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    This document discusses characterization techniques for biomaterials covered in Module 6 of the MSE 204 Introduction to Biomaterials course. It covers Scanning Tunneling Microscopy and Atomic Force Microscopy, both taught by instructor Vivek Verma. Scanning Tunneling Microscopy uses a probe to scan surfaces at the atomic level. Atomic Force Microscopy scans a sharp probe across a surface and monitors tip interactions to generate 3D images of the surface's topography at the nanoscale.

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    This document discusses characterization techniques for biomaterials covered in Module 6 of the MSE 204 Introduction to Biomaterials course. It covers Scanning Tunneling Microscopy and Atomic Force Microscopy, both taught by instructor Vivek Verma. Scanning Tunneling Microscopy uses a probe to scan surfaces at the atomic level. Atomic Force Microscopy scans a sharp probe across a surface and monitors tip interactions to generate 3D images of the surface's topography at the nanoscale.

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    © All Rights Reserved
    Download as PPTX, PDF, TXT or read online from Scribd
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    6 views5 pages

    Module 06 Characterization Techniques

    Uploaded by

    The BS Channel
    This document discusses characterization techniques for biomaterials covered in Module 6 of the MSE 204 Introduction to Biomaterials course. It covers Scanning Tunneling Microscopy and Atomic Force Microscopy, both taught by instructor Vivek Verma. Scanning Tunneling Microscopy uses a probe to scan surfaces at the atomic level. Atomic Force Microscopy scans a sharp probe across a surface and monitors tip interactions to generate 3D images of the surface's topography at the nanoscale.

    Copyright:

    © All Rights Reserved
    Download as PPTX, PDF, TXT or read online from Scribd
    Flag for inappropriate content
    of 5

    MSE 204

    Introduction to Biomaterials

    Module 6
    Characterization Techniques

    Instructor: Vivek Verma


    Scanning Tunnelling Microscopy

    Instructor: Vivek Verma


    Scanning Tunnelling Microscopy

    Instructor: Vivek Verma


    Atomic Force Microscopy

    Instructor: Vivek Verma


    Atomic Force Microscopy

    • A sharp probe is scanned across a surface (left)


    • Interaction of the probe tip with the force fields of the
    surface
    • By monitoring the motion of the probe from each pass
    across the surface, a 2-D line profile is generated
    • Then the line profiles are combined to create a 3-D image
    of the surface (right)
    Instructor: Vivek Verma

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