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1MRG005019
Exercise 9 - Autorecloser and 1/3 phase operations
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In all the previous exercise, any simulation for single-phase faults inside the protected line resulted in a three-
phase operation by REL670. REL670-A32 is engineered to perform single-phase operation for single phase
faults within the protected line.
This has happened because the autorecloser function has always been switched off, and in this case a three-
phase trip command is issued by REL670.
In this section we will study the autorecloser function and it’s interaction with distance protection / trip function
in order to achieve a single phase trip.
Managing single phase operation for single phase faults within the protected line
Distance protection settings, and communication schemes, are the same as for the previous exercise.
1. Autorecloser settings
Autorecloser will be set On:
Operation = On
The dead time for the first attempt will be set for:
single phase trip: 1,5 s t1 1Ph = 1,5 s
three-phase trip: 0,4 s t1 3Ph = 0,4 s
Injection tests
We need to connect the single phase trip signals to the relay test set.
Single phase trip signals are available at BO2, BO3 and BO4 of the ION card. Connect:
IOM OUTPUT 2 (Trip phase L1, “TRIP_L1”) Binary Input 2 of the test set
IOM OUTPUT 3 (Trip phase L2, “TRIP_L2”) Binary Input 3 of the test set
IOM OUTPUT 4 (Trip phase L1, “TRIP_L3”) Binary Input 4 of the test set
We need to connect the closing command from REL670 to the relay test set. This signal is available at binary
output 9 of the IOM card. Connect:
IOM OUTPUT 9 (CB Close Command, “CLOSE_CB”) Binary Input 9 of the test set
The other connections between the relay test set and REL670 may be left as they are, but they will not be used.
The test file is called REL670 LE Faults AR.adt and is available in the folder Files for SEP-602A REL670 /
OMICRON TESTS on the desktop of your training PC.
The file simulates single-phase fault injections at two different line positions:
The first fault injection is in zone 1 (fault at 10% of the line) and the second fault injection is in zone 2 (90% of
the line).
Figure 2: Running the first L1-E fault, zone 1 trip at 10% of the line
Verify that the REL670 operated single phase (ad in the correct phase) and verify as well that autorecloser
issued the CB CLOSE command after 1,5 seconds from the trip.
Figure 3: Results from the first L1-E fault, 10% of line: correct L1 trip and AR CLOSE after 1,5 s
Verify the same correct behavior for L2-E and L3-E faults, at 10% of the line and fill the Table 1
You need to energize the carrier receive binary input in order to get instantaneous trip from REL670, as time
delayed zone 2 does not start the autorecloser.
The carrier receive signal is available at the binary input 2 of the IOM card.
You still need to give the correct conditions to autorecloser (CB CLOSED and CB READY).
Select the fault nr. 2 in the test file and run it, as you did in the previous steps.
This time it is the communication scheme that has operated. Notice the single phase trip by the communication
scheme.
6. Verify the behavior of CB READY and CB CLOSED signals on A/R and trip command
Inject one single phase fault at 10% of the line, without giving CB READY and CB CLOSED information to
autorecloser.
Table 3: LE faults at 10% of the line. Effect of CB READY and CB CLOSED signals
L1-E Fault at 10% of the line Zone 1, 3-phase trip. No A/R. The
starting signal is not considered because
CB CLOSED = 1 (Input nr. 4) the CB is not ready to close
CB READY = 0 (Input nr. 5)
7. Open the Omicron file for testing 3-phase trip with autorecloser
The test file is called REL670 Autorcloser.seq and is available in the folder Files for SEP-602A REL670 /
OMICRON TESTS on the desktop of your training PC.
The sequence just contains the simulation for a three-phase fault in zone 1, which will trip three-phase and will
start
autorecloser,
according to
the
engineering of
REL670-A32.
Did you get the close command from autorecloser after 400 ms (t1 3Ph setting in A/R) from the zone 1
operation?
The autorecloser expects correct synchrocheck conditions in order to reclose from a three-phase open command.
Synchrocheck is at the moment switched off, hence the synchrocheck condition is always false.
Operation = On
AutoEnerg = DLLB
10. Set the correct VT ratio to the VTs that are feeding the busbar voltages to the synchrocheck
11. Connect the busbar voltage simulation from test set to REL670
Voltage amplifier Nr. 4 of the test set will be used to simulate the busbar voltage in L2 (phase-earth).
Connect it to Analog Input 11 of REL670 (Busbar 1 Voltage, L2).
13. Simulate the busbar voltage in the sequence with the three-phase fault
Remember to be realistic, and in step 2 the busbar voltage drops as the line voltage (this will not affect the test
results, but the more realistic one simulation is, the less is the probability of investigating in false problems!)
We will simulate one L1E fault in zone1, which will cause zone 1 to trip and to start A/R.
After 1,5 s will A/R issue the close command and we will simulate the same fault again (permanent fault). Zone
1 (and switch onto fault) will operate again with a three-pole opening and A/R will issue the unsuccessful
reclose information.
15. Open the Omicron file for testing L1-E permanent fault
The test file is called REL670 LE Permanent Fault AR.seq and is available in the folder Files for SEP-602A
REL670 / OMICRON TESTS on the desktop of your training PC.
Set NoOfShots = 2
And set the dead time for the second attempt to 2
seconds: t2 3Ph = 2 s
18. Open the Omicron file for testing L1-E permanent fault – 2 shots
The test file is called REL670 LE Permanent Fault AR 2shots.seq and is available in the folder Files for SEP-
602A REL670 / OMICRON TESTS on the desktop of your training PC.
Have a look at the sequence, and notice that the trip on the first reclose (3-phase) has been simulated with all the
three line voltages down (step 7 in the sequence), requesting the synchrocheck to use the DLLB algorithm.
The sequence stops at the second close command, hence we are in practice simulating a successful reclose at the
second attempt.