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Carrier Action: I
Pierret, Semiconductor Device Fundamentals (SDF)
pp. 75-89
7
Out of 75 points:
6
5 N: 22
4 Mean: 88.7% (66.5/75)
C ount
3 SD: 7.9%
2 Min: 68%
1 Max: 100%
0
40 45 50 55 60 65 70 75 80 85 90 95 100
Median: 90.6% (68/75)
E X A M
1
P erc en t
%
( ) 2 (0.16 × 10 )
3/ 2
*
2 m n −19
3/ 2
HW 2 problem 5a): Ne =
π !
2 3
3
Ne =
(
1.414 × 1.11× 10−45 ) × 0.667 × ( 2.02 × 10 )
−30
( )
3
−34
9.87 × 1.055 × 10
Exam 2 info:
Intrinsic ni = N C NV e− EG /2 kBT
Extrinsic
n0 = N D+ = N D
Freeze out p0 = ni2 n0
5
Fig. 2.22 from R.F. Pierret, Semiconductor Device Fundamentals
key equations in equilibrium
( ) ⎤⎥ n0 p0 = ni2
3/2
⎡ mkT *
NC = 2 ⎢
n B
⎢⎣ 2π ! 2
⎥⎦ 1
f0 ( E ) =
ni = N C NV e− EG /2 kB T 1+ e( E−EF ) kBT
( ) ⎤⎥
3/2
⎡ m kT *
p B
NV = 2 ⎢
⎢⎣ 2π ! 2
⎥⎦ ni = 1.00 × 1010 cm -3
6
Carrier concentration from doping
(N-type) (P-type)
ni2 ni2
− n + ND − NA = 0 p− + ND − NA = 0
n p
1/2
N A − N D ⎡⎛ N A − N D ⎞ ⎤
1/2 2
N D − N A ⎡⎛ N D − N A ⎞ ⎤
2
n= + ⎢⎜ ⎟ + ni ⎥
2 p= + ⎢⎜ ⎟ + ni ⎥
2
2 ⎢⎣⎝ 2 ⎠ ⎥⎦ 2 ⎢⎣⎝ 2 ⎠ ⎥⎦
ni2 ni2
p= n=
n p
2. Mobility
3. Conductivity
“ideal” contacts 3
cross-sectional KE = k BT
2
area, A
L 1 * 2
KE = mn υ
2
3k BT
υ 2 = υ rms =
uniform n-type mn*
semiconductor
10
Lundstrom ECE 305 S16
current flow
“ideal” contacts
1) random walk with a small
bias from left to right
cross-sectional
area, A
L
I
uniform n-type
semiconductor 2) assume that electrons
“drift” to the right at an
average velocity, υd
−V +
3) what is I ?
“ideal” contacts I = − Q tt
cross-sectional
area, A Q = −qnAL
L
tt = L υ dn
I = nqυ d A
I
n-type semiconductor
υ dnx = − µ nE x
J nx = −nqυ dnx A/cm 2
υ dn = − µ nE υ dn “high-field transport”
⎛ qτ ⎞
µn = ⎜ * ⎟ cm 2 V-s
⎝ mn ⎠
υ dn = µ n E
υ dp = + µ pE
E
⎛ qτ ⎞
µ p = ⎜ * ⎟ cm 2 V-s “low-field” or “near-equilibrium”
⎝ mp ⎠ or “linear” transport
Lundstrom ECE 305 S16 13
velocity vs. field
υ dnx = − µ nE x
υ dpx = + µ pE x
J nx = nq µnE x A/cm 2
⎛ qτ ⎞
µ = ⎜ * ⎟ cm 2 V-s
⎝m ⎠
decreasing mobility
µn suggests the
presence of lattice
scattering.
increasing mobility
suggests the
presence of charged µ n ∝ T 3/ 2
impurity scattering µ n ∝ T −3/ 2
⎛ qτ ⎞
µ = ⎜ * ⎟ cm 2 V-s
⎝m ⎠
17 Lundstrom ECE 305 S16
T
re-cap
J n = −nqυ dn A/cm 2 υ dn = − µ nE dV
E =− V/cm
dx
J p = + pqυ dp A/cm 2 υ dp = + µ pE V
E =− V/cm
L
L
I
n-type semiconductor
υ dnx = − µ nE x
−V +
18 x
outline
( )
J x = J nx + J px = σ n + σ p E x = σE x A/cm 2
1
J x = σE x A/cm 2 Ex= J x = ρ J x V/cm
σ
1 1 1
ρ= = = Ω-cm
σ σ n + σ p nqµn + pqµ p
20
resistivity vs. doping density
1
ρ= Ω-cm
nqµ n + pqµ p
L
J n = σ nE A/cm 2
I I = − AJ n = σ n AE Amps
n-type semiconductor
υ d = − µ nE x
V
I = σnA
L
−V +
⎛ A⎞ 1
I = ⎜ σ n ⎟ V = GV = V
⎝ L⎠ R
L
R = ρn
A