Professional Documents
Culture Documents
% of Rework Due to Mean: Each Phase (After V&V) Mean: Metric Report
V&V SD: SD: Path
V&V_Code Review Mean: After V&V Implement ion Mean: Metric Report
Defect Density SD: Phase SD: Path
V&V_System Testing Mean: After V&V Testing Phase Mean: Metric Report
Defect Density SD: SD: Path
Milestones:
Page 1 of 5
Status Report for MAVBB_COM MF-SRM-230-v1.3
Page 2 of 5
Status Report for MAVBB_COM MF-SRM-230-v1.3
Tentative
floor
planning
completed.
PCB stack up
support
discussed
with
Micropack.
Review in
progress.
Page 3 of 5
Status Report for MAVBB_COM MF-SRM-230-v1.3
Discussed
with Altair
on PollEx
and Electrflo
tools.
5 PCIe RC – EP 08 Oct 21 10 Nov 08 Oct TI processor
test setup 21 21 AM5728
identification based
Beagleboard
procurement
in process.
Interface
adapter
design is in
progress.
6 MPC Carrier 28 Oct 21 05 Nov Will be taken
Board design 21 up in this
week.
Open issues/ Areas of concern DDR4 interface and HS Serial I/O PCB design
Page 4 of 5
Status Report for MAVBB_COM MF-SRM-230-v1.3
Design Team:
1. Agile_Sprint Productivity = Actual Sprint Efforts/Story Points
2. %Task Completion = Actual finished tasks in a Month*100 / No.of tasks planned to be finished in a
month
3. % of Rework Due to V&V = (A+B)*100/(A+B+C)
A: V&V Closures Efforts by Design team
B: Closures Verification Efforts by V&V team
C: Design team Actual Efforts upto Internal Testing Phase
4. V&V_Code Review Defect Density=(No. of defects found in V&V Code Review)/(Modified
ELOC/1000)
5. V&V_System Testing Defect Density=(No. of defects found in V&V System Testing)/(Modified
ELOC/1000)
V&V: V&V QPM Monitoring data will be presented along with department specific V&V status report
Mean: Average
SD: Standard Deviation
◄►
Page 5 of 5