Pinhole Cameras – Operation and Analysis

US Particle Accelerator School

January 14-18, 2008

- Use x-rays to minimize diffraction effects

- Reflective/refractive optics not available

- Simple components
 Camera Obscura

d
M 2
d
1
d1 d2
object
pinhole
image
X-ray Pinhole Camera - Schematic

SPEAR circa 1975

DIAMOND circa 2005

SPEAR3 Pinhole, Filters, YaG Screen and Camera
 What does the Pinhole Camera See?

1. Horizontal Plane

Electron beam distribution

1 ( o x22o xx'o x'2)/ 2o
 ( x, x')  e
2o

Photon beam distribution

1 ( x22xx' x'2)/ 2
 ( x, x')  e (new Twiss, new ellipse)
2

Searchlight sweeping across pinhole integrates over x’

1  x2 / 2
 ( x)  e (simple result)
2

where   o o  (o )2 fit to Gaussian, compute o

 BESSY-II Pinhole Array
(Peatmann and Holldack)

Finite beam divergence

Constant Image Intensity

 SPEAR3 Example – three different operational modes

Measurement Theory

intensity [au]
intensity [au]

x-position [mm] x-position [mm]

 What does the Pinhole Camera See?

2. Vertical Plane
- Sweeping searchlight no longer integrates over angles
y
- Pinhole projected onto source casts a ‘shadow’ in phase space: y' 
d
1

 2 
y2
   
 1    
 2  
 y  2yy'  y'2  / 2 
  2   d  
  1  
angle [mrad]

 
 eff  1
F
 y2 / 2( )eff
 yi   Ae i at the screen
(neglecting diffraction)

position [mm]
 What size pinhole?

s
d1 d2

If the pinhole is large, ray-optic ‘spread’ dominates

w (d  d )
s 1 2
d
1

If the pinhole is small, diffraction dominates...

 Evaluating the Source Size

2
 s source 
s image 
2
    s blur   s diffraction 
2 2

 demag 

w L1  L2  L1 Source – pinhole 2.34 m

s blur  ~ 40 mm
L2 Pinhole - screen 1.2 m
Demagnification 1.95:1

2 L1 W pinhole size 63 mm

12  L2
s diffraction 
4 w
 Diffraction Effects – monochromatic beam

sin( xi )
 eikr
r r  eiks xi
s
s


point source xo , yo 
(spherical waves) aperture x, y 
(Huygen’s wavelets) screen  xi , yi 
 
(field superposition)

F ( xi | xo , yi | yo )  B  eik (r s)dxdy
rs aperture
 Point Source Diffraction (cont’d)

F ik(r s)dxdy field integral over pinhole aperture

 e
aperture

 U xV y retangular aperture - surface integral is separable

I x  intensity U *xU x

I y V *yV y

expand ‘r’ and ‘s’ to 2nd order - the field integrals look like

 2 ( x  x)2 
 ( xo  x) 
Ux   exp ik  i dx
xaperture 

2d
1
2d
2 
 Distributed Source Field Pattern

I ( x | xo)  intensity U *U is for a point source

i

Integrate again over the source distribution

I ( x )    ( xo ) I ( x | xo )dxo
i i

x2 / 2s x2
where  ~e (Gaussian distribution)

Jack reduced the double integral to a single integral

emittance image
1e  Az 2
I ( x)   sin Bz(1 z)  cos Cxz  dz
0 z
A, B and C are physical system parameters
 ‘Polychromatic’ Diffraction

Sands-121
spectrum at screen
dN/dE: Photons/sec/keV

C. Limborg - SSRL

 Integrate intensity pattern over photon spectrum

 Putting it all together...

fresnel.m valid from geometric to diffraction regimes

Ay=5 micron Ay=40 micron Ay=250 micron

(diffraction) (optimum) (geometric)

143mm 78mm 250mm

J. Bergstrom - CLS
 Application to measurement

SPEAR3: M=0.6, w=30mm, 8keV

magnification, wave optics, chromatics

spot size on screen

hardening of the spectrum

0.1% coupling

electron beam source size

 Summary

- Pinhole cameras effective in the x-ray regime

- System construction fairly straight-forward

- Power loading considerations

- Optimize aperture size

- Data analysis relies on comparison of model with measurement

fresnel.m

- Effective for measuring small spot sizes