TLE 8

Electronics Product Assembly and Servicing

LEARNING ACTIVITY SHEET

ASSESSING QUALITY OF RECEIVED MATERIALS AND
COMPONENTS
Subject Area and Grade Level: T.L.E.
Activity Sheet No. 1. ASSESSING QUALITY OF RECEIVED MATERIALS AND
COMPONENTS
First Edition, 2020

Published in the Philippines

By the Department of Education
Region 8 – Division of Samar

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payment of royalties.

This Learning Activity Sheet is developed by DepEd Region 8 – Division of Samar.

ALL RIGHTS RESERVED. No part of this learning resource may be reproduced or

transmitted in any form or by any means electronic or mechanical, without written
permission from the DepEd Regional Office 8 – Division of Samar.

Development Team of T.L.E. Activity Sheet

Writer: Marvin C. Distrajo

Illustrator: _________________________

Layout Artists: _______________________

Reviewer: Francia A. Tan, EPS-TLE
Editor: _______________________________
Carmela R. Tamayo EdD., CESO V – Schools Division Superintendent
Moises D. Labian Jr. PhD., CESO VI – Asst. Schools Division
Superintendent
Antonio F. Caveiro PhD. - Chief Education Supervisor, CID
Josefina F. DacallosEdD. – PSDS/LRMS Manager Designate
Francia A. Tan, EPS-TLE
Remedios O. Carcellar,Ph.D. - District Head
Alvin A. Aguirre,PhD.- School Head

Republic of the Philippines

Department of Education
Region VIII
Schools Division of Samar
Sta. Rita II, District
TOMINAMOS INTEGRATED SCHOOL
Sta. Rita, Samar
 LEARNERS ACTIVITY SHEETS 1
T.L.E. 8
ASSESSING QUALITY OF RECEIVED MATERIALS AND COMPONENTS

Name of Learner: ____________________ Grade Level:_____

Section:______
School:________________________________ Date:____________

I. INTRODUCTION: This lesson consists of three (3) learning objectives.

Each learning objective contains cognitive information supported by self-
paced activities. Before you perform the instructions/procedure, read first
the given information with comprehension.
This lesson is prepared to help you achieve the required competency, in receiving
and relaying information. This will be the source of information that will enable you
to acquire the knowledge and skills in “Applying Quality Standards: Assessing
Quality of Received Materials or Components” independently at your own pace
or with minimum supervision or help from your teacher.

II. MELC : After going through this module, you are expected to Assess quality of
received materials or components (TLE_IAEPAS9-12AQS-Ia-1). Specifically, you
should be able to:
A. Obtain work instructions in accordance with standard operating
procedure;
B. Carry out work in accordance with standard operating procedures;
C. Check received materials or component parts against workplace
standards and specifications; and
D. Isolate faults and faulty materials.

III. STRATEGY:
A. EXPLORE
B. Activity 1: Name Me! Instructions: Name these electronic parts and
explain briefly each function? Write your answers on your EPAS activity
notebook.

1. ____________________ 2.___________________

3.___________________ 4. ___________________
 B. LEARN
This section deals on the actual assessment of received electronic component parts
and materials from the suppliers or manufacturers. It is important to check and test
first these electronic parts in order to achieved quality standard, before we utilized and
mount those electronic components on the electronic circuit board.
The procedures in assessing the quality of received components and materials are
described as follows:
1. Inspect the physical appearance of the electronic components receive
2. Prepare an inventory components and materials assessment sheet
3. Segregate the type of components and materials received
4. Record the data as to their corresponding specification and values.
5. Test all the components and materials received to ensure functionality
6. Segregate and isolate the good from the bad components
Components and Materials Assessment Sheet

PROPER HANDLING OF TEST PROBE IN ISOLATING FAULTY AND GOOD

ELECTRONIC COMPONENTS

1. Testing Resistor:
 GOOD RESISTOR:
The meter reading should be closed to the rated value of the resistor, depending on
the tolerance of the resistor.

black red
5%

Bad or Defective Resistor

OPEN RESISTOR:
The tester pointer does not deflect at all. The resistor is OPEN.

Black red

CHANGE VALUE RESISTOR:

The resistance reading has a big difference to the resistor rated value. The resistor
has change value.

black red
2. Testing Capacitor:
Good Capacitor
The tester pointer deflects and then move back to
its initial position.
pointer deflect
and return to
its initial
position does

Open Capacitor
The tester pointer does not deflect at all.
Needle
pointer
does not
deflect

Shorted Capacitor
The tester pointer rests on the 0 ohm scale, reverse and forward bias
test.

Needle
pointer
deflected to
zero ( 0 Ω )

Leaky Capacitor
The tester pointer deflects toward the right position but does not
return to its initial position or remains stationary.
Needle pointer
slightly deflect to
the right and did
return fully to its
3. Testing Diode:
Good Diode
The tester needle pointer deflect to low resistance on forward bias and does not
during reverse.

Open Diode
The tester pointer does not
deflect even the proved is
reversed.

Shorted Diode
The resistance reading deflects and measures the same in both directions.

Leaky Diode
The resistance reading slightly deflects and does not return to its initial position in
both forward and reverse bias.

( - )

Note: K – Cathode
A – Anode

4. Testing Transistor:
Open Transistor
The tester pointer does not deflect in the base to emitter or base to collector

Shorted Transistor
Two terminals of the transistor read the same resistance in both forward and
reverse direction.

Electrodes: B – Base
 C – Collector
E – Emitter

C.ENGAGE:
Activity A.
Instructions: Read each of the following statement. On your TLE EPAS
notebook, write TRUE if the statement is correct, and FALSE if the statement is
wrong.

1. In testing a good diode, the needle pointer will deflect during reverse bias.
2. If the needle pointer does not move or deflect, the resistor is OPEN.
3. The transistor is shorted, if the needle pointer does not deflect.
4. Capacitor is considered good if the needle pointer deflect and
return to its initial position.
5. If the resistor color coded value is closed to the actual reading of
the needle pointer is considered change value.
Activity B.
Instructions: Complete the statements by filling in the blanks the missing words.
Write your answer in your answer sheets.
1. Testing Resistor. If the tester needle pointer does not deflect at all the trouble is
_______________.
2. Testing Transistor._____________ when the tester pointer does not
deflect in the base to emitter or base to collector.
3. Testing Diode._______________ if the resistance reading deflects and measures
the same in both directions.
4. Testing Transistor. When two terminals of the transistor read the same
resistance in both direction the defect is ______________.
5. Testing Capacitor. _____________ if the tester pointer deflects and then return
back to its initial position
6. Testing Resistor. The resistance reading has a big difference to the resistor rated
color coded value the trouble is ______________.
7. Testing Diode. ______________The tester pointer does not deflect even the probe is
reversed.
8. Testing Transistor. If two terminals of the transistor read the same resistance in
both direction the defect is _____________.
9. Testing Capacitor. _________________The tester pointer rests on the 0 ohm scale,
both reverse and forward bias test.
10. Testing Diode. ______________ if the tester needle pointer deflects to low
resistance on forward bias and does not during reverse.

C. APPLY:
Finally, you are about to end this module. Let us check the things that you have
learned.
Instructions: Choose the correct answer. Write the letter of your chosen answers on
your TLE ANSWER SHEETS.
1. Testing Resistor. What is the fault if the tester needle pointer does not deflect?
A. open B. good C. shorted D. change value
2. Testing Capacitor. The tester pointer deflects and then return back to its initial
position.
A. open B. good C. leaky D. shorted
3. Testing Transistor. The tester pointer does not deflect in the base to emitter or
base to collector.
A. open B. good C. leaky D. shorted

4. Testing Diode. The tester pointer does not deflect even the probe is reversed.
A. open B. good C. leaky D. shorted
5. Testing Transistor. Two terminals of the transistor read the same resistance in
both forward and reverse direction.
A. open B. good C. leaky D. shorted
6. Testing Resistor. The resistance reading has a big difference to the resistor
rated color coded value.
A. open B. good C. leaky D. change value
7. Testing Transistor. The tester pointer does not deflect in the base to emitter or
base to collector.
A. open B. good C. leaky D. shorted
8. Testing Capacitor. The tester pointer rests on the 0 ohm scale, both reverse
and forward bias test.
A. open B. good C. leaky D. shorted
9. Testing Diode. The resistance reading deflects and measures the same in both
directions.
A. open B. good C. leaky D. shorted
10. Testing Capacitor. The tester pointer rests on the 0 ohm scale, both reverse
and forward bias test.
A. open B. good C. leaky D. shorted

IV. References:
Technology and Livelihood Education – Grade 7 Alternative Delivery Mode: Module 1:
Assessing Quality of Received Materials and Components First Edition, 2020

V. Anwers Key

EXPLORE 1. Resistor ENGAGE 1. FALSE

2. Capacitor 2. TRUE

3. Diode 3. FALSE

4. Transistor 4. TRUE

5. FALSE

APPLY

1. A 6. D

2. B 7. A

3. A 8. D

4. A 9. D

5. D 10. D
Prepared by:

MARVIN C. DISTRAJO
Teacher
Checked by:

LIEZEL I ANDILAB
MT-I