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v = µn E µn = movility of electrons
E = electric field
Vd − V s Vds < 100 mV
E=
L
C g ⋅ (V g − Vt )
= µ n 2 ⋅ (V g − Vt )⋅ (Vd − Vs )
Cg
ID =
L L
µn E
⋅ (Vg − Vt )⋅ (Vd − Vs )
W
I D = µ n Cox
L
EAMTA 2012 04-12/08/12 toledo@uccor.edu.ar 4
Modelo para analizar circuitos con
transistores MOS
⋅ (Vg − Vt )⋅ (Vd − Vs )
W
I D = µ n Cox
L
gate
source drain
n+ n+
y dy
Q = C ox ⋅ W ⋅ dy ⋅ (V g − Vt )
dy I D ⋅ d y = µ n ⋅ C ox ⋅ W ⋅ (V g − Vt )⋅ dv
τ=
dv
µn
∫ (V − Vt )⋅ dv
dy W VD
I D = µ n ⋅ C ox ⋅ g
L Vs
(VD = VS = 0)
1
Vt = VFB − ⋅ 2 ⋅ q ⋅ ε si ⋅ N ⋅ 2 ⋅ φ B − 2 ⋅ φ B
C ox
VFB = Flat band voltage q = charge on an electron
ε si = dielectric constant of the silicon substrate
N = concentration density of the substrate
N
φ B = VT ln B
ni
(VD ≠ VS )
1
Vt = VFB − ⋅ 2 ⋅ q ⋅ ε si ⋅ N ⋅ 2 ⋅ φB + V − 2 ⋅ φB + V [2]
Cox
integrating
⎧⎪⎡ VD ⎤ 2 2qε si N ⎫
I D = µ n C ox
W
(V − V )V − − ⎡(V + 2 φ )
3
− (2 φ B )3
⎤⎪
⎨⎢ G 2 2
⎥⎦ ⎬⎪
2 ⎥⎦ 3 C ox ⎢⎣ D
T0 D B
L ⎪⎩⎣ ⎭
EAMTA 2012 04-12/08/12 toledo@uccor.edu.ar 6
Modelo para analizar circuitos con
transistores MOS
∫ (V − Vt )⋅ dv
W VD
I D = µ n ⋅ C ox ⋅ g [1]
L Vs
VG
VT
VT0
V
VS VD
Representación gráfica de la corriente en un transistor MOS.
VG
VT
VT0
VS VD V1
V
V1
VT0+λV
VG
VT0
V1 V2 V3 V4 V
VT0+λV
0 V
VG
VT0
V VDD
VG
VT0
V V1 VDD
VT0+λV
0 V
VT0
VT0
VG
V1 V VDD
VG
VT0
VT0
V1 V VDD