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2SC1359
Silicon NPN epitaxial planar type
5.1±0.2
■ Features
• Optimum for RF amplification of FM/AM radios
• High transition frequency fT
0.7±0.2
0.7±0.1
12.9±0.5
■ Absolute Maximum Ratings Ta = 25°C
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Parameter Symbol Rating Unit
0.45+0.15
–0.1 0.45+0.15
–0.1
tin nc
Collector-base voltage (Emitter open) VCBO 30 V
2.5+0.6 2.5+0.6
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–0.2 –0.2
d
typ
Collector-emitter voltage (Base open) VCEO 20 V
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1 2 3
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Emitter-base voltage (Collector open) VEBO 5 V
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1: Emitter
±0.2
tin
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Collector current IC 30 mA 2: Collector
3: Base
Collector power dissipation PC 400 mW
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TO-92-B1 Package
d t ife
Junction temperature Tj 150 °C
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tin uc
Storage temperature Tstg −55 to +150 °C
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Di ain
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VCB = 10 V, IE = 0 µA
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Reverse transfer capacitance Cre VCB = 10 V, IE = −1 mA, f = 10.7 MHz 0.9 1.5 pF
ma ain
(Common emitter)
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Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
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2. *: Rank classification
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Rank B C
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PC Ta IC VCE IC I B
500 12 15.0
Ta = 25°C VCE = 10 V
Ta = 25°C
IB = 100 µA
Collector power dissipation PC (mW)
10 12.5
400
200
4 40 µA 5.0
100 20 µA
2 2.5
0 0 0
0 40 80 120 160 0 4 8 12 16 0 20 40 60 80 100
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Ambient temperature Ta (°C) Collector-emitter voltage VCE (V) Base current IB (µA)
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IB VBE IC VBE VCE(sat) IC
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dt
120 60 100
IC / IB = 10
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VCE = 10 V
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VCE = 10 V
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Ta = 25°C
tin
CE(sat)
, d st
on na
100 50
ed cle
Collector current I (mA)
10
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Base current IB (mA)
25°C
d t ife
80 40
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C
tin uc
Ta = 75°C −25°C
isc saturation
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60 30 1
Ta = 75°C
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Collector-emitter
40 20 25°C
Di ain
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0.1
pla wi
−25°C
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20 10
typ s f
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0 0 0.01
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0 0.2 0.4 0.6 0.8 1.0 0 0.4 0.8 1.2 1.6 2.0 0.1 1 10 100
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Base-emitter voltage VBE (V) Base-emitter voltage VBE (V) Collector current IC (mA)
int ed
ma inu
e, ont
typ isc
hFE IC fT I E Zrb IE
ce /D
240
an ce
400 60
VCE = 10 V VCB = 10 V
en an
Ta = 25°C f = 2 MHz
VCB = 10 V
int ten
Ta = 25°C
Reverse transfer impedance Z (Ω)
200
Forward current transfer ratio hFE
50
ma ain
Transition frequency f (MHz)
6V
rb
300
M
160 Ta = 75°C 40
T
ed
25°C
lan
120 200 30
−25°C
(p
80 20
100
40 10
0 0 0
0.1 1 10 100 − 0.1 −1 −10 −100 − 0.1 −1 −10
Collector current IC (mA) Emitter current IE (mA) Emitter current IE (mA)
2 SJC00102BED
2SC1359
Cre VCE GP IE NF IE
3.0 24 12
f = 10.7 MHz f = 100 MHz VCB = 6 V
Ta = 25°C VCB = 10 V f = 100 MHz
Ta = 25°C
Cre (pF)
2.5 20 10 Rg = 50 Ω
Ta = 25°C
2.0 16 8
IC = 3 mA
1 mA
(Common emitter)
1.5 12 6
1.0 8 4
0.5 4 2
0 0 0
0.1 1 10 100 − 0.1 −1 −10 −100 − 0.1 −1 −10
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Collector-emitter voltage VCE (V) Emitter current IE (mA) Emitter current IE (mA)
tin nc
e)
bie gie bre gre bfe gfe
d
typ
24 0 0
d
f = 10.7 MHz f = 10.7 MHz
on e.
yre = gre + jbre
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yie = gie + jbie − 0.1 mA 10.7
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58
VCE = 10 V VCE = 10 V −1 mA 100
tin
istransferr Psusceptance b (mS)
Reverse transfer susceptance b (mS)
, d st
on na
20 − 0.1 −20
ed cle
−7 mA 58
−4 mA
Input susceptance bie (mS)
fe
re
yp cy
100 IE = −1 mA −2 mA 100
d t ife
16 −2 mA 58 − 0.2 −40
ue t l
tin uc
IE = −1 mA
IE = −4 mA
sc te
12 − 0.3
on rod 58 −60
100 58
d d fou
8 − 0.4 −80
100
Di ain
ne ng
Forward c
pla wi
f = 10.7 MHz
e, ollo
4 − 0.5 −100
yfe = gfe + jbfe
typ s f
VCE = 10 V
ce de
0 − 0.6 −120
an clu
Input conductance gie (mS) Reverse transfer conductance gre (mS) Forward transfer conductance gfe (mS)
int ed
ma inu
e, ont
typ isc
boe goe
ce /D
an ce
1.2
yoe = goe + jboe
en an
VCE = 10 V
int ten
1.0
ma ain
Output susceptance boe (mS)
0.8 IE = −1 mA
100
ed
lan
0.6
(p
58
0.4
0.2
f = 10.7 MHz
0
0 0.1 0.2 0.3 0.4 0.5
Output conductance goe (mS)
SJC00102BED 3
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semiconductors described in this book
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Standards in advance to make sure that the latest specifications satisfy your requirements.
(5) When designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating conditions
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(operating power supply voltage and operating environment etc.). Especially, please be careful not to exceed the range of absolute
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maximum rating on the transient state, such as power-on, power-off and mode-switching. Otherwise, we will not be liable for any
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defect which may arise later in your equipment.
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Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure
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mode, possible to occur to semiconductor products. Measures on the systems such as redundant design, arresting the spread of fire
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or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products.
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(6) Comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors (ESD, EOS,
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thermal stress and mechanical stress) at the time of handling, mounting or at customer's process. When using products for which
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tin uc
damp-proof packing is required, satisfy the conditions, such as shelf life and the elapsed time since first opening the packages.
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(7) This book may be not reprinted or reproduced whether wholly or partially, without the prior written permission of Matsushita
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