HOW TO VIEW NANOMATERIALS

 VIEWING NANOMATERIALS REQUIRES SPECIALIZED INSTRUMENTS AND

TECHNIQUES DUE TO THEIR EXTREMELY SMALL SIZE

EXPLANATION: NANO SIZE PARTICLES EXIST IN NATURE AND CAN BE CREATED

FROM A VARIETY OF PRODUCT SUCH A CARBON OR MINERALS LIKE SILVER BUT
NANOMATERIALS BY DEFINITION MUST HAVE AT LEAST ONE DIMENSION THAT IS
LAST THAN APPROXEMETLY ONE HUNDRED NANO METERS SO MOST
NANOSCALE MATERIALS ARE TOO SMALL TO BE SEEN WITH THE NIKED EYAND
EVEN WITH CONVENTIONAL LOG

*MICROSCOPES

EXPLANATION: MICROSCOPES SCIENTIST USED SPECIAL TYPES OF MICROSCOPE

TO VIEW MANY NANOMATERIALS.

DURING THE EARLY 1930s SCIENTIST USE ELECTRON MICROSCOPE AND FIELD
MICROSCOPES TO LOOK AT THE NANOSCALE

1. SCANNING ELECTRON MICROSCOPE (SEM) EXPLANATION: SEM IS ONE OF

THE SPECIAL TYPE OF MICROSCOPE THAT HAVEN BEEN USE BY
SCIENTISTS.

● German engineers Ema Ruska and Max

Knoll built the first electron microscope
During the 1930s.

● utilize a particle beam of electron to

Light up specimen and develop a well-
Magnified image.

EXPLANATION: ELECTRON MICROSCOPES PRODUCE HIGHER AND BETTER

RESOLUTION THAN OLDER LIVE MICROSCOPE BECAUSE THEY CAN MAGNIFY
OBJECTS TO A MILLION TIMES WELL CONDITIONAL LIGHTS MICROSCOPE CAN
MAGNIFY OBJECTS UP TO 1,500 TIMES ONLY.

• 2 GENERAL TYPES OF AN ELECTRON MICROSCOPES

1.SCANNING ELECTRON MICROSCOPES (SEM)
2.TRANSMISSION ELECTRON MICROSCOPES (TEM)

2. ATOMIC FORCE MICROSCOPE (AFM)

● it was first developed by Gerd Binig,

Calvin Quate, and Christoph Gerber in
1986.

● make use of a mechanical probe that

Gathers information from the surface of a
Material..

EXPLANATION: Atomic-force microscopy (AFM) is a powerful technique that can image

almost any type of surface, including polymers, ceramics, composites, glass, and biological
samples. AFM is used to measure and localize many forces, including adhesion strength,
magnetic forces, and mechanical properties.

3. SCANNING TUNNELING MICROSCOPE

● enable scientists to view and manipulate

Nanoscale particles, atoms and small molecules. ● In 1986, Gerd Binig and Hienrich Rohrer
won the
Nobel Prize in Physics because of this invention.

EXPLANATION: -AN IMAGING TECHNIQUE USED TO OBTAIN ULTRA HIGH

RESOLUTION IMAGES AT THE ATOMIC SCALE WITHOUT USING LIGHT OR
ELECTRON BEAMS.
-IT WORKS BY SCANNING A VERY SHARP METAL WIRE TIP OVER THE SURFACE BY
BRINGING THE TIP VERY CLOSE TO THE SURFACE AND BY APPLYING AN
ELECTRICAL VOLTAGE TO THE TIP OR SAMPLE WE CAN IMAGE THE SURFACE AT
AN EXTREMELY SMALL SCALE DOWN TO RESOLVING INDIVIDUAL ATOMS.
- THE SCANNING TUNNELING MICROSCOPE AND THE ATOMIC FORCE
MICROSCOPE ARE JUST AMONG THE MODERN AND REMARKABLE
ADVANCEMENT IN MICROSCOPING