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17-Optical Detectors and Displays
17-Optical Detectors and Displays
Optical displays
평판 디스플레이(FPD)
Applied volatage 증가
LCD 제품
장점
• 방전광을 이용한 자발광.
자발광
• 0.1~0.3mm의 방전 갭을 가지므로 패널형이 가능.
• 형광체를 이용한 컬러 발광이 가능.
• 대화면 패널 제작이 용이.
단점
• 소비전력이 커서 전지구동이 어려움.
plasma
• 컬러 발광효율이 나쁨.
• 구동 전압이 높음.
PDP 발광원리
PDP 제품
• Reflective type TFT LCD contains a reflective mirror, utilizing the external light for image
display. power saving, and light-weight
((without backlight).
g ) Ideal for viewing
g with external light
g sources.
• Transflective type TFT LCD is a promising displaying device for both outdoor and indoor
applications.
Driving Methods of LCD
Passive Matrix: (PM-LCD)
Simple matrix type was used in the first stage of LCDs. In this
method, the transparent electrodes are set on X and Y axis.
There is not switching device.
Active Matrix: (AM-LCD)
( C )
A switching device and a storage capacitor are integrated
at the each cross point of the electrodes
TFT LCD
TFT LCD (Thin Film Transistor Liquid Crystal Display)
has a sandwich-like structure with liquid crystal filled between two glass plates.
LC ((liquid
q crystal)
y )
Twisted Nematic LC ( TN-LC )
(phototube)
Metal-Semicon. photoconductor
((Schottky-barrier
y photodiode))
p
5 basic steps of optical/IR photon detection
1. Get light into the detector
Anti-reflection coatings
g Quantum
2. Charge generation Efficiency
Popular materials: Silicon, HgCdTe, InSb (#e/#p)
3
3. Charge collection
Electrical fields within the material
Point
ity
collect photoelectrons into pixels.
Spread
Sensitvi
4. Charge transfer
If infrared, no charge transfer required. Function
S
For CCD,
CCD move photoelectrons to the edge
where amplifiers are located.
5. Charge amplification & digitization
Amplification process is noisy.
In general CCDs have lowest noise,
CMOS and IR detectors have higher noise noise.
Detector zoology
AlN
Direct gap 0.2
6.0 III-Nitrides
(c ~ 1.6 a0)
Indirect gap
AlN
E(eV)=1.24/ λ(㎛)
5.0
Theory
4.0 0.3
ZnS
Bandgap (eV)
Zincblend
avelengtth (㎛)
GaN
GaN
3.0 04
0.4
ZnSe
AlP CdS ZnTe 0.5
InN AlAs
GaP 06
0.6
Wa
20
2.0 InN Theory CdSe
AlSb 0.7
GaAs InP CdTe
Si 1.0
10
1.0
6H-SiC
3C-SiC
Ge GaSb
Al2O3
Al2O3
ZnO
2.0
InAs
5.0
0.0 InSb
25
2.5 30
3.0 35
3.5 40
4.0 45
4.5 50
5.0 55
5.5 60
6.0 65
6.5
Lattice Constant (Å)
2D Image Detectors
[m]
0.1 0.3 0.9 1.1 2.5 5 20
HgCdTe
InSb
STJ Si:As
Image
g Sensor - Digital
g Film
CCD Sensor CMOS Sensor
CCD
Output
Amp
capacitor
H i
Horizontal
t l Shift Register
R i t
CCD IMAGERS
Qualities
■ Text book performance for all parameters (QE, read noise,
MTF,, dark current,, linearity,
y, etc.).
)
Deficiencies
■ Low high-energy radiation damage tolerance.
e.g. proton bulk damage and resultant CTE degradation.
■ Significant off-chip electronic support required.
■ Difficulty with high-speed readout (inherently a serial read out
device).
device)
CMOS image sensors
• Based on
standard
p
production
process for
CMOS chips,
allows
ll iintegration
t ti
with other
components.
components
CMOS IMAGERS
Q liti
Qualities
■ Very tolerant to high-energy radiation sources (long life time).
■ On- chip system integration (low power, low weight and
compact designs).
■ High speed / low noise operation (inherently a parallel-
random access readout device).
Deficiencies
■ Currently lacks performance in most areas compared to the
CCD ((charge
g g generation,, charge
g collection,, charge
g transfer and
charge measurement).
Comparison CCD/CMOS sensors
CMOS:
low cost
CCD:
medium to high end