Lecture 27

The target thickness for silicon wafers used in a certain type of

integrated circuit is 245 mm. A sample of 50 wafers is obtained and
the thickness of each one is determined, resulting in a sample mean
thickness of 246.18 mm and a sample standard deviation of 3.60 mm.
Does this data suggest that true average wafer thickness is
something other than the target value?

Also Find 95% Confidance Inter for Population Mean

Step 1: Formulation of Hypothesis

Ho: µ = 245

H1: µ ≠ 245

Step 2: Level of Significance:

α = 5% =0.05

Step 3: Test Statistic to be Used

n = 50, X =246.18, S = 3.6

σ unknown & n >30

X−µ
Zcal = S
√n
Step 4: Computation
246.18−245
Zcal = 3.6 = 2.318
√50
Step 5: Critical region

If zcal < z α2 or zcal > z 1−α

2
we will reject Ho. (Two Tailed Test)

If zcal < z 0.05

2
or zcal > z 1−0.05
2
we will reject Ho.
If zcal < z 0.02 5 or zcal > z 0.97 5 we will reject Ho.

If zcal < −1.96 or zcal > 1.96 we will reject Ho.

Step 6: Conclusion

Zcal = 2.318 fall into the critical region. So we do not accept H o. We concluded that
µ ≠ 245.

Also Find 95% Confidance Inter for Population Mean (for Z-test when
σ unknown & n >30)

S S
-
X zα
2 √n <µ<X +z α
2 √n
3.6 3.6
246.18-1.96 √50 <µ<246.18+1.96 √50
246.18-26.45 <µ<246.18+26.45
219.73 < µ<272.63
Confidance Inter for Population Mean (for Z-test when σ known)

σ σ
X zα- 2 √n <µ<X +z α
2 √n

Confidance Inter for Population Mean (for-Test, when σ unknown & n

<30)
s s
-
X t α (n−1)
2 √n <µ< X +t α
1− (n−1 )
2 √n