a nd A(3 L vduos.
 .

IzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA

T ABLE C-’I -C.m t ht ue d RU I I O M e t hod

Llm lt c of Z Z c t lm ~t e dLX Pe re e nt De fe c t ive for Re duc e d fm pe c t im i

,0 4 ,0 6 S ,10 T 2 .5
.002 ,00s .0 Z 4
y
.012 1 .4 0
.013 ,021 .0 4 9 .0 8 7 2 .5 0 4:00
.0 Z 6
TF ,0 1 0 .0 8 8 .1 4 4 & i

.0 0 4 .0 1 0 .0 2 0 .0 3 6 .0 7 6 .1 4 0 .Z 8 8 ,5 0 9 .8 5 7 1 .6 ,? 2.86 5.01 8.11 11.o~ 5

L .0 1 0 .0 1 6 .0 6 2 .1 OZ .1 9 0 .3 3 2 .5 8 1 .9 4 .? 1 .4 7 2 .s0 4.00 6 .5 0 10.00 19.00 10
.0 3 3 .0 s9 .0 9 ? .1 s .Z 5 .4 0 .6 5 1 .0 0 1 .s0 & k’ A k b 15

.0 0 7 .0 1 4 .0 7 .6 .0 4 6 .0 9 Z .1 7 4 ,3 2 6 .5 6 2 .9 2 i 1 ,7 Z 2.99 5.2Z 8.48 13. z7 5

5 .5 .0 2 3 .0 4 1 ,0 6 9 ,1 1 2 .z0 6 .3 5 Z .6 o4 .9 6 8 1 .5 0 Z ,5 0 4.00 6.5o 10,00 15.00 10
.0 3 6 .0 6 4 .1 0 .1 5 .Z 5 .4 0 .6 5 1 .0 9 b A b tt-t-1 bd 15

.Olz .Ozz .0 )8 .0 6 4 .I zz .z1 6 ,3 8 9 .6 4 8 l.o4 l 1 ,8 7 3 .1 9

N .Ozfl .0 5 1 .0 z .1 Z 9 .2 Z 6 .3 7 8 .6 3 6 1 .0 0 1 .5 0 2 <5 0 4 .0 0
#. 0 4 Z .0 6 5 .1) .1 5 .2 5 .4 0 .6 5 i A A A
—
,0 1 5 /.oz9 .0 .0 7 8 .1 4 4 .2 4 6 .4 3 4 .109 1.119 1 .9 0 1.32
.0 1 3 .0 5 6 I t .0 8 .1 3 9 . .Z)a .391 ,65 1.00 1.50 Z .so 4 .0 0
.0 4 .0 6 s .1 0 .1 5 .25 .4044A b 1 & AA 15

P
.0 9 3
.1 4 6
.1s”
333 .?.08
Z .5 0
&
3 .4 6
4 .0 0
1
5.BO
6 .5 o
l& A
9 .1 5
1 0 .0 0
1 4 .OZ
1 5 .0 0
5
10
1s

,1 0 3 Z .1 5 3 .5 4 5 .9 0 9 .Z 7 1 4 .1 5 5
Q 1 .1 4 9 2 ,5 0 4 .0 0 6 .5 0 1 0 .0 0 1 S.0 0 10
& A A 11 Is
El&E!! k

N] AQ Ipt tholI I n t he bra c k e t m , ● re h pe rc e nt c le f, :t k e ,

Wm . t ht (I rm l flsu?o I n dira c t lon O( a rrow a a d c orre e ~a din~

T#
num be r of I ot n. in e ~e h bl~c k t ho t op (I nure
prc c odk ng 3 I ot a , t he m lddlo N pre ‘t o t ho pre c e ding 1 0 I ot t , a nd t he bot t om figure t o t he pre c e dla l 1 5 lot s.
re f. r# t o t he

Re duc ~d I m pa c t ion m a y bo I not lt ut e d w he n e ve ry e m t lm m e d lot pe rc e nt defe c t lv~ from t he pre c e ding 5 , 1 0 , or 1 5 I ot m I c -

bde w t he figure @ive n la t he la bl~ ra duc e d im pe c t le a (or sunpllng plum m a rk e d I * .) in t be t a ble re quire s t ha t t he e 8 t I m a t e d
:!
lot pe rc e nt de fe c llve la e qua 2 to -ero, for t he num be r of c om e c ut ive I o!* ia dlc st e d !n br~c k e t ~. in t ddlt la m . dt ot he r c ondlt iom
for r-duc a d lna pe c t ion, I n Part 221et Sactlom C, mumtbe ● attmii*d. !,g
g$
~1 ●btlnmtem of tbe lot percent defective ● re obtained from T .ble C-5 .

1
 ,

T ABLE C-8
V duc s Of f for h{dm um Ave ra ge Ra nge (hfARl

$ a m ple # lz* Slrnple :c e pt a ble Oua llt y Le !I t (in pe rc t de/cctive)

CO* Ienor 91s* .04 .065 2.50 4.00 6 .5 0 I 1 0 .0 0 1 1 5 ,0 0
B 3 ’7 7 .811 .865 .9 0 7 .9 5 8 1,028
+
c 4 .7 5 6 .7 8 .9 .8 1 6 .8 9 1 .9 6 S 1 .0 s6 I 1 .1 8 0
—
D 5 --t-% .7 6 4 !8 0 1 .8 5 7 .9 2 3 1 .0 1 1 I 1 .1 1 8 I 1 .2 6 j
+
E 1 .8 0 4 .8 4 6 .910 I .9 8 5
695 727 765
I I
r 10 .5 2 9 ,6 4 z .6 7 7 .730 .19)

G 15 .444 .460 ,4 7 7 .4 9 J
442!3
.5 1 7 ,5 4 2 .5 7 2 .6 OZ ,6 3 7 .68.9 .748
-t-
n 15 .4[6 .412 .4 4 7 .4 6 3 .4 8 6 ,5 0 9 .5 3 7 .5 6 7 .6 OO .6 4 9 I .7 0 7 .7 8 5 I .8 7 9 I 1.004
I 30 .411 .426 .4 4 2 .4 5 7 ,4 8 0 .5 0 3 .5 3 1 .5 6 o .5 9 3 .6 4 2 I .6 9 9

1 35 .408 .4?.3 .4 3 8 .4 5 4 ,4 1 6 .4 9 ? .5 2 7 .5 5 6 .5 8 8 .6 )7 j .6 9 4
*
% K 40 .402 .417 .4 J Z .4 4 1 .4 6 9 .4’?2 .5 1 9 .5 4 8 ,5 8 0 .6 2 8 I .6 8 4

L 50 .396 .411 .4 2 6 .4 4 1 ,4 6 3 .4 8 6 .5 0 3 .5 4 2 ,5 7 3 .6 2 1 .6 7 6 ,7 5 2 .8 4 3 .9 6 )

M 60 .190 .405 .4 1 9 .4 3 4 ,4 5 5 .4 7 8 .5 0 5 .5 3 3 .5 6 4 .6 0 8 .6 6 6 ,7 4 0 .830 .9 4 9

it- + I
N 85 .J8Z .398 .4 1 2 .4 2 7 .5 2 5 .5 5 5 .6OZ I .656 .129 I .618 I ,9 3 4
44’I 470I 497
0’ 115 .318 .)9 2 .4 0 6 .4 2 1 .442 ,464 .490 .5 1 7 .5 4 0 .5 9 4 .6 4 S .7 2 0 I ,s0 8 ] ,9 2 3
—
P 175 .3 7 1 .3 8 4 .3 9 9 ,4 1 1 .434 .455 .481 .3 0 0 .5 )8 .5 0 4
-1- .6 3 7 .7 0 8 I .1 9 4 I .9 0 8

a 230 .3 6 9 .3 8 4 .1 9 7 .4 1 z .43.? ,454 .480 .5 0 7 .5 1 6

+
i--l--
The MAR may ba obtdaod by m ult lplyin~ t he fa c t or f by t he diffe re nc e be t w e e n t he uppe r .pe c ific a t i.a n lim it u .nd le w . r
spe c iflc a llon Ilmif L. The formuh 1- MAR . lIU-L). The htAR serveB as a guide for t he m a gnit ude Of t he a ve ra ge ra ng, of
I ha ounpla when uaia# plant for the double ope cU ic a t ia n I lm it .c a # e , ba se d on t he a ve ra ge ra nge of t he m unpla of .m bm .w n
va rla bU it y. T ha werap ruge of t he .smple, tl It.ls Ieoo t ha n t he 5 dAR, he lpc t o inoure , bd doe - not [ut ra nt e e , lot a c c e pt .
a biflt y.

NOT&: T he re h t eorreopoadkg occepfablllty constant In Table C. I for eqch .aZue of f. For reduced hirpection, find
t ht ●c c e pt t billt y c om t a nt of T -ble C-Z in T ~ble C- I m d u-e t he c orre ~pm t ding va lue or f.
 f

m L-SlW4 1 4
.1 1 J une 1 9 s7

APPENDIX C

mMlmitfO.s

Read Definition.
SY@.?!
m sample ●ike far ● single lot.

x X bar % rnple m e a n. Arit hm e t ic m e a m of ●m ple m e a .. r.m .rm

from . .ingle la t .

R Range. The difference betweer. the Iarge. t and ●rnalle.t

mea.ur. mests in . .. bgroup. & this Smitdard, the #ubg.o.p
site <s 5 except for them= plan. in which m . 3. 4: er 7. in
which ea.. the ●ubgroup i. the same a. ths .ampl. size.
Range e: the fir. t subgroup.

Ra nge d the ●econd subgroup.

R bar Aver.~e ruag.. The a rifhn-.e t ic m e a n of t he rug. va lue s of

t he subgroups e f t bc sa m ple m e a surc m .nt a [ra m ● single la t .

u Upper spec Uication limit.

L faumx apecificstien limit.

I k The acc.pcability conctanr given in Tables C- 1 nc.d C-Z

c A factor u.ed in determinizi~the quality index when using the

range method. The c values ● re given is Table.. C-3 and C-4.

Qu O ●ub U Ouafiry fmdex for “.= wijh Table C-5.

QL Q ●.b L Ouafiry fndex for use with Table C-5.

Pu p .ub U Sample estimate of the let percent defective above U from

I Table C-5.

p ●ub f. Sample ●.tixnale cd the lot percent defective below L from

‘L
Table C-5.
I
P Totti SUTIple estimate of the 101percenl defective p = Pu + PL.

I M M&imum ● llowable percent defective for sa m ple ● m t im a m .

give n in Tablmm C-3 and C-4.

M,ub. U Mtitun allowable percent d. fecfive above U gi.em in Tables

%
C-> scuf C-4. (For use wbem differenf AOL valuca for U and
L ● re specified.)

ML ~uxn mflowmble pe rt ..t de f.cti.. blew f. Siv.m in Tabfe.

C-3 and C-4. fF~r u.e -ha. different AQL value. for U ad
f. ● re cp=dfied.)

P p ba r S-pi. ..tinut. @f the p.ece.. p.rc.m defective. i.e.. Cbe

estinmt=d prc.ee.. average.

$U p bar #ub V The estimumd proc e .. ..e ra ~e for UI upper ●pecUication lf-mit.

FL p bar suh L The ● stimated pro . . . . ● verage for a low e r .pecific.tion limit.

T The m- um num be r of e m t in’t a t e d proces. a.er4ea w~cb

may e x c e e d the AOL give n in T a ble C-6 . (For use in de ffr-
_ WW+fiCa fiL= U fi~ht=aod Ampeefloa)

8s

.—.
 M I L-ST D-4 1 4
11 Jffffa 10s?

SECTfON D

vARIABIIJ’I-s KNOWN

Part 1

SINGLE SPEC1fICATION LIMIT

01. SAM PLfN G PLAN FOR SINGLE Dz.2.2 Acceptability Com.tant. Th= ●=c=Pt-
sPEC1 nCATfON LfhffT ●bility comstaut k. corrcapOd@f to the SUTI-
ple is. mentioned in paracraph DV..2. I, im
This part of the Stand~rd de.tribes tbe i-dicated in the column of the maater tabl*
prOc=<u, =* fer u*= with plan- fOr ● ●in81= c orre . p.a m ding t o t he ●pplic a ble AOf.. va fue .
.peciftcac ion limit whe. variability of the T a ble D-1 i- .nt e re d from t he t .pf. r norm a l
lot with rcapecl to the quality chbracteri. tic i.. peetion ● nd from tbe bottom for tightened
i. known. Tbc acceptability criterion i. im.pection. Sampling plan. for reduced ic.-
givcm in two equivalent form.. The.. are apectioo ● re provided in Table D-Z.
identified am Form 1 ● nd Form 2.
D3 . WT -BY -~T ACCEPT AEfl-~ PRO-
D1. 1 U.c of Samplinu Plan.. To determine CEDURES WNEN FORM 1 IS fJSEf#
whether the lot meets the ●cceptability
criterion with respect to ● particular qtmtity D3. 1 Ac c e pt a bilit y
Criterion. The dear-
chsracteristi. and ACIL value, the applicable of of a quality characseri. tic
c onform a nc e
.ampling plan shall be umed in accordance with re. pect to a •in~le specification limit
with the prcwi. iom of Sectic. n A. General hall be judged by lb. quantity {u-X)/_ or
Description of S.m pling Plan.. ● nd lhose in (x- L.)/..
thi. psrt of the Standard.
D3.2 timputation. The folio witas qu~tifY
D1.2 Drawing of Sag. “All -ample. ●hail ● ball be compute& (u-X )1 . or (X - I .)l. . de -
be dramt i. ●ccarrJa.ce with pa ra #rm ph A7 .2 . pendins on whether the .p..fficatiom limit
I i. u uppe r Or ● 1 0 w e r lim it , w he re
D1.3 Determination of Sample Size Cod.
Letter. T he m -pie 9 1 Z C code,letter .hdf U i- the upper specification Mntlt,
~.cted from Table A-2 tn 8ce.rdmce .L is the low-r ●pecKicatioa llmit.
with paragraph A7 .1 . X i. t he sample mean. ● nd
e is the bnown va ria bilit y.
D2 . SELECTING THE SAMPLING PLAN
wHEN FORM 1 I S USED btlltv Criterion. timpar. the
qmantity - L)I. with tba ●ccept-
DZ.1 Master Sampliq Table-. The rzm. t.r ●bifity coaatant L M (U-X)1. or (X- L)le i.
●amplms fabJe. Ior planm ba. =d on v8ria - .quf ’te ox sroater tb- b. tfmbg=-e~ ~
bt t lc y ~ k ? ● ●im sle qe e t fk a t t c $ m ltmlt ●cc*pfabfflfy crtsertcud If (U-w. or ~- L)/.
● re Tables D-1 and D-z. Tablo D-1 i- omd Is 18** tbn k or Decative. tin tbe lot dOa*
(m -rmsl Ind tightened tnapectiom and mt mat tbo 8cc*pfAbtltty c rlterioa.
T&l. D-z for rod.ced icupectioa.
D4. SUMMARY PUR OPERATION’ OF
DZ . Z 8ampffnR Pt M .
Obtdmimr T bo Qu8 1 - 8mAuNGm..Az4wmz N?onu 12s
pli8* ph. C.nmmtm 01 ● ,unpl* ●
i.a,wd M
s~moclated ●cceptability conmtant. Tbe
samplimg plan ia e bt a he d from k .t e r
T a ble D-I ● nd D-Z .

DLL, ~pfe Sise. The ..niph she m i. [1) Determine [be sample sise coda let-
●howa in t e mamter table correspoadhs fo ter from Table A-Z by u-lr.I Ibc lot ●iM ad
each ●ampl. ●he code leffer & AOL. tba tipecftoa lee:.

lS.a Appcadis D for d= finicia=u al all ●pnbals used in tba sunptiQz PIUU bned oavar~U~
Z~-~PIe D. I fo, ● COmpfete .sunpf’e Of tti prO=eda.e.

67
 mL-snb414
11 June 1957

(21 ObtainzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
PI * . from M a st e r Table 33-I ●Pecificalion limit. The p.rc.mtag. ef nom-
or D-Z by sel=ctitag the ●ample .i%e rI ●nd c.nferming product i’ ● .;imamd b~ ●nfcr-
the .Cceptabitity Coti.ta-t k. Tablt D-5 with the quality index.

(3) Seleti at random ~ha .unple ef ❑ D6. Z Computation of Oualilv lade-. The
units from the lot: inspect ● nd record the qua lit y ic.de= QtI . [U-X) VI. .h.lf be corn.
tn. amur. merit of the quality c ha ra c t e rist ic puted if the 8 pe ; ific a t ion lim it im u. uppe r
I or each unit of the ●ample. lim it U, or C3L = fX-L) v/. if il is s lower
limit L. The quzc.litie.. ~ and . . ● re the
[4) Cornput. the .unpl. me.. X, ●nd ..mplc mean and known variability. respec-
●lso compute the quantity (u-X)/e for an tively. The laclor v i. provide d in Tables
D-3 and D-4 corre. pc.ading to the .unpfe
u pe r spe c ific a t ion lim it U or the qua m t it y
{f- L)/. for ● lower .pe c iiic a t ia a lim it L size.

(5) lf the quatitity (U-X)/. O. (x- L)/a D6.3 Estimnte of Pert.nt Defective in Lot.
The quality of ● lot ●hall be exprem. ed by
i. equal to or greater lhas k, the lC.I meet.
the acceptability criterion; U (u-X )1 . or Pu. the e st im a t e d pe rc e nt delective in the
lot ● bove the upper .pecificstmn limit, or
(X - L)/W is I c a a :ha n k c .r e e sa t ive , t he m t he
by P the ●stimated percetit defective below
1 0 1 do=. not m e a l t he a c c .pt a billt y c rise rbn.
ih. l-”
owcr specific alior. limit. The citimated
percent de~ective PU or pL i. obtaizted by
D5 . SELECT I N G THE SAMPL3NG PLAN cmte. img Table D-5 with OU or Cfti
WHEN FORM 2 3S USED
D6.4 Acceptability Criterion. Compare the”
D5. I Master Samplirm T. bles. The ma.t.r estimated 101 p=rcent defective p~ or pL
m.rnpling tables for plans ba. ed on vari. - with th. maximum ●llowable percent de fcc -
bilily knc.un (~r ● .ingle specification Iirnil ti. e M. lf pu or pL i’ equal to or le.. than
● rc Table. D-3 ●nd D-4 of Part IL Table M, the lot meet. the acceptability criteriotx
D-3 is used {or normal .ad tightened in- if PU or PL is ~reater than M or U QU or
spection and Table D-4 for reduced inspec-
tion. ‘L ~S negative. ~h=n th= 10t do= C@ IIWCt
cn. acceptability crxterior..
D5 . Z Obt a inin~ t he Sa m plinff Pla n. T he .137. SUMMARY FOR OPERATION OF
sampl.ug plan .onsi. ts c.{ ● ample .iz. ●nd SAMPLZNG PLAN WNEN FOffhf 2 IS
an ●ssociated maximum ●llowable pe rc c nl USED
defective. The .amplimg plan is obtained
from Master Table O-3 or D-4. The follow ing st e ps sum m a ric e the Pro-
c e dure s t O be followed:
D5. Z.1 Sample Sise. The .ampl. .i=e ~ i.
.hown in the rnasler table .x. rreaportdine to (1) Dele. rninethe .m’nple size code 141-
each s~mple .i=e code letter, cer from TabIe A-Z by ..ing the lot .ise and
the in. pecliem level.
D5.2. Z Maximum Allnr.. able P.rcecIt De-
fe<tive. The rnaxirnum ● llowable ~ereent (2) Obtaia plmr. from Mater Table D-3
i~ve M for 9UTIP1. ●.timalc. c orr.. - or D-4 by ●e le c t ing lhe ●unple ●i=e U . fbe
poa dk m g b t be sa m ple ●i.e meatlomed i. fbc t or ., ●nd t he m ulm um df.w a ble pe r-
r-wr~pb D5.z. 1 I* irtdicated in the Colwn. c e nt de fe e fiw e M .
of the mseter table corrempoadiag to the
~PP1ic~hle AOL value. Tabl. D. 1 is acte, ed (3) S4ect st ramdom tbe .unple of n
from tbe t.pfar .armaf inopecfioh and frc.m umits from the 10G irs. pect and record t he
tbc bottom let tight.md tip.cuon. Sun- nm a .ur.nm nt 01 t he qua lht y charutari9tic
plirig plans for re duc e d I a m fm c t im a .a re pro- on each umit of tbe ●empl..
vide d io T a ble D-4 .
(4) Compute tbe sample me- X.
DE. ~T -BY -WT ACCEPTABILITY PRO-
CEDURES WNEN FORM Z IS USED 3 [5) Compute the quality index f2u .
( U - X }v/- U ● . upper t c ific a t im n lim it U
Db. 1 Ac c e pt a bilit y Crit e rion. The de~ree = (FL)v/. If ● ,-*
of con>ormae.ce c .f ● qua lit y eha~aeterimtic ;F%%%$; %ai% i, .peeified.,
with respect m ● .iagi. .pecifi. atio~ limit
.hdl be judpd by the prc=a of ~~con- 16) Determine the ●mtimsted lot prcasd
formimg produc l nut side t be uppe r Or lm .e r defective PU or pL fram T a ble D-5 .

‘S=. EXamPI. D-2 fa r . c om ple t e exunple of thl. precedure.

88

I -——
 MUA7D-414
11 Juoa 1SS7

(7) U the emthrmtcd lot percent de f.c -

UW* pU or pL im eqtml W or Ie*a ttmo tbe u ‘u h ‘rnesattve,
QL “ “ ““”=’
thea the ‘- let M “ ad
deem ‘f ‘4Z
maximum atlowable percent defective M, the =ccopMbUitY criterion.
the lot meata thm ●ccaptabiii.~ cricerla~

EXAMPLE D-1

&Ample of Ca3ctiiiamzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONM

Sia Cle Spe c 5 1 ic t ii0 a L%iit- Form 1

VariabiIlfy t(cw-n

Ex a m ple T he ●pe c if ie d m inim um yie ld point for c e rt a in ●t 4 e l c ~-t t a gs is 5 0 ,0 0 0 psi. A lot

of 500 item. im wubmicted for inspection. lo bpection Level IV. normal Ia.poction.
with AOL . 1 .5 S i. to be u..d. The variability . i. knowm te be 3000 p-i. From
Table. A-Z and D-1 it i- seen that ● mample of ●kc iO io re.autred. SU PW9 C fhe
yield point. of the ●unple specimen, ● re:

6Z,500; 60,500; 68,00(h 59.000; 65.500;

6z.000; 61 ,000; 69.000; S6.000; 64.500;
and rom plia m e with the acce?tabilitv criterion i- to be determined.

Lint Information Ne.ded Value Obtained Expluulion

—
1 Sample Sise: n io
I 2 Known V .ria bit it y: . 3.000

3 Sum af Mes..rcmcnt.: IX 630,000

4 Sample Mm. X: ZXln 63.000 6J,000110

5 Speeificatioo Llmlc (Luwer): L 58,000

I b The Quantity: (X- L)le 1 .6 7 (63,000-5.5.000)/3000

I 7 Acceptability CoLI. taat: k 1.70 See T-ble D- I

I .. 8 Acceptability Criter- Compare (X- L)/. 1.67 c 1.70 see Para. D>.3
w it h k

The lot does mot m e e t t he =e c e pt a bi3 it y critmriom, dnce (X-L)!. is le.. th= ~
I NOTE: If ● ●ksie upper specUiCatiOn ltrrdt u i. SWen. tbeh c om put e tbe quaatlfy (U-X)1. tm
— lb- b d c om pu~ it with k the 10C meet. the .cceptabiiify crit=rio. if ( u-X)k i.
I equal to or greater tbui k.

I
I
I

89
 54flL-sl’13-414
11 Jumd 1957
E~LEzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
D-2

fk a m pfe of Ca fc uht fonm

Single Spe c ific a t ion L4 m it - Form 2

VariabUity Known

Example The specified mimimum yield poiuf f-r certain .teel casting. . . .in S8.000 psi. A lot
or 500 item. is submitted ror inspection. inspection Level Iv, normal lnspectlon,
with AQL = 1.5% is to be u.ed. The variability e is known to be 3000 psi. From
Table, A-2 a nd D-1 it is . ..c I that ● sample of ●ize 10 i. re quire d. .SuPpa. e t he
yie ld point s of t he sa m ple m pe c im e n. a re :
6 2 .5 0 0 ; 6 0 .5 0 0 : 6 8 ,0 0 0 ; 5 9 .0 0 0 ; 6 5 ,5 0 0 :
62,000; 61 ,000; 6 9 ,0 0 0 ; 5 8 .0 0 0 ; 6 4 ,5 0 0 ;
and compliance w it h t he ●c c e pt a bilit y c rit e rion is m be de t e rm ine d.

Line biforr?m t irm N e e de d V a lue Obt a im e d Ex pla na t ion

—
I sa m ple size : n 10

2 K now . V a ria bilit y: c 3 .0 0 0

3 sun-l of M r. a .ure rnc I ll’: xx 6 >0 .0 0 0

4 sa m ple Me- X: T X ln 6 3 .0 0 0 6 3 0 ,0 0 0 /1 0

5 Fa c t or, v 1 .0 5 4

b sp=c ific a liOn ~m i, lt iw e r): f- S8 .0 0 0

(63.000-58.000)1 .054
7 Ouality fnder: OL : (X- L)v/o !.76
3,000
8 3.927. Se. T a ble D-5
‘m’” ‘f “ ‘Crcent ‘“1 ‘L
9 M a x . A1 l.a w a bl, Pe rc e m Def.: M 3.63% See Table D-3

10 Ac c e pt a bilit y Crit c ria n: Com pa re pL 3 .9 2 % a 3 .6 3 % S=. Pa r.. D6 .4

w it h M

T he lot d~e s not rn. e $ the ●c c e pf.a bifit y c rit e rion, sinc e PL is gre a t =r t ha n M .

~E ff . sin 1 . uppe r .pe c ific .t ion I ii-nit ff i. give n. t he . c om put e the qu~lity index Qu =
F-
(U. XIV . m lme 7 and ebtain the sstimale -f $ he pe rc e m l
with W. the 1.s rn. et. the ●c c e pt a bilit y c rit e rion
de fe c t ive PU . c om pa re
if pu i. ●qual 10.0. 1.*S than M-
PU

90

I ------- . . ..- .-
 T ABLE D-1
M a t t e r T a ble for N orm a l a nd T lght e na d I nspe c t ion for Planr Ba oe d on V a rla blllt y K now n
(Single Spe c ific a t ion Lk m lt -Form 1)

c c e pt t ble Oua llt y Le ve l? (norm a 2 I nopa c t ion]

Sa m ple 9 1 * c
.0 4 .06S .10 [ .1s I .25 .40 ,65
c ode letter [ I
n k n k a k [nk lnk lnk l ak

c
— —
D

F F .
— — 1 1 , ,
G’ 3 2.58 3 49 4 2.39 4 2.30 4 2,14 5 2.05 5 1,25

H 4 2 .6 3 4 2.5s
++” S 2 .4 6 .
I
5,.,4 I 62.2,
I
I 6Z.0*
I
I ?.‘“ 1,95

1 5 .?,6 9 6 2.59 6 2 .4 9 I 6 2 .3 7 I ? 2 .2 5 I 8 2 .1 3 I 8 1 .9 6

J“ 6 2,12 6 2.58 -1 2.s0 1 2.3s 8 2.26 9 2 ,1 3 10 1.99

x 1 2.7? 7 2.63 8 2 .5 4 ‘? 2 .4 s 9 2 .2 9 10 2 .1 6 1 1 “2 ,0 1

5 ., 8 2.7? 8 1.64 9 2 .5 4 10 2 .4 5 II 2 .3 1 12 2 .la 13 2 .0 3

1 t

M 10 2 .8 1 11 2.12 11 2.59 12 2.49 13 2 .3 5 14 2 .2 1 26 2.o7

I I
N 14 2 .8 8 15 2,77 16 2.65 I 1? 2 .S4 I 19 Z.41 I 21 2.21 I 23 2.12

o 19 2 .9 2 20 .?.80 22 2 .6 9 2 )- 2 .5 7 25 Z .4 J 27 2 .2 9 30 2 .1 4
I I I
27 2.96 10 2 ..9 4 31 2.72 34 2.62 31 2,41 40 2.33 44 2,11

37 2.97 42 2,71 45 2.62 49 2.48 %4 2,34 59 2.18

,’ ~
.0 6 3 .10 .15 .29 ~o .65 i ,00
‘E 1=r- Acceptable Oua21ty Levalo (tightened lnopectlon)
 . ---

T ABLE D-1 -Conl[nud

=s
M a ole r T a ble [or N orm a l a nd T i~ht e nid Z nope c t ionfor Pla rJ I Ba se d On V a ria blllt y l(now n
(Single Spe c lflc .t lon Limit-Form II ?1
;.
Ac c e pt a ble I 31ty Le ve l# (norm a l I nm pe e t im ) d
z
Sa m ple ●I c * ~~
I .0 0 1 .5 0 Z .5 0 4<00 6.5o 10.00 15.00
c ode I e t la r I I I *
n k nk n k ink n k ]a k
.—
B
l== 1 1 3

v v v Vlvlvlvl
c I 2 1 .3 6 z 1.25 z 1 .0 9

D 2 1,42 ,? 1.33 3 1 .1 7

I E 3 1.s6 J 1.44 4 1 .2 8 4 ,.,, I , .9,9 I , .,.28 I , .,,, I

I 4 1.53 5 “ 1 .$ 9 5 1 .2 0 6 .9 9 1
I
7 .1 9 7 8 .S8 4

--+-H%- 6 1 .6 2 7 1 .4 5 8 1 .2 8 9 1.01 11 .8 7 7 12 .6 4 9

H 7 1.s0 B 1 .6 8 9 1 .4 9 10 1 .3 1 12 1 .1 1 14 .9 0 6 lb .685

1 9 1 .8 3 10 1.10 11 1 .5 1 13 1 .3 4 Is 1.13 I 17 ,9 2 4 I ..2 0 .7 0 6

—
f l-- II 1 .S6 12 1 .7 2 13 1 .5 3 Is 1 .3 5 lZ I 1 .1 5 [ 21 ,9 4 2 I 24 .7 1 9
I
“1

K 12 1.88 14 1.75 IS 1 .5 6 I 18 1.38 20 1 .1 1 24 .9 6 4 27 .7 3 7

14 [.09 Is 1.75 10 1 .5 7 20 1 .3 8
Ill
L,

M 17 1.93 39 3.79 22 1.61 25 J ,4 2

N 25 1 .9 7 28 1.84 32 1.65 t 36 1 .4 6

o 31 2.00 36 1.86 42 1.67 48 1 ,4 8

——
P 49 2.03 54 1.89 61 1.69 70 1.51
=-b-t=-,
55

82
I .Z ~

1 .2 9
] 64

95
1 .0 5

1.07
], 75

Ill
.8 I 9

.841
I

t--- I I
Q 65 2 .0 4 ?1 1.89 El 1.70 I 93 1 .5 1 109 1 .2 9 t 127 1 .0 7 147 .0 4 5 I
, ,I
1.50 2,50 4.00 6.50 I 10.00 15.00 I
Ac c e pt a ble O !t y La ve lo (t ight e ne d I nc pe c lhm )
I I

AI AQL V dU S* ●?E I n Be rc e nt da fe c t lve .

’
I!fi::v,r, item in
k
a t c unplk a g plm ba Z ow ●rrow , t ha t ln, bot h a unple sit e * 8 w e ll a m k va lue ,
nzua t be k m pe c t e d.
idol Whe n S~pt O sit e e qua 2 0 or ●x c t a ds t ot
 .

T ABLE D-2
M som r ~nbt e for Re duc e d Z n8 pe c t ionfm r Pla nt Ba ie don V a ria bilit y bon
(Sinlle Spe c U ic a I lon Lim it - Form 1)
1
ble Qua lit y Le ve lo—
Sa m ple a ic o .065 .10 .1 5 I .2 5 .40 .b5
.04
coda I nt t m r
8 k m k n k n k nk n k nk
}

25

r Z 1 .3 b
—
G z ,.5 8 1 , z 1.42 I

34 z 1 .9 4 z 1 .0 1 3 1.b9 3 1 .S.6

J’
I

I
1 3

3
2 .1 9

2 .1 9
RF1 1

3
2.07

2.07
I 3

3
1.91

1.91
-=-H-i
II

K 132.’ 914 39 4 Y..3O 4 2.14 s 2.05 5 l.aa b 1.7a

II
L 4 2.ss 5 2.46 5 2.34 6 2.23 b 2.0%
a M 4 2.55 5 2.46
r 5 2.34 ‘k 2.23 b 2 .0 8
=-l-=-i
N 6 2.59 b 2.49 6 2.37 7 2.25 8 2.13

0 6 2 .5 8 7 2 .5 0 7 Z .J 8 a 2 .2 6 9 Z .1 3 10 [.9 9 I II 1 .8 6 I

P 11 2 .1 2 11 2 .5 9 la 2.49 13 2 .3 5 14 2 .2 1

Q 15 2 .7 7 16 2 .6 5 17 2 .s4 19 z.4 1 21 2 .2 1
I I *

4*
 :. .

T ABLE D-2 -ConU nue d

:s
Masltr T a ble {m Re duc e d k ic pe c t bn f.? I ?la n. Bre e d On V a ria bilit y I GI .Wm
(Sin@Spe c iflc a t lon Lim it -F.a t m 1 ) :8
..—
Ac e c pt a ble C2 ua I it y Le ve lt
‘Sm ple Siso
1 .0 0 I 1 .5 0 2 .5 0 “ 4 .0 6 .5
c ode letter
n k n k m k n k n k n k 1
! ! I
B

D,

F a 1 .2 s 1 2 1.09 I 2 .9 3 6 I 3 .7 5 5 I J .5 7 3

G a 1 .3 3 1 1 .1 7 3 1 .0 1 3 .8 .3 5 4 .6 4 1

53 9 1 .4 4 4 1 .2 8 4 1 .1 1 5 .9 1 9 5 .1 ?.8
=--l
6 ,5 1 5
z .1
4 t .5 j 5 1 .3 9 5 1 .2 0 6 .9 9 1 1 .7 9 7 0 .5 8 4 I

J 4 1 .5 3 I 5 ,1 .3 9 I 51.ZO 6 .9 9 1 1 .7 9 7 8 ,5 8 4

K b 1 .6 2 7 1 .4 5 8 1 .2 8 9 1.01 11 .8 7 7 !2 .6 4 9
II
L a 1 .6 0 9 1 .4 9 10 1 .3 1 11 1 .1 1 14 .9 0 6 16 ,6 8 5

M S 1 .6 0 9 1 .4 9 10 1 .3 1 12 1 .1 1 14 .906 16 ,6 8 5

N 10 1.70 11 1 .5 1 13 1 .3 4 15 1 .1 3 17 .9 ?.4 20 .706

I I
o 12 1 .?2 13 1 .5 3 \s 1 .3 5 18 1 .1 5 21 .9 4 2 2.4 .7 1 9

P 19 1 .7 9 22 1 .6 1 25 1 .4 2 29 1 .2 1 33 .9 9 5 18 .7 7 0

Q 28 1 .8 4 32 1 .6 5 36 1 .4 6 42 1.24 49 1 .0 3 56 .8 0 3
E I I
 kUL-sm-414zyxwvutsrqpo
llJ um s 106?

Psrt n

DOUBLE SP3 Z C3 SX AT Z ON Lfb4 Z T

DE. sAM ’PU ?J G PLAN FOR DO CfBCE the lover Itrnlt. M4 by MU for tb= UPWr
sPECIF3CAT10N _ limit. u one AOZ. i- ●ssigned to bath l~ltc
combined. demipte tbe maximum A31.wable
T his pa rt Of t he St a nda rd de sc ribm a t he p-rcerd defective by M. Table D. 3 is entered
proc e dure s f.r use w it h pft is for ● double from the zop for uornuz t ipe c zt on and from
Specific-tiom limit when variabttlty of the t be bosom for ttghtened imopectdon. Sam-
lot =ith reopact to the qtmfky c~rscteristic pli.s plans for redoced imcpeczion sre prO-
i. known. vide d in T a ble D-4 .

DE. 1 U .* Of SU nplim c Plan,. TO de t e rm ine D1 O. DRAWI N G OF SWLES

w % t he r t he lot m e e t s t he ●c c e pt a bilit y c ri -
I le.-ion with ?=* PCCX co ● X rt iCt I I Sr qu~i~ Samples #ball be selected In accord-
characleri~ tic and AOL v’a zue ls). the appli- ● nce with parasraph A7. Z.
cable ●ampliag plan shall bc u.ed in accord-
I ance with the prwimic.nm cd .$ection A, Gea -
eral DeacriptiOm of SkrqdiW Plmns, md D1l. #.&-T-Y~O T ACC~PTABIIXl%’
those in this part of the Standard.

D9 . SELECT WG THE fMkfPLfNG PLAN D! 1.1 Accepi.bility criterion. Tbe degree

et conformance al ● qutiltY c r.cleri~ tic
A sampling plan for esch AQI. .ake with respect to a do~le sF&c Ification limit
.h.11 be selected from Tab)e D-3 or D-4 ● .ihll be judge d .by t be pe rc e ~ a l ~c on-
[0110-s: fa rm iog produc t . T he ~T Ce I I U SS Of Wa -
.I J a forzniq produc t La e st im a t e d by e nt e rk g
D9 . i De t e rm ina t ion Of S=mple Sise Code Table D-5 wAzh Z& quality M-x.
Letter. T he ●a m ple ● ma c a de le t t e r .bfi
-- b~.cte.d [ram Treble A-Z in mecordamce D 1 1 .2 Computation of Qua lit y lndic e ■ . T he
I
...” with paragraph A7. 1. qua3ity iadices Q . (U-xwi e and OL=
(X- L)v/c . ●ba ll be ~omputed, where
D9. Z Master SamPlinE Table.. The maater
SUnpl-es ier w bs. ed on wuiabi3- U is the uppe r spe c ific a t ion lim it ,
ity known for ● double cpecific-tti Itit ● r= L i- t he 1 0 w e r ●peeificmion lim it ,
T=ble- D-3 and D-4. Table D-3 11 u~ed for “ is a fa c sor providsd in Table* D- 3 ~d D-4.
.O rmal amd tightened izupection ud Tmblc X is tk .unple mean. and
. D-4 for reduced inspect.ion. . ia zbe ksowm w a ria bifizy.
D9. > Obtaining .sunpli.g P1_ A ●unplia g
pla a Celia, mt, 01 ● ●mple ● 2*, d M ● s80-
..: .da t e d m a x im um a flow sble ~rc =m defec-
tively). The ●uf@ins PI- ti be ●pp3Aed Jo
inspection shall be ebtahed from 3dmcter
Table D-3 or D-4.

D9 .3 . 1 Sun 1 . Si.e . T he ●unple ●i.e m i-

#how . =~ t e m a st e r Z Ab3 e . e orre c pondla g to
each ●unple ●t x e code le t t e r -d AOL.

~Iv* .unpte
for .8Unut.* percent.of
da fe e c t w e th4 Imr.
for nppe?. 0rb04b cp*c-
tfication limits co~ta.d. eerr*mpOndbs fa
tb. sample ●ize memfiomed in parasrmpb
D9.3. 1. i. #ho_ in the cdunm of the W1 8 m t e r
t a ble e orre a ponding co t ba a pplic a ble AQ3 .
w dt e (s]. K dKferemtAQLos m aa~isad w
●x b spe c k fic a t lon U m lt . de m t suua t h8 --
t m m m t ile -a ble pe rc e nt de fe c t ive by U LI OZ

es
 nlL-s’nk414
11 JuIIe 1957

a t hrw i. t, tbe 10I doe. rat meet tb. ●ce.pl -

ability .rit. ria. Zf either OL O* O“ or both
Pi +b *= .U e w * I e
delceuve M. 25 p u equaf to or lea- 3baa U
‘P~z~t i ar. ae*.U.e,
s-AmzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
●ccep3abUtty criteria.
UMrI the 10; &e. 03%rpe.t the

the Id meeb t he ●ccep3abUIty crUeri~ ff

p ic ‘re=ter tbm M or if Of) or Of. or both : D1 2 .Z . Z sum m a ryc .f ope ra t ion e f s-
.,* Itapfive. Umn the lot & e s ml meet t he Plan. Za em=. wtmre ● diflereot AOL
a c c e pt a bffit y c rit e ria m ~c t a blic he d f., t he “p-r -d lower t~c.
Aficatiom limit for a •in~le qtmii17 character -
D12.1. Z Suna~ryef OP erati.n of Sunplia imtic, tbe ;dfow - .t c p. . urnnm rim e tbe
Plan. la caoe. where a .ingle AOLvtiue ~ prm c e dure m fn be u.e d:
~bliohed for tbe upper and lower ●pacifi-
cation limit cornbim.d (or a ●fwle quality (1) Determlae the ●unple ●k. code
characterimtlc. the tolZowinS steps 8umma. letter from Table A-Z by uefa, the 105.&e
ri. e th.. procedtwe. to be u.ed: d in.peetio. level.

(1) Determine the sunple ●ise code {Z] Select tbe san-tpliag plan front
letter from Table A-2 by u.ing the lot .ize Mate. Table D-3 or D-4. Obtaio tb. amp-
and the in. pectioa level. le .ise tI .ad the I.cter ., eorre.podirq
to the lar~erof lb. two AQLva3ue.. dal. o
(Z) Select pla n fr.a m M a t e r Table the maximum .U.Ywable percerit delecgive.
D-3 or D-4 . Obt t i t be .unpla si.e n. t he ●nd M corresponding to the AOL
fa c t or ., a nd t he rrux im urn a llow a ble pe r- va
‘Y ue. for 1# e apper and lower specificatiea
c e d de fe c t ive M . limit., respectively.

(3) .%], ct ● l ra=dem t he .a m ~le of 13) Select at random the ●mple of

n unit. from the lot; in. pect and record the n unit. from tbe 10C irIap. ct ●md record the
m... ttmeatat of tbe quality c ha ra c c e rim t ic mcaauremcm of the quality characteristic
on ●.cb unit of the sample. on each unit in the .arrtple.

(4) COmpute the .unple mean X. (4) compute tie .8mpIe mean x.
(s) compute the quality indicem Qu (5) Compute the q~ty indiee. QU
.. = (U-x)vl. ad QL . (X. L)v/.. = (U- fov/. and CZL = (X- L)v/&,.

(6) Determine the ●.tinmxed lot (6) Determine the ●.tImued @t

percent defective p . pu + pL from TabIe p.rceat de fectl.es p“ mud pL, correspond -
D-5 . ins to tha pa rc.af d. f.ctivec tie tb. upper
and b.lmw the lower .pecific.tkm limit..
(7) M tbe e. f.inuted lot percent de- Afmo d.te rmine th. combined percent de f.c -
fective p i. ●qua l t o e r le .. t ha n the maxi. tive p = p“ + p~ .
mum allowable p.rceas defective M. tbe lot
me. t. tbe a c c e pt a bilit y c rit e rion: if p is (7) u all three of tbe fallowing cc,n-
sreater than M or if Qu or OL o, both ● xe diuolt a :
=S~~V~. tfI*n *- let doa - not meet ~e
mccapc-bility criterion. l.) ~u i’ equaf to or 1... tbma
%.
DIz. z Dlff8 re m t AOL V a lue s for U ppe r and
& w .r .Sp.e U i.a U OO LiI nlL (b) pL i. mquaf 1. or lR.8 ffun
Mu
D1 2-2; 1 Aceap4abflUy Crit9ria. 5 COirtfu*e
the ●stdnuted 1ot pm rc ~t de fe e t ive m m .. h (CJ p b equaf t s Or I e * #fzla m t he
PU dt h t he c e rro@om d4 ng ~ -a ..- la rge r of ML and Mu,
=bI = Pe rt a =t de f==ttvew M d Mfj alao
=Omi=r. P . Pfi + PU wittt k larger d ML u. satiaficd, th. lot umato the ~C~t diii~
mmdMu. lf pL sequmt taarle*attmm ML. P criterk other+se. the lot does MC meet the
ic 9qtmf to or Ie*m tbul Mu. ad p i. q A
to or lam than the larger of ML aad M u, “’=~
or both am “’’”’A’*
aesativ~ tbeo ‘*’
* lot%::%
the lot meat. tbe ●ecepbility criterk m..t tbe acc.ptiifiiy criterb

—--- . .
 .

bn~14
11*2ES7

EXAMP= D-S

fsxanlpze of Cdcufat,ioms

DOEbh sp4c3d&az10a ZAm2t

varhbmfy XmOwm

Dm. AC3L Vahie for Seth Upper @ &w.r Spe e U ie a 3 2 0 a 2 AM A1 Combined

E.mtple The ●peclfie.d maximum ad mitdmnun yield 3,0311u[m cemd. steel rutimzN are
67.000 p. i and 58,000 psi, rucpceUvel y. A lot of 500 items is ●tbmitted for im pe c -
t loa . 3 nop.c t 3 0 n & va l Z V . a ornd insPc t 3 a a , W3 U I AQL = 1 .5 % 1 - t o be ..4. T&
variability c is &o-n to be 3,000 psi. Fra t i ?abka A-2 ●nd D-> it i. se e m fzut a
.unpl. of ●i.e 10 i. re quire d. SuPpu. e the yi.ld point. of the ●ample specimens
● re:

6z, SOO; 60,500; 68.000; s9,000; 65.500;

6z.000; 61 ,000; 69.000: 58.000; 64.500;
●nd c om plia nc e with the ●cceptability criteriom is to b, determined.

Lb.
— lnIornutio. Needed V. I.e Obtaim.d Explanation,

1 Sample Size: n 10

?. Know. Variability: o 3,000

3 Sum of Meaaurem6ats: ZX 630,000

4 Sample Mean X: sXln 63, o0O 630,000/10

I 5 Factor, v 1.054 See Table D-3

6 Upper Specification Untie: U 67,000

7 Zmwer Specific=cion Limiti L 56,OOO

8 QuaIity Index: Qu = fU-X)V/. 1.41 (67,000-61,000)1.054/3,000

9 Quality Lufex: Z3L . (~- Z.).1. l.?b (63,000-58.000)1.054/3.000

10 Est. of Lot Percen: Def. Above U: pu 7.93% See Table D-5

..:
11 12tc. of &t PerccnI D*I. Below IA P& 1.92% See Table D-5

J2 TelaJ ~*t. P=r=e=t D-f- ~ ~~ P -

Pu + P~ 11.85% 7.93% + 3.92%

13 Max. A310w~ble Percent D.[.: M 3.63S Seo T*1c D-3

14 AcceotablI1tv C.ite rioa: cmn~r=

. .n .
pu + “pL w it h M 11.85% > 3.63% See Para. D13.4

The 3ot doe ● not met the ●ccepzcbiflty criterion. da.. p = pu + PL io sreater than ~

97

------ .. . -—
um=slv-414
11 Jnne 19S7zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA

EXAMPLK D-4

Ex a m pt e of Ca fc ut a t im u

m l= sp0 dfk a 3 A9 n Z Am t t

V.rkatduty K a Ow t !

Difie re .t AQL. Vti.ss for Upp.r & lmwer SpeeUicDtinm ZAmlt.

The .pecified maximum and minintum yield p0&39 for cer3mim ot e e l c a .t l~o ● re zyxwvutsrqponm
psi -d
6 7 .0 0 0 5 8 ,0 0 0 psi. reapectivdy. A lot d S00 item, is submitted for inspee-
UO.. znspctko. *CI IV, uarnuf knspctinn with ML = 1%. for the uPP8r aad
AOZ. . 2.5% for the lower tipecificuiom lkmit im m. be u..d. The vari.bilicy . is
kcuaw. m be 3.000 pi. Frern Table. A-Z ●d D.> it i. .... that ● .unple cd ais.
11 c~rre. poridir..g to the s.rnple .ise code letter, 1, ●nd the AQL value Of 2.S% i.
required. S.ppc.. e the yield Pc.itis d the ●mple specimen- ● re:

6Z.500; 60.500: 6 4 .0 0 0 ; 5 9 ,0 0 0 ; 6 5 .5 0 0 :
6 Z .0 0 0 ; 6 1 .0 0 0 ; 6 0 .6 3 1 ; 6 8 .0 0 0 ; 6 2 .0 0 0 ; 6 3 ,0 0 0
and cmnplisnce with the ●cceptability criteria 1. to be determined.

Lim e Information Needed Value Obtained Expl-ation

—
I Sa m ple Size-: n 11
~ Kn~wn Variability: o 3,000

3 Sum .f Me... rernen:.: Ix 67.9,131

4 .%rnple Mean X: XXIC. 61,64.9 678.131/11

5, Factc. r: v 1.049 See Table D-3

6 UPPe r Specific atiort Lirnic u 67,000

7 faw. r Speci[ieatiea Limit: L 58,000

8 Quslity Index au = (u-X )v/. 1.07 (67,000-61,648)1.049/3,000

9 Ou-lit y ht de x : QL = (X - L)* /a 1.28 (6 1 .6 4 8 -SB.0 0 0 )l.0 4 9 1 J . oOO

10 3.07% See Table D-5

=.~ ‘f ‘t ‘“’c e nt De f” -’e u: Pu
11 E.1 . of bt Pe rc e nt De f. Se low b pL 10.01% See T-ble D-5

17. T .a t a l Ca t . Pe rc e nt De l. h bt : p = pu +
Pz. 13.10% 3.07% + 10.03%

11 M u. Allowabi. Pe r..mt Del. Abo.e U: 2.59% Se . Tabl. D-3

%
14 - A31.wable Pe rcest De[. B=lmu k s.60% See Table D-3
‘L
15 Acceptabilit~ Criteriw (al Compare PLI 3.07s ~ 2.59s see Pa r* .
with Mu - DIZ..Z. Z(7)(a)
(b] Compare PI. 10.05% > 5.60% see Para.
with ML 1312.Z, Z(7)lb)
(c) Cemoare 0 13.10% >5.609 s.. P.**.
with “ML D12. Z. Z17)(C)

The 10: dins. not meet the mccep~bUity crIterl.. .tnce 15(a), (b) - (c) ● re Dot ●*-
fied; i.e.. pu ●64U. pL > Mb ●nd p wM~

08

,:
-. -.. .—
 ..— —,. ..—. .—.

T ABLE D-fl;
Matter T a ble for N orm t i ●nd Tightened I oa pe c t lon ~or Pla in Ba m a don K now n V t ria bllit y
(Doubla 5pec{flcatlon Llmlt a nd Form Z -Single Spe c ific a t ion Llm lt ]

I m pI * -I * E
ode le t t e r
—.

I r

1
a
J

P
,.
Q

I J!LJ__
l!
IJ
AU AQ L id tabl~ who ● m In pmcaat defective.
1 ● firm sunpllq plan balow arrow. that Id, bath mmpsa 01*4 as well as M valua. When ●a m ple ●I s* e qudo or ●x e * sd* lot
I:la., @v*r, ‘Mm ,. tba 10, rnu,tb. SrIlpocied.

I
 ... ,.

T ABLE D-3 -Con(lnue d

MmIar Tcble for Normal and TI$ht~ned hmpectlon for Plm a Ba a e d on Known VarlabIllty
(Doubl. Specllic8tl.m U m it -nd 5 ’orm Z -Single Spe c i[ic zt lm Lim it )

Acceptable Quality Level# [normal In#pectio,

mpl* 01:
1.00 “ 1.s0 2.50 4.00 6,50 10.00 I 13,00
oda ldtt 1
m M v m Mv n he v n M v n M v n 64 v m M v

B
v v v v v v ~
c 1 .?.13 1.414 ?. 3 .9 0 1 .4 1 4
T ?. 6.11 1.414 6 9.27 1.414 3 {1.14 1.ZZ5 3 Z4.2Z 1.225 4 33.67 1 .1 5 s

D t Z.23 1.414 2 3 1.56 1.225 3 10.79 1..?Z5 3 15.60 1.ZZ5 4 2 2 .9 1 1 .I J 5 4 3 1 .0 1 1 .1 5 5

E 3 2.76 1.U5 1 4 6.99 1.155 4 9.97 1.155 5 15,21 1.118 5 Z o.a o 1 ,1 1 8 6 2 8 .6 4 1 .0 9 5

r 4 2.s8 1.155 4 5 6.05 1.110 5 B.9Z l.lia 6 13,s9 1,095 7 19.46 1.080’ f5 2 b. b4 1 .0 b9
*
G b 2 .s7 1 .0 9 3 6 1 .7 7 1 .0 9 5 7 5,83 1.080 B 8.62 1.069 9 1 2 .8 8 1 .0 6 1 1 1 I 7 .8 8 1 .0 4 9 1 2 2 4 .8 8 I .0 4 s

54 1 2.’bZ 1.000 s }.b@ 1 .0 6 9 9 5 .6 8 1 .0 6 1 10 8 .4 3 1 .0 5 4 1 2 1 2 .3 5 1 .0 4 s 1 4 1 7 .3 6 1 ,0 3 8 1 6 23.96 1.033

1 9 2.s9 1.061 10 ),6 3 1 .0 5 4 I I 5 ,6 0 1 .0 4 9 1 3 e .1 3 1 .0 4 1 1 5 1 2 .0 4 1 .0 3 s 17 17.03 1,031 20 23,43 1,026

J I 2.51 1.049 Iz 3.61 1.045 1 3 5 .5 0 1 .0 4 1 1 5 8 ,1 3 1 .0 3 5 la I l,n8 1 .0 2 9 21 16.71 1.025 24 23,13 1.022

K z 2.49 1.045 14 3 .4 3 1.038 1 $ 5 .3 4 1 .0 3 5 18 1 .7 2 1 ,0 2 9 2 0 1 1 .5 7 1 .o2 6 Z4 16.23 1.022 21 u;i) 1.019

L 4 2.51 1 .0 3 8 1 ! 1 .5 4 1.03s 1 8 5 ,2 9 1 .0 ,?9 Z o 7 .8 0 l.OZ b z] 1 1 .5 b 1 .0 2 3 Z1 16.z7 1.019 31 Z2,51 1,011

— —
M 1 2 .3 s 1 .0 3 1 1 9 3 .2 $ 1,027 z?. 4 .9 8 1 .0 2 4 2 5 7 .3 4 1 .0 2 1 3 9 1 0 .9 3 1 .0 1 8 3~ 1S.61 1.016 30 21.77 1.013

N s 2 .1 9 1 .0 2 ! 2 a 3 .0 ! 1.OIE 3 2 4 .6 8 1 .0 1 6 3 6 6 .9 S 1 .0 1 4 4 2 I ,).4 0 1 .0 1 2 49 14.81 1.010 56 20,90 1.009

o 3 2 .1 2 1 .o1 6 3 1 2 .9 ~ 1.014 4 2 4 .s5 1 ,0 1 2 4 8 6 .7 5 1 .0 1 1 5 s 1 0 .1 7 1.Ooq 64 14.s8 1<008 ?5 20.48 1.001

P 9 7 ..0 0 1 .0 1 0 5 4 2,s2 I.ooq 6 1 4 .3 5 1 .0 0 8 7 0 6 ,4 8 I .0 0 7 82 9 .7 6 1 ,0 0 6 95 14.09 1.00s [11 19.90 1.00s

Q 5 2 .0 0 1 .0 0 8 11 ‘1.82 1.007 8 1 4 .3 4 1 .0 0 6 9 3 6 .4 6 1.0 0 s 1 0 9 9 .7 3 1 .0 0 3 I Z7 14.02 I ,004 I 47 19.84 1.003

1.50 2.50 4.00 6.50 10.00 15.00

I I I I I I
Accepluble Qu4Zlty Zmvela (t ic ht e ne d 1 0 spQc ll.onl

A3 3 ML hd tabla vaheo ●rt 18 percmt de fe c t ive .

,~c ::it sa m pling plan bet.- .rrc$w, that f., both .unp,e ct.. . . well .S M WIZ.. Whe n * a m ple ●I S6 Cqua lc or • x c e od~ lot
v-ry it e m I n t he 1 0 1m uot bs hm pe c le d.
 . .. ——. —

T ABLE D-4
M a t t e r T a ble for Re duc e d Z nope c t lonfa r Pla n@ Ba se d on K now n V a rhbllliy
fDm hlo Spe c illc m ion Lim it a nd Form 2 –Single Spe c llic a t l.m Lim it )

Ac c e pt a ble (lua lhy Le ve ls

m ph Dim
.04 I .065 [ .10 I .1s I .25 I .4 0 I .& <
ode le t t e r

2(

1!

AU AOL Ad Iabh V dU Ci i?o in PO?CQ8 4da fa c t lvc .

I U S* flrol m m Plk I s Pla n hlOW ●rrow , t ha t I * , bot h m nv.le slsa ●s w e ll ●s M va hie . Whe n m m plo t lse ●qua la o? a ze w dc lot
{DI SC, ●T * ?F I t im k ~ha lot m ut t ba inspe c t e d,
k
 .-. . .

TABLE D-4-Continued
.M m t e r T sb2 e for Re due .d Z n* p.c t l.n lor Pla rM Bated on K now n V srisbllit y
(Doub1 8 Spe c illc m t ion U m it a nd Form Z -Single Spe c l{~c I t iOn U m it ]

ACCI
Ssm plo BI * 9 1 .0 6 1.50 2,50
c od- lqt t @r
n M v a M v n M “ II

B
~.

1
D

12
v v T t
k 1 3.90 1.414 1 6.11 1.414 2 9.27 1 .4 1 4 J 1 7 .7 4 1.Z?.5 3 1.Z25 i 4 I J .6 7 1 .2 2 5

G 2 3.00 1.414 3 7 .5 b 1 .2 2 5 3 1 0 .7 9 1 .2 z5 ) 1 5 .bO 1.ZZ3 4 lZ .9 1 1 .1 5 5 4 )l.O1 1 .1 5 5

1
3

4
3 .8 5

1 .8 7
1 .Z Z 5

1 .1 5 s
4

5
6 .9 9

6 .0 5
1 .1 s5

1 .1 1 8
4

5
9 .9 7

8 .9 2
1 .1 5 5

1 .1 1 8
5

6
1 5 .Z 1

1 1 .8 9
F
1.118

1.095
5

?
Z O.8 0

19.46
).1 1 .3

1 .0 8 0
6

8
2 8 .6 4

zi.b4
1 .0 9 5

1.069

J 4 3 .8 1 1 .1 5 5 $ 6.05 1.118 5 .9 .9 2 1 .1 16b 1 3 ..5 9 1 ,0 9 5 7 I 19.46 1 .0 8 0 8 t4.64 1.0$9

K b 5 .7 7 1.095 1 5.0) 1.080 8 8 .6 2 1 .0 6 9 9 1 2 .8 8 1 .0 6 1 11 17.88 1 .0 4 9 1z 2 4 .0 8 1 .0 4 5

L,

M
a

8
l.be

3.68
1 .0 69 9

1 .0 69 9
5 .6 8

5 .b8
1 .0 6 1

1 .0 6 1
10

10
8 .4 3

8 .4 3
1 .0 5 4

1 .0 5i
Iz

IZ
I Z .3 5

1 2 .3 5
T
1 .0 4 5

1 ,0 4 5
14

14
1 7 .lb

1 7 .3 6

1 7 ,0 5
1 .o3 8

1 .0 3 8
16

16
z3 .9 6

Z 3 .9 6
1 .0 3 3

1 .0 3 3

N 10 3 .6 3 1.05 4 11 5 .6 o 1.04 9 13 8.13 1 .0 4 1 15 1 2 .0 4 1 ,0 3 5 17 1 .0 3 1 Zo 2 3 .4 3 1 .0 2 6

0 1z L61 1.04 s 13 5.58 1.04 1 15 8.13 1 .0 35 “1 8 1 1 ..5 8 1 ,0 2 9 z! 1 6 .7 1 1 .0 ,?$ Z 4 2 3 .1 3

+ 1 .0 2 2

P 19 3.26 1.02 7 22 4.98 1.02 4 7.5 7.34 I .oz 1 .?9 10.93 1 ,0 1 8 31 1S.61 1 .0 1 6 M 2 1 .7 7 1,013

0 28 3.05 1.01 8 32 4.68 1.01 6 36 6.95 1 .0 14 4Z 10.40 I .olz 49 14.81 I .O1 O 56 ?.0.90 1.009
— i i
. —— –-— ——-
—— __
.

T ABLE D-5
T a bI c for Cot lm st I nS t he la t Pe rc e nt a ge De fe c t ive for Pla ns Ba re d on t iow a V a rllbilit yl

1
 Part Ill

ESTIMATION OF PROCESS AVDLAOE A34D CRfTER3A ~31

REDuCED AND TIGNTENW 1NSPECTIONzyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQ

D 13. ~:S# fAT fON OF PROCESS AV ER- !. with Q or QL 4 t he c orr. spondin~ .m t i-

defective
m ut e d Y e t pe rc e ,a t t Pu 0. P L. ?*-
spectively, is read from #he ~bIe. The
T h. ● ve ra ge percent de fe c t i* e . ba oe d e.tinuted proces. ●verage pu i. the arith-
U POn A 8 r0 .P 0 [ 1 0 U ●t bm it m d for or~im a l metic m-u. of the Itidi.idual e.timated lot
in. pe c t ic m , i. c a lle d Sbc proc e a a a ve ra ge . percent defective. Pu’ ●. Sina ihrly. t he e .t i -
OrlgirI a l inspe c t ion is t he fir-t I nope .t ion Of nuted procems average p is the arithmetic
● prt ic ula r qua nt it y 0 1 produc t .ubm it t e d me- of tbeiadividdemt~atcd lot percemt
[or .e c e pt a hslit y ● . di.tfngui.hed from the de fect%ve. PL’..
in. pe c t ia n of produc t w hic h ba . b=c m re . ub -
rnirt e da ft e r prior ra je c t im m . T h. proc e a . D13. Z.Z Double Specification lAmit. Tbe
●.e ra gc sha ll be ..t inut e d frc . rn t be re . ult . e.cim.ced lot percent dciectzve ●hall be .de-
of i.. pe . t ion of w a m pl. m dra w n from . ●pe e - termim.d from Table D-5 for the pluI. bm. ed
ifi.d m urnbe r of pre c e ding lot . for t he pur- on variability b.swa. The quality Indic.s
pose of decermis.img severity cd inspection 0 and QL shall b. computed. Table D-5 i-
during lhe tour. e of ● contract in accordance enY ered separately with QU and OL ad- the
with paragraph D14. J. Any Iot. .htil be in- carre.pomding pu snd pLare read frOm the
cluded OUZY once io e.timatitig tbe proce. a fable. The e.timtied ict percemt defective
average. The estimate of the pre c ... ● ve r - is p = pU + pL. The e.tirnat.d pro . . . . a.er -
●t ?. is de signa t e d by $ u what computed with ●ge p i. th= ●rithmetic rn.a.mof the individual
r.. pect to ● n upper ●pecific.tion limit, by =atimsced lot percent defective. p’..
PL wb=n cOmp~t=d rnth r=~p=ct tO ● 10w=r
specification Iirnit, and by p w he n c m nput =d D13. Z.3 Special Case. U the quazity index
w it h re . pe c t W. a dc .uble .pe c ific a c iOm I im it . 0,, or Q, ,s a nt~atm.e number. them Table
DY5 i..~~ter=d by-di. regarding the negative
si~n. However. io thi. case the e.timated iot
D13.1 Abtmrrr,a) Remult,. Th. re. ult. 0[
P. TC.nt defective ●bove the upper limit or
irmpectior. of product manufactured umdcr below the Jow.r limit i* obtained by ●ubtract -
1, conditions not typical cd tmual production.
~~~~ Per==at=ge found in the table from
shall be excluded from the estitrmted pre -
cemm’ average.
RE-
D1 3.2 Ccmputatiem d the Esf.inuted prc -
c e . a Ave rs e . T h ● e .t m ut e d proc e .. a ve r-
‘“ %%%dWPECITC)N AL T X GZ iT EN ED, AN D

●ge M t he ●r~t hrne t ic m e a n of t be e st im a t e d This S$azidard e.tabli. ha. wampling

1 0 t pe rc e m de f ●c t ive computed from the pl*rsh for normal, tightened, and reduced
.unpling itt*pecti.ma re.. tit. of the preceding i-peetioa.
tea (10) low or S* may be .alhenvi. e d.miS -
❑ated. In order to estimate the lot percerat D1 4 . 1 At St a rt of Inspection. Normal in-
dsf.cti.e, the quality kdicem Ou &\.ar QL .pectiom SW b. wed ● t t he ●tart of inapec.
●lmfl be computed for each lot. Theme ● re: UOa IU13C.*Secberwim de # $ gm 4 t e d.
(3u . (U-X)WI. and QL = (X- LWIO. (S8.
paragraph D] I. Z.) D14.Z OuriaS fn.xctiou During the co.r ● e
of In9puctia, -rmal uumction shall be
used when taapeecio. cmaditioo. ● re much
D1 3 .?.. I SiI @. Sp.c ifie a t lon Z .lm l% 6 T he tbt t6sht.nod O. redncad iaapection is not
e st im a t e d 1ot pe rc e nt dof e c u-e ●ba l-1 b de - rqufred fn accordance with prmS.aphs
Ce nnine d fra rn Table D. 5 ter the plum haw ed D14.3 and D14.4.
O. bnow a va rbbi3 it y. T be q-am3ityiadex Q“
hall be us.d far tbe ea.. of aocJppr .pec - D1 4.3 Tight=imd 31Wpecttoa. Tiuhtermd tn-
iiic.tiom limit c,r QLlor the c.. e of a 10X. Spectltl. .W1 be in. ututed wb. n t he e m t i -
●pecifi..ticm limit. Table D-5 ii entered na a t .d proc e . m ●ve ra ge computed from’<he
6Wbem Form ~_~l.
s~di=utia d.tmit ti a-cd (0 ? Czu ue * pt a bi3 ~t y c rlt a riO=, ~h= a ~t i-
rnst e Of lot defective pzz or pL i. ❑ m ebtaiaed,
pe rc e nt 10 order to emtinmte the procems
●veraga, it ia aecea.~y to eornpiete paragraphs D6. Z d D6. S af hrm 2.
‘ra, .m~e. ifQ . -.50and O = 1.60,thenpu = 100IL - 30.854% = 69. J46%. pL = %4g%
~ P “ 69.146% + &S . 74.6z6&.

..-— ----
 MUAID-414
11 Jftfld 10s7
!’
prece4iag [e.zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBA
(1 OJ I ot # (.r m uc h ot he r sm m - I e sm than the ●pplicable loumr limit cbown
be r of lm a demig=atedl in ●ccordmce with i- Table D-7.
paragraph D1 3.2 i. greaur thaa the AQL.
and when m ore t ha o ● c e rt An num be r T Of Caufitiom c. Pr0dmct50n is ● t ●
t he se 1 0 t a ‘ha ve ●st im m e n of t he pe rc e nt ●tcD4y ra k . zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQ
de ie c t ive e x c e e ding c t a eADL. Tb* T-value. N onnsf impecthm *baff be retostate4 U my
are SiWeaI in Table D-b when tbe pr.acua one of t be foI low ing e ondft iom oc c urm tiad~r
average is computed from 5, 10. or 15 lots. 8 redueed tic wctlon:
Normal inspection still be reimtmted if t he
.stinnted pro . . . . ..erage of Iota under Condition D. A Iot-ic rejected.
tightemed iiwpectio. i, equaf tc.c.,lem. than
the AQ L. fkradiiinm E. The estiunkd plw J c e ~-
. ..erage i. ~re.ter tbn the AQL.
D1 4 .4 Re duc e d fnsp=c t ior.. Re duc e 4 b- Comditiom F. P.oductiom be=om.a
c pe c t ie n m a y be inst it ut e d provide d t ha t a ll irregular or delay=d.
of t he follow ing c OndiliOn. ● re ■a t isf ie d:
COtisti.n G. Dthe r ccmditiom u
Condition A. The pre c e ding t e a (1 0 ) may w t a rrw t that normti inspection should
lots designated)
lc .t s (or such other mmnberof be reinstated.
have be.- under r.c.rrnsl i.. pecti.m -d no.e
has been rejected. D1 4.5 Sarnplin~ Plans for Tightened or Re -
duced k,C.~=CtLOIl. S~PIIDS Pl~S fOr *lghl -
Condition B. The e.linuted percent e~ed and reduced inspection ● re provided in
defective for ●ach of these preceding lots is Section D, Parts I and 11

I
10s

..
I

T ABLE D-U

v.iu. mof T for Ti+t.oed k+spsctbon

—

7F
Sample size Ac c e pt a ble Oust I t y t a ve ls (in percent deft!, i.e Nu13160r
—
code letter .J -t .065 .10 .15 .25 .40 .65 1.0 1.5 2.5 ●-o ,.5 10.0 15.0 of bm
—

B . . . ● ● . . ● ● ● ● ● ● *

D
●

●
.

●
●

●
●

.
.

2
.

3
●

3
4
b

3
3
5
6

3
3
5
6

:
3
5
7

4
6
a

4
:
7

4
b
9

4
—
4
7
9

4
7
9

4
w
E . ● . ● 4 4 5 6 : 6 7 7
5 6 7 7 8 9 9 10

3 3 3 4 4 4 4 4
F . . . 6 6 6 7
: : : 8 8 8 ; 9

3 3 3 3 4 4 4 4 4 4 4 445
G 4 4 5 5 : 6 6 ‘1 7 7 7 7 88 10
b 6 7 7 7 8 8 ,9 9 10 la 10 11 11 15
—
3 3 3 3 4 4 4 4 4 4 4 445
H 5 5 b 6 6 2 7 7 7 7 7 8 88 10
b 7 7 8 a 9 9 9 10 10 10 11 -++-
II 11 15
—
3 4 4 4 4 4 4 4 4 4 4 4 445
1 5 6 b 6
b 6 7 7 7 7 7 7 8 88 10
7 a 8 8 9 99 9 I.101 10110 11 11 11 15

u
!
4 4 4 444444 4
J : b b b : 77 8
8 a 181819119101 :1:1: 11
—
4 4 445
K : b a en 10
8 8 9 9 9 9 10 10 10 10 II 11 11 11 1s
—

-l-J--
4 4 4 4 4 4 4 4 44 4 445
L b 6 6 7 7 7 7 7 ; 88 8 88 10
a q 99 9 9 10 10 10 10 11 11 11 11 11 15
I I I —
44d t 4 4 4 4 4 4 4 4 4 44=
7 8 a
1: 9 1: 1: 1: 1: 1: 1! l.: 11
—

+E
4 445
a 88 10
II 11 11 Is

4 44’5
8 8 8 10’
11 .11 11 15
—
.There a re no .a nt plim g plM M provide d in t his St a nda rd fe r t he se c ode le t t e rs 8 nd AOL.a 3 nOS.

I&

—
 hfnATD-414
11 June 1951

TABLE D4-CmtJmd v ●riab.bMc7 ~

VAM., of T for Tl@umd f519~Cti00

Sample ●L. Accepmkle Ouatlty Lavelo (in PC rc e m t t t e fe

code letter .04 .065 .10 .15 .25 .40 .b5 I .0 1 .5 2 .5 4.0

4 4 .4 4 4 4 4 4 4 4 4
P 7 7 1 7
10 10 10 10 If< 1: i! 17 1: J: 1:

4 4 4“ 4 4 4 4 .4 4 .4 4 4445
Q 1 7 8 s 8 s 8 888 10
10 10 lJ 11 11 11 11 1: 1: 1; 1: 11 11 11 15

I The top rigure in cacb block refer. to tbe precedi~ 5 lot., the rniddlc figure m the
preceding 10 lot. ●nd the bottom figure to the precedi~~ 15 lots.

Tightemed i.. pectiom i. rquir.d wbem the aurnber af lotm with .stirn.tea of percent
defective ●bove the AQL from t he pre c e ding 5 , 1 0 , or 1 5 I ot m i. gre a t e r t ha a t he Eive n va lue
Of T iu t be t .ble , a nd t he proc e os ●ve ra ge from th.. e lat. e=c=ed. th= AOL.

N] estinutea of the lot p.rcemt de fectiws ● re Obtaimed from T a ble D-5 .

107
 T ABLE D.7 V . fI a blllI ~ K now n ~~
Llm lt o o{ Est im a t e d Lot Pe rc e I I I D. f.c !I vr ior Re duc e d Inspection *r

Sa m ple size Acceptable C1. &litv Levels

*
c ode letter .04 .065 ,1 0 ,15 ,,?5 ,40 .b5 1 .0 15.0
—

● * . ● ● . ● . . *
35
J
.0 1 1 .021 1.714 5
c ● * * ● ● ● ● .109 .2, ?2 14.z91 10
,209 .558 ! I 5.00 Is

.003 .011 .027 .369 .769 1.645 4.386

D ● * ● ● ● ● .050 .109 .222 I,Z48 Z.354 4.496 8.049
.144 .290 .558 2.145 3.850 6.50 10.00 I 5.00 1$
I I
.001 .002 .045 .086 ,16b .631 1.225 z.q37 5.154 9.419 5
E ● * ● * .009 .021 .197 .)57 .62Z 1.64J 2.9z4 5.69? 9.330 15.00
.029 .064 .384 .669 1.124 2.50 4.00 6.50 I 0,00 A

.005 .010 .021 .09n .178 .311 .046 1.560 1.3Z5 6.114 10.436 5
~ ● 4 * .025 ,052 .100 .309 1.880 3.250 5.958
I J- .5Z8 .874 9.806 15.00- 10
.056 .110 .204 .5.22 .867 1.194 2.50 4.00 6.50 10.00 b 1$

.001 .001 007 .013 .0Z6 .078 .147 .J z Z .53J 1.1)6 t.166 4.o45 1.093 11.470 5
G .004 .008 027 .049 .093 .Z17. .385 .718 I ,I J 9 Z.141 3.698 6.342 10.00 15.00 10
: .010 .01.9 055 .090 .167 .347 .6OZ .00 1 .5 0 2.50 4.00 6.50 J A IS

53”
.002
.009
.004
.017
l-l .-1-
013
041
.02.?
.0b7
,057
.147
.103
.252
,ZZ3
.418
.375
,773
.677
1.Z70
1.326
z.Z17
Z.40J
3.8JI
4,453
6.5o
7.s02
10.00
12.054
I 5.00
5
10
.018 .033 071 .114 .227 .382 .65 ,.00 1.s0 2.50
% 4.00 A A & Is

.004 .011 018 .030 .070 .142 .252 .451 .718 1.461 Z ,6 4 3 4 .7 1 9 1 ,7 8 6 12.427 5
.298 1.346 Z.J59 J .9 4 z 6 .5 o 10.00 15.00
I .014
.025
.011
.051
0s1
082
.081
.129
,164
.244
—
.40
—
.508
.65
.847
,.00
.
1.50 2.50 4.00 A i
-L ~ [’015

.006 .011 OZJ .038 .08Z .15.9 .298 .316 .85J 1.562 2.758 4.909 8.05s 12,693 5
J .016 .011 0s8 .092 ,177 .J13 .549, .892 1.J94 2.412 3.987 b.50 10.00 15.00 10’
.030 .051 090 .140 .2s .40 .b5 1 .0 0 1.50 2.50 4.00 A a A 15
— —
.008 .014 ,028 .051 ,09 I .171 .3!7 .540 .910 1.641 2.89! 5.009 8.205 12.848 5
2( .021
.033
.036
.056
,064
,09b
+
.10’9
.1S
.18B
.25
.JZ6
.40
.564
.b5
.908
1.00
1.4z7
1.50
2.449
2.50
TF
,4.00
1
A
1
6.50
A
1
10.00
A
15.00
A
10
1$

I ●There ● re no aampllng plant provided in lhh Standard far lhe. e :ode letter, and AQL va 5 ue # .
4
 _—— .

T ABLE D-7 -Conllnue d V ~rI a bI llt y K now s

Llm lt o of t ht im it e d La t Pe rc e nt De fe c t ive lor Re duc e d fnnpe c t im
., .-. . .
we u“alftv La C19 N um b-r
“X .40 2.5 4.0 6.S 10.0 1 .0 of I/As
—
.107 .191 .348 .501 .934 1.732 z.96Q 5.131 8.3Z8 13,017 5
,203 .344 .586 .934 1.440 Z.406 4.00 b.io ko.oo I+5.03 10
.Z5 .40 .65 I ,00 1.50 2.50 b A h 1115
—
.120
.Z14
.211
.557
.383
.608
T
.6zl
.959
---1- I ,o1 O
1.415
1.821
2.50
3.093
4.00
5.310
6.50
8.516
10.00
13-238
I S.00
5
10
.Z5 .40 .65 I .00
I 1 .5 0 ha, A A 15

N
.017 .030 .049 .080 .146
.03Z ,054 ,086 .134 .232
.Z51
.38Z
.435
.635
.705
.994
-1_
1.113
1.50
1,959
T
2.50
3.Z7Z
4,00
5.546
6,5o
8.0z2
10.00
13.588
15.00 -
s
3u-
.04 .06S .10 .1 5 ?.25 .40 .b5 1.00 i A A * A 1 15
-1- —
.(41 .277. 1 3 .8 0 1 5
.241 .392. I 5 .0 0 10
.2s .40 & 15

.1s0 .299 1 4 .0 3 4 5
5 .249 .41Z‘ I S,oo 10
.25 b & 14
*
.191 .316 1 4 .1 7 3 5
,. .25
h
.40
1zyxwvutsrqponmlkjihgfedcbaZYXWVUTSRQPONMLKJIHGFEDCBAb
*

All A(3 L ●nd tsble vdue c ~r; I n pe rc e nt de fe c t ive .

m 1 5 .0 0
A
10
15

bU m et he flrot fl# ure I n dlre c t lon of a rrow a nd c orre e pondin~ num be r of 1 0 M . I n e a c h bloc k t he t op (I gura re form t o t he
pre c e dlm [ 5 lot t . t he m iddle figure t o t he pre c e ding I O lot s. a nd I he bot t om figure 1 0 t he pre c e ding 1 5 lots.

Rw!uc813 impectkon may b- t na lit ule d w he n e ve ry e m t lm a le d lot pe rc e nt de fe c t ive from t he pre c e ding 5 , 1 0 , or 15 lot- in
bdow t he flsure glvon I n t he t a ble . fn a ddit ion, I I I c .t he r c ondit iom for re duc e d im pe c t ion, I n Pa rt 3 2 3of Se c t loa D, m ust bc
dt ilt fle d.

AN e nt k nm t e oof t he lot pe rc e nt de fe c t ive ● re Obt a ine d lrom ‘T a ble D-5 .

=H

II
ba L-sT D-4 1 4
1 1 J une 1 9 5 7

APPENDIX D

Defhiflmu

Sz@!s!! Read Def intt.io.s

n Sunple site for + ●ingle lot.

x X bar S-pie rnemn. Arithmetic mean of ● unple rneawaremento from

8 tingle lot.

. Sigma fbowa variability. The predetermined variability of the quaf -

ify cbaract.ristic which vill be u.ed rntb the .a ria bifify bow .
●c c e pt a bflt fy plus.

u U ppe r spe c ific a t ion I im t it .

1. La w m r ■pe c t fic a t ia n lim it .

k The .ceeptabi3ity constant givem in Table. D. 1 and D-z.

v A factor tw.d in determining the quality indices when ua ing

the bnowLI variability acceptability plan, The v vafues., ● re
giv== in T~b10. D-3 -d D-4.
Q“ Q ,ub U Quality Index for use with Table D-5.

QL O .ub L C3uality Index for use with Table D-5.

m p sub U Sample estinute 0[ the Iot percent defective ●bove U front

.Table D-5.

p ●ub 1. Sample escinute of the lot percent @ef.ctive below L fr.a m

PL Table D-5.

P Total ●unple e mfirnsfe .a f t be 1 0 1pe rc e nt de fe c t ive p = p“ + PL.

M“ Maxdmum dfowable percent defective lor sample eatimatea

given in T @ble s D-3 and D-4.

Mu M ●.b u Maxfmum allowable percent defective ●bove U ~ivem h Table.

D-3 and D-4. IForuce when different AQf- v81uec for W and
L ● re spactfjed. )

‘L M ●ub L Maximum ●llow.blcpercent defective below 1. @em ia Table.

D-3 and D-4. (For usawhen different Mf- value. for U =d
L ●re ●~edfted. )

P p bar Sunpfe ewtdnnte Of the procemw merceut de fe c t ive , i. e ., the

amfimated procema average.

P“ p bar ●ub U Tbe ●mfimuod pw..s. .Verq. [*. -n upper Spectficstlom unlit.

p bo ●ub L The estimated process average for a lower ●pecf3icatlon Umit.

‘L
T Tbe maximum num be r of e m t t nut e d pr.x e oa ●ve ra ge - w hic h
may exceed AQL given in Table D-6.
t be {For u.e indetnr -
=1- applic~t~a Of ti8bt=n=d i=~p=ctiOa. )
< Less than L.eom than.

> Greater tbM Greater than.

I SLunof

110

. — .— — .- ---- ----
I I

-.
,FOM d.m # t hb lhn,

lFOM k -, Ih” I t ”. )

n
DEPART M EN T OF T H E N AV Y

111111 N o PGE?AOe
wscE!EEAmv
1S UAILEO

UNITED
1947MC
STATU

OFFK I AL ●k rJ N E5
●EN ALT V FOm ●RI v AT C U SC E.1 0 0 BUSINE:SNOR~,P;~M,M,fi[&,
rlnsl CLAW
POSfAGE WI LL BE PAI D BY T H E DEPART M EN T OF T H E N AV Y

Co@xuanding Officer
Naval Ordcmce Station
StandardizationlDocumen tatiop Divieion (Code 524
Indian had , KO 20660
I

,.

DDa??”1426
. . .. --?r
 NOTICE OF NOT MEASUREMENT
CANCELLATION SENSITIVE

MIL-STD-414
NOTICE 2
2 February 1999

MILITARY STANDARD

SAMPLING PROCEDURES AND TABLES

FOR INSPECTION BY VARIABLES
FOR PERCENT DEFECTIVE

MIL-STD-414, dated 11 June 1957, and Notice 1, dated 8 May 1968, are hereby
cancelled. Future acquisitions should refer to an acceptable non-Government standard on
sampling procedures and tables for inspection by variables for percent defective such as the
American National Standards Institute (ANSI)/American Society for Quality Control (ASQC)
Z1.9-1993, ASampling Procedures and Tables for Inspection by Variables for Percent
Nonconforming.@

(DoD activities may obtain copies of ANSI/ASQC Z1.9-1993 from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094. The
private sector and other Government agencies may purchase copies from the American Society
for Quality Control, 611 East Wisconsin Avenue, Milwaukee, WI 53202-4606.)

Custodians: Preparing activity:

Army - AR Navy - OS
Navy - OS
Air Force - 10

AMSC N/A AREA QCIC

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
 NOTICE OF NOT MEASUREMENT
CANCELLATION SENSITIVE

MIL-STD-414
NOTICE 2
2 February 1999

MILITARY STANDARD

SAMPLING PROCEDURES AND TABLES

FOR INSPECTION BY VARIABLES
FOR PERCENT DEFECTIVE

MIL-STD-414, dated 11 June 1957, and Notice 1, dated 8 May 1968, are hereby
cancelled. Future acquisitions should refer to an acceptable non-Government standard on
sampling procedures and tables for inspection by variables for percent defective such as the
American National Standards Institute (ANSI)/American Society for Quality Control (ASQC)
Z1.9-1993, ASampling Procedures and Tables for Inspection by Variables for Percent
Nonconforming.@

(DoD activities may obtain copies of ANSI/ASQC Z1.9-1993 from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094. The
private sector and other Government agencies may purchase copies from the American Society
for Quality Control, 611 East Wisconsin Avenue, Milwaukee, WI 53202-4606.)

Custodians: Preparing activity:

Army - AR Navy - OS
Navy - OS
Air Force - 10

AMSC N/A AREA QCIC

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.