Professional Documents
Culture Documents
CEI02N6/CEF02N6
N-Channel Enhancement Mode Field Effect Transistor
FEATURES
Type VDSS RDS(ON) ID @VGS
CEP02N6 600V 5Ω 2A 10V
CEB02N6 600V 5Ω 2A 10V
CEI02N6 600V 5Ω 2A 10V
CEF02N6 600V 5Ω 2A e 10V
D
Super high dense cell design for extremely low RDS(ON).
High power and current handing capability.
Lead free product is acquired.
TO-220 & TO-263 & TO-262 package & TO-220F full-pak for through hole.
D G
G G G
G D D D
S S S S
S
CEB SERIES CEI SERIES CEP SERIES CEF SERIES
TO-263(DD-PAK) TO-262(I2-PAK) TO-220 TO-220F
Thermal Characteristics
Parameter Symbol Limit Units
Thermal Resistance, Junction-to-Case RθJC 2.1 4.3 C/W
Thermal Resistance, Junction-to-Ambient RθJA 62.5 65 C/W
2002.September http://www.cetsemi.com
4-2
CEP02N6/CEB02N6
CEI02N6/CEF02N6
Electrical Characteristics Tc = 25 C unless otherwise noted
4-3
CEP02N6/CEB02N6
CEI02N6/CEF02N6
3.0
VGS=10,9,8,7V
2.5
ID, Drain Current (A)
1.0
VGS=5V -55 C
0.5 1.VDS=40V
25 C 2.Pulse Test
-1
0 10
0 2 4 6 8 10 12 2 4 6 8 10
600 2.2
ID=1A
RDS(ON), On-Resistance(Ohms)
VGS=10V
500 1.9
C, Capacitance (pF)
RDS(ON), Normalized
400 1.6
Ciss
300 1.3
200 1.0
Coss
100 0.7
Crss
0 0.4
0 5 10 15 20 25 -100 -50 0 50 100 150 200
1 VGS=0V
10
IS, Source-drain current (A)
1.2 ID=250µA
VTH, Normalized
1.1
1.0
0
0.9 10
0.8
0.7
-1
0.6 10
-50 -25 0 25 50 75 100 125 150 0.4 0.6 0.8 1.0 1.2
4-4
CEP02N6/CEB02N6
CEI02N6/CEF02N6
1
15 10
VGS, Gate to Source Voltage (V)
VDS=480V
12
ID=2A
10µs 4
RDS(ON)Limit
6
-1
10
3
TC=25 C
TJ=150 C
Single Pulse
0 -2
10 0 1 2 3
0 6 12 18 24 10 10 10 10
VDD
t on toff
RL td(on) tr td(off) tf
V IN 90%
90%
D VOUT
VGS VOUT 10% INVERTED 10%
RGEN G
90%
50% 50%
S VIN
10%
PULSE WIDTH
0
10
r(t),Normalized Effective
D=0.5
0.2
0.1
-1 PDM
10
0.05
t1
t2
0.02
1. RθJC (t)=r (t) * RθJC
0.01 2. RθJC=See Datasheet
3. TJM-TC = P* RθJC (t)
-2 Single Pulse
10 4. Duty Cycle, D=t1/t2
-5 -4 -3 -2 -1 0 1
10 10 10 10 10 10 10
4-5