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0V
5V
0V
Test 0V 0V
5V
DRAM - Dynamic random-access memory
wordline
bittest
bitline
VSS
Number of Byte=number of row=4byte
Number of bit=number of column=8bit
Test Test Test Test
+++ +++
C 5V +++
0V 5V
----- C ----- C5V ----- C5V
write 5V 5V
• Sequence
• Make bitline 1 or 0
• Make wordline 1 bittest bittest
• Keep wordline 1 for a short duration
• Make wordline 0
• Check saved data at bittest
Capacitor will take the value of bitline only at gate pulse or wordline pulse
read
• Sequence
• Make bittest 1 or 0
• Make wordline 1 bittest bittest
• Keep wordline 1 for a short duration
• Make wordline 0
• Check test data at bitline
G D G
S S D
blue = metal1
white = contact
Cap Switch
green=poly
B B
wordline
Cap Switch
G
bittest S D
B
G bitline
S D
B
VSS
wordline
G G
S S
D D
bittest
bitline
Cap
Switch
VSS
B B