Professional Documents
Culture Documents
ระบบความปลอดภัยในงานไฟฟ้าและอิเล็กทรอนิกส์
ระบบความปลอดภัยในงานไฟฟ้าและอิเล็กทรอนิกส์
4
5
2
2
2
3
3
3
3
4
4
4
4
4
4
5
5
6
6
6
7
7
8
8
10
10
10
13
14
(2100-1003)
. 1
(2100-1003)
. 1/2 45
1.
1. . 1/2
(2100-1003)
2. .
1/2 (2100-1003)
2.
. 1/2
(2100-1003)
3.
1. . 1/2
45 1 2551
2.
(2100-1003)
4.
1. (Expectation Teaching Method)
2. (Lecture Method)
3.
5.
1.
2.
2
1. (Expectation Teaching Method)
1.
2.
3.
4.
2.(Lecture Method)
3.
1.
2.
4.
1.
2.
3.
4.
5.
1.
2.
3.
4.
6.
1.
2.
3.
4.
5.
1.
(Quasi-experiment)
(One group, Pretest-Posttest design) (Pre-test)
(Post-test)
1.1
(2100-1003)
1.2 (2100-1003) .
1/2
1.3
1.4
1.5
1)
2)
3)
1.6
1) (x )
2) (S.D.)
3) t-test (Dependent)
4) (C.V.)
2.
. 1
2 95
. 1/2
2 45
3.
4 10
3.1 (Validity)
5
+1
0
-1
IC (Index of item
objective congruence)
1
IC
1
1
1
2
1
3
1
4
1
5
1
6
1
7
1
8
1
9
1
10
1
2
1
1
0
1
1
1
1
1
1
1
3
1
1
1
1
1
1
1
1
1
1
4
1
1
1
1
0
1
1
1
0
1
5
1
5
1
5
1
4
1
5
1
4
1
5
1
5
1
5
1
4
1
5
IC
1
1
0.8
1
0.8
1
1
1
0.8
1
0.8
3 1.00 7
0.50
3.2
5
2
5
1
2
3
4
5
6
7
8
9
10
1
1
1
1
1
1
1
1
1
1
1
2
1
1
1
1
1
1
1
1
1
1
3
0
0
0
0
1
1
1
1
1
1
4
1
1
1
1
1
1
1
1
1
1
5
1
4
1
4
1
4
1
4
1
5
1
5
1
5
1
5
1
5
1
5
IC
0.8
0.8
0.8
0.8
1
1
1
1
1
1
5
(1-10 ) 0.6 1.00 0.5
(1-10)
3.3
(Test-retest)
1 15 2
.1/2
10 16 2551 1
2551 ( )
1 (X)
X2
2 (Y)
Y2
XY
81
81
81
36
49
42
3
4
5
6
7
8
9
10
36
36
36
19
21
24
29
33
37
45
8
5
4
7
8
8
6
64
25
16
49
64
64
36
8
5
5
7
8
7
6
64
25
25
49
64
49
36
64
25
20
49
64
56
36
67
471
68
478
473
N=10
X2
Y2
XY
10
4
1.
(x )
(S.D.)
(C.V.)
t-test (Dependent)
IC
r ( Test retest)
p r ( )
2.
(2100-1003)
.1/2
45
4
.
1
2
3
4
5
6
7
8
9
10
X
2
2
5
2
3
4
2
4
3
2
X
8
6
9
7
8
7
6
8
8
7
D2
-6
-4
-4
-5
-5
-3
-4
-4
-5
-5
36
16
16
25
25
9
16
16
25
25
1
1
5
1
2
2
7
4
1
3
2
3
2
4
1
2
2
4
2
4
3
4
5
1
1
1
2
4
6
3
4
5
4
4
3
5
8
9
8
7
7
9
8
5
9
5
5
6
5
5
8
6
5
7
5
8
7
8
5
5
6
8
5
9
7
8
8
9
7
6
-4
-7
4
-7
-5
-5
-2
-4
-4
-6
-3
-2
-4
-1
-4
-6
-4
-1
-5
-1
-5
-3
-3
-4
-4
-5
-6
-1
-3
-4
-4
-3
-5
-3
-3
16
49
16
49
25
25
4
16
16
36
9
4
16
1
16
36
16
1
25
1
25
15
9
16
16
25
36
1
9
16
16
9
25
9
9
N = 45
X
X = 132
2.9
X = 254
6.9
D= -176
176
D2
822
df
D2
(n-1) = 44
S.D. =
1.528
S.D. =
1.654
15.055 **
11
12
.1/2
2.9 ( 1.528) 6.9
( 1.654)
2
D = 176 D = 822
t-test
5
5
(2100-1003) .1/2
2
N
D
D
t-test
45
176
822
15.055**
45
5
t-test t = 15.055 0.01
99 %
. 1/2
(2100-1003)
13
. 1
(2100-1003)
(2100-1003)
. 1/2
0.01
2.9 6.9
1.528
1.654
(C.V.) (C.V.) = 23.97
. 1/2 (21001003)
15
16
1
17-18
-
19-20
.1/2
21-22
23-27
28-32
.
14
15
1.
. -
.
.
.
-
2.
20
24
. 12
. 1.2
. 480
. 833.3
3.
. 3
. 10
. 12
. 25
4.
.
.
.
5.
.
.
.
.
6.
.
.
.
.
7.
.
.
.
15
. . .
8.
. 100 500
. 500 1
. 5 10
.
9.
-
. .
. .
10.
. 2
. 1
. 3
.
1
2
3
4
5
6
7
8
9
10
16
17
1
2100-1003
1
-- 2-0-2
2
1.
1.1 -
1.2 -
1.3
2.
-
3.
4.
1) -
2)
3) -
4)
5.
1) (10 )
1.1 -
2 3
2) (40 )
2.1 -
2.2 -
2 3
2.3
5
3) (20 )
4) (20 )
-
6. ()
7.
1.
3.
4.
5. -
18
. 1/2
Test -retest
19
. 1/2
Test retest
20
16 2551
2551
-
1
1
2
2
3
3
4
4
5
5
6
6
7
7
8
8
9
9
10
10
11
11
12
12
13
13
14
14
15
15
16
16
17
17
18
18
19
19
20
20
21
21
22
22
23
23
24
24
25
25
26
26
27
27
21
1
-
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
22
(Validity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
23
(Validity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
24
(Validity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
25
(Validity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
26
(Validity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
27
( Objectivity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
28
( Objectivity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
29
( Objectivity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
30
( Objectivity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
31
( Objectivity)
+1 , 0 , -1
+1
0
-1
1
2
3
4
5
6
7
8
9
10
( . )
.
( )
( . 184 )
32
33