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CMOS Combinational Circuit

Design

Prof. Jagannadha Naidu K


Ratioed Logic
VDD VDD VDD

Resistive Depletion PMOS


Load RL Load VT < 0 Load
VSS
F F F
In1 In1 In1
In2 PDN In2 PDN In2 PDN
In3 In3 In3

VSS VSS VSS


(a) resistive load (b) depletion load NMOS (c) pseudo-NMOS

Goal: to reduce the number of devices over complementary CMOS


Ratioed Logic
VDD

• N transistors + Load
Resistive
Load • VOH = V DD
RL

• VOL = RPN
F RPN + RL

In1 • Assymetrical response


In2 PDN
In3 • Static power consumption

• tpL= 0.69 RLCL


VSS
Active Loads
VDD VDD

Depletion PMOS
Load VT < 0 Load
VSS
F F
In1 In1
In2 PDN In2 PDN
In3 In3

VSS VSS

depletion load NMOS pseudo-NMOS


Pseudo-NMOS VTC
3.0

2.5

2.0 W/L p = 4

1.5
Vout [V]

W/L p = 2
1.0

W/L p = 0.5 W/L p = 1


0.5

W/L p = 0.25
0.0
0.0 0.5 1.0 1.5 2.0 2.5
V in [V]
Differential Cascode Voltage Switch Logic (DCVSL)
V DD V DD

M1 M2

Out Out

A
A
PDN1 PDN2
B
B

VSS VSS
CVSL Inverter
VDD

M1 M3

Z Z

A M2 Ā
M4
  ´
𝑍 = 𝐴 + BC
VDD

Z  A  BC Z  A  BC

A
B
Ā

C B C
XOR with Two Inputs

VDD

A  B( XOR)
A  B( XNOR)

A Ā Ā A

B B
NOR-OR Gate / NAND –AND Gate
Dynamic Logic
 In static circuits at every point in time (except when
switching) the output is connected to either GND or V DD
via a low resistance path.
 fan-in of n requires 2n (n N-type + n P-type) devices

 Dynamic circuits rely on the temporary storage of signal


values on the capacitance of high impedance nodes.
 requires on n + 2 (n+1 N-type + 1 P-type) transistors
Dynamic Gate

Clk Mp Clk Mp
Out Out
In1 CL
A
In2 PDN
C
In3
B
Clk Me
Clk Me

Two phase operation


Precharge (CLK = 0)
Evaluate (CLK = 1)
Dynamic Gate

off
Clk Mp Clk Mp on
1
Out Out
In1 CL ((AB)+C)
A
In2 PDN
C
In3
B
Clk Me
off
Clk Me on

Two phase operation


Precharge (Clk = 0)
Evaluate (Clk = 1)
Conditions on Output
 Once the output of a dynamic gate is discharged, it
cannot be charged again until the next precharge
operation.

 Inputs to the gate can make at most one transition


during evaluation.

 Output can be in the high impedance state during and


after evaluation (PDN off), state is stored on CL
Properties of Dynamic Gates
 Logic function is implemented by the PDN only
 number of transistors is N + 2 (versus 2N for static complementary CMOS)
 Full swing outputs (VOL = GND and VOH = VDD)
 Non-ratioed - sizing of the devices does not affect the logic
levels
 Faster switching speeds
 reduced load capacitance due to lower input capacitance (Cin)
 reduced load capacitance due to smaller output loading (Cout)
 no Isc, so all the current provided by PDN goes into discharging CL
Properties of Dynamic Gates
 Overall power dissipation usually higher than static CMOS
 no static current path ever exists between VDD and GND (including Psc)
 no glitching
 higher transition probabilities
 extra load on Clk
 PDN starts to work as soon as the input signals exceed VTn, so
VM, VIH and VIL equal to VTn
 low noise margin (NML)
 Needs a precharge/evaluate clock
Complex Logic Circuits

VDD

A3 OUT  A0  A1 & A 2  A3 & A 4


A1
A0
A4
A2

VSS
Examples
Dynamic Logic Cascading
Dynamic Logic Cascading
Domino Logic
VDD

precharge OUT
A

NMOS
logic

CLK evaluate

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